A sensor arrangement for position sensing comprises a row of multiple magnetoresistive elements. A magnetic field source (3) provides a magnetic field with a first magnetic pole (N) and a second magnetic pole (S). The magnetic field source (3) is arranged such that magnetoresistive elements of the row face one of: the first magnetic pole (N) or second magnetic pole (S). The first magnetoresistive element is arranged in the magnetic field and provides a first output signal dependent on a position of the magnetoresistive element relative to the magnetic field source (3). A measurement unit is configured to determine a position of the magnetic field source (3) relative to the magnetoresistive elements of the row dependent on the first output signals of the magnetoresistive elements.
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1. A sensor arrangement for position sensing, comprising
a magnetic field source providing a magnetic field with a first magnetic pole (N) and a second magnetic pole (S), and
multiple magnetoresistive elements arranged in the magnetic field in a row along a longitudinal axis (X) and each element having a depth extending along a traverse axis (Y), each magnetoresistive element in the row separated by a gap, and each magnetoresistive element of said row differing in an arrangement along a vertical axis (Z) such that said magnetoresistive elements of said row facing the first magnetic pole (N) are offset from each other along the vertical axis (Z);
a measurement unit,
wherein the row of multiple magnetoresistive elements is arranged in the magnetic field and each providing an output signal dependent on a position of the magnetoresistive elements relative to the magnetic field source,
wherein the measurement unit is configured to determine a position of the magnetic field source (3) relative to the row of multiple magnetoresistive elements dependent on the output signals.
11. A method for determining the position of an object, comprising:
coupling one of
a magnetic field source (3) providing a magnetic field with a first magnetic pole (N) and a second magnetic pole (S) and
multiple magnetoresistive elements with the object, said multiple magnetoresistive elements arranged in the magnetic field in a row along a longitudinal axis (X) and each element having a depth extending along a traverse axis (Y), each magnetoresistive element in the row separated by a gap along said longitudinal axis, and each magnetoresistive element of said row differing in an arrangement along a vertical axis (Z) such that said magnetoresistive elements of said row facing the first magnetic pole (N) are offset from each other along the vertical axis (Z);
arranging the magnetic field source (3) such that the first magnetic pole (N) faces the multiple magnetoresistive elements of the row to form a sensor arrangement,
receiving, at a measurement unit, an output signal from each of the multiple magnetoresistive elements dependent on their position (x) relative to the magnetic field source (3), and
determining, by the measurement unit, a position of the object (5) dependent on the received output signals.
2. The sensor arrangement of
3. The sensor arrangement of
4. The sensor arrangement of
5. The sensor arrangement of
6. The sensor arrangement of
7. The sensor arrangement of
8. The sensor arrangement of
9. The sensor arrangement of
10. The sensor arrangement of
12. The method as claimed in
defining a dipole axis (DA) of the magnetic field source by the first and the second magnetic pole (N, S) extending along a vertical axis (Z) orthogonal to a plane defined by the longitudinal axis (X) and the transverse axis (Y).
13. The method as claimed in
moving the magnetic field source (3) relative to the first row of multiple magnetoresistive elements along the longitudinal axis (X), a position (x) thereof along the longitudinal axis (X) is to be sensed by the sensor arrangement, and
determining, by the measurement unit, the position (x) along the longitudinal axis (X) by computing a difference between each said provided output signal.
14. The method as claimed in
arranging additional multiple magnetoresistive elements in the magnetic field in an additional row along the longitudinal axis and having a gap between each magnetoresistive element in the additional row, said additional row of additional multiple magnetoresistive elements facing the second magnetic pole (S).
15. The method as claimed in
moving the magnetic field source (3) relative to the first row of multiple magnetoresistive elements along the longitudinal axis (X), a position (x) thereof along the longitudinal axis (X) is to be sensed by the sensor arrangement, and
determining, by the measurement unit, the position (x) along the longitudinal axis (X) by computing a subtraction of each said provided output signal of a magnetoresistive element in a common row and adding the results of the subtractions.
