A metal complex of a metal from groups 13 to 16 uses a ligand of the structure (I), where R.sup.1 and R.sup.2 can independently be oxygen, sulfur, selenium, NH or NR.sup.4, where R.sup.4 an alkyl or aryl and can be connected to R.sup.3. R.sup.3 is an alkyl, long-chain alkyl, alkoxy, long-chain alkoxy, cycloalkyl, halogenalkyl, aryl, arylene, halogenaryl, heteroaryl, heteroarylene, heterocycloalkylene, heterocycloalkyl, halogenheteroaryl, alkenyl, halogenalkenyl, alkynyl, halogenalkynyl, ketoaryl, halogenketoaryl, ketoheteroaryl, ketoalkyl, halogenketoalkyl, ketoalkenyl, halogenketoalkenyl, where in suitable radicals, one or more non-adjacent CH.sup.2-groups can be substituted independently of one another by —O—, —S—, —NH—, —NR.sup.o-, —SiR.sup.oR.sup.oo-, —CO—, —COO—, —OCO—, —OCO—O—, —SO.sub.2-, —S—CO—, —CO—S—, —CY1═CY2 or —C.dbd.C—, specifically in such a way that O and/or S atoms are not connected directly to one another, are likewise optionally substituted with aryl- or heteroaryl preferably containing 1 to 30 C atoms, as a dopant for matrix materials in organic electronic components.

Patent
   10305047
Priority
Jun 06 2012
Filed
Dec 19 2016
Issued
May 28 2019
Expiry
May 21 2033
Extension
7 days
Assg.orig
Entity
Large
10
46
currently ok
5. A metal complex comprising:
bismuth atoms bonded to ligands L having the following structure:
##STR00015##
where R1=R2=oxygen and wherein the ligand comprises a fluorinated benzoic acid.
1. metal complex containing at least one Ligand L of the following structure
##STR00014##
where R1=R2=oxygen and wherein the ligand is selected from the group consisting of 3,5-bis(trifluoromethyl)benzoic acid, 3-(trifluoromethyl)benzoic acid, and 3,5-difluorobenzoic acid, and wherein the metal is selected from the group consisting of bismuth, and mixtures thereof.
2. The metal complex according to claim 1, wherein the complex is a mononuclear metal complex.
3. The metal complex according to claim 1, wherein the metal complex follows the structure ML3, wherein M represents the metal and L represents the ligand.
4. The metal complex according to claim 1, wherein the complex is a polynuclear metal complex.
6. The metal complex according to claim 5, wherein the ligand is selected from the group consisting of 3,5-bis(trifluoromethyl)benzoic acid, 3-(trifluoromethyl)benzoic acid, and 3,5-difluorobenzoic acid.
7. The metal complex according to claim 5, wherein the ligand is selected from the group consisting of 3,5-bis(trifluoromethyl)benzoic acid and 3-(trifluoromethyl)benzoic acid.
8. The metal complex according to claim 5, wherein the complex is a mononuclear metal complex.
9. The metal complex according to claim 5, wherein the complex is a polynuclear metal complex.
10. The metal complex according to claim 5, wherein the metal complex follows the structure ML3, wherein M represents the metal and L represents the ligand.

This application is a Divisional of U.S. application Ser. No. 14/406,041 filed on Dec. 5, 2014, which is based on and hereby claims priority to International Application No. PCT/EP2013/059911 filed on May 14, 2013 and German Application No. 10 2012 209 523.3 filed on Jun. 6, 2012, the contents of which are hereby incorporated by reference.

Described below is the use of bi- or polynuclear main group metal complexes as p-dopants for organic electronic matrix materials.

Within organic electronics, it is possible to identify essentially two important commercial fields of technology. The first field of technology is concerned with uses of organic matrix materials for conversion of light to electrical current and vice versa, and the other field is focused on the construction of electrical components by organic semiconductor material. Examples of the former category are, for example, photodetectors and organic solar cells, shown in schematic form in FIG. 1, which convert light to an electrical signal or to electrical current, and organic light-emitting diodes (OLEDs), which can generate light by organic electronic materials (see FIG. 2). In the second field of technology are, for example, organic field-effect transistors, shown in schematic form in FIG. 3, in which doping reduces the contact resistance between electrode and semiconductor material, or bipolar transistors.

A common factor to all the applications is that they include, as an important functional component, electrical transport layers which have different conduction mechanisms depending on their composition. In general, a distinction is made between intrinsic p-conductivity (hole conductivity) and n-conductivity (electron conductivity) of the organic materials. Since the electrical properties of these organic substance classes are generally insufficient for high-efficiency utilization of the components, they are admixed with additional compounds which are intended to improve the electrical properties of the layers. This is typically done by doping with metallic or further organic compounds. One approach to achieving significant improvements in conductivities is the addition of metal complexes and especially the addition of transition metal complexes.

