A method for manufacturing connection structure, the method includes arranging conductive particles and a first composite on a first electrode located on a first surface of a first member, arranging a second composite on a region other than the first electrode of the first surface, arranging the first surface and a second surface of a second member where a second electrode is located, so that the first electrode and the second electrode are opposed to each other, pressing the first member and the second member; and curing the first composite and the second composite.
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1. A connection structure comprising:
a first member having a first surface;
a plurality of first electrodes located on the first surface;
a second member having a second surface opposed to the first surface;
a plurality of second electrodes opposed to the a plurality of first electrodes and located on the second surface;
a first resin and conductive particles arranged between the at least one of the plurality of first electrodes and at least one of the plurality of second electrodes, the conductive particles including a particle core having elasticity coated with metals; and
a second resin arranged between a first region surrounding the at least one of the plurality of first electrodes on the first surface and a second region surrounding the at least one of the plurality of second electrodes on the second surface,
an insulating film arranged in the first region,
wherein the second resin is in contact with the insulating film in the first region and the second surface in the second region, and the first resin and the second resin have different compositions from each other,
wherein the conductive particles are arranged between the at least one of the plurality of first electrodes and the at least one of the plurality of second electrodes in a range of seven per 400 μm2 or more and twenty per 400 μm2 or less.
2. The connection structure according to
3. The connection structure according to
4. The connection structure according to
5. The connection structure according to
6. The connection structure according to
7. The connection structure according to
8. The connection structure according to
9. The connection structure according to
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This is a divisional of U.S. patent application Ser. No. 16/004,281 filed on Jun. 8, 2018, which claims the benefit of priority from the prior Japanese Patent Application No. 2018-015665, filed on Jan. 31, 2018, the entire contents of which are incorporated herein by reference.
An embodiment of the present invention relates to a connection structure having a connection configuration of electrodes made of conductive composite and a method for manufacturing the connection structure.
In general, an anisotropic conductive films (ACF) containing conductive particles is widely used when an electronic component such as an integrated circuit is mounted on a substrate in COG (Chip on Glass) connection for connecting an integrated circuit directly to a glass substrate such as a liquid-crystal display or FOG (Film on Glass) connection for connecting a flexible printed board to a glass substrate of a flat panel display. The anisotropic conductive film is a thermosetting resin film with fine conductive particles dispersed therein. By interposing the anisotropic conductive film between aligned electrodes and performing thermal compression, the conductive particles positioned between the electrodes can form a conductive route. On the other hand, insulation properties of the thermosetting resin can reduce a short circuit between electrodes adjacent in a substrate surface direction. That is, the anisotropic conductive film has anisotropy of forming conductivity in a pressurizing direction (direction of both of the electrodes) and insulation properties are kept in a non-pressurizing direction (surface direction of the substrate). Having these characteristic, the anisotropic conductive film can collectively connect a plurality of electrodes provided on an integrated circuit, printed board, glass substrate, or the like, and can retain insulation properties of adjacent electrodes in the substrate surface direction.
However, with high fineness and high density of connection circuits in electronic devices in recent years, reliability of connection using the anisotropic conductive film matters. That is, when the size of an electrode as a connection target decreases, the number of conductive particles contributing to conductivity between paired electrodes decreases, and connection reliability between the electrodes may not be sufficiently obtained. Moreover, when a space between electrodes adjacent in the substrate surface direction is narrowed, both of the adjacent electrodes and the conductive particles may be in contact with each other, and insulation reliability may not be sufficiently obtained. Thus, for example, an anisotropic conductive film in a state with conductive particles dispersed by means such as application of a magnetic field and as being separated from other conductive particles is disclosed (for example, refer to Japanese Unexamined Patent Application Publication No. 2015-167106).
A method for manufacturing connection structure according to an embodiment of the present invention, the method includes arranging conductive particles and a first composite on a first electrode located on a first surface of a first member, arranging a second composite on a region other than the first electrode of the first surface, arranging the first surface and a second surface of a second member where a second electrode is located, so that the first electrode and the second electrode are opposed to each other, pressing the first member and the second member, and curing the first composite and the second composite.
A connection structure according to an embodiment of the present invention includes a first member having a first surface, a first electrode located on the first surface, a second member having a second surface opposed to the first surface, a second electrode opposed to the first electrode and located on the second surface, a first resin and conductive particles arranged between the first electrode and the second electrode, and a second resin arranged between the first electrode and the second electrode and between a region other than the first electrode on the first surface and a region other than the second electrode on the second surface. The first resin is in contact with the first electrode, the second resin is in contact with the second electrode. The first resin and the second resin are different compositions from each other.