16. The method as claimed in
identifying, by the measurement unit, the single magnetoresistive element out of the multiple magnetoresistive elements of the row that shows a change in its first output signal (R1) which change results from the magnetic field source (3) passing by the single first magnetoresistive element (1a), and
deriving, by the measurement unit, the position (x) along the longitudinal axis (X) from a known position of the first magnetoresistive element within the row of magnetoresistive elements.
17. The method as claimed in
subtracting, by the measurement unit, first output signals (R1) of adjacent first magnetoresistive elements (1) from each other, and
determining, by the measurement unit, the position (x) along the longitudinal axis (X) dependent on a resulting difference signal.
18. The method as claimed in
adding, by the measurement unit, the first output signals (R1) of adjacent first magnetoresistive elements (1), and
determining, by the measurement unit, the position (x) along the longitudinal axis (X) dependent on a resulting sum signal.
19. The method as claimed in
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The present invention relates to a sensor arrangement for position sensing and to a method for supporting determining the position of an object.
High bandwidth, high resolution nanoscale sensing is a key enabling technology for nanoscale science and engineering. Application areas include life sciences, scanning probe microscopy, semiconductor fabrication and material science. Currently available position sensors based on optics, capacitors or inductive coils, although accurate and fast, do not scale down to micro-scales for use in micro-structures or in large-scale point-wise position sensing of macro-structures. Thermo-electric position sensors, on the other hand, scale down to micro-scale, but suffer from low resolution and bandwidth.
A known position sensing concept is based on the property of magnetoresistance (MR). Magnetoresistance is the property an electrical resistance of a conductive layer sandwiched between ferromagnetic layers changes as a function of a magnetic field applied to the layers. A magnetoresistive sensor typically uses this property to sense the magnetic field.
According to an embodiment of one aspect of the invention, a sensor arrangement is provided for position sensing. The sensor arrangement comprises a first magnetoresistive element, a second magnetoresistive element, and a magnetic field source providing a magnetic field with a first magnetic pole and a second magnetic pole. The magnetic field source is arranged between the first magnetoresistive element and the second magnetoresistive element with the first magnetic pole facing the first magnetoresistive element and the second magnetic pole facing the second magnetoresistive element. The first magnetoresistive element is arranged in the magnetic field and provides a first output signal dependent on a position of the first magnetoresistive element relative to the magnetic field source. The second magnetoresistive element is arranged in the magnetic field and provides a second output signal dependent on a position of the second magnetoresistive element relative to the magnetic field source. A measurement unit is configured to determine a position of the magnetic field source relative to the first and the second magnetoresistive element dependent on the first output signal and the second output signal.
In embodiments, the sensor arrangement may comprise one or more of the following features:
According to an embodiment of another aspect of the present invention, a method is provided for supporting determining the position of an object. One of a magnetic field source providing a magnetic field with a first magnetic pole and a second magnetic pole and a first and a second magnetoresistive element is coupled with the object. The magnetic field source is arranged between the first magnetoresistive element and the second magnetoresistive element with the first magnetic pole facing the first magnetoresistive element and the second magnetic pole facing the second magnetoresistive element. Output signals are received from the first and the second magnetoresistive elements dependent on their position relative to the magnetic field source. A position of the object is determined dependent on the first output signal and the second output signal.
Embodiments described in relation to the aspect of the position sensor shall also be considered as embodiments disclosed in connection with any of the other categories such as the method.
The invention and its embodiments will be more fully appreciated by reference to the following detailed description of presently preferred but nonetheless illustrative embodiments in accordance with the present invention when taken in conjunction with the accompanying drawings. The figures are illustrating:
As an introduction to the following description, it is first pointed at a general aspect of the invention concerning a sensor arrangement based on the magnetoresistive effect.