For example, WO 2005 086251 describes dopants for production of n-conductive layers which may have structures including the following:

##STR00001##

The structure of this compound class is also referred to in the literature as “paddle wheel complex”. More particularly, the publication describes the use of a metal complex as n-dopant for doping an organic semiconductive matrix material to alter the electrical properties thereof. The compounds presented are said, with respect to the matrix material, to be usable as n-dopants.

Another way of using Lewis-acidic metal complexes to dope p-conductive transport layers is given by Endo et al. (Jpn. J. Appl. Phys. vol. 41 (2002) L358-L360). This reference describes organic electroluminescent devices having a p-conductive layer which are prepared by co-doping from FeCl3 and arylamine derivatives, for example N,N′-dinaphthyl-N,N-diphenylbenzidine (α-NPD). However, significant disadvantages for the component are also described therein, such as extinguishment of the luminescence and an increase in intrinsic absorption.

A further way of configuring organic semiconductors for bipolar transistors by doping is additionally disclosed in DE 102010041331.

Additionally known are polynuclear metal complexes, for example from WO 2008/154915.

One possible object is further materials which are suitable as p-dopants in organic electronic matrix materials, especially hole transporters, and increase the efficiency of components containing these layers.

The inventors propose an organic electronic component having a matrix is proposed, wherein the matrix contains, as p-dopant, a main group metal complex of groups 13 to 15 which in turn contains at least one ligand L of the following structure:

##STR00002##
where R1 and R2 are each independently oxygen, sulfur, selenium, NH or NR4 where R4 is selected from the group comprising alkyl and aryl and may be bonded to R3; and R3 is selected from the group comprising alkyl, long-chain alkyl, alkoxy, long-chain alkoxy, cycloalkyl, haloalkyl, aryl, arylenes, haloaryl, heteroaryl, heteroarylenes, heterocycloalkylenes, heterocycloalkyl, haloheteroaryl, alkenyl, haloalkenyl, alkynyl, haloalkynyl, ketoaryl, haloketoaryl, ketoheteroaryl, ketoalkyl, haloketoalkyl, ketoalkenyl, haloketoalkenyl, where one or more non-adjacent CH2 groups in suitable radicals may independently be replaced by —O—, —S—, —NH—, —NRº—, —SiRºRºº—, —CO—, —COO—, —OCO—, —OCO—O—, —SO2—, —S—CO—, —CO—S—, —CY1=CY2 or —C≡C—, in such a way that no oxygen and/or sulfur atoms are bonded directly to one another, and are likewise optionally replaced by aryl or heteroaryl preferably containing 1 to 30 carbon atoms (terminal CH3 groups are regarded as CH2 groups in the sense of CH2—H).

It has been found that, surprisingly, these materials are suitable as p-dopants for matrix materials in organic electronic components. More particularly, these materials often have one or more of the following advantages:

The materials have good co-evaporability together with the matrix material from various sources, such that doped matrix layers of defined composition form.

The materials are obtainable in a simple way and do not require any complex preparation processes.

The doping strength can be adapted to the matrix.

The conductivity can be adjusted via the concentration and type of substance.

In the context of this discussion, the term “organic electronic component” means and/or encompasses especially organic transistors, organic light-emitting diodes, light-emitting electrochemical cells, organic solar cells, photodiodes and organic photovoltaics in general.

In the context of this discussion, the term “p-dopant” means or encompasses especially materials which have Lewis acidity and/or are capable of forming complexes with the matrix material in which these materials act as Lewis acids (if only in a formal sense).

Such a main group metal complex matrix material (hole conductor) may have, for example, the following structure (shown here with bismuth as metal and coordination via the nitrogen):

##STR00003##

The term “main group metal complex of groups 13 to 15” is understood to mean the metals of groups 13 to 15 according to IUPAC, i.e. aluminum, gallium, indium, silicon, germanium, tin, lead, thallium, arsenic, antimony, bismuth or mixtures thereof. Preference is given to the metals of groups 14 and 15, i.e. silicon, germanium, tin, lead, arsenic, antimony, bismuth, more preferably tin and/or bismuth.