Hereinafter, embodiments of the present invention will be described with reference to the drawings and the like. The present invention may be carried out in various embodiments, and should not be construed as being limited to any of the following embodiments. In the drawings, components may be shown schematically regarding the width, thickness, shape and the like, instead of being shown in accordance with the actual sizes, for the sake of clear illustration. The drawings are merely examples and do not limit the present invention in any way. In the specification and the drawings, components that are substantially the same as those described or shown previously bear the identical reference signs thereto (or the identical reference signs followed by letters “a”, “b” or the like), and detailed descriptions thereof may be omitted. The terms “first”, “second” and the like used for elements are merely provided for distinguishing the elements and do not have any other significance unless otherwise specified.
In the specification and the claims, an expression that a component is “on” the other component encompasses a case where such a component is in contact with the other component and also a case where such a component is above or below the other component, namely, a case where still another component is provided between such a component and the other component, unless otherwise specified.
In the anisotropic conductive film, since the sequence of the conductive particles is irregularly disturbed when substrates are subjected to thermal compression. Thus, it is difficult to sufficiently solve problems such as conduction failure due to the absence of conductive particles between the electrodes and a short circuit due to a contact of the conductive particles between the adjacent electrodes. Moreover, with a heat curing connection scheme, a dimensional change occurs in principle, due to a difference in coefficient of thermal expansion between upper and lower substrates, and a problem of deviation occurs between the electrodes formed on the upper and lower substrates. In several embodiments described further below, one aspect of a connection structure capable of solving one or plurality of these problems is described.
In the specification, a connection structure in COG connection for connecting an integrated circuit (second electronic component) to a glass substrate of a liquid-crystal display (a first electronic component) is described by way of example. However, the connection structure is not limited to this, and may be a connection structure in FOG connection for connecting a flexible printed board to a glass substrate of a flat panel display. In this case, the second electronic component may be a flexible printed board such as a TAB (Tape Automated Bonding) or COF (Chip on film).
As shown in
A plurality of first electrodes 110 are arranged on the first surface of the first member 102. On the first surface of the first member 102, a second insulating film 108 is arranged in a region other than a region where the first electrodes 110 are arranged. A plurality of second electrodes 114 are arranged on the second surface of the second member 112 so as to correspond to the plurality of first electrodes 110. On the second surface of the second member 112, an insulating film may be arranged in a region other than a region where the second electrodes 114 are arranged.
The plurality of first electrodes 110 and the plurality of second electrodes 114 are arranged so as to be the first electrode 110 and the second electrode 114 are opposed to each other. The plurality of conductive particles 10 and the first resin 20 are arranged between the opposing first electrode 110 and second electrode 114. The plurality of conductive particles 10 are arranged in a surface direction (D2-D3 surface direction) between the opposing first electrode 110 and second electrode 114. One conductive particle 10 is arranged between the opposing first electrode 110 and second electrode 114 in an opposing direction (D1 direction) of the first electrode 110 and the second electrode 114. Each of the plurality of conductive particles 10 are in contact with the opposing first electrode 110 and second electrode 114. As shown in
The plurality of conductive particles 10 are dispersed in the first resin 20 between the first electrode 110 and the second electrode 114. Each of the plurality of conductive particles 10 are surrounded by the first resin 20 between the first electrode 110 and the second electrode 114 in the surface direction (D2-D3 surface direction). The first resin 20 is an insulating resin. Thus, the connection structure 100 has insulation properties in the surface direction (D2-D3 surface direction). However, the plurality of conductive particles 10 arranged between the opposing first electrode 110 and second electrode 114 and adjacent to each other in the surface direction (D2-D3 surface direction) may be in contact with each other. When the conductive particles 10 adjacent to each other in the surface direction (D2-D3 surface direction) are in contact with each other, the conductive particles 10 adjacent to each other are also electrically connected. This arrangement allows the conductive particles 10 to further reliably connect the opposing first electrode 110 and second electrode 114 electrically. The distance between the adjacent conductive particles 10 can be appropriately controlled according to the concentration of the conductive particles 10 mixed into a first composite 20′, which will be described further below.
As shown in
In the present embodiment, the shape of the region where the conductive particles 10 and the first resin 20 are arranged when viewed in the opposing direction (D1 direction) of the electrodes is a circle. However, the shape is not limited to this, and the region where the conductive particles 10 and the first resin 20 are arranged may have any shape satisfying the above-described condition. In the present embodiment, the region where the conductive particles 10 and the first resin 20 are arranged is positioned at two locations on the upper surface of one first electrode 110 (or the lower surface of one second electrode 114). Also, seven conductive particles 10 are arranged in one region. However, this is not meant to be restrictive, and the number of regions where the conductive particles 10 and the first resin 20 are arranged on the upper surface of one first electrode 110 (or the lower surface of one second electrode 114) can be adjusted as appropriate to satisfy the above-described condition, depending on the area of the upper surface of the first electrode 110 (or the lower surface of the second electrode 114), the area of the region where the conductive particles 10 and the first resin 20 are arranged, and the size of the conductive particles 10. Also, the number of conductive particles 10 arranged in one region can be adjusted as appropriate to satisfy the above-described condition, depending on the size of the conductive particles 10 and concentration of the conductive particles 10 mixed into the first composite 20′.
