A write data processing apparatus and method associated with computational memory cells formed as a memory/processing array provides the ability to shift data between adjacent bit lines in each section of the memory/processing array or the same relative bit lines in adjacent sections of the memory/processing array. The memory/processing array has one or more sections and each section has its own unique set of ā€œnā€ bit lines.

Patent
   10847213
Priority
Dec 06 2016
Filed
Aug 23 2018
Issued
Nov 24 2020
Expiry
Sep 19 2037
Assg.orig
Entity
Small
13
400
currently ok
1. A processing array, comprising:
a plurality of memory cells arranged in an array having a plurality of columns and a plurality of rows, each memory cell having a storage element wherein the array has a plurality of sections and each section has a plurality of rows of memory cells and a plurality of columns of memory cells organized as a plurality of bit line sections equal to the number of columns in the section, wherein each bit line section includes all of the rows of memory cells in a single column of the section, wherein the memory cells in each bit line section are all connected to a single read bit line and the plurality of bit lines in each section are distinct from the plurality of bit lines included in the other sections of the array;
circuitry in each bit line section that is connected to the single read bit line to read data from the memory cells in the bit line section as a read bit line signal; and
wherein each bit line section receives two or more neighbor read bit line signals from other adjacent bit line sections in the array and wherein the circuitry in each bit line section distributes the read data received by the bit line section to the two or more neighbor bit line sections in the array.
2. The processing array of claim 1, wherein a particular bit line section is a bit line section at a corner of the array and wherein the two or more neighbor bit line sections further comprise an adjacent bit line section, having an adjacent single read bit line, horizontally adjacent to the corner bit line section and a same relative bit line section, having the same relative read bit line as the read bit line of the corner bit line section, vertically adjacent to the corner bit line section.
3. The processing array of claim 1, wherein a particular bit line section is a bit line section along a horizontal edge of the processing array and wherein the two or more neighbor bit line sections further comprise two neighbor adjacent bit line sections, each having an adjacent single read bit line, horizontally adjacent to the horizontal edge bit line section and a same relative bit line section, having the same relative read bit line as the read bit line of the horizontal edge bit line section, vertically adjacent to the horizontal edge bit line section.
4. The processing array of claim 1, wherein a particular bit line section is a bit line section along a vertical edge of the processing array and wherein the two or more neighbor bit line sections further comprise a neighbor adjacent bit line section, having an adjacent single read bit line, horizontally adjacent to the vertical edge bit line section and two same relative bit line sections, having the same relative read bit line as the read bit line of the vertical edge bit line section, vertically adjacent to the vertical edge bit line section.
5. The processing array of claim 1, wherein the two or more neighbor bit line sections further comprise two adjacent bit line sections, each having an adjacent single read bit line, horizontally adjacent to the bit line section and two same relative bit line sections, each having the same relative read bit line as the read bit line of the bit line section, vertically adjacent to the bit line section.
6. The processing array of claim 1, wherein the circuitry in each bit line section further comprises write circuitry that distributes a selected piece of read data to a set of write bit lines of the memory cells in the bit line section.
7. The processing array of claim 6, wherein the write circuitry further comprises a multiplexer that selects the selected piece of read data, the selected piece of read data selected from the read data of the bit line section and from the two or more neighbor read bit line signals.
8. The processing array of claim 7 further comprising a multiplexer control signal that controls the multiplexer to select the selected piece of read data.
9. The processing array of claim 7, wherein the multiplexer has five inputs connected to the read data from the bit line section and the two or more neighbor read bit line signals.
10. The processing array of claim 9, wherein the bit line section is a corner bit line section at a corner of the array and two inputs of the multiplexer are set to zero.
11. The processing array of claim 9, wherein the bit line section is an edge bit line section at an edge of the array and one input of the multiplexer is set to zero.
12. The processing array of claim 7, wherein the write circuitry further comprises an inversion circuit connected to the output of the multiplexer that is configurable to invert the selected piece of read data before it is written to the set of write bit lines of the memory cells in the bit line section.
13. The processing array of claim 12, wherein the inversion circuit further comprises an exclusive OR logic gate.
14. The processing array of claim 1, wherein the circuitry in each bit line section further comprises read storage connected to the single read bit line to store the read data read out on the single read bit line.
15. The processing array of claim 14, wherein the read storage is a register.

This application is a continuation in part of and claims priority under 35 USC 120 to U.S. patent application Ser. No. 15/709,399, filed Sep. 19, 2017 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells For Xor And Xnor Computations”, U.S. patent application Ser. No. 15/709,401, filed Sep. 19, 2017 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells For Xor And Xnor Computations”, U.S. patent application Ser. No. 15/709,379, filed Sep. 19, 2017 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells”, U.S. patent application Ser. No. 15/709,382, filed Sep. 19, 2017 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells”, and U.S. patent application Ser. No. 15/709,385, filed Sep. 19, 2017 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells” that in turn claim priority under 35 USC 119(e) and 120 and claim the benefit of U.S. Provisional Patent Application No. 62/430,767, filed Dec. 6, 2016 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells For Xor And Xnor Computations” and U.S. Provisional Patent Application No. 62/430,762, filed Dec. 6, 2016 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells”, the entirety of all of which are incorporated herein by reference.

The disclosure relates generally to a computational memory element and in particular to a computational memory element having write data processing.

Memory cells have traditionally been used to store bits of data. It is also possible to architect a memory cell so that the memory cell is able to perform some simple logical functions when multiple memory cells are connected to the same read bit line. For example, when memory cells A, B, and C are connected to a particular read bit line and are read simultaneously, and the memory cells and read bit line circuitry are designed to produce a logical AND result, then the result that appears on the read bit line is AND(a,b,c) (i.e. “a AND b AND c”), where a, b, and c represent the binary data values stored in memory cells A, B, and C respectively.

By themselves, these computational memory cells and read bit line circuitry allow for a single logical function (e.g. AND) to be performed across multiple memory cells connected to the same read bit line, when read simultaneously. However, in many cases more complex logical functions across multiple memory cells connected to the same read bit line are desirable. To facilitate these more complex logical functions, it is desirable to be able to shift/write data between sections of the multiple memory cells and thus, it is desirable to provide additional circuitry that facilitates the more complex logical functions and it is to this end that the disclosure is directed.

FIG. 1 illustrates an example of a semiconductor memory that may include a plurality of computation memory cells and write circuitry;

FIG. 2 illustrates an example of a computer system that may include a plurality of computation memory cells and a write circuitry;

FIG. 3A illustrates an example of a processing array with computational memory cells that may be incorporated into a semiconductor memory or computer system;

FIG. 3B illustrates the processing array with computational memory cells having one section and multiple bit line sections;

FIG. 3C illustrates the processing array with computational memory cells having multiple sections and multiple bit line sections;

FIGS. 4A and 4B illustrate examples of two different types of computational memory cells that may be used in the semiconductor memory of FIG. 1, the computer system of FIG. 2 or the processing array of FIGS. 3A-3C;

FIG. 5 illustrates read/write logic including read logic, read data storage, and write logic associated with each bit line section in the processing array device depicted in FIG. 3C;

FIG. 6 illustrates a processing array device comprising “k” sections with “n” bit lines in each section, where each bit line within each section connects to “m” computational memory cells;

FIG. 7 illustrates the read logic, read data storage, and write logic associated with each bit line section in the processing array device depicted in FIG. 6; and

FIG. 8 illustrates the read logic, read data storage, and write logic associated with each bit line section in the processing array device depicted in FIG. 6 with the ability to invert the selected data before it is stored in the bit line section.

The disclosure is particularly applicable to a processing array, semiconductor memory or computer that utilizes a plurality of computational memory cells (with each cell being formed with a static random access memory (SRAM) cell) and additional write processing circuitry to provide more complex logical functions based on the data read out of the computational memory cells and it is in this context that the disclosure will be described. It will be appreciated, however, that each memory cell may be other types of volatile and non-volatile memory cell that are within the scope of the disclosure, that other additional write circuitry (including more, less or different logic) may be used are within the scope of the disclosure or that different computational memory cell architectures that those disclosed below are within the scope of the disclosure.

The disclosure is directed to a memory/processing array that has a plurality of computing memory cells in an array with additional write processing circuitry. A column of computing memory cells in the array may each have a read bit line and the read bit line for each of the computing memory cells in the column may be tied together as a single read bit line. The memory/processing array may be subdivided into one or more sections (an example of which is shown in FIGS. 3B and 3C) wherein each section has a unique set of “n” bit lines (each bit line being part of a bit line section) where each bit line section comprises a single read bit line and a pair of positive and negative write bit lines, with each bit line connected to “m” computational memory cells. Each bit line section also may have a read data storage that is used to capture and store the read result from the read bit line during read operations (so a read data storage is implemented per read bit line) and write circuitry for shifting read data among the bit line sections of the array. In the disclosure, BL-Sect[x,y] is a shorthand notation indicating a bit line section with bit line “y” in section “x”.

Write circuitry is disclosed that may be used with the memory/processing array with the sections above since it is desirable to be able to shift data between adjacent bit lines in the same section (e.g. between bl-sect[x,y] and bl-sect[x,y+1]), and between the same relative bit lines in adjacent sections (e.g. between bl-sect[x,y] and bl-sect[x+1,y]). To facilitate this ability, the read data storage output in each bit line section (such as bl-sect[x,y]) is connected not only to that bl-sect's write circuitry, but also to the write circuitry associated with its horizontally and vertically adjacent neighbor bl-sects: for example, bl-sect[x,y−1], bl-sect[x,y+1], bl-sect[x−1,y], and bl-sect[x+1,y] for a bit line section in the middle of the array with bit line yin section x.

Consequently, the write circuitry in each bl-sect[x,y] receives the read data storage outputs from 5 bl-sects—itself and its 4 neighbors, and during write operations a 5:1 mux is used to select one of those 5 read data storage outputs as the write data for that bit line section (“bl-sect”). It is also desirable to be able to invert the selected data (i.e. the 5:1 mux output) before it is stored in the bl-sect during a write operation. The write processing circuitry may have some simple logic along with a write data inversion control signal to facilitate the write data inversion.