General group definitions: general groups, for example alkyl, alkoxy, aryl etc., are described. Unless stated otherwise, preference is given in the context of these documents to using the groups which follow within the groups described in general terms:

heteroarylene: selected from the group comprising: pyridinediyl; quinolinediyl; pyrazodiyl; pyrazolediyl; triazolediyl; pyrazinediyl; thiophenediyl; and imidazolediyl, where the heteroarylene functions as a bridge in the compound via any atom in the ring of the selected heteroaryl, the following being especially preferred: pyridine-2,3-diyl; pyridine-2,4-diyl; pyridine-2,5-diyl; pyridine-2,6-diyl; pyridine-3,4-diyl; pyridine-3,5-diyl; quinoline-2,3-diyl; quinoline-2,4-diyl; quinoline-2,8-diyl; isoquinoline-1,3-diyl; isoquinoline-1,4-diyl; pyrazole-1,3-diyl; pyrazole-3,5-diyl; triazole-3,5-diyl; triazole-1,3-diyl; pyrazine-2,5-diyl; and imidazole-2,4-diyl, thiophene-2,5-diyl, thiophene-3,5-diyl; a —C1-C6-heterocycloalkyl selected from the group comprising: piperidinyl; piperidine; 1,4-piperazine, tetrahydrothiophene; tetrahydrofuran; 1,4,7-triazacyclononane; 1,4,8,11-tetraazacyclotetradecane; 1,4,7,10,13-pentaazacyclopentadecane; 1,4-diaza-7-thiacyclononane; 1,4-diaza-7-oxacyclononane; 1,4,7,10-tetraazacyclododecane; 1,4-dioxane; 1,4,7-trithiacyclononane; pyrrolidine; and tetrahydropyran, where the heteroaryl may be bonded to the C1-C6-alkyl via any atom in the ring of the selected heteroaryl.

Unless stated otherwise, the following groups are more preferred groups within the general group definitions:

In a preferred embodiment, R3 is haloalkyl, more preferably perfluoroalkyl having 1 to 8 carbons, more preferably 1 to 4, haloaryl, more preferably perfluoroaryl, haloalkylaryl, especially preferably (per)fluoroalkylaryl and haloheteroaryl, especially preferably perfluoroheteroaryl.

Further examples of ligands L preferably include fluorinated benzoic acids, for example 2-(trifluoromethyl)benzoic acid; 3,5-difluorobenzoic acid; 3-hydroxy-2,4,6-triiodobenzoic acid; 3-fluoro-4-methylbenzoic acid; 3-(trifluoromethoxy)benzoic acid; 4-(trifluoromethoxy)-benzoic acid; 4-chloro-2,5-difluorobenzoic acid; 2-chloro-4,5-difluorobenzoic acid; 2,4,5-trifluorobenzoic acid; 2-fluorobenzoic acid; 4-fluorobenzoic acid; 2,3,4-trifluorobenzoic acid; 2,3,5-trifluorobenzoic acid; 2,3-difluorobenzoic acid; 2,4-bis(trifluoromethyl)benzoic acid; 2,4-difluorobenzoic acid; 2,5-difluorobenzoic acid; 2,6-bis(trifluoromethyl)benzoic acid; 2,6-difluorobenzoic acid; 2-chloro-6-fluorobenzoic acid; 2-fluoro-4-(trifluoromethyl)-benzoic acid; 2-fluoro-5-(trifluoromethyl)benzoic acid; 2-fluoro-6-(trifluoromethyl)benzoic acid; 3,4,5-trifluorobenzoic acid; 3,4-difluorobenzoic acid; 3,5-bis(trifluoromethyl)benzoic acid; 3-(trifluoromethyl)benzoic acid; 3-chloro-4-fluorobenzoic acid; 3-fluoro-5-(trifluoromethyl)benzoic acid; 3-fluorobenzoic acid; 4-fluoro-2-(trifluoromethyl)benzoic acid; 4-fluoro-3-(trifluoromethyl)benzoic acid; 5-fluoro-2-methylbenzoic acid; 2-(trifluoromethoxy)benzoic acid; 2,3,5-trichlorobenzoic acid; 4-(trifluoromethyl)benzoic acid; pentafluorobenzoic acid; 2,3,4,5-tetrafluorobenzoic acid,

In an alternative preferred embodiment, R3 is selected from the group comprising:

##STR00004##
where Y1-Y5 are each independently selected from the group comprising C—F, C—CF3, C—NO2, C—CN, C-halogen, C-pseudohalogen and N.

In a preferred embodiment, R3 is selected from the group comprising:

##STR00005##
where Y1-Y7 are each independently selected from the group comprising C—F, C—CF3, C—NO2, C—CN, C-halogen, C-pseudohalogen and N.

In a preferred embodiment, R3 is selected from the group comprising:

##STR00006##
where Y1-Y7 are each independently selected from the group comprising C—F, CF3, C—NO2, C—CN, C-halogen, C-pseudohalogen and N.