The second resin 30 is further arranged between the first surface of the first member 102 and the second surface of the second member 112. The second resin 30 is arranged in a region not between the opposing first electrode 110 and second electrode 114. The second resin 30 is arranged between a region other than the first electrode of the first surface and a region other than the second electrode of the second surface. That is, the second resin 30 is arranged between the plurality of first electrodes 110 adjacent to each other in the surface direction (D2-D3 surface direction) and on the periphery thereof (between the plurality of second electrodes 114 adjacent to each other in the surface direction (D2-D3 surface direction) and on the periphery thereof). Furthermore, the second resin 30 is also arranged between the first electrode 110 and the second electrode 114 and in a region other than the region where the conductive particles 10 and the first resin 20 are arranged. The second resin 30 is arranged between the regions adjacent in the surface direction (D2-D3 surface direction) where the plurality of conductive particles 10 and the first resin 20 are arranged and on the periphery thereof. The second resin 30 is arranged between the regions where the plurality of conductive particles 10 and the first resin 20 adjacent in the surface direction (D2-D3 surface direction) are arranged and on the periphery thereof. In other words, the conductive particles 10 and the first resin 20 are surrounded by the second resin 30 in the surface direction (D2-D3 surface direction). That is, when viewed in the opposing direction (D1 direction) of the electrodes, the plurality of conductive particles 10 are surrounded by the first resin 20, and the first resin 20 is surrounded by the second resin 30. The second resin 30 is an insulating resin. Thus, the connection structure 100 has insulation properties in the surface direction (D2-D3 surface direction). This arrangement allows the second resin 30 to reliably insulate between the plurality of first electrodes 110 adjacent in the surface direction (D2-D3 surface direction), between the plurality of second electrodes 114 adjacent in the surface direction (D2-D3 surface direction), and between the first electrode 110 and the second electrode 114 not opposed to each other.
The boundary between the first resin 20 and the second resin 30 can be observed by cross-sectional observation of the connection structure 100. From a difference in composition between the first resin 20 and the second resin 30, the boundary between the first resin 20 and the second resin 30 can also be determined by a process/observation apparatus such as a Focused Ion Beam (FIB) process observation apparatus, a Scanning Electron Microscope (SEM), or a Transmission Electron Microscope (TEM).
If the first composite 20′ and a second composite 30′, which will be described further below, are less phase-soluble, the boundary between the first resin 20 and the second resin 30 can be observed as an interface. If the first composite 20′ and a second composite 30′ are similar to each other in composition and the interface therebetween disappear in a process described further below, the boundary may be observed as a boundary layer with the first resin 20 and the second resin 30 mixed together.
The first electronic component 101 may be, for example, a flat display such as a liquid-crystal display, an organic EL display, or a plasma display, and the first member 102 is preferably an insulating substrate such as, for example, a glass substrate or a transparent film substrate. The first electrode 110 corresponds to, for example, an external connection terminal provided to a display. The first electrode 110 and the terminal 104 may be formed of a transparent conductive material such as ITO (indium tin oxide) or IZO (indium zinc oxide); a metal such as copper (Cu), aluminum (Al), molybdenum (Mo), or titanium (Ti); an alloy including at least one type thereof (such as Mo—Ti alloy); or a laminated structure of these materials (such as Mo/Cu laminated structure, Mo—Ti alloy/Cu laminated structure, Mo/Al laminated structure, Mo/Al/Mo laminated structure, or Al/Ti laminated structure).
The second electronic component 111 may be a Si chip having an integrated circuit formed thereon. In this case, the second electrode 114 corresponds to an external connection terminal (bonding pad) provided to the integrated circuit. The second member 112 is preferably a silicon substrate, a SiC substrate, a sapphire substrate, a plastic substrate, or the like. The second electrode 114 is preferably formed, for example, of gold (Au) or by plating a surface of copper (Cu) with gold. When the second electronic component 111 is, for example, a flexible printed board, the second member 112 is preferably, for example, an insulating polymer film made of a polyimide, a para-based polyamide, or the like. The second electrode 114 corresponds to an external connection terminal provided to, for example, the flexible printed board, is generally formed of copper (Cu), and has its surface plated with gold.
The size of each of the first electrode 110 and the second electrode 114 when viewed in the opposing direction (D1 direction) is not limited to particular sizes. The distance between the pluralities of first electrodes 110 adjacent in the surface direction (D2-D3 surface direction) (the distance between the pluralities of second electrodes 114 adjacent in the surface direction) is not limited to particular values, and is, for example, at least equal to or large than 5 μm. This configuration allows the first electrode 110 and the second electrode 114 to be electrically connected without impairing insulation properties. In the present embodiment, the first electrode 110 and the second electrode 114 are arranged so that short sides thereof are aligned in a line at one end part of each of the first electronic component 101 and the second electronic component 111. However, this is not meant to be restrictive, and a plurality of rows of the first electrodes 110 and the second electrodes 114 may be arranged, and the first electrodes 110 and the second electrodes 114 may be arranged in a staggered formation.