A magnetoresistive sensor preferably comprises a magnetoresistive element comprising a stack of layers which stack of layers includes at least a conductive layer in between two magnetic layers, and preferably in between two ferromagnetic layers. Specifically, the magnetoresistive element is a giant magnetoresistive element based on the underlying effect wherein in a layer stack comprising a non-magnetic conductive layer sandwiched between two ferromagnetic layers a change in the electrical resistance can be observed subject to a magnetization orientation in the ferromagnetic layers. In the absence of an external magnetic field, the magnetization orientation of the corresponding ferromagnetic layers is antiparallel. By means of applying an external magnetic field to at least one of the ferromagnetic layers the subject magnetization orientation is changed which in turn leads to the magnetization orientation in the two ferromagnetic layers becomes parallel which in turn causes the electrical resistance of the layer stack to change. The electrical resistance of the layer stack is also denoted as electrical resistance of the magnetoresistive element. The change in the electrical resistance may be monitored and taken as a measure for the presence of an external magnetic field applied. When such external magnetic field is generated by a magnetic field source attached to an object, a position of such object may be determined with respect to the magnetoresistive element. Specifically, a significant change of the electrical resistance in the conductive layer can be observed when the magnetization orientation of the ferromagnetic layers is changed between a parallel alignment to an antiparallel alignment or vice versa. In a parallel alignment of the magnetization orientation of the ferromagnetic layers the electrical resistance in the conductive layer is rather low while in an antiparallel alignment of the magnetization orientation of the ferromagnetic layers the electrical resistance in the conductive layer is rather high. The change in conductivity is based on spin-dependent interfacial electron scattering. Electrons passing the magnetoresistive element may show a short mean free path at antiparallel magnetization orientation in the ferromagnetic layers owed to an increased spin dependent electron scattering at the interfaces between the conductive layer and the ferromagnetic layers while electrons may show a longer mean free main path owed to a less spin dependent interfacial electron scattering when the ferromagnetic layers show a parallel magnetization orientation.
The magnetoresistive element hence preferably comprises a stack of layers which at least includes one conductive layer in between two ferromagnetic layers, but which stack of layers may include multiple conductive layers sandwiched between adjacent ferromagnetic layers, wherein an overall electrical resistance of the stack of layers may finally be measured and allow for a determination of the position of the field generating magnet relative to the magnetoresistive element. An external magnetic field applied may cause the magnetization orientation in these ferromagnetic layers to switch from an antiparallel alignment to a parallel alignment or vice versa. Generally, and specifically for the present embodiments of the invention, the magnetization orientation of both ferromagnetic layers may be floating or, alternatively, the magnetization orientation of one of the ferromagnetic layers may be pinned such that its magnetization orientation may not change even under the application of an external magnetic field. The external magnetic field may then only act on the other ferromagnetic layer and cause its magnetization orientation to change subject to a position the magnet takes.
In the context of the present embodiments of the invention, the following geometrical definitions are used: The layers of the layer stack may have a longitudinal extension along a longitudinal axis and a lateral extension along a transverse axis. Accordingly, a height of the stack extends orthogonal to a plane defined by the longitudinal and the transverse axis along a vertical axis. A sensor central axis of the magnetoresistive element is defined as an axis along the vertical axis, and at half of the longitudinal extension of the layers. It is preferably assumed that a magnetic field source and/or an object comprising the magnetic field source is at least movable along the longitudinal axis, which means that the magnetic field source is movable along the longitudinal extension of the layers of the layer stack. Preferably, the magnetic field source is arranged at a vertical distance D>0 from the magnetoresistive element such that the magnet field source and an upper surface of the magnetoresistive element are spaced apart along the vertical axis by the distance D. Moreover, the magnetic field source provides a magnetic field with a North (N) and a South (S) pole. A dipole axis is assumed to be a straight connection between the N pole and the S pole.