In a preferred embodiment, R3 is selected from the group comprising:

##STR00007##

In a preferred embodiment, R3 is selected from the group comprising halogenated, preferably perhalogenated and/or pseudohalogenated, pteridines, isopteridines, naphthyridines, quinoxalines, azaquinoxalines.

In a preferred embodiment, the metal complex (in the absence of matrix material) is Lewis-acidic, meaning that it acts as an electron pair acceptor. This has been found to be particularly preferred for interaction with the matrix materials.

In a preferred embodiment, the metal complex (in the absence of matrix material) has at least one unoccupied or partly accessible coordination site. This has likewise been found to be particularly preferred for interaction with the matrix materials.

In a preferred embodiment, the compounds can be processed either in the gas phase or in the liquid phase. In the case of gas phase deposition, both dopant and matrix material are co-vaporized under high vacuum, preferably from different sources, and deposited as a layer. In the case of processing from the liquid phase, the metal complex and the matrix material are dissolved in a solvent and deposited by printing techniques, spin-coating, knife-coating, slot-coating, etc. The finished layer is obtained by vaporizing the solvent. It is possible to establish any desired doping ratios via the different mass ratios of metal complex to the matrix material.

It is possible with particular preference to process the following hole conductors by a solvent process:

##STR00008##

In addition, it is possible by a solvent process, with particular preference, to process matrix materials which are referred to as “small molecules”. This substance class is known to those skilled in the art and includes, for example, spiro-TAD (2,2′,7,7′-tetrakis(N,N-diphenylamino)-9,9′-spirobi-fluorene) and spiro-TTB (2,2′,7,7′-tetrakis(N,N′-di-p-methyl-phenylamino)-9,9′-spirobifluorene), and further materials as listed as matrix materials in this application.

In a preferred embodiment, the metal complex is a mono- or bi- or polynuclear metal complex. More particularly, the metal complex may be in solid form as a polynuclear metal complex. The polynuclear metal complex in solid form may depolymerize during vaporization and may advantageously be in mononuclear form in the gas phase. This embodiment is particularly advantageous since particularly intimate mixing and good binding of the complexes to the matrix materials are thus effected.

In a preferred embodiment, at least one of the ligands L is in a bridging arrangement between two metals.

In a preferred embodiment, the metal complex has the empirical formula M2L4 (with M=metal and L=ligand) where both the metals and the individual ligands may independently be selected as defined above.

In a further preferred embodiment, the metal complex may contain the metal atom M as Sn, Sb, Pb or bismuth. More preferably, the metal complexes may either be mononuclear according to the structures given below

##STR00009##
or be dinuclear according to the structures given below:

##STR00010##

Without being bound to the theory, there is terminal coordination of the metal via the ligand(s) in the mononuclear complexes. In the case of a dinuclear complex, there is bi- or tridentate coordination of the metal atom. If different metal atoms are employed to form a bidentate complex, a hetero-bimetallic complex is the result.

More preferably, the main group metal complex contains bismuth. In this context, particular preference is given to bismuth main group metal complexes:

The II oxidation states which, without being bound to the theory, as a function of the ligands chosen, may have the following paddle-wheel structure:

##STR00011##

The III oxidation state (MLn=3) which, without being bound to the theory, does not have a paddle-wheel structure. These compounds are generally in solid form in mono- or polynuclear form, and can depolymerize during the vaporization process.

The V oxidation state, in which, in a particular embodiment, the main group metal complex may contain bismuth in the V oxidation state with the following structure:

##STR00012##

The Ari may, in this preferred case, independently be selected from the group of the substituted or unsubstituted aromatics or heteroaromatics. A particular embodiment involves partially fluorinated or perfluorinated aromatics or heteroaromatics. In addition, the Ari may more preferably be selected from the group of the non-fluorinated or fluorinated carboxylates or generally from the group of ligands L as listed in this application.

In an alternative embodiment, the metal complex has the structure MLm with M=metal, L=ligand and m=1 to 10, where, when m>1, all L are independent of one another. These metal complexes are preferred, especially in the case of tin and bismuth; in this case, m is preferably m=2 for tin, or 2, 4, and 3 or 5 for bismuth, according to the oxidation state.

In an alternative embodiment, the metal complex has the structure ML2L′n with M=metal, L=ligand, as defined above, and L′=a ligand nonidentical to L, selected from the group of aryl, heteroaryl, haloaryl and haloheteroaryl, where n may be from 0 to 3 and, if n>1, each L′ is selected independently from the others. These metal complexes are preferred especially in the case of tin and bismuth; in this case, preferably, n=2 for tin, or 1 or 3 for bismuth, according to the oxidation state, and n=0.