The conductive particle 10 included in the connection structure 100 may be in an oblate spheroidal shape. The diameter (longitudinal diameter) of the conductive particle 10 when viewed in the opposing direction (D1 direction) of the electrodes is in a range between a value equal to or larger than 2 μm and a value equal to or smaller than 10 μm. The conductive particle 10 may originally have a spherical shape with the above-described longitudinal diameter as a diameter, and may be deformed to be flat in the opposing direction (D1 direction) of the electrodes by a range between a value equal to or larger than 10% and a value equal to or smaller than 40% with respect to 100% of the longitudinal diameter. The diameter (longitudinal diameter) and the pressure deformation amount of the conductive particle 10 can be selected as appropriate from the values in the above-described range, depending on the type of the first electronic component 101 and the second electronic component 111, the method for manufacturing each connection structure, and so forth. While the conductive particle 10 has a round shape in the present embodiment as shown in
The material of the conductive particle 10 is not limited to particular materials, and any can be selected as appropriate for use from known conductive particles. The conductive particle 10 may be a metal-coated particle by coating with metals 10b and 10c such as nickel (Ni), copper (Cu) or gold (Au), a particle core with a highly-hard resin material coated with a rubber-like elastic resin or a particle core 10a with a highly-hard inorganic material coated with a rubber-like inorganic elastic body, as shown in
The first resin 20 and the second resin 30 are formed by curing the first composite 20′ and the second composite 30′ including different materials. The materials of the first composite 20′ and the second composite 30′ are not limited to particular materials, and any can be selected as appropriate from known curable resin materials. In the present embodiment, the curable resin materials of the first composite 20′ and the second composite 30′ both contain a radical-polymerization resin. As the radical-polymerization resin, a (meth)acrylic monomer or (meth)acrylate oligomer is preferable, and one bonded in an ester form is more preferable. The (meth)acrylate oligomer has at least one (meth)acryloyl group or more and, for example, epoxy acrylate, urethane acrylate, polyester acrylate, polybutadiene acrylate, polyol acrylate, polyether acrylate, silicone resin acrylate, melamine acrylate, or the like can be used. The (meth)acryl oligomer may be monofunctional or polyfunctional, and preferably contains a polyfunctional monomer or oligomer. The curably resin material may be configured by selecting two or more types from (meth)acrylate monomers and (meth)acrylate oligomers.
In particular, as a curable resin material of the second composite 30′, one with a low volume shrinkage ratio at the time of curing is preferable. Thus, the (meth)acrylic monomer may contain, for example, an amide methylol structure portion, and may contain a dendrimer or hyper branch polymer structure portion. In a (meth)acrylic monomer compound having an amide methylol structure portion, together with polymerization of carbon-carbon double bonds derived from (meth)acrylic acid, methylene-oxygen bonds in the amide methylol structure portion are cleaved at the time of photocuring. Thus, with the second compound 30′ containing a (meth)acrylic monomer compound having at least one amide methylol structure portion formed of —CO'NH—CH2—O— in a molecule as a curable component, the volume shrinkage ratio of the second resin 30 due to curing of the second composite 30′ can be more reduced, and warpage due to a difference in flexural rigidity between the first electronic component 101 and the second electronic component 111 can be reduced. With a branch including a dendrimer or hyperbranch polymer structure portion having an acryl group, a Van der Waals distance between branches becomes shorter than a Van der Waals distance between general molecules. Thus, with the second composite 30′ containing a dendrimer or hyperbranch polymer structure portion having an acryl group as a curable component, the volume shrinkage ratio of the second resin 30 due to curing of the second composite 30′ can be more reduced, and warpage due to a difference in flexural rigidity between the first electronic component 101 and the second electronic component 111 can be reduced.
As the curable resin material of the second composite 30′, a fluorene-based acrylate is preferably used. The second composite 30′ may contain an ene/thiol-based curable resin containing a composite having an ethylene unsaturated double bond and a thiol compound as a curable component, at least one of these components may contain a compound having a 9,9-bisarylfluorene skeleton. The 9,9-bisarylfluorene compound may be a 9,9-bisarylfluorene compound having an ethylene unsaturated bond and/or a 9,9-bisarylfluoren compound having a mercapto group. As the ethylene unsaturated compound, for example, 9,9-bis(4-acryloyloxyethoxyphenyl)fluorene (produced by Osaka Gas Chemicals Co., Ltd., OGSOL EA-0200) and phenoxyethyl acrylate (produced by KYOEISHA CHEMICAL CO., LTD., LIGHT ACRYLATE POA) may be used. As the thiol compound, for example, pentaerythritol tetra (3-mercaptobutyrate) (produced by SHOWA DENKO K. K., Karenz MT PE1) may be used. With the second composite 30′ containing this curable resin material, the volume shrinkage ratio of the second resin 30 due to curing of the second composite 30′ can be more reduced, and warpage due to a difference in flexural rigidity between the first electronic component 101 and the second electronic component 111 can be reduced.