FIG. 1 illustrates an example of a semiconductor memory 10 that may include a plurality of computation memory cells and write circuitry that are described below in more detail. The below disclosed plurality of computation memory cells and write circuitry allow the semiconductor memory 10 to perform more complex logic functions than are possible with just the plurality of computation memory cells. FIG. 2 illustrates an example of a computer system 20 that may include a plurality of computation memory cells and write circuitry that are described below in more detail. The below disclosed plurality of computation memory cells and write circuitry allow the semiconductor memory 20 to perform more complex logic functions than are possible with just the plurality of computation memory cells. The computer system 20 may have at least one processor 22 and a memory 24 that may include the plurality of computation memory cells and write circuitry.

FIG. 3A illustrates an example of a processing array 30 with computational memory cells in an array that may be incorporated into a semiconductor memory or computer system. The processing array 30 may include an array of computational memory cells (cell 00, . . . , cell 0n and cell m0, . . . , cell mn). In one embodiment, the array of computational memory cells may be rectangular as shown in FIG. 3 and may have a plurality of columns and a plurality of rows wherein the computational memory cells in a particular column may also be connected to the same read bit line (RBL). The processing array 30 may further include a wordline (WL) generator and read/write logic control circuit 32 that may be connected to and generate signals for the read word line (RE) and write word line (WE) for each memory cell (such as R0, . . . , REn and WE0, . . . , WEn) to control the read and write operations as well known and one more read/write blocks 34 that are connected to the read and write bit lines of the computational memory cells. In the embodiment shown in FIG. 3, the processing array may have read/write circuitry 34 for each set of bit line signals of the computational memory cells. For example, BL0 read/write logic 340 may be coupled to the read and write bit lines (WBLb0, WBL0 and RBL0) for the computational memory cells in column 0 of the array and BLn read/write logic 34n may be coupled to the read and write bit lines (WBLbn, WBLn and RBLn) for the computational memory cells in column n of the array as shown in FIG. 3.

The wordline (WL) generator and read/write logic control circuit 32 may also generate one or more control signals that control the read/write circuitry 34. For example, for the different embodiments of the read/write logic described in the co-pending U.S. patent application Ser. No. 16/111,178, filed on Aug. 23, 2018 and incorporated herein by reference, the one or more control signals may include a Read_Done control signal, an XORacc_En control signal, an ANDacc_En control signal and an ORacc_En control signal. Note that for each different embodiment, a different one or more of the control signals is used so that the wordline (WL) generator and read/write logic control circuit 32 may generate different control signals for each embodiment or the wordline (WL) generator and read/write logic control circuit 32 may generate each of the control signals, but then only certain of the control signals or all of the control signals may be utilized as described in the above incorporated by reference co-pending patent application.

During a read operation, the wordline (WL) generator and read/write logic control circuit 32 may activate one or more word lines that activate one or more computational memory cells so that the read bit lines of those one or more computational memory cells may be read out. Further details of the read operation are not provided here since the read operation is well known.

FIGS. 3B and 3C illustrate the processing array 30 with computational memory cells having sections having the same elements as shown in FIG. 3A. The array 30 in FIG. 3B has one section (Section 0) with “n” bit lines (bit line 0 (BL0), . . . , bit line n (BLn)) in different bit line sections, where each bit line connects to “m” computational memory cells (cell 00, . . . , cell m0 for bit line 0 for example). In the example in FIG. 3B, the m cells may be the plurality of computational memory cells that are part of each column of the array 30. FIG. 3C illustrates the processing array 30 with computational memory cells having multiple sections. In the example in FIG. 3C, the processing array device 30 comprises “k” sections with “n” bit lines each, where each bit line within each section connects to “m” computational memory cells. Note that the other elements of the processing array 30 are present in FIG. 3C, but not shown for clarity. In FIG. 3C, there are no read data storageoutput paths between horizontally adjacent bit lines in the same section, nor between the same relative bit line in vertically adjacent sections. In FIG. 3C, the BL-Sect(0,0) block shown corresponds to the BL-Sect(0,0) shown in FIG. 3B with the plurality of computational memory cells and the read/write logic 340 and each other block shown in FIG. 3C corresponds to a separate portion of the processing array. As shown in FIG. 3C, the set of control signals, generated by the wordline generator and read/write logic controller 32, for each section may include one or more read enable control signals (for example S[0]_RE[m:0] for section 0), one or more write enable control signals (for example S[0]_WE[m:0] for section 0) and one or more read/write control signals (for example S[0]_RW_Ctrl[p:0] for section 0).

FIGS. 4A and 4B illustrate examples of two different types of computational memory cells that may be used in the semiconductor memory of FIG. 1, the computer system of FIG. 2 or the processing array of FIGS. 3 and 6. In the examples, the computational memory cell are based on an SRAM memory cell.

FIG. 4A illustrates an example of a dual port SRAM cell 20 that may be used for computation. The dual port SRAM cell may include two cross coupled inverters 121, 122 and two access transistors M23 and M24 that interconnected together to form a 6T SRAM cell. The SRAM may be operated as storage latch and may have a write port. The two inverters are cross coupled since the input of the first inverter is connected to the output of the second inverter and the output of the first inverter is coupled to the input of the second inverter as shown in FIG. 4A. A Write Word line carries a signal and is called WE and a write bit line and its complement are called WBL and WBLb, respectively. The Write word line WE is coupled to the gates of the two access transistors M23, M24 that are part of the SRAM cell. The write bit line and its complement (WBL and WBLb) are each coupled to one side of the respective access transistors M23, M24 as shown in FIG. 4A while the other side of each of those access transistors M23, M24 are coupled to each side of the cross coupled inverters (labeled D and Db in FIG. 4A.)

The circuit in FIG. 4A may also have a read word line RE, a read bit line RBL and a read port formed by transistors M21, M22 coupled together to form as isolation circuit as shown. The read word line RE may be coupled to the gate of transistor M21 that forms part of the read port while the read bit line is coupled to the source terminal of transistor M21. The gate of transistor M22 may be coupled to the Db output from the cross coupled inverters 121, 122.

During reading, multiple cells (with only a single cell being shown in FIG. 4A) can turn on to perform an AND function. Specifically, at the beginning of the read cycle, RBL is pre-charged high and if the Db signal of all cells that are turned on by RE is “0”, then RBL stays high since, although the gate of transistor M21 is turned on by the RE signal, the gate of M22 is not turned on and the RBL line is not connected to the ground to which the drain of transistor M22 is connected. If the Db signal of any or all of the cells is “1” then RBL is discharged to 0 since the gate of M22 is turned on and the RBL line is connected to ground. As a result, RBL=NOR (Db0, Db1, etc.) where Db0, Db1, etc. are the complementary data of the SRAM cells that have been turned on by the RE signal. Alternatively, RBL=NOR (Db0, Db1, etc.)=AND (D0, D1, etc.), where D0, D1, etc. are the true data of the cells that have been turned on by the RE signal.

As shown in FIG. 4A, the Db signal of the cell 20 may be coupled to a gate of transistor M22 to drive the RBL. However, unlike the typical 6T cell, the Db signal is isolated from the RBL line and its signal/voltage level by the transistors M21, M22. Because the Db signal/value is isolated from the RBL line and signal/voltage level, the Db signal is not susceptive to the lower bit line level caused by multiple “0” data stored in multiple cells in contrast to the typical SRAM cell. Therefore, for the cell in FIG. 4A, there is no limitation of how many cells can be turned on to drive RBL. As a result, the cell (and the device made up for multiple cells) offers more operands for the AND function since there is no limit of how many cells can be turned on to drive RBL. Furthermore, in the cell in FIG. 4A, the RBL line is pre-charged (not a static pull up transistor as with the typical 6T cell) so this cell can provide much faster sensing because the current generated by the cell is all be used to discharge the bit line capacitance with no current being consumed by a static pull up transistor so that the bit line discharging rate can be faster by more than 2 times. The sensing for the disclosed cell is also lower power without the extra current consumed by a static pull up transistor and the discharging current is reduced by more than half.

The write port of the cell in FIG. 4A is operated in the same manner as the 6T typical SRAM cell. As a result, the write cycle and Selective Write cycle for the cell have the same limitation as the typical 6T cell. In addition to the AND function described above, the SRAM cell 20 in FIG. 4A also may perform a NOR function by storing inverted data. Specifically, if D is stored at the gate of M22, instead of Db, then RBL=NOR (D0, D1, etc.). One skilled in the art understand that the cell configuration shown in FIG. 4A would be slightly altered to achieve this, but that modification is within the scope of the disclosure. Further details of this exemplary computational memory cell is found in co-pending U.S. patent application Ser. Nos. 15/709,379, 15/709,382 and 15/709,385 all filed on Sep. 19, 2017 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells” which are incorporated herein by reference.

FIG. 4B illustrates an implementation of a dual port SRAM cell 100 with an XOR function. The dual port SRAM cell 100 may include two cross coupled inverters 131, 132 and two access transistors M33 and M34 that are interconnected together as shown in FIG. 4B to form the basic SRAM cell. The SRAM may be operated as storage latch and may have a write port. The two inverters 131, 132 are cross coupled since the input of the first inverter is connected to the output of the second inverter (labeled D) and the output of the first inverter (labeled Db) is coupled to the input of the second inverter as shown in FIG. 4B. The cross coupled inverters 131, 132 form the latch of the SRAM cell. The access transistor M33 and M34 may have their respective gates connected to write bit line and its complement (WBL, WBLb) respectively. A Write Word line carries a signal WE. The Write word line WE is coupled to the gate of a transistor M35 that is part of the access circuitry for the SRAM cell.

The circuit in FIG. 4B may also have a read word line RE, a read bit line RBL and a read port formed by transistors M31, M32 coupled together to form as isolation circuit as shown. The read word line RE may be coupled to the gate of transistor M31 that forms part of the read port while the read bit line RBL is coupled to the drain terminal of transistor M31. The gate of transistor M32 may be coupled to the Db output from the cross coupled inverters 131, 132. The isolation circuit isolates the latch output Db (in the example in FIG. 4B) from the read bit line and signal/voltage level so that the Db signal is not susceptive to the lower bit line level caused by multiple “0” data stored in multiple cells in contrast to the typical SRAM cell.