In a preferred embodiment, the matrix material of the optoelectronic component comprises one or more of the following materials:

These materials have been found to be useful as matrix materials in (opto)electronic components.

In a preferred embodiment, the doping level in mol of metal complex based on mol of matrix material is from ≥0.1% to ≤50%. This has been found to be appropriate to the purpose. Preferably, the doping level is from ≥0.5% to ≤15%, more preferably ≥1% to ≤5%.

In a preferred embodiment, R3 is selected from the group comprising halogenated, preferably perhalogenated and/or pseudohalogenated, pteridines, isopteridines, naphthyridines, quinoxalines, azaquinoxalines.

In a further preferred embodiment, the metal complex may contain at least one ligand L selected from the group of the unsubstituted, partly fluorinated or perfluorinated organic carboxylic acids. Organic carboxylic acids may generally be selected from the groups of the aliphatically, saturated monocarboxylic acids; aliphatically, unsaturated monocarboxylic acids; aliphatically, saturated dicarboxylic acids; aliphatically, saturated tricarboxylic acids; aliphatically, unsaturated dicarboxylic acids; aromatic carboxylic acids; heterocyclic carboxylic acids; aliphatically, unsaturated cyclic monocarboxylic acids. Particularly preferred partial or perfluorinated ligands L are selected from substituted and unsubstituted compounds of acetic acid, phenylacetic acid and/or benzoic acid, and are listed by way of example above. Particular preference is given to non-fluorinated, partially fluorinated or perfluorinated acetic acid. In a further preferred embodiment, there may be one or more polydentate bridging ligands L between the metal atoms of the complex.

The inventor also propose the use of a group 13-15 metal complex containing at least one ligand L of the following structure:

##STR00013##

The aforementioned components for use with the proposals, and also those described in the working examples, are not subject to any particular exceptional conditions in terms of their size, configuration, materials selection and technical design, and so the selection criteria known in the field of use can be applied without limitation.

These and other objects and advantages of the present invention will become more apparent and more readily appreciated from the following description of the preferred embodiments, taken in conjunction with the accompanying drawings of which:

FIG. 1 is a schematic side view of the structure of an organic light-emitting diode (10). The light-emitting diode is formed from a glass layer (1); transparent conductive oxide (TCO) or PEDOT:PSS or PANI layer (2); hole injector layer (3); hole transport layer (HTL) (4); emitter layer (EML) (5); hole blocker layer (HBL) (6); electron transport layer (ETL) (7); electron injector layer (8) and a cathode layer (9);

FIG. 2 is a schematic side view of the structure of an organic solar cell having PIN structure (20), which converts light (21) to electrical current. The solar cell is formed of a layer of indium tin oxide (22); a p-doped layer (23); an absorption layer (24); an n-doped layer (25) and a metal layer (26);

FIG. 3 is a schematic cross section of an organic field-effect transistor (30). Atop a substrate (31) is applied a gate electrode (32), a gate dielectric (33), a source and drain contact (34+35) and an organic semiconductor (36). The hatched areas show the points where contact doping is helpful.

FIG. 4 is a graph of current density against voltage for an undoped matrix material and for a doped matrix material in a first embodiment;

FIG. 5 is a graph of absorption against wavelength for the materials from FIG. 4;

FIG. 6 is a graph of photoluminescence against wavelength for the materials from FIG. 4;

FIG. 7 is a graph of reflection against wavelength for the doped material from FIG. 4;

FIG. 8 is a graph of current density against voltage for an undoped matrix material and for several doped matrix materials in a second embodiment;

FIG. 9 is a graph of absorption against wavelength for the materials from FIG. 8;

FIG. 10 is a graph of photoluminescence against wavelength for the doped materials from FIG. 8;

FIG. 11 is a graph of reflection against wavelength for the materials from FIG. 8;

FIG. 12 is a graph of current density against voltage for an undoped matrix material and for several doped matrix materials in a third embodiment;

FIG. 13 is a graph of current density against voltage for an undoped matrix material and for several doped matrix materials in a fourth embodiment;

FIG. 14 is a graph of current density against voltage for an undoped matrix material and for several doped matrix materials in a fifth embodiment;

FIG. 15 is a graph of luminescence against voltage for the doped materials from FIG. 14;

FIG. 16 is a graph of current density against voltage for an undoped matrix material and for several doped matrix materials in a sixth embodiment;

FIG. 17 is a graph of luminescence against voltage for the doped materials from FIG. 16.

Reference will now be made in detail to the preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like elements throughout.