As the curable resin material of the second composite 30′, an ene compound having in a molecule two or more functional groups selected from a group of an allyl ether group, a vinyl ether group, an acrylate group, and a methacrylate group or ene compound as a mixture of two or more types of the above-described ene compounds, and a substance obtained by performing oxidizing-compound-process on the ene/thiol-based curable resin containing a thiol compound having two or more thiol groups in one molecule may be used. A compound having two or more mercapto groups in one molecule may contain esters obtained from mercaptocarboxylic acid and polyhydric alcohol, aliphatic polythiols, aromatic polythiols, and other polythiols, or one, two or more of these may be used. The oxidizing-compound process is preferably performed with a gas having oxidative capacity. The gas having oxidative capacity is a compound having air properties and oxidative capacity under temperature and atmospheric pressure conditions for performing oxidizing-compound process. As the gas having oxidative capacity, air, oxygen, ozone, or the like can be used, and a mixture gas partially containing any of these may be used. The second composite 30′ can enhance stability with time by performing oxidizing-compound process on the above-described photocurable resin material.
The materials of the first composite 20′ and the second composite 30′ further contain a photocuring initiating component. The photocuring initiating component is a photoradical initiator, and may be any compound which generates radicals by irradiating ultraviolet rays or visible rays. As an ultraviolet-ray radical initiator, for example, an acetophenone-based initiator, a benzoin-ether-based initiator, a benzophenone-based initiator, an α-diketone-based initiator, a thioxanthone-based initiator, or the like can be used. As a visible-ray radical initiator, for example, a camphorquinone-based compound, an acylphosphine oxide compound, or the like can be used. Also, one classified as an ultraviolet-ray radical initiator but capable of visible-ray radical initiation by using combination with a sensitizer may be used. The sensitizer can be appropriately used as required. As the sensitizer, a known composite can be used. For example, an amine-based compound, a (meth)acrylic acid ester of an alkanol amine, or the like can be used. A plurality of types of the photocuring initiating component and the sensitizer can be used in combination. For example, by using an ultraviolet-ray radical initiator and a visible-ray radical initiator in combination, a curable wavelength region can be expanded. The photocuring initiating component is more preferably a photoradical initiator which generates radicals with a irradiation light in a range of wavelength between a value equal to or larger than 300 nm and a value equal to or smaller than 500 nm. The photocuring initiating component is compounded in the curable resin material so that the curable resin material can be curing at room temperatures with a light irradiation for a period of preferably equal to or shorter than approximately three seconds, more preferably equal to or shorter than one second. The curable resin material is selected as appropriate so as to allow curing at room temperatures with the above-described time period.
In the present embodiment, the first composite 20′ and the second composite 30′ more preferably further contain a shielding part curable activation compound such as, for example, a chain transfer agent. The chain transfer agent transmits radicals generated by light irradiation to a shielding part which light does not directly reach. As the chain transfer agent, for example, a compound containing at least one or more of selected from a urethane bond, a urea bond, and an isocyanate group and one or more of alkoxysilyl group can be used. In photocuring reaction using the above-described chain transfer agent, polyalcohol having a hydroxyl group as one type of anion is generated as a by-product. With this polyalcohol and the alkoxysilyl group containing in the chain transfer agent undergoing a transesterification, curing further proceeds. That is, with the chain transfer agent being contained in the first composite 20′ and the second composite 30′, radical curing and anion curing occur simultaneously, thereby allowing curing of the shielding part where light does not directly reach.
With the first composite 20′ and the second composite 30′ containing a shielding part curable activation compound, the first composite 20′ and the second composite 30′ can be reliably cured even under conditions with the connection method, the material of the first electronic component 101, the second electronic component 111, the first electrode 110, and the second electrode 114, and so forth in which the first composite 20′ and the second composite 30′ cannot be cured only with the action of a photocuring initiating component by light irradiation.
In the present embodiment, the material of the first composite 20′ may further contain an anaerobic curing initiating component. As the anaerobic curing initiating component, a known group including organic peroxide and a curing accelerator can be used. As the organic peroxide, for example, any of hydroperoxides, ketone peroxides, diallyl peroxides, peroxyesters, and so forth can be used. As the curing accelerator, for example, an o-benzoic sulfimide (saccharin), a hydrazine compound, an amine compound, a mercaptan compound, or the like can be used. A plurality of types of the anaerobic curing initiation component and the curing accelerator may be used in combination.