The cell 100 may further include two more read word line transistors M36, M37 and one extra complementary read word line, REb. When the read port is active, either RE or REb is high and the REb signal/voltage level is the complement of RE signal/voltage level. RBL is pre-charged high, and if one of (M31, M32) or (M36, M37) series transistors is on, RBL is discharged to 0. If none of (M31, M32) or (M36, M37) series transistors is on, then RBL stay high as 1 since it was precharged high. The following equation below, where D is the data stored in the cell and Db is the complement data stored in the cell, describes the functioning/operation of the cell:
RBL=AND(NAND(RE,Db),NAND(REb,D))=XNOR(RE,D)  (EQ1)

If the word size is 8, then it needs to be stored in 8 cells (with one cell being shown in FIG. 4B) on the same bit line. On a search operation, an 8 bit search key can be entered using the RE, REb lines of eight cells to compare the search key with cell data. If the search key bit is 1, then the corresponding RE=1 and REb=0 for that cell. If the search key bit is 0, then the corresponding RE=0 and REb=1. If all 8 bits match the search key, then RBL will be equal to 1. IF any 1 of the 8 bits is not matched, then RBL will be discharged and be 0. Therefore, this cell 100 (when used with 7 other cells for an 8 bit search key) can perform the same XNOR function but uses half the number of cell as the typical SRAM cell. The following equation for the multiple bits on the bit line may describe the operation of the cells as:
RBL=AND(XNOR(RE1,D1),XNOR(RE2,D2), . . . ,XNOR(REi,Di)), where i is the number of active cell.  (EQ2)

By controlling either RE or REb to be a high signal/on, the circuit 100 may also be used to do logic operations mixing true and complement data as shown below:
RBL=AND(D1,D2, . . . ,Dn,Dbn+1,Dbn+2, . . . Dbm)  (EQ3)

where D1, D2, . . . Dn are “n” number of data with RE on and Dbn+1, Dbn+2, . . . Dbm are m-n number of data with REb on.

Furthermore, if the cell 100 stores inverse data, meaning WBL and WBLb shown in FIG. 4B is swapped, then the logic equation EQ1 becomes XOR function and logic equation EQ3 becomes NOR a function and can be expressed as EQ 4 and EQ5
RBL=XOR(RE,D)  (EQ4)
RBL=NOR(D1,D2, . . . ,Dn,Dbn+1,Dbn+2, . . . Dbm)  (EQ5)

where D1, D2, . . . Dn are n number of data with RE on and Dbn+1, Dbn+2, . . . Dbm are m−n number of data with REb on.

In another embodiment, the read port of the circuit 100 is FIG. 4B may be reconfigured differently to achieve different Boolean equation. Specifically, transistors M31, M32, M36 and M37 may be changed to PMOS and the source of M32 and M37 is VDD instead of VSS, the bit line is pre-charged to 0 instead of 1 and the word line RE active state is 0. In this embodiment, the logic equations EQ1 is inverted so that RBL is an XOR function of RE and D (EQ6). EQ3 is rewritten as an OR function (EQ7) as follows:
RBL=XOR(RE,D)  (EQ6)
RBL=OR(D1,D2, . . . ,Dn,Dbn+1,Dbn+2, . . . Dbm)  (EQ7)

where D1, D2, . . . Dn are n number of data with RE on and Dbn+1, Dbn+2, . . . Dbm are m−n number of data with REb on.

If the cell stores the inverse data of the above discussed PMOS read port, meaning WBL and WBLb is swapped, then
RBL=XNOR(RE,D)  (EQ8)
RBL=NAND(D1,D2, . . . ,Dn,Dbn+1,Dbn+2, . . . Dbm)  (EQ9)

where D1, D2, . . . Dn are n number of data with RE on and Dbn+1, Dbn+2, . . . Dbm are m−n number of data with REb on.

For example, consider a search operation where a digital word needs to be found in a memory array in which the memory array can be configured as each bit of the word stored on the same bit line. To compare 1 bit of the word, then the data is stored in a cell and its RE is the search key Key, then EQ1 can be written as below:
RBL=XNOR(Key,D)  EQ10
If Key=D, then RBL=1. If the word size is 8 bits as D[0:7], then the search key Key[0:7] is its RE, then EQ2 can be expressed as search result and be written as below:
RBL=AND(XNOR(Key[0],D[0]),XNOR(Key[1],D[1], . . . ,Key[7],D[7])  EQ11
If all Key[i] is equal to D[i] where i=0-7, then the search result RBL is match. Any one of Key[i] is not equal to D[i], then the search result is not match. Parallel search can be performed in 1 operation by arranging multiple data words along the same word line and on parallel bit lines with each word on 1 bit line. Further details of this computation memory cell may be found in U.S. patent application Ser. Nos. 15/709,399 and 15/709,401 both filed on Sep. 19, 2017 and entitled “Computational Dual Port Sram Cell And Processing Array Device Using The Dual Port Sram Cells For Xor And Xnor Computations”, which are incorporated herein by reference.

FIG. 5 illustrates the read/write circuitry 34 including read logic, read data storage, and write logic associated with each bl-sect in the processing array device depicted in FIG. 3C. The read/write circuitry 34 for each section may include read circuitry 50, a read storage 52, implemented as a register, and write circuitry 54. The read circuitry 50 and read storage 52 allows the data on the read bit lines connected to the particular read circuitry and read storage to accumulate so that more complex Boolean logic operations may be performed. Various implementations of the read circuitry 50 and read storage 52 may be found in Ser. No. 16/111,178, filed Aug. 23, 2018 that is co-pending and co-owned and is incorporated herein by reference. The write circuitry 54 manages the writing of data from each section. Each of the read circuitry 50, read storage 52 and write circuitry 54 may be connected to one or more control signals (S[x]_RW_Ctrl[p:0] in the example implementation shown in FIG. 5) that control the operation of each of the circuits. The control signals may include the read control signals that are described above in the incorporated by reference patent application.

The read circuitry 50 may receive inputs from the read bit lines of the computing memory cells of the section (S[x]_RBL[y]) and the write circuitry 54 may receive an input from the read data storage 52 and output data to the word bit lines of the computing memory cells of the section (S[x]_WBL[y] and S[x]_WBLb[y] in the example in FIG. 5). Thus, as shown in FIG. 5, the read storage 52 output is only connected to the write circuitry 54 associated with its own bl-sect. Consequently, the write circuitry 54 associated with each bl-sect receives the read data storageoutput only from its own bl-sect, and therefore each bl-sect can only store/write data from its own read data storage.

Shifting Data Between Adjacent Bit Line Sections

It is desirable to be able to shift read data between adjacent bit line sections of a processing array. The ability to shift read data between adjacent bit line sections of the processing array allows the processing array to perform more complicated logic functions. For example, if it is desirable for the computational array to add two 16 bit vectors, the processing array may place 1 bit (the same relative bit) from each vector in a single bl-sect so that the entire vectors are spread over 16 bl-sects (say, the same relative bit line across multiple sections). One way to perform the addition in this case is to add the first least significant bits (LSBs) of the 2 vectors (say in bl-sect[0,0]) to generate a “sum” bit and a “carry” bit. The carry bit then needs to be shifted to the bl-sect that contains the next (2nd) 2 LSBs (say bl-sect[1,0]), so that those 2 LSBs plus the carry bit can then be added together to generate the next sum and carry bits. That next (2nd) carry bit then needs to be shifted to the bl-sect that contains the next (3rd) 2 LSBs (bl-sect[2,0]). Etc. So the shifting ability described here provides a mechanism to shift carry bits during an “add” computaion.

One way to provide a mechanism to shift data between adjacent bit lines in the same section, and between the same relative bit lines in adjacent sections, is to connect the read storage 52 output in each bl-sect[x,y] not only to that bl-sect's write logic 54, but also to the write logic 54 associated with its 4 horizontally and vertically adjacent neighbor bl-sects: bl-sect[x,y−1], bl-sect[x,y+1], bl-sect[x−1,y], and bl-sect[x+1,y]. Consequently, the write logic 54 for a particular bl-sect receives the read data storage 52 outputs from 5 bl-sects—itself plus its 4 horizontally and vertically adjacent neighbors.

Since each bl-sect has (up to) 5 read data storage outputs feeding its write logic as shown in FIG. 6, a 5:1 write mux (shown in FIGS. 7-8 and described below) in some embodiments may be used to select which of those 5 read data storage outputs is used as the write data source to the bl-sect during a write operation. Furthermore, the one or more control signals shown in FIG. 5 from the WL generator and read/write logic controller and described above may include S[x]_wmux_sel[2:0] control signals for each section that are used to control the write mux selection during the write operation for each section.

The net result of the 5 read data storage output connections to each bl-sect's write logic 54, and the circuitry to select one of the read data storage outputs (the multiplexer in one embodiment) within each bl-sect, is that each bl-sect can store the read data storage output data (as produced by one or more read operations) from any of the 5 bl-sects—itself plus its 4 neighbors as described, thereby providing a mechanism to shift data between horizontally and vertically adjacent bl-sects.

FIG. 6 illustrates a processing array device 30 consisting of “k” sections (Section 0, . . . , Section k in the example in FIG. 6) with “n” bit lines per section and thus shows a 2-dimensional “k by n” array of bl-sects. In the array, each bl-sect has 5 read data storage outputs (its own read data storage output plus the read data storage outputs from its 4 neighbor bl-sects) feeding the write logic of the bl-sect so that the write logic receives as input each of the read data storage output signals. In the example embodiment in FIG. 6, each section includes one or more bit line sections (Sect-BL0, . . . , Sect-BLn) in a row of the processing array.