Example I relates to Bi(O2CCF3)3 which has been prepared according to literature; see Bo Li “Heterometallic Carboxylates Incorporating Bismuth”, PhD Thesis, State University of New York at Albany, Chair M. Petrukhina 2007, UMI Number 3277252, and Vera Reiland “Chemie und Koordinationschemie von Bismuttri-fluoracetat und verwandten Verbindungen” [Chemistry and Coordination Chemistry of Bismuth Trifluoroacetate and Related Compounds], Thesis D368, University of Kaiserslautern 2000.

ITO-prestructured glass substrates were subjected to an oxygen plasma treatment for 10 min and then subsequently transferred as quickly as possible to the vaporizer. The vaporizer was transferred into an argon glovebox in which the oxygen and water concentration was less than 2 ppm.

All the vaporizations were conducted at a vacuum of less than 2×10−6 mbar base pressure (the pressure then rises in the course of vaporization).

First of all, both the matrix material and doping material were heated to just below the vaporization point, then heating was continued until constant vaporization was observable.

The overall vaporization rate was about 1 Å/s, with the vaporization rate of the doping material set via the vaporization rate of the matrix material.

Once the shutters had been closed, the system was cooled to 40° C. and flooded with argon, the mask for the deposition of the cathode was changed, and then the system was evacuated again.

The electrode was formed of a 150 nm-thick layer of aluminum, which was applied at an initial vaporization rate of 0.5 Å/s, which was increased gradually to 5 Å/s.

FIGS. 4 to 7 relate to Bi(O2CCF3)3-doped and undoped HTM-014 (matrix material, from Merck KGaA). In these cases, 200 nm-thick layers of HTM-014 (Merck KGaA) on the one hand, and of HTM-014 doped with 15% Bi(O2CCF3)3 on the other hand, were produced.

FIG. 4 shows current density against voltage applied for the two materials. Even in the case of the doped layer, an increase in current density against voltage applied is observed.

To study the optical properties of the proposed dopant material, absorption, photoluminescence and reflection were measured (FIGS. 5 to 7). It can be seen that the complexes are virtually transparent, which makes them suitable for use in (opto)electronic components.

Example II relates to Bi(O2CC6H2(2,3,4-F3))3, which was prepared as follows:

A 50 mL Schlenk flask was charged with 0.251 g (0.57 mmol) of triphenylbismuth(III), followed by 10-15 mL of freshly distilled benzene, and an excess (about 3 mmol) of 2,3,4-trifluorobenzoic acid was added. The mixture is heated under reflux for one hour and then cooled to room temperature; subsequently, the solvent is drawn off under reduced pressure until a white solid precipitates out. The crude product (yield 85-88%) is washed with a little hexane and dried under reduced pressure overnight. Purification can be accomplished by sublimation.

In analogy to example I, four layers, one of an undoped matrix material (HTM-014, Merck), and HTM-014 layers doped with 5%, 13% and 15% Bi(O2CC6H2(2,3,4-F3))3, were applied. The layer thickness was 200 nm in each case.

FIG. 8 shows current density against voltage applied for the three materials. Even in the case of the layer with 5% doping, an increase in current density against voltage applied is observed.

To study the optical properties of the dopant material, absorption, photoluminescence and reflection were measured (FIGS. 9 to 11). It can be seen that the complexes are virtually transparent, which makes them suitable for use in (opto)electronic components.

In the course of a solvent process, a majority charge carrier component is produced, using HIL-012 (matrix material, from Merck KGaA) as polymeric hole conductor and the metal complexes Bi(O2C2F3)3 and BipFbz as dopants.

To produce an undoped hole conductor, a 2% by weight solution of the HIL-012 in anisole and xylene (volume ratio of the solvents 1:1) is applied by a spin-coater to an ITO-coated glass plate. The application is effected for 40 s with a spin speed of 1200 rpm (revolutions per minute) and, after drying at 120° C. for 1 h standard pressure, a 120 nm-thick HIL-012 layer is obtained. For the upper electrode, by a vacuum vaporization process, a 200 nm-thick aluminum layer is applied.

The layers doped with the metal complexes are produced analogously, except that the solutions admixed with the bismuth tris(trifluoroacetate) Bi(O2C2F3)3 or bismuth tris(pentafluorobenzoate) (BipFbz) dopants are processed. The total solids content in these embodiments totals 2% by weight, and the proportion of the dopants in the total solids content is 15% by weight.

The parameters for the spin-coating are found to be 1500 rpm for the element with Bi(O2C2F3)3 as dopant, and 1000 rpm for the element with BipFbz. in total, coating is effected for a period of 40 s, and the layer thickness after drying using the abovementioned parameters is 100 nm for both elements.