In conventional magnetoresistive position sensing concepts a dipole axis of the magnetic dipole of the magnet is aligned in parallel to a longitudinal extension of the layers of the layer stack contributing to the magnetoresistive element. Given that a gradient of the magnetic field is responsible for generating a change in the magnetization orientation of the one or more ferromagnetic layers, it was observed that in the conventional concept the gradient of the magnetic field along the longitudinal extension of the layers of the stack is rather low. The gradient is defined as a change in magnetic flux at any location. However, the higher the gradient of the magnetic field is along the longitudinal extension of the layers of the stack the higher the sensitivity/resolution of the sensing scheme is given that only a small variation of the position of the magnet may cause an impact on the magnetization orientation of the ferromagnetic layers because such small variation in position still leads to a substantial change in magnetic flux owed to the high gradient. In addition, it was observed that for typical magnet geometries such as rectangular permanent magnets, an absolute strength of the magnetic field at a given distance from the magnet increases with the gradient. Because there is an upper bound on the strength of the magnetic field after which the magnetoresistive element saturates, the gradient of the magnetic field that can effectively be used for sensing is limited.
According to an embodiment of the present invention, the dipole axis of the magnetic field source is aligned orthogonal to the plane defined by the longitudinal axis and the transverse axis. Hence, the dipole axis is also orthogonal to a sensing direction of the magnetoresistive element which sensing direction is defined by the longitudinal extension of the layers of the stack in direction of the longitudinal axis. Orthogonal in this context shall include tolerances of +/−20° degrees, i.e. the dipole axis is supposed to be arranged with a range of 70° to 110° degrees with respect to the plane defined by the longitudinal axis and the transverse axis.
In one embodiment of the present invention, the magnetic field source is a permanent magnet of a size comparable to the size of the stack of layers. This includes a width of the permanent magnet along the longitudinal axis comparable to the longitudinal extension of the layers of the stack. In this context, comparability preferably includes a width of the permanent magnet not more than ten times the longitudinal extension of the layers of the stack, and preferably not less than half of the longitudinal extension of the layers of the stack. In a very preferred embodiment, the magnet is of rectangular shape in a plane defined by the longitudinal axis and the vertical axis, and in another very preferred embodiment is of cuboid shape or rectangular prism shape cubic shape. According to another embodiment of the present invention, the magnetic field source is embodied as electromagnet.
The present idea is to place the magnetoresistive elements to both poles of the magnetic dipole. By doing so, completely new sensing regimes can be achieved. In one embodiment, the sensors placed at the opposite poles of the magnetic field source may be used to suppress an inherent sensitivity of the magnetoresistive elements to motion in a vertical direction. This can be a particularly powerful technique which is of great importance in one-dimensional sensing applications. In another embodiment, the dual-pole sensing is used in a different read-out configuration to increase the sensitivity in the vertical axis, therefore enabling simultaneous sensing in two directions. Hence, the concept of dual-pole sensing has many advantages.
In the figures, same or similar elements are denoted by the same reference signs.
The first and second MR elements 1 and 2 are elements specifically underlying the giant magnetoresistivity phenomenon, wherein in thin magnetic multilayers with one or more conductive layers in between spin coupling occurs. The first MR element 1 comprises a layer stack arranged on a substrate 12 which layer stack includes at least a first ferromagnetic layer 111, a conductive and non-magnetic layer 112 and a second ferromagnetic layer 113. Magnetic moments of the ferromagnetic layers 111 and 113 are naturally aligned antiparallel with respect to each other when no external magnetic field is applied. In case an external magnetic field of sufficient strength is applied, magnetic moments become parallel in the ferromagnetic layers 111 and 113, i.e. the magnetization orientations in the ferromagnetic layers 111 and 113 are aligned in parallel. An antiparallel magnetization orientation in the ferromagnetic layers 111 and 113 result in a rather low mean free path of electrons passing the layer stack leading to a rather high electrical resistance in the layer stack. On the other hand, a parallel magnetization orientation in the ferromagnetic layers 111 and 113 result in a rather high mean free path of electrons passing the layer stack leading to a rather low electrical resistance in the layer stack. This effect is based on the dependence of electron scattering on the spin orientation at the interfaces of the layers 111, 112 and 113. The same holds for the second MR element 2 comprising a layer stack arranged on a substrate 22 which layer stack includes at least a first ferromagnetic layer 211, a conductive and non-magnetic layer 212 and a second ferromagnetic layer 213.