Note that the “k by n” exemplary array of bl-sects in FIG. 6 has four “edges” including two horizontal edges and two vertical edges. The bl-sects 600 along the two horizontal edges of the “k by n” array are BL-Sect[0,0], . . . , BL-Sect[0,n] and BL-Sect[k,0], . . . , BL-Sect[k:n] with the BL-Sect[0,0], . . . , BL-Sect[0,n] contained in the dashed line boxes in FIG. 6. The bl-sects 602 along the two vertical edges of the “k by n” array are BL-Sect[0,0], . . . BL-Sect[k,0] & BL-Sect[0,n], . . . BL-Sect[k,n] with the BL-Sect[0,n], . . . BL-Sect[k,n] contained in a dashed line box. In addition, the “k by n” array of bl-sects in FIG. 6 has four “corners” at the intersection of each pair of “edges”. The subset of 4 “corner” bl-sects within the set of “edge” bl-sects in the “k by n” array are BL-Sect[0,0], BL-Sect[0,n], BL-Sect[k,0], & BL-Sect[k,n] in the example in FIG. 6. The horizontal and vertical edge bl-sects (excluding the subset of “corner” bl-sects) lack one adjacent neighbor bl-sect whose location depends on the particular “edge” bl-sect. The “corner” bl-sects lack two adjacent neighbor bl-sects whose location depends on the particular “corner” bl-sect. For each corner bl-sect, the two neighbor bl-sects may include an adjacent bit line section (such as BL-Sect[0,1] for the corner bl-sect BL-Sect[0,0]) having an adjacent single read bit line (bit line 1 in section 0 for example) horizontally adjacent to the corner bit line section and a same relative bit line (for example, BL-Sect [1,0] for corner bl-sect BL-Sect[0,0]) having the same relative read bit line as the read bit line of the corner bit line section (bit line 0 for both Section 0 and Section 1) vertically adjacent to the corner bit line section.

Each edge bl-sect along either edge of the processing array has three neighbor bl-sects. Each horizontal edge bl-sect (such as BL-Sect[k,1]) may have two neighbor adjacent bit line section (for example, BL-Sect[k,0] and BL-Sect[k,2] for BL-Sect[k,1]) having an adjacent single read bit line (bit line 0 and bit line 2 in section k for example) horizontally adjacent to the horizontal edge bit line section and a same relative bit line (for example, BL-Sect [k−1,1] for BL-Sect[k,1]) having the same relative read bit line as the read bit line of the horizontal edge bit line section (bit line 1 for both Section k and Section k−1) vertically adjacent to the horizontal edge bit line section. Each vertical edge bl-sect (such as BL-Sect[1,n]) may have one neighbor adjacent bit line section (for example, BL-Sect[1,n−1] for BL-Sect[1,n]) having an adjacent single read bit line (bit line n−1 in section 1 for example) horizontally adjacent to the vertical edge bit line section and two same relative bit line (for example, BL-Sect [0,n] and BL-Sect [2,n] for BL-Sect[1,n]) having the same relative read bit line as the read bit line of the vertical edge bit line section (bit line n for both Section 0, Section 1 and Section 2) vertically adjacent to the vertical edge bit line section.

FIG. 7 illustrates the read/write circuitry 34 for each bl-sect including the read circuitry 50, the read data storage 52 and the write circuitry 54 associated with each bl-sect in the processing array device depicted in FIG. 6. The read circuitry 50 and read data storage 52 operate and are implemented as described above. In this embodiment, the write circuitry may further include a multiplexer 70, such as a 5:1 write multiplexer for the embodiment in FIG. 7, and additional write circuitry 72 that is connected to the output of the multiplexer 70. The multiplexer 70 is used to select which of the 5 read data storage outputs feeding that write circuitry 34 is used as the write data source to the particular bl-sect during a write operation. In the example in FIG. 7, the inputs to the multiplexer may include an output from the read data storage 52 of that bl-sect, the horizontal neighbor bl-sect read data storage outputs (S[x−1]_RBL[y]_Reg_Out and S[x+1]_RBL[y]_Reg_Out) and the vertical neighbor bl-sect read data storage outputs (S[x]_RBL[y−1]_Reg_Out and S[x]_RBL[y+1]_Reg_Out). The RW control signals may also include S[x]_wmux_sel[2:0] control signals that are used to control the write mux selection during the write operation. The output of the multiplexer 70 (S[x]_RBL[y]_WMUX_Out) may be fed as a input to the additional write circuitry 72 that can write the data to the two word bit lines of the memory cells of the bl-sect.

Like each other bl-sect, the output of the read storage 52 (the read register) (S[x]_RBL[y]_Reg_Out) is output from the read/write circuitry 34 and also sent to the 4 neighboring bl-sects (except for bl-sects along an edge or at a corner) that may be Section[x−1], BL[y], Sect [x+1], BL[y], Sect [x], BL[y−1] and Sect [x], BL[y+1]. The read/write circuits 34 is a means for swapping/shifting data to adjacent bl-sects. In edge and corner bl-sects, the absent read data storage output connection(s) to their respective write multiplexers (corresponding to the particular neighbor bl-sect(s) that the edge and corner bl-sects lack) can simply be tied off, for example set to a logic “0” so that the same write circuitry 54 with the multiplexer 70 in FIG. 7 may be used for all of the bl-sects. For example, in the “k by n” array of bl-sects illustrated in FIG. 6, the following write mux connections (as illustrated in FIG. 7) can be tied off:

The S[x−1]_RBL[y]_Reg_Out connection to bl_sect[0,y] Write Mux.

The S[x+1]_RBL[y]_Reg_Out connection to bl_sect[k,y] Write Mux.

The S[x]_RBL[y−1]_Reg_Out connection to bl_sect[x,0] Write Mux.

The S[x]_RBL[y+1]_Reg_Out connection to bl_sect[x,n] Write Mux.

Inverting Data Before it is Stored in the BL-Sect

FIG. 8 illustrates the read/write circuitry 34 for each bl-sect including the read circuitry 50, the read data storage 52 and the write circuitry 54 associated with each bl-sect in the processing array device depicted in FIG. 6 in which logic and control signal are implemented in the bl-sect's write logic 54 (that also has the same multiplexer 70 and additional write circuitry 72) to provide the ability to invert the selected data (i.e. the 5:1 mux output) before it is stored in the bl-sect. One way to provide a mechanism to invert the selected write data (i.e. the output of the multiplexer 70, as described previously) before it is stored in the bl-sect during a write operation is to implement logic in the bl-sect's write logic that Exclusive-ORs (XORs) (using a XOR circuit 80) the selected write data under control of a write data inversion control signal (S[x]_winvert signal) that is part of the set of read/write control signals sent to the read/write circuitry 34 of the bl-sect.

When the write data inversion control signal is low, the output of the XOR logic 80 is equal to the selected write data. When the write data inversion control signal is high, the output of the XOR logic 80 is equal to the inverted selected write data. In this embodiment, the output of the XOR logic is used as the write data source for the bl-sect during write operations.

The foregoing description, for purpose of explanation, has been described with reference to specific embodiments. However, the illustrative discussions above are not intended to be exhaustive or to limit the disclosure to the precise forms disclosed. Many modifications and variations are possible in view of the above teachings. The embodiments were chosen and described in order to best explain the principles of the disclosure and its practical applications, to thereby enable others skilled in the art to best utilize the disclosure and various embodiments with various modifications as are suited to the particular use contemplated.

The system and method disclosed herein may be implemented via one or more components, systems, servers, appliances, other subcomponents, or distributed between such elements. When implemented as a system, such systems may include an/or involve, inter alia, components such as software modules, general-purpose CPU, RAM, etc. found in general-purpose computers. In implementations where the innovations reside on a server, such a server may include or involve components such as CPU, RAM, etc., such as those found in general-purpose computers.

Additionally, the system and method herein may be achieved via implementations with disparate or entirely different software, hardware and/or firmware components, beyond that set forth above. With regard to such other components (e.g., software, processing components, etc.) and/or computer-readable media associated with or embodying the present inventions, for example, aspects of the innovations herein may be implemented consistent with numerous general purpose or special purpose computing systems or configurations. Various exemplary computing systems, environments, and/or configurations that may be suitable for use with the innovations herein may include, but are not limited to: software or other components within or embodied on personal computers, servers or server computing devices such as routing/connectivity components, hand-held or laptop devices, multiprocessor systems, microprocessor-based systems, set top boxes, consumer electronic devices, network PCs, other existing computer platforms, distributed computing environments that include one or more of the above systems or devices, etc.

In some instances, aspects of the system and method may be achieved via or performed by logic and/or logic instructions including program modules, executed in association with such components or circuitry, for example. In general, program modules may include routines, programs, objects, components, data structures, etc. that performs particular tasks or implement particular instructions herein. The inventions may also be practiced in the context of distributed software, computer, or circuit settings where circuitry is connected via communication buses, circuitry or links. In distributed settings, control/instructions may occur from both local and remote computer storage media including memory storage devices.

The software, circuitry and components herein may also include and/or utilize one or more type of computer readable media. Computer readable media can be any available media that is resident on, associable with, or can be accessed by such circuits and/or computing components. By way of example, and not limitation, computer readable media may comprise computer storage media and communication media. Computer storage media includes volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disks (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and can accessed by computing component. Communication media may comprise computer readable instructions, data structures, program modules and/or other components. Further, communication media may include wired media such as a wired network or direct-wired connection, however no media of any such type herein includes transitory media. Combinations of the any of the above are also included within the scope of computer readable media.

In the present description, the terms component, module, device, etc. may refer to any type of logical or functional software elements, circuits, blocks and/or processes that may be implemented in a variety of ways. For example, the functions of various circuits and/or blocks can be combined with one another into any other number of modules. Each module may even be implemented as a software program stored on a tangible memory (e.g., random access memory, read only memory, CD-ROM memory, hard disk drive, etc.) to be read by a central processing unit to implement the functions of the innovations herein. Or, the modules can comprise programming instructions transmitted to a general purpose computer or to processing/graphics hardware via a transmission carrier wave. Also, the modules can be implemented as hardware logic circuitry implementing the functions encompassed by the innovations herein. Finally, the modules can be implemented using special purpose instructions (SIMD instructions), field programmable logic arrays or any mix thereof which provides the desired level performance and cost.

As disclosed herein, features consistent with the disclosure may be implemented via computer-hardware, software and/or firmware. For example, the systems and methods disclosed herein may be embodied in various forms including, for example, a data processor, such as a computer that also includes a database, digital electronic circuitry, firmware, software, or in combinations of them. Further, while some of the disclosed implementations describe specific hardware components, systems and methods consistent with the innovations herein may be implemented with any combination of hardware, software and/or firmware. Moreover, the above-noted features and other aspects and principles of the innovations herein may be implemented in various environments. Such environments and related applications may be specially constructed for performing the various routines, processes and/or operations according to the invention or they may include a general-purpose computer or computing platform selectively activated or reconfigured by code to provide the necessary functionality. The processes disclosed herein are not inherently related to any particular computer, network, architecture, environment, or other apparatus, and may be implemented by a suitable combination of hardware, software, and/or firmware. For example, various general-purpose machines may be used with programs written in accordance with teachings of the invention, or it may be more convenient to construct a specialized apparatus or system to perform the required methods and techniques.