The measurements in each case are effected on elements of size 4 mm2.

FIG. 12 shows the current density-voltage characteristics obtained for the different components in this example. It can be clearly seen that the doping results in an increase in conductivity by several orders of magnitude.

In the course of a solvent process, a majority charge carrier component is produced, using spiro-TTB as polymeric hole conductor and the metal complexes Bi(O2C2F3)3 and BipFbz as dopants.

The processing of the dopants with the spiro-TTB hole conductor material, a “small molecule”, is effected in an analogous manner to example III. For the production of 100 nm-thick layers, a total of 3.5% by weight solutions are produced (anisole:xylene solvent mixture, ratio 1:2), which contain 1.6 mol %, 2 mol % and 10 mol % of dopant, based on the amount of matrix material. The solutions are spun on at 750 rpm for 40 s and dried at 120° C. for 1 h.

FIG. 13 shows the current density-voltage characteristics obtained for the different components in this example. The doping can again achieve a very distinct increase in conductivity compared to the pure hole conductor material. In addition, it is found that about 10 mol % of doping is necessary to achieve a sufficient influence on conductivity.

The undoped and doped hole conductor layers described in example III are incorporated into red OLEDs. The red OLEDs have the following layer structure: glass/ITO/100 nm HTL varied/10 nm NPB/20 nm emitter layer of 20% NPB, 70% TPBi, 10% ADS076/60 nm TPBi/0.7 nm LiF/200 nm Al.

As dopants, bismuth tris(trifluoroacetate) Bi(O2C2F3)3 and bismuth tris(pentafluorobenzoate) (BipFbz) are used in the concentrations stated in FIG. 14 and FIG. 15. It is found that the OLEDs obtained by a solvent process, with regard to luminance (FIG. 15) and the current-voltage characteristic (FIG. 14), are better than reference OLEDs comprising PEDOT-PSS.

Instead of the HIL-012-based HIL from example V, spiro-TTB is utilized as hole conductor and doped with BipFbz. spiro-TTB and BipFbz can be prepared both by the solvent process (characteristic identified by BipFbz) and by the vaporization process (characteristic identified by BipFbz (ev)). The characteristic current density-voltage characteristic and luminance-voltage characteristic are depicted in FIGS. 16 and 17. It is found that the properties of layers produced by the vaporization process are better than those deposited from solution. However, the differences are small.

The doped hole conductor layers produced in examples III and IV can also be utilized as hole conductor layers for organic solar cells, especially those with p-i-n structure.

The individual combinations of the constituents and of the features of the executions already mentioned are illustrative; the exchange and the substitution of these teachings for other teachings present in this publication are likewise explicitly contemplated with the publications cited. It will be apparent to the person skilled in the art that variations, modifications and other executions which are described here can likewise occur, without departing from the idea and the scope.

The invention has been described in detail with particular reference to preferred embodiments thereof and examples, but it will be understood that variations and modifications can be effected within the spirit and scope of the invention covered by the claims which may include the phrase “at least one of A, B and C” as an alternative expression that means one or more of A, B and C may be used, contrary to the holding in Superguide v. DIRECTV, 69 USPQ2d 1865 (Fed. Cir. 2004).

Schmid, Guenter, Maltenberger, Anna, Wemken, Jan Hauke, Petrukhina, Marina A.