In the present embodiment, the first composite 20′ is surrounded by the first surface (including the first electrode 110), the second surface (including the second electrode 114), and the second composite 30′. Furthermore, the first composite 20′ is in contact with the first electrode 110, the second electrode 114, and the conductive particles 10. The first electrode 110, the second electrode 114, and the conductive particles 10 contain transition metals. Thus, with the first composite 20′ containing an anaerobic curing initiating component, a redox reaction by the cure acceleration agent and the transition metal ions dissolves peroxide, thereby allowing anaerobic curing of the first composite 20′ to be initiated.
With the first composite 20′ further containing an anaerobic curing initiating component, the first composite 20′ can be reliably cured even under conditions with the connection method, the material of the first electronic component 101, the second electronic component 111, the first electrode 110, and the second electrode 114, and so forth in which the first composite 20′ cannot be cured only with the action of a photocuring initiating component by light irradiation.
The additive can be appropriately used as required to improve or modify the properties such as fluidity, coating characteristics, preservability, curing characteristics, and physical properties after curing. As the additive, any known compound can be used. Examples of the additive include a silane coupler, a diluent, a modifying agent, a surface active agent, a preservative stabilizer, an antiforming agent, and a leveling agent, although not limited thereto. The silane coupler is not limited to particular agent and for example, any of epoxy-based, amino-based, mercapto/sulfide-based, and ureido-based ones and so forth can be used. With the addition of silane coupler, adhesion at the interface between the organic material and the inorganic material is improved.
The viscosity of the first composite 20′ is higher than the viscosity of the second composite 30′. The viscosity of the first composite 20′ is in a range between a value equal to or higher than 5×103 cP and a value equal to or lower than 5×105 cP. The viscosity of the second composite 30′ is in a range between a value equal to or higher than 2×103 cP and a value equal to or lower than 2×105 cP. It is required that the viscosity of the first composite 20′ is twice as high as the viscosity of the second composite 30′ or higher. The viscosity of the first composite 20′ and the second composite 30′ can be controlled also by the degree of polymerization of the resin material contained in the first composite 20′ and the second composite 30′. The viscosity of each composite can be selected as appropriate from values within the above-described range, depending on the type of the first electronic component 101 and the second electronic component 111, the method for manufacturing connection structure, the method for composite arrangement, and so forth. If the viscosity of the first composite 20′ is lower than 5×103 cP, uniform dispersibility of the conductive particles 10 in the first composite 20′ is degraded, and sedimentation and agglomeration tend to occur. With the viscosity of the first composite 20′ being higher than the viscosity of the second composite 30′, the conductive particles 10 mixed into the first composite 20′ is inhibited from flowing, and can be efficiently arranged between the first electrode 110 and the second electrode 114. Therefore, connection reliability between the first electrode 110 and the second electrode 114 can be ensured.
The first resin 20 and the second resin 30 are formed by curing the first composite 20′ and the second composite 30′. The volume shrinkage ratio of the first resin 20 due to curing of the first composite 20′ and the volume shrinkage ratio of the second resin 30 due to curing of the second composite 30′ are both preferably equal to or smaller than 4%, and more preferably equal to or smaller than 2%. If the volume shrinkages ratio of the first resin 20 and the second resin 30 are larger than 4%, an inner shrinkage stress occurs, warpage due to a difference in flexural rigidity between the first electronic component 101 and the second electronic component 111 tends to occur, and physical connection reliability between the first electronic component 101 and the second electronic component 111 is degraded.
The first resin 20 more preferably has high power of adhesion to a conductive material such as a metal material or metal oxide material. The first resin 20 preferably has high power of adhesion to a metal material forming the first electrode 110 and the second electrode 114, and preferably has high power of adhesion to, for example, Au, ITO, and so forth. The second resin 30 preferably has high power of adhesion to a resin material. The second resin 30 preferably has high power of adhesion to an insulating film material forming the first surface of the first member 102 and the second surface of the second member 112, and preferably has high power of adhesion to an insulating material such as, for example, polyimide, para-based polyamide film, P—SiNx, glass, and so forth. The adhesion power of the first resin 20 is preferably in a range equal to or larger than 500 N/m. The adhesion power of the second resin 30 is preferably in a range equal to or larger than 700 N/m. The adhesion power, glass transition temperature, and hardness of each resin can be selected as appropriate, depending on the type of the first electronic component 101 and the second electronic component 111, the method for manufacturing connection structure, and so forth. With the first resin 20 and the second resin 30 each being selected depending on the material of an adherend, the adhesive power between the first surface of the first member 102 and the second surface of the second member 112 can be further improved. Therefore, physical connection reliability between the first electronic component 101 and the second electronic component 111 can be improved.