Aspects of the method and system described herein, such as the logic, may also be implemented as functionality programmed into any of a variety of circuitry, including programmable logic devices (“PLDs”), such as field programmable gate arrays (“FPGAs”), programmable array logic (“PAL”) devices, electrically programmable logic and memory devices and standard cell-based devices, as well as application specific integrated circuits. Some other possibilities for implementing aspects include: memory devices, microcontrollers with memory (such as EEPROM), embedded microprocessors, firmware, software, etc. Furthermore, aspects may be embodied in microprocessors having software-based circuit emulation, discrete logic (sequential and combinatorial), custom devices, fuzzy (neural) logic, quantum devices, and hybrids of any of the above device types. The underlying device technologies may be provided in a variety of component types, e.g., metal-oxide semiconductor field-effect transistor (“MOSFET”) technologies like complementary metal-oxide semiconductor (“CMOS”), bipolar technologies like emitter-coupled logic (“ECL”), polymer technologies (e.g., silicon-conjugated polymer and metal-conjugated polymer-metal structures), mixed analog and digital, and so on.

It should also be noted that the various logic and/or functions disclosed herein may be enabled using any number of combinations of hardware, firmware, and/or as data and/or instructions embodied in various machine-readable or computer-readable media, in terms of their behavioral, register transfer, logic component, and/or other characteristics. Computer-readable media in which such formatted data and/or instructions may be embodied include, but are not limited to, non-volatile storage media in various forms (e.g., optical, magnetic or semiconductor storage media) though again does not include transitory media. Unless the context clearly requires otherwise, throughout the description, the words “comprise,” “comprising,” and the like are to be construed in an inclusive sense as opposed to an exclusive or exhaustive sense; that is to say, in a sense of “including, but not limited to.” Words using the singular or plural number also include the plural or singular number respectively. Additionally, the words “herein,” “hereunder,” “above,” “below,” and words of similar import refer to this application as a whole and not to any particular portions of this application. When the word “or” is used in reference to a list of two or more items, that word covers all of the following interpretations of the word: any of the items in the list, all of the items in the list and any combination of the items in the list.

Although certain presently preferred implementations of the invention have been specifically described herein, it will be apparent to those skilled in the art to which the invention pertains that variations and modifications of the various implementations shown and described herein may be made without departing from the spirit and scope of the invention. Accordingly, it is intended that the invention be limited only to the extent required by the applicable rules of law.

While the foregoing has been with reference to a particular embodiment of the disclosure, it will be appreciated by those skilled in the art that changes in this embodiment may be made without departing from the principles and spirit of the disclosure, the scope of which is defined by the appended claims.