Patent Priority Assignee Title
11040988, Sep 30 2014 Novaled GmbH Method for producing an organic electronic component, and organic electronic component
11158833, Jul 14 2016 LG Chem, Ltd Organic electroluminescent device and manufacturing method therefor
11239440, Feb 20 2017 Novaled GmbH Electronic semiconducting device and method for preparing the electronic semiconducting device
11322710, Feb 20 2017 Novaled GmbH Electronic semiconducting device and method for preparing the electronic semiconducting device
11393987, Mar 01 2017 Merck Patent GmbH Organic electroluminescent device
11450829, Feb 20 2017 Novaled GmbH Electronic semiconducting device, method for preparing the electronic semiconducting device and compound
11522150, Feb 20 2017 Novaled GmbH Electronic device, method for preparing the same and display device comprising the same
11539014, Feb 20 2017 Novaled GmbH Electronic semiconducting device, method for preparing the electronic semiconducting device and compound
11731988, Sep 30 2014 Novaled GmbH Method for producing an organic electronic component, and organic electronic component
11825667, Feb 20 2017 Novaled GmbH Electronic semiconducting device and method for preparing the electronic semiconducting device
Patent Priority Assignee Title
4622355, Jul 16 1984 UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE DEPARTMENT OF ENERGY, THE Radiation-hardened polymeric films
5247226, Apr 19 1991 Mitsubishi Kasei Corporation Organic electroluminescent device
6423429, Mar 02 1998 ROHM CO , LTD Organic electroluminescent devices
6589673, Sep 29 1999 ROHM CO , LTD Organic electroluminescent device, group of organic electroluminescent devices
6891330, Mar 29 2002 BOE TECHNOLOGY GROUP CO , LTD Mechanically flexible organic electroluminescent device with directional light emission
7632703, Dec 22 2005 Xerox Corporation Organic thin-film transistors
8258501, Mar 03 2004 Novaled AG Use of a metal complex as an n-Dopant for an organic semiconducting matrix material, organic of semiconducting material and electronic component, and also a dopant and ligand and process for producing same
8278652, Jun 20 2007 Novaled GmbH Semiconductor material for an organic diode
8314545, May 11 2005 Panasonic Corporation Organic electroluminescence element
8513702, Jun 20 2007 Novaled GmbH Use of a metal complex as a p-dopant for an organic semiconductive matrix material, organic semiconductor material and organic light-emitting diodes
8734963, Oct 02 2008 UDC Ireland Limited Complex salts
8860009, Apr 28 2008 DAI NIPPON PRINTING CO , LTD Device comprising positive hole injection transport layer, method for producing the same and ink for forming positive hole injection transport layer
9276223, Mar 31 2010 OSRAM OLED GmbH Dopant for a hole conductor layer for organic semiconductor components, and use thereof
9382253, Jul 16 2010 UDC Ireland Limited Metal complexes
20050230665,
20070082284,
20110089408,
20110108819,
20130200353,
20150123047,
20150162534,
DE102010041331,
EP510541,
EP1089361,
EP1220339,
EP1768200,
EP2276086,
JP1131588,
JP2002008741,
JP2002110357,
JP2010530618,
JP2012504569,
JP2015526881,
JP585060,
JP596860,
KR1020040098035,
KR1020110015525,
KR1020150027075,
WO2005061654,
WO2005086251,
WO2008154915,
WO2008155310,
WO2011033023,
WO2011120709,
WO2012007087,
WO2013182389,
////////////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Nov 10 2014MALTENBERGER, ANNASiemens AktiengesellschaftASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0485200009 pdf
Nov 10 2014SCHMID, GUENTERSiemens AktiengesellschaftASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0485200009 pdf
Nov 13 2014PETRUKHINA, MARINA A Siemens AktiengesellschaftASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0485200009 pdf
Nov 13 2014WEMKEN, JAN HAUKESiemens AktiengesellschaftASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0485200009 pdf
Dec 22 2014Siemens AktiengesellschaftSiemens AktiengesellschaftASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0485200071 pdf
Dec 22 2014Siemens AktiengesellschaftOSRAM OLED GmbHASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0485200071 pdf
Dec 19 2016Siemens Aktiengesellschaft(assignment on the face of the patent)
Dec 19 2016OSRAM OLED GmbH(assignment on the face of the patent)
Apr 06 2020Siemens AktiengesellschaftNovaled GmbHCORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS PREVIOUSLY RECORDED ON REEL 054212 FRAME 0187 ASSIGNOR S HEREBY CONFIRMS THE ASSIGNMENT 0544290418 pdf
Apr 06 2020Siemens AktiengesellschaftNovaled GmbHASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0542120187 pdf
May 14 2020OSRAM OLED GmbHNovaled GmbHCORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS PREVIOUSLY RECORDED ON REEL 054212 FRAME 0187 ASSIGNOR S HEREBY CONFIRMS THE ASSIGNMENT 0544290418 pdf
May 14 2020OSRAM OLED GmbHNovaled GmbHASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0542120187 pdf
Date Maintenance Fee Events
Nov 16 2022M1551: Payment of Maintenance Fee, 4th Year, Large Entity.


Date Maintenance Schedule
May 28 20224 years fee payment window open
Nov 28 20226 months grace period start (w surcharge)
May 28 2023patent expiry (for year 4)
May 28 20252 years to revive unintentionally abandoned end. (for year 4)
May 28 20268 years fee payment window open
Nov 28 20266 months grace period start (w surcharge)
May 28 2027patent expiry (for year 8)
May 28 20292 years to revive unintentionally abandoned end. (for year 8)
May 28 203012 years fee payment window open
Nov 28 20306 months grace period start (w surcharge)
May 28 2031patent expiry (for year 12)
May 28 20332 years to revive unintentionally abandoned end. (for year 12)