Next, a method for manufacturing connection structure according to one embodiment of the present invention is described by using
First, the plurality of conductive particles 10 and the first composite 20′ are arranged in a predetermined region on the first electrode 110. The plurality of conductive particles 10 and the first composite 20′ are mixed, and are arranged by using an offset printing scheme. Since the mixture of the conductive particles 10 and the first composite 20′ contains the conductive particles 10, a pad printing scheme of transferring a printed matter by using a pad is particularly preferable. By using
The material of the lyophilic layer 222 may be, for example, an aluminum oxide (Al2O3). The material of the liquid-repellent layer 224 is preferably, for example, an elastic silicone resin. The depressed parts 226 have a depth substantially equal to the depth of the liquid-repellent layer 224. The depth of the depressed parts 226 is required to be larger than the diameter of the conductive particles 10. The plate 220 may be, in addition to a waterless planographic plate, a glass deep-etch plate, a stainless deep-etch plate, a sapphire deep-etch plate, or a zirconia deep-etch plate. The depressed parts 226 when viewed from the upper surface of the plate 220 are preferably separated from each other by 5 μm or more. If the depressed parts 226 are separated from each other by less than 5 μm, the liquid-repellent layer 224 which separates the adjacent depressed parts 226 tends to be broken, and durability of the plate 220 may be degraded.
In the present embodiment, the shape of each depressed part 226 when viewed in the opposing direction (D1 direction) of the electrodes is circle. Also, the depressed part 226 has the same shape in a depth direction. That is, the depressed part 226 has a shape obtained by cutting out a cylinder from the plate 220. However, the shape of the depressed part 226 is not limited to this, and the depressed part 226 can take any shape with the depth in the above-described range.
In the present embodiment, the mixture of the conductive particles 10 and the first composite 20′ is arranged on the plate 220 by using a roller 210. As shown in
As for the concentration of the conductive particles 10 mixed into the first composite 20′, the ratio of the conductive particles 10 to the total volume of the conductive particles 10 and the first composite 20′ is preferably in a range between a value equal to or larger than 20 volume % and a value equal to or smaller than 60 volume %. If the mixing amount of the conductive particles 10 is smaller than 20 volume %, it is difficult to fill the sufficient number of conductive particles 10 in the depressed parts 226. If the mixing amount of the conductive particles 10 is larger than 60 volume %, operability is degraded, and it is difficult to fill the mixture of the conductive particles 10 and the first composite 20′ in the depressed parts 226. By arranging the mixture of the conductive particles 10 and the first composite 20′ with the roller 210, the conductive particles 10 and the first composite 20′ can be filled in the depressed parts 226 of the plate 220. Since the depressed parts 226 have the depth in the above-described range, one conductive particle 10 can be retained in the depth direction (D1 direction) of the depressed parts 226. The number of conductive particles 10 arranged in one depressed part 226 is preferably equal to or more than one and equal to or smaller than seven. The number of conductive particles 10 arranged in one depressed part 226 is preferably seven and, more preferably three. This arrangement allows the conductive particles 10 and the first composite 20′ to be efficiently displaced to the pad in a process of displacing the mixture of the conductive particles 10 and the first composite 20′ to the pad, which will be described further below.
Each depressed part 226 is formed by the opening of the elastic liquid-repellent layer 224. Thus, if the conductive particles 10 make contact with the liquid-repellent layer 224 as the roller 210 progress, the conductive particles 10 can be retained in the depressed parts 226 without damage. Since the depressed parts 226 have the lyophilic layer 222 at the bottom, it can retain the first composite 20′. On the other hand, the liquid-repellent layer 224 arranged on the upper surface of the plate 220 makes the first composite 20′ liquid-repellent.
The material of the pad 230 is preferably, for example, an elastic silicone resin or the like. The shape of the pad 230 preferably has at least a convex configuration. The shape of the pad 230 can be selected as appropriate depending on the shape of the first electronic component 101, the plate 220, and the like.
Next, the second composite 30′ is arranged on the first surface of the first member 102. As shown in
The viscosity of the second composite 30′ is in a range between a value equal to or higher than 2×103 cP and a value equal to or lower than 2×105 cP. It is required that the viscosity of the first composite 20′ is twice as high as high as the viscosity of the second composite 30′ or higher. This allows a flow of the conductive particles 10 mixed into the first composite 20′ to be inhibited, and the conductive particles 10 can be retained on the first electronic component 110.