Haig, Bob, Ehrman, Eli, Chang, Chao-Hung, Huang, Mu-Hsiang

Patent Priority Assignee Title
10930341, Jun 18 2019 GSI TECHNOLOGY, INC Processing array device that performs one cycle full adder operation and bit line read/write logic features
10943648, Dec 06 2016 GSI TECHNOLOGY, INC Ultra low VDD memory cell with ratioless write port
10958272, Jun 18 2019 GSI TECHNOLOGY, INC Computational memory cell and processing array device using complementary exclusive or memory cells
10998040, Dec 06 2016 GSI TECHNOLOGY, INC Computational memory cell and processing array device using the memory cells for XOR and XNOR computations
11094374, Dec 06 2016 GSI Technology, Inc. Write data processing circuits and methods associated with computational memory cells
11150903, Dec 06 2016 GSI Technology, Inc. Computational memory cell and processing array device using memory cells
11194519, Dec 06 2016 GSI Technology, Inc. Results processing circuits and methods associated with computational memory cells
11194548, Jun 18 2019 GSI Technology, Inc. Processing array device that performs one cycle full adder operation and bit line read/write logic features
11205476, Dec 06 2016 GSI Technology, Inc. Read data processing circuits and methods associated with computational memory cells
11227653, Dec 06 2016 GSI TECHNOLOGY, INC Storage array circuits and methods for computational memory cells
11257540, Dec 06 2016 GSI Technology, Inc. Write data processing methods associated with computational memory cells
11409528, Dec 06 2016 GSI Technology, Inc. Orthogonal data transposition system and method during data transfers to/from a processing array
11763881, Dec 06 2016 GSI Technology, Inc. Computational memory cell and processing array device using the memory cells for XOR and XNOR computations
Patent Priority Assignee Title
10153042, Nov 28 2013 GSI TECHNOLOGY INC In-memory computational device with bit line processors
10192592, Mar 15 2013 GSI Technology, Inc. Systems and methods involving data bus inversion memory circuitry, configuration and/or operation including data signals grouped into 10 bits and/or other features
10249312, Oct 08 2015 Qualcomm Incorporated Quantization of spatial vectors
10249362, Dec 06 2016 GSI TECHNOLOGY, INC Computational memory cell and processing array device using the memory cells for XOR and XNOR computations
10388364, Sep 12 2016 Semiconductor Energy Laboratory Co., Ltd. Memory device, driving method thereof, semiconductor device, electronic component, and electronic device
10425070, Jun 22 2015 GSI Technology, Inc. Systems and methods involving lock-loop circuits, clock signal alignment, phase-averaging feedback clock circuitry
10521229, Dec 06 2016 GSI TECHNOLOGY, INC Computational memory cell and processing array device using memory cells
10535381, Mar 14 2013 GSI Technology, Inc. Systems and methods of pipelined output latching involving synchronous memory arrays
10659058, Jun 26 2015 GSI TECHNOLOGY, INC Systems and methods involving lock loop circuits, distributed duty cycle correction loop circuitry
10673440, Aug 13 2019 XILINX, Inc. Unified programmable computational memory and configuration network
10770133, Dec 06 2016 GSI TECHNOLOGY, INC Read and write data processing circuits and methods associated with computational memory cells that provides write inhibits and read bit line pre-charge inhibits
10777262, Dec 06 2016 GSI TECHNOLOGY, INC Read data processing circuits and methods associated memory cells
3451694,
3747952,
3795412,
4227717, Apr 04 1979 Motorcycle safety device
4308505, Jun 13 1979 TRW, Inc. Frequency detector device and method
4587496, Sep 12 1984 INRANGE DEVELOPMENT CORPORATION Fast acquisition phase-lock loop
4594564, Jun 11 1984 Signetics Corporation; SIGNETICS CORPORATION 811 EAST ARQUES SUNNYVALE, CA 94088-3409 A CORP OF Frequency detector for use with phase locked loop
4677394, Jul 19 1985 Siemens Aktiengesellschaft Method and apparatus for calibrating an adjustable frequency generator
4716322, Mar 25 1986 Texas Instruments Incorporated Power-up control circuit including a comparator, Schmitt trigger, and latch
4741006, Jul 12 1984 Kabushiki Kaisha Toshiba Up/down counter device with reduced number of discrete circuit elements
4856035, May 26 1988 Raytheon Company CMOS binary up/down counter
5008636, Oct 28 1988 Hewlett-Packard Company Apparatus for low skew system clock distribution and generation of 2X frequency clocks
5302916, Dec 21 1992 AT&T Bell Laboratories; American Telephone and Telegraph Company Wide range digital frequency detector
5375089, Oct 05 1993 AMD TECHNOLOGIES HOLDINGS, INC ; GLOBALFOUNDRIES Inc Plural port memory system utilizing a memory having a read port and a write port
5382922, Dec 23 1993 International Business Machines Corporation; International Business Machines Corp Calibration systems and methods for setting PLL gain characteristics and center frequency
5400274, May 02 1994 SHENZHEN XINGUODU TECHNOLOGY CO , LTD Memory having looped global data lines for propagation delay matching
5473574, Feb 06 1992 International Business Machines Corporation Multi-port static random access memory with fast write-thru scheme
5530383, Dec 05 1994 SHENZHEN XINGUODU TECHNOLOGY CO , LTD Method and apparatus for a frequency detection circuit for use in a phase locked loop
5535159, Sep 17 1992 Renesas Electronics Corporation Multiport memory cell circuit having read buffer for reducing read access time
5563834, Aug 14 1992 Intersil Corporation Multiport memory and method
5587672, Sep 25 1995 Xylon LLC Dynamic logic having power-down mode with periodic clock refresh for a low-power graphics controller
5608354, Sep 26 1994 NEC Corporation Phase-locked loop circuit obtaining the phase difference between time series pulse strings and a reference frequency
5661419, May 23 1996 Oracle America, Inc Dynamic phase-frequency detector circuit
5696468, Feb 29 1996 Qualcomm Incorporated Method and apparatus for autocalibrating the center frequency of a voltage controlled oscillator of a phase locked loop
5736872, Jan 31 1994 SGS-THOMSON MICROELECTRONICS S A Low voltage high speed phase frequency detector
5744979, Jul 23 1992 XILINX, Inc. FPGA having logic cells configured by SRAM memory cells and interconnect configured by antifuses
5744991, Oct 16 1995 ALTERA CORPORATION, A DELAWARE CORPORATION System for distributing clocks using a delay lock loop in a programmable logic circuit
5748044, Oct 11 1996 Silicon Motion, Inc.; SILICON MOTION, INC Dual VCO phase-locked loop
5768559, May 20 1991 Fujitsu Limited Multiple bank structured memory access device having flexible setting of a pipeline stage number
5805912, Mar 01 1991 Advanced Micro Devices Microprocessor arranged to synchronously access an external memory operating at a slower rate than the microproccessor
5883853, Dec 12 1996 U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT Clock frequency detector for a synchronous memory device
5937204, May 30 1997 SAMSUNG ELECTRONICS CO , LTD Dual-pipeline architecture for enhancing the performance of graphics memory
5942949, Oct 14 1997 AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD Self-calibrating phase-lock loop with auto-trim operations for selecting an appropriate oscillator operating curve
5963059, Dec 19 1997 Advanced Micro Devices, Inc. Phase frequency detector having reduced blind spot
5969576, Dec 22 1997 NXP B V Phase locked loop lock condition detector
5969986, Jun 23 1998 INNOVATIVE MEMORY SYSTEMS, INC High-bandwidth read and write architectures for non-volatile memories
5977801, Jul 07 1997 International Business Machines Corporation Self-resetting phase/frequency detector with reduced dead zone
5999458, Dec 10 1997 SOCIONEXT INC Latch circuit, data output circuit and semiconductor device having the circuits
6005794, Jun 26 1998 Texas Instruments Incorporated Static memory with low power write port
6044034, Mar 16 1998 Fujitsu Limited Multiport memory having plurality of groups of bit lines
6058063, Nov 07 1997 SAMSUNG ELECTRONICS CO , LTD Integrated circuit memory devices having reduced power consumption requirements during standby mode operation
6072741, Apr 01 1997 FOOTHILLS IP LLC First-in, first-out integrated circuit memory device incorporating a retransmit function
6100721, Feb 01 1999 Apple Inc Circuit and method of extending the linear range of a phase frequency detector
6100736, Jun 05 1997 Cirrus Logic, INC Frequency doubler using digital delay lock loop
6114920, Oct 14 1997 AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD Self-calibrating voltage-controlled oscillator for asynchronous phase applications
6115320, Feb 23 1998 INTEGRATED DEVICE TECHNOLOGY INC Separate byte control on fully synchronous pipelined SRAM
6133770, Nov 28 1997 NEC Electronics Corporation Phase locked loop circuit
6167487, Mar 07 1997 RENESAS ELECTRONICS AMERICA INC Multi-port RAM having functionally identical ports
6175282, Oct 09 1998 International Business Machines Corporation Method for calibrating a VCO characteristic and automatically calibrated PLL having a VCO
6226217, Feb 18 2000 Hewlett Packard Enterprise Development LP Register structure with a dual-ended write mechanism
6262937, Mar 13 1998 MONTEREY RESEARCH, LLC Synchronous random access memory having a read/write address bus and process for writing to and reading from the same
6263452, Dec 22 1989 Compaq Computer Corporation Fault-tolerant computer system with online recovery and reintegration of redundant components
6265902, Nov 02 1999 CLUSTER, LLC; Optis Wireless Technology, LLC Slip-detecting phase detector and method for improving phase-lock loop lock time
6286077, Dec 29 1997 HYUNDAI ELECTRONICS INDUSTRIES CO , LTD Synchronous semiconductor memory device with a plurality of memory modules which has an additional function for masking a data strobe signal outputted from each memory module
6310880, Mar 17 2000 FOOTHILLS IP LLC Content addressable memory cells and systems and devices using the same
6366524, Jul 28 2000 U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT Address decoding in multiple-bank memory architectures
6377127, Nov 10 1999 NEC Corporation Phase locked loop circuit
6381684, Apr 26 1999 III Holdings 12, LLC Quad data rate RAM
6385122, Jan 31 2001 Synopsys, Inc Row and column accessible memory with a built-in multiplex
6407642, Jan 07 2000 Matsushita Electric Industrial Co., Ltd. Frequency detector and phase-locked loop circuit including the detector
6418077, Dec 17 1997 SOCIONEXT INC Memory access methods and devices for use with random access memories
6441691, Mar 09 2001 Ericsson Inc. PLL cycle slip compensation
6448757, Jun 28 1996 Curtin University of Technology Precise digital frequency detection
6473334, Oct 31 2001 HEWLETT-PACKARD DEVELOPMENT COMPANY, L P Multi-ported SRAM cell with shared bit and word lines and separate read and write ports
6483361, May 18 2001 National Semiconductor Corporation Lock detector for determining phase lock condition in PLL on a period-by-period basis according to desired phase error
6504417, Aug 15 2001 International Business Machines Corporation Active trim circuit for CMOS on-chip resistors
6538475, Mar 15 2000 Intel Corporation Phase detector
6567338, Apr 19 1996 Integrated Device Technology, Inc. Fully synchronous pipelined RAM
6594194, Jul 11 2001 Oracle America, Inc Memory array with common word line
6642747, Mar 15 2002 National Semiconductor Corporation Frequency detector for a phase locked loop system
6661267, May 06 2002 GOOGLE LLC Coarse calibration circuit using variable step sizes to reduce jitter and a dynamic course calibration (DCC) circuit for a 2 GHz VCO
6665222, Apr 25 1997 Round Rock Research, LLC Synchronous dynamic random access memory device
6683502, Mar 12 2002 XILINX, Inc. Process compensated phase locked loop
6683930, Dec 23 1999 RPX Corporation Digital phase/frequency detector, and clock generator and data recovery PLL containing the same
6732247, Jan 17 2001 University of Washington Multi-ported memory having pipelined data banks
6744277, May 06 2001 Altera Corporation Programmable current reference circuit
6757854, Sep 16 1999 AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD Detecting faults in dual port FIFO memories
6789209, Oct 08 1999 SOCIONEXT INC Semiconductor integrated circuit device
6816019, Jun 19 2001 STMICROELECTRONICS S R L Automatically calibrated phase locked loop system and associated methods