The layers of each layer stack show a longitudinal extension L along the longitudinal axis X. The layers also extend along the transverse axis Y into the plane of projection. A current I may be applied to each layer stack during position sensing. The layers of the stacks are arranged vertically, i.e. along vertical axis Z on top of each other.
The magnetic field source 3 may in the present embodiment be a permanent magnet. Preferably, miniature ultra-thin magnetic dipoles may be used for enabling the stack of layers being exposed to magnetic fields with a very high gradient. A position sensing resolution of less than <200 pm over 100 kHz may be achieved. The magnetic field source 3 presently is of rectangular shape with a width W along the longitudinal axis X, a depth not visible along the transverse axis y, and a height H along the vertical axis Z. The width W of the magnet exceeds the longitudinal extension L of the layer stack.
In the present position, a dipole axis DA of the magnetic field source 3 coincides with a sensor central axis SA of the MR elements 1 and 2 which are preferably mechanically coupled and do not change position with respect to each other. This means, the magnetic field source 3 is centered above the MR elements 1 and 2. The magnetic field source 3 provides a magnetic field illustrated in dashed lines which virtually may be separated into a first portion B1 and a second portion B2. As can be derived from
Hence, while in conventional position sensor arrangements the magnetic field source is aligned with its dipole axis DA in parallel to a sensing direction X of the MR element 1 coinciding with the longitudinal extension of the layers, in the present embodiment the magnet field source 3 is aligned with its dipole axis DA orthogonal to the sensing direction X of the first and second magnetoresistive elements 1 and 2. For this reason, both a high gradient and a low strength of the magnetic field can be achieved at the same time. The low strength of the magnetic field is owed to the fact that the magnetic field lines go through zero magnitude because the magnetic field in the subject portion when projected to the sensing direction changes direction.
In terms of resolution a high gradient and a low flux density is desired at the same time. Diagram 2c) in addition shows that a determination of the distance D may preferably also take into account the linearity of the gradient. It may be desired at the same time to provide a position sensor sensing with a rather linear property over the sensing range. However, from diagram 2c) it can be derived that the closer the magnetoresistive element is arranged with respect to the magnetic field source 3, the higher the maximum gradient becomes, but after a point the gradient becomes less linear across the sensing range.
On the other hand, the diagram in
With this insight and having returned to
In the example of
This can be illustrated by the diagrams in
A block diagram of this embodiment is shown in
The diagram in
A block diagram of a corresponding sensor arrangement is shown in
In the schematic diagram of
Diagram 9a) shows the two corresponding output signals R11 and R12 of the first MR elements 11, 12 as two impulses when that magnetic field source 3 passes. When combining the output signals R11 and R12 by subtraction, e.g. by subtracting R12 from R111 as is illustrated in
The curves in diagram 9a) stem from an arrangement of the MR elements 11 and 12 of
Diagram 11 shows, how multiple MR elements—in the present example five—can be arranged in a row for enhancing the sensing range, and therefore allowing position sensing in a wider sensing range x than with an individual MR element.
In the block diagram of
In
The embodiments according from
However, the arrangement of multiple first MR elements and the corresponding concepts of combining the respective output signals as introduced in
Embodiments of the present invention may be applicable to position sensing in industry, to lithography, and specifically in connection with semiconductors such as the manufacturing, EDA and testing of semiconducting devices, and specifically of micro- and/or nano-electromechanical devices. Any such position sensor may transmit its result wire bound or wireless to an evaluation unit.
Sebastian, Abu, Pantazi, Angeliki, Haeberle, Walter, Tomas, Tuma
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