6836419, Aug 23 2002 Round Rock Research, LLC Split word line ternary CAM architecture
6838951, Jun 12 2002 Qorvo US, Inc Frequency synthesizer having VCO bias current compensation
6842396, Sep 17 2002 Renesas Technology Corp Semiconductor memory device with clock generating circuit
6853696, Dec 20 1999 Nortel Networks Limited Method and apparatus for clock recovery and data qualification
6854059, Jun 07 2000 LAKESTAR SEMI INC ; Conexant Systems, Inc Method and apparatus for medium access control in powerline communication network systems
6856202, Apr 14 2003 CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD ; CIRRUS LOGIC INC Phase/frequency detector and phase lock loop circuit
6859107, Sep 05 2001 SUPER INTERCONNECT TECHNOLOGIES LLC Frequency comparator with hysteresis between locked and unlocked conditions
6882237, Apr 30 2003 ZARLINK SEMICONDUCTOR INC Capture range control mechanism for voltage controlled oscillators
6897696, Oct 02 2002 VIA Technologies, Inc. Duty-cycle adjustable buffer and method and method for operating same
6933789, Nov 13 2003 Skyworks Solutions, Inc. On-chip VCO calibration
6938142, Aug 28 2002 Round Rock Research, LLC Multi-bank memory accesses using posted writes
6940328, Aug 28 2002 Mosaid Technologies Incorporated Methods and apparatus for duty cycle control
6954091, Nov 25 2003 AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED Programmable phase-locked loop
6975554, Apr 30 2003 AMD TECHNOLOGIES HOLDINGS, INC ; GLOBALFOUNDRIES Inc Method and system for providing a shared write driver
6998922, Sep 08 2003 AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED Phase locked loop modulator calibration techniques
7002404, Feb 27 2003 Maxlinear, Inc Tuning circuit for a filter
7002416, Jun 29 2004 Microchip Technology Incorporated Circuit for driving a voltage controlled oscillator for frequency modulation
7003065, Mar 09 2001 Ericsson Inc. PLL cycle slip detection
7017090, Aug 02 2001 Renesas Electronics Corporation Semiconductor module including semiconductor memory device shiftable to test mode as well as semiconductor memory device used therein
7019569, Jul 09 2004 Faraday Technology Corp. Method of implementing multi-transfer curve phase lock loop
7042271, May 06 2004 AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED Resistor compensation apparatus
7042792, Jan 14 2004 Integrated Device Technology, Inc. Multi-port memory cells for use in FIFO applications that support data transfers between cache and supplemental memory arrays
7042793, Jun 03 2004 SOCIONEXT INC Semiconductor memory device
7046093, Aug 27 2003 Intergrated Device Technology, Inc. Dynamic phase-locked loop circuits and methods of operation thereof
7047146, Dec 19 2003 Airoha Technology Corp Method for automatically calibrating the frequency range of a PLL and associated PLL capable of automatic calibration
7053666, Nov 09 2004 Electronics and Telecommunications Research Institute Phase frequency detector
7095287, Dec 28 2004 Silicon Laboratories Inc Method and apparatus to achieve a process, temperature and divider modulus independent PLL loop bandwidth and damping factor using open-loop calibration techniques
7099643, May 27 2003 AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD Analog open-loop VCO calibration method
7141961, Jan 30 2004 DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT Method and device for generating clock signal
7142477, Jun 18 2004 Infineon Technologies LLC Memory interface system and method for reducing cycle time of sequential read and write accesses using separate address and data buses
7152009, Nov 29 2002 Panasonic Corporation Parameter correction circuit and parameter correction method
7180816, Sep 09 2004 Samsung Electronics Co., Ltd. Address coding method and address decoder for reducing sensing noise during refresh operation of memory device
7200713, Mar 29 2004 Intel Corporation Method of implementing off-chip cache memory in dual-use SRAM memory for network processors
7218157, Aug 30 2002 MORGAN STANLEY SENIOR FUNDING, INC Phase locked loop
7233214, Aug 13 2004 Samsung Electronics Co., Ltd. Voltage-controlled oscillators with controlled operating range and related bias circuits and methods
7246215, Nov 26 2003 Intel Corporation Systolic memory arrays
7263152, Nov 18 2003 LSI Logic Corporation Phase-locked loop structures with enhanced signal stability
7269402, May 31 2002 Google Technology Holdings LLC PLL circuit having a multi-band oscillator and compensating oscillation frequency
7282999, Jul 30 2004 Polaris Innovations Limited Method and device for generating a clock signal using a phase difference signal and a feedback signal
7312629, May 17 2006 GSI TECHNOLOGY, INC Programmable impedance control circuit calibrated at Voh, Vol level
7313040, Oct 28 2005 GSI TECHNOLOGY, INC Dynamic sense amplifier for SRAM
7330080, Nov 04 2004 Intellectual Ventures Holding 81 LLC Ring based impedance control of an output driver
7340577, May 29 2002 Nvidia Corporation Method and system for efficiently executing reads after writes in a memory employing delayed write data
7349515, Sep 22 2003 MONTEREY RESEARCH, LLC Method and an apparatus to improve production yield of phase locked loops
7352249, Oct 03 2003 MEDIATEK, INC Phase-locked loop bandwidth calibration circuit and method thereof
7355482, Feb 17 2006 Seiko Epson Corporation Methods and apparatus for compensating a variable oscillator for process, voltage, and temperature variations using a replica oscillator
7355907, Oct 28 2005 GSI TECHNOLOGY, INC Performing read and write operations in the same cycle for an SRAM device
7369000, Apr 15 2004 Mediatek Incorporation Adaptive frequency detector of phase locked loop
7375593, Jan 19 2005 Circuits and methods of generating and controlling signals on an integrated circuit
7389457, Oct 28 2005 GSI TECHNOLOGY, INC Shift registers free of timing race boundary scan registers with two-phase clock control
7439816, Sep 28 2005 RPX Corporation Phase-locked loop fast lock circuit and method
7463101, May 21 2004 Sunplus Technology Co., Ltd. Voltage controlled oscillator with temperature and process compensation
7464282, Sep 03 2003 T-RAM ASSIGNMENT FOR THE BENEFIT OF CREDITORS , LLC Apparatus and method for producing dummy data and output clock generator using same
7487315, Sep 14 2005 VIA Technologies, Inc. Accessing apparatus capable of reducing power consumption and accessing method thereof
7489164, Nov 19 2007 CALLAHAN CELLULAR L L C ; YAKIMISHU CO LTD , LLC Multi-port memory devices
7512033, Feb 28 2005 Hynix Semiconductor Inc. Apparatus and method for controlling clock signal in semiconductor memory device
7516385, Apr 28 2006 GSI TECHNOLOGY, INC Test semiconductor device in full frequency with half frequency tester
7538623, Sep 08 2003 AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED Phase locked loop modulator calibration techniques
7545223, Sep 14 2006 Renesas Electronics Corporation PLL circuit
7565480, Jun 20 2002 Rambus Inc. Dynamic memory supporting simultaneous refresh and data-access transactions
7577225, Jul 28 2005 BROADCOM INTERNATIONAL PTE LTD Digital phase-looked loop
7592847, Mar 22 2007 MEDIATEK INC. Phase frequency detector and phase-locked loop
7595657, May 01 2007 GSI TECHNOLOGY, INC Dynamic dual control on-die termination
7622996, Sep 07 2006 Realtek Semiconductor Corp. Multi-loop phase locked loop circuit
7630230, Oct 02 2002 Cisco Technology, Inc. Static random access memory architecture
7633322, Apr 06 2007 Altera Corporation Digital loop circuit for programmable logic device
7635988, Nov 19 2007 CALLAHAN CELLULAR L L C ; YAKIMISHU CO LTD , LLC Multi-port thin-film memory devices
7646215, Mar 24 2008 GSI TECHNOLOGY, INC Efficient method for implementing programmable impedance output drivers and programmable input on die termination on a bi-directional data bus
7646648, Dec 03 2007 CAVIUM INTERNATIONAL; MARVELL ASIA PTE, LTD Apparatus and method for implementing memory array device with built in computational capability
7659783, Jul 16 2007 Microchip Technology Incorporated System and method for phase-locked loop (PLL) for high-speed memory interface (HSMI)
7660149, Dec 07 2006 Taiwan Semiconductor Manufacturing Co., Ltd. SRAM cell with separate read and write ports
7663415, Dec 30 2005 STMicroelectronics Pvt. Ltd. Phase locked loop (PLL) method and architecture
7667678, May 20 2003 SYNDIANT, INC Recursive feedback control of light modulating elements
7675331, Mar 31 2007 Hynix Semiconductor, Inc. Power-up signal generating circuit and method for driving the same
7719329, Jun 15 2007 MONTEREY RESEARCH, LLC Phase-locked loop fast lock circuit and method
7719330, Dec 26 2007 ALI CORPORATION Phase locked loop device and control method thereof
7728675, Mar 31 2006 MONTEREY RESEARCH, LLC Fast lock circuit for a phase lock loop
7737743, Mar 07 2008 National Semiconductor Corporation Phase-locked loop including sampling phase detector and charge pump with pulse width control
7746181, Jan 28 2005 MUFG UNION BANK, N A Circuit and method for extending the usable frequency range of a phase locked loop (PLL)
7746182, Nov 02 2007 Texas Instruments Incorporated Systems and methods for voltage controlled oscillator calibration
7750683, Jul 25 2008 Etron Technology, Inc. Phase/frequency detector
7760032, Apr 20 2007 Tialinx, Inc. Self-compensating voltage-controlled oscillator
7760040, Jan 20 2006 CSR TECHNOLOGY INC Method of eliminating temperature induced band switching in ultra wideband voltage controlled oscillator
7760532, Mar 15 2001 U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT Multi-bank memory
7782655, Jul 01 2008 Ultra-low power hybrid sub-threshold circuits
7812644, Jun 25 2007 Samsung Electronics Co., Ltd. Digital frequency detector and digital phase locked loop using the digital frequency detector
7830212, Jul 30 2007 MEDIATEK INC.; NATIONAL TAIWAN UNIVERSITY Phase locked loop, voltage controlled oscillator, and phase-frequency detector
7839177, Nov 07 2008 Altera Corporation Techniques for phase detection with fast reset
7843239, Jan 02 2008 Samsung Electronics Co., Ltd. Dividing circuit and phase locked loop using the same
7843721, Sep 18 2008 MIE FUJITSU SEMICONDUCTOR LIMITED Memory cell including an emitter follower and emitter follower sensing scheme and method of reading data therefrom
7848725, Jul 02 2007 AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD RF transmitter with stable on-chip PLL
7859919, Aug 27 2008 SHENZHEN XINGUODU TECHNOLOGY CO , LTD Memory device and method thereof
7876163, Aug 06 2007 Renesas Electronics Corporation Voltage-controlled oscillator circuit and phase locked loop circuit using the same
7916554, Aug 28 2002 Round Rock Research, LLC Multi-bank memory accesses using posted writes
7920409, Jun 05 2007 Arizona Board of Regents For and On Behalf Of Arizona State University SRAM cell with intrinsically high stability and low leakage
7920665, Sep 28 2005 RPX Corporation Symmetrical range controller circuit and method
7924599, Jun 02 1987 Infineon Technologies LLC Non-volatile memory circuit using ferroelectric capacitor storage element
7940088, Mar 31 2009 MICROSEMI STORAGE SOLUTIONS, INC High speed phase frequency detector
7944256, Mar 07 2007 Hitachi, Ltd. Semiconductor integrated circuit device
7956695, Jun 12 2007 Altera Corporation High-frequency low-gain ring VCO for clock-data recovery in high-speed serial interface of a programmable logic device
7965108, Apr 26 2007 MEDIATEK INC.; NATIONAL TAIWAN UNIVERSITY Frequency synthesizer
8004920, May 29 2007 U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT Power saving memory apparatus, systems, and methods
8008956, May 18 2010 Kwangwoon University Industry-Academic Collaboration Foundation; KWANGWOON UNIVERSITY INDUSTRY-ACADEMIC COLLABORATION Frequency synthesizer and high-speed automatic calibration device therefor
8044724, Sep 22 2008 MOSYS, INC Low jitter large frequency tuning LC PLL for multi-speed clocking applications
8063707, May 08 2009 MEDIATEK INC. Phase locked loop
8087690, Jun 03 2008 Hyundai Motor Company Airbag system for vehicle
8089819, Jun 09 2004 Acacia Research Group LLC Semiconductor device and semiconductor signal processing apparatus
8117567, Dec 03 2007 CAVIUM INTERNATIONAL; MARVELL ASIA PTE, LTD Structure for implementing memory array device with built in computation capability
8174332, Jun 07 2005 MONTEREY RESEARCH, LLC Phase lock loop pre-charging system and method
8218707, Jun 25 2003 Mosaid Technologies Incorporated Intialization circuit for delay locked loop
8242820, Dec 28 2009 Hynix Semiconductor Inc. Phase locked loop and method for operating the same
8258831, Nov 09 2009 Marvell Israel (M.I.S.L) Ltd.; MARVELL ISRAEL M I S L LTD Method and apparatus for clock generator lock detector
8284593, Apr 14 2010 SHENZHEN XINGUODU TECHNOLOGY CO , LTD Multi-port memory having a variable number of used write ports
8294502, Mar 04 2011 TAHOE RESEARCH, LTD Delay circuitry
8400200, Jul 09 2011 GSI TECHNOLOGY, INC Systems and methods including features of power supply noise reduction and/or power-saving for high speed delay lines
8488408, Jul 20 2011 GSI TECHNOLOGY INC Systems and methods including clock features such as minimization of simultaneous switching outputs (SSO) effects involving echo clocks
8493774, Jun 17 2011 International Business Machines Corporation Performing logic functions on more than one memory cell within an array of memory cells
8526256, Sep 16 2011 International Business Machines Corporation Single-ended sense amplifier with read-assist
8542050, Oct 28 2005 GSI TECHNOLOGY, INC Minimized line skew generator
8575982, Jul 09 2011 GSI Technology, Inc. Systems and methods including features of power supply noise reduction and/or power-saving for high speed delay lines
8593860, Dec 09 2011 GSI TECHNOLOGY INC Systems and methods of sectioned bit line memory arrays
8625334, Dec 16 2011 Taiwan Semiconductor Manufacturing Company, Ltd. Memory cell
8643418, Jun 02 2011 U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT Apparatus and methods for altering the timing of a clock signal
8692621, Dec 21 2011 Semiconductor Components Industries, LLC Methods and apparatus for oscillator frequency calibration
8693236, Dec 09 2011 GSI TECHNOLOGY INC Systems and methods of sectioned bit line memory arrays, including hierarchical and/or other features
8817550, Dec 02 2011 GSI TECHNOLOGY, INC Systems and methods of semiconductor memory devices including features of output buffer initialization circuit(s) and/or multiple power-up detection/handling
8837207, Apr 23 2013 National Chiao Tung University Static memory and memory cell thereof
8885439, Jul 20 2011 GSI Technology Inc. Systems and methods including clock features such as minimization of simultaneous switching outputs (SSO) effects involving echo clocks
8971096, Jul 29 2013 Qualcomm Incorporated Wide range multiport bitcell
8995162, Sep 04 2013 HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY Radiation-hardened memory storage unit
9018992, Dec 30 2009 GSI Technology, Inc. Systems and methods involving phase detection with adaptive locking/detection features
9030893, Feb 06 2013 Qualcomm Incorporated Write driver for write assistance in memory device
9053768, Mar 14 2013 GSI TECHNOLOGY, INC Systems and methods of pipelined output latching involving synchronous memory arrays
9059691, Dec 31 2012 Taiwan Semiconductor Manufacturing Company, Ltd. Duty cycle detection and correction circuit in an integrated circuit
9070477, Dec 12 2012 MIE FUJITSU SEMICONDUCTOR LIMITED Bit interleaved low voltage static random access memory (SRAM) and related methods
9083356, Mar 14 2013 GSI TECHNOLOGY, INC Systems and methods of phase-locked loop involving closed-loop, continuous frequency range, auto calibration and/or other features
9093135, Nov 15 2012 Nvidia Corporation System, method, and computer program product for implementing a storage array
9094025, Mar 15 2013 GSI TECHNOLOGY, INC Systems and methods of phase frequency detection involving features such as improved clock edge handling circuitry/aspects
9135986, Dec 09 2011 GSI Technology, Inc. Systems and methods of sectioned bit line memory arrays, including hierarchical and/or other features
9142285, Dec 13 2013 National Chiao Tung University Multi-port SRAM with shared write bit-line architecture and selective read path for low power operation
9159391, Dec 13 2012 GSI TECHNOLOGY, INC Systems and methods of double/quad data rate memory involving input latching, self-timing and/or other features
9171634, Mar 14 2013 ARM Limited Memory device and method of controlling leakage current within such a memory device
9177646, May 06 2013 CAVIUM INTERNATIONAL; MARVELL ASIA PTE, LTD Implementing computational memory from content-addressable memory
9196324, Aug 12 2011 GSI TECHNOLOGY, INC Systems and methods involving multi-bank, dual- or multi-pipe SRAMs
9240229, Mar 15 2012 GSI TECHNOLOGY, INC Systems and methods involving control-I/O buffer enable circuits and/or features of saving power in standby mode
9311971, Dec 02 2011 GSI Technology, Inc. Systems and methods of semiconductor memory devices including features of output buffer initialization circuit(s) and/or multiple power-up detection/handling
9318174, Mar 15 2013 GSI TECHNOLOGY, INC Memory systems and methods involving high speed local address circuitry
9356611, Dec 30 2009 GSI TECHNOLOGY, INC Systems and methods involving phase detection with adaptive locking/detection features
9384822, Mar 15 2013 GSI TECHNOLOGY, INC Systems and methods involving data bus inversion memory circuitry, configuration and/or operation including data signals grouped into 10 bits and/or other features
9385032, Mar 15 2013 GSI TECHNOLOGY, INC Systems and methods involving data bus inversion memory circuitry, configuration and/or operation
9396790, Jun 30 2015 STMicroelectronics International N.V. Multi-supply dual port register file
9396795, Dec 30 2014 The Regents of the University of Michigan Storage device supporting logical operations, methods and storage medium
9401200, Dec 22 2014 TAHOE RESEARCH, LTD Memory cells with p-type diffusion read-only port
9412440, Mar 14 2013 GSI TECHNOLOGY, INC Systems and methods of pipelined output latching involving synchronous memory arrays
9413295, Mar 15 2013 GSI TECHNOLOGY, INC Systems and methods of phase frequency detection with clock edge overriding reset, extending detection range, improvement of cycle slipping and/or other features
9431079, Dec 13 2012 GSI TECHNOLOGY, INC Systems and methods of memory and memory operation involving input latching, self-timing and/or other features
9443575, Oct 04 2013 Renesas Electronics Corporation Semiconductor memory
9484076, Dec 13 2012 GSI Technology, Inc. Systems and methods of double/quad data rate memory involving input latching, self-timing and/or other features
9494647, Dec 31 2013 GSI TECHNOLOGY, INC Systems and methods involving data inversion devices, circuitry, schemes and/or related aspects
9552872, Nov 17 2014 Industry-Academic Cooperation Foundation, Yonsei University Memory device
9608651, Mar 14 2013 GSI Technology, Inc. Systems and methods of phase-locked loop involving closed-loop, continuous frequency range, auto calibration and/or other features
9613670, Mar 15 2013 GSI Technology, Inc. Memory systems and methods involving high speed local address circuitry
9613684, Jun 05 2014 GSI TECHNOLOGY, INC Systems and methods involving propagating read and write address and data through multi-bank memory circuitry
9640540, Jul 19 2016 TAIWAN SEMICONDUCTOR MANUFACTURING CO , LTD Structure and method for an SRAM circuit
9679631, Aug 12 2011 GSI Technology, Inc. Systems and methods involving multi-bank, dual- or multi-pipe SRAMs
9685210, Jul 08 2016 Qualcomm Incorporated Overlapping precharge and data write
9692429, Nov 15 2012 GSI TECHNOLOGY, INC Systems and methods involving fast-acquisition lock features associated with phase locked loop circuitry
9697890, Jun 01 2016 Taiwan Semiconductor Manufacturing Co., Ltd. Memory and interface circuit for bit line of memory
9722618, Mar 14 2013 GSI TECHNOLOGY, INC Systems and methods of phase-locked loop involving closed-loop, continuous frequency range, auto calibration and/or other features
9729159, Mar 14 2013 GSI Technology, Inc. Systems and methods of phase-locked loop involving closed-loop, continuous frequency range, auto calibration and/or other features
9789840, Mar 18 2016 Ford Global Technologies, LLC Downwardly inflatable vehicle airbag
9804856, Mar 15 2012 GSI Technology, Inc. Systems and methods involving control-I/O buffer enable circuits and/or features of saving power in standby mode
9847111, Mar 14 2013 GSI Technology, Inc. Systems and methods of pipelined output latching involving synchronous memory arrays
9853633, Jun 22 2015 GSI TECHNOLOGY, INC Systems and methods involving lock-loop circuits, clock signal alignment, phase-averaging feedback clock circuitry
9853634, Mar 15 2013 GSI Technology, Inc. Systems and methods of phase frequency detection with clock edge overriding reset, extending detection range, improvement of cycle slipping and/or other features
9859902, Nov 15 2012 GSI Technology, Inc. Systems and method involving fast-acquisition lock features associated with phase locked loop circuitry
9916889, Dec 01 2016 TAHOE RESEARCH, LTD Memory circuitry with row-wise gating capabilities
9935635, Aug 28 2015 GSI TECHNOLOGY, INC Systems and methods involving pseudo complementary output buffer circuitry/schemes, power noise reduction and/or other features
9966118, Mar 14 2013 GSI Technology, Inc. Systems and methods of pipelined output latching involving synchronous memory arrays
20010052822,
20020006072,
20020060938,
20020136074,
20020154565,
20020168935,
20030016689,
20030107913,
20030185329,
20040053510,
20040062138,
20040090413,
20040160250,
20040169565,
20040199803,
20040240301,
20040264279,
20040264286,
20050024912,
20050026329,
20050036394,
20050186930,
20050226079,
20050226357,
20050253658,
20050285862,
20060039227,
20060055434,
20060119443,
20060139105,
20060143428,
20060248305,
20070001721,
20070047283,
20070058407,
20070109030,
20070115739,
20070139997,
20070171713,
20070189101,
20070229129,
20080010429,
20080049484,
20080068096,
20080079467,
20080080230,
20080117707,
20080129402,
20080155362,
20080175039,
20080181029,
20080265957,
20080273361,
20090027947,
20090089646,
20090141566,
20090154257,
20090161468,
20090231943,
20090256642,
20090296869,
20090319871,
20100085086,
20100157715,
20100169675,
20100172190,
20100177571,
20100214815,
20100232202,
20100260001,
20100271138,
20100322022,
20110018597,
20110063898,
20110153932,
20110211401,
20110267914,
20110280307,
20110292743,
20110299353,
20120049911,
20120133114,
20120153999,
20120242382,
20120243347,
20120250440,
20120281459,
20120327704,
20130039131,
20130083591,
20130170289,
20140056093,
20140125390,
20140136778,
20140185366,
20140269019,
20150003148,
20150029782,
20150063052,
20150187763,
20150213858,
20150248927,
20150279453,
20150302917,
20150310901,
20150357028,
20160005458,
20160027500,
20160064068,
20160141023,
20160225436,
20160225437,
20160247559,
20160284392,
20160329092,
20170194046,
20170345505,
20180122456,
20180123603,
20180157621,
20180158517,
20180158518,
20180158519,
20180158520,
20200117398,
20200160905,
20200301707,
CN104752431,
DE10133281,
JP2005346922,
/////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Aug 23 2018GSI Technology, Inc.(assignment on the face of the patent)
Oct 17 2018HAIG, BOBGSI TECHNOLOGY, INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0477480690 pdf
Oct 17 2018HUANG, MU-HSIANGGSI TECHNOLOGY, INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0477480690 pdf
Oct 24 2018CHANG, CHAO-HUNGGSI TECHNOLOGY, INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0477480690 pdf
Oct 25 2018EHRMAN, ELIGSI TECHNOLOGY, INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0477480690 pdf
Date Maintenance Fee Events
Aug 23 2018BIG: Entity status set to Undiscounted (note the period is included in the code).
Sep 10 2018SMAL: Entity status set to Small.
Feb 28 2024M2551: Payment of Maintenance Fee, 4th Yr, Small Entity.


Date Maintenance Schedule
Nov 24 20234 years fee payment window open
May 24 20246 months grace period start (w surcharge)
Nov 24 2024patent expiry (for year 4)
Nov 24 20262 years to revive unintentionally abandoned end. (for year 4)
Nov 24 20278 years fee payment window open
May 24 20286 months grace period start (w surcharge)
Nov 24 2028patent expiry (for year 8)
Nov 24 20302 years to revive unintentionally abandoned end. (for year 8)
Nov 24 203112 years fee payment window open
May 24 20326 months grace period start (w surcharge)
Nov 24 2032patent expiry (for year 12)
Nov 24 20342 years to revive unintentionally abandoned end. (for year 12)