Next, the second member 112 is mounted on the first surface of the first member 102. As shown in
As shown in
Here, the conductive particles 10 are pressurized until deformed into an oblate spheroidal shape by receiving pressure from the first electrode 110 and the second electrode 114. The pressure deformation amount of the conductive particles 10 is controlled in a range between a value equal to or larger than 10% and a value equal to or smaller than 40% with respect to a longitudinal diameter of the conductive particles 10 of 100%. Here, a stress is applied among the first electrode 110, the conductive particles 10, and the second electrode 114, thereby eliminating the first composite 20′ between the first electrode 110 and the conductive particles 10 and between the second electrode 114 and the conductive particles 10. Furthermore, even if a natural oxide film is formed on the first electrode 110, the conductive particles 10, or the second electrode 114 and its surface is insulated, the first electrode 110 and the second electrode 114 are press-welded with the conductive particles 10 interposed therebetween, thereby breaking the natural oxide film to form a conductive route. Deformation of the conductive particles 10 can increase the area of contact between the first electrode 110 and the conductive particles 10 and the area of contact between the second electrode 114 and the conductive particles 10. This arrangement allows the conductive particles 10 to electrically connect the first electrode 110 and the second electrode 114.
With the first member 102 and the second member 112 pressed, the connection structure 100 is irradiated with light. The wavelength region of light is preferably an ultraviolet ray and/or visible ray region. In particular, ultraviolet rays are more preferable. The wavelength region of light can be selected as appropriate depending on the photocuring initiating component and the like included in the first composite 20′ and the second composite 30′. The direction of light irradiation can be selected as appropriate from a first electronic component 101 side or a second electronic component 111 side, depending on the wavelength region of light, the materials of the first member 102 and the second member 112, and so forth. Also, irradiation of light from both sides is preferable, and irradiation from a side surface without a shielding substance is also effective. The light irradiation time can be selected as appropriate depending on the photocuring initiating component, the curable resin material, and the like contained in the first composite 20′ and the second composite 30′. In general, the light irradiation time is preferably equal to or shorter than approximately three seconds and, more preferable equal to or shorter than one second. In other words, light irradiation intensity, the photocuring initiating component, the curable resin material, and so forth are selected as appropriate so that curing is achieved at room temperatures within the above-described light irradiation time.
Light irradiation causes most of the first composite 20′ and the second composite 30′ included in the connection structure 100 to be cured at room temperatures. However, for example, a portion between the first electrode 110 and the second electrode 114 which sufficient light does not reach may be insufficiently cured. Thus, the material of the first composite 20′ more preferably contains a shielding part curable activation compound, an anaerobic curing initiating component, or the like. By containing a shielding part curable activation compound, an anaerobic curing initiating component, or the like, it is possible to promote curing at room temperatures even in a portion which sufficient light does not reach. By curing the first composite 20′ and the second composite 30′, the first resin 20 and the second resin 30 are formed. This configuration allows physical connection between the first surface of the first electronic component 101 and the second surface of the second electronic component 111.
According to the present embodiment, a connection structure and a method for manufacturing connection structure can be provided that can ensure conductivity between the opposing electrodes with a simple process and can reduce a short circuit between adjacent connection electrodes, even if the electrodes arranged on the electronic components have high fineness and high density. Furthermore, since no heat curing connection scheme is used, the electrodes of the upper and lower substrates having different coefficients of thermal expansion can be connected with high accuracy.
The configuration of a connection structure according to a second embodiment is the same as the configuration of the connection structure according to the first embodiment. A method for manufacturing connection structure according to the present embodiment is the same as the method for manufacturing connection structure according to the first embodiment except that the process of arranging the mixture of the plurality of conductive particles 10 and the first composite 20′ and the process of arranging the second composite 30′ change places. The same description as that of the first embodiment is omitted, and parts different from the methods for manufacturing connection structure according to the first embodiment are described herein.
The method for manufacturing connection structure according to one embodiment of the present invention is described by using
First, the second composite 30′ is arranged on the first surface of the first member 102. As shown in
The viscosity of the second composite 30′ is in a range between a value equal to or higher than 2×103 cP and a value equal to or lower than 2×105 cP.
This allows a flow of the second composite 30′ to be inhibited.
Next, the plurality of conductive particles 10 and the first composite 20′ are arranged in a predetermined region on the first electrode 110. The plurality of conductive particles 10 and the first composite 20′ are mixed, and are arranged by using an offset printing scheme. Since the mixture of the conductive particles 10 and the first composite 20′ contains the conductive particles 10, a pad printing scheme of transferring a printed matter by using a pad is particularly preferable. The region and method for arranging the mixture of the plurality of conductive particles 10 and the first composite 20′ are the same as those of the method for manufacturing connection structure according to the first embodiment, and therefore are not described herein.
Next, the second electronic component 111 is mounted on the first surface of the first electronic component 101. As shown in
As shown in
With the first member 102 and the second member 112 pressed, the connection structure 100 is irradiated with light to cure the first composite 20′ and the second composite 30′. A method of curing the first composite 20′ and the second composite 30′ is the same as that of the method for manufacturing connection structure according to the first embodiment, and is therefore not described herein. By curing the first composite 20′ and the second composite 30′, the first resin 20 and the second resin 30 are formed. This configuration allows physical connection between the first surface of the first electronic component 101 and the second surface of the second electronic component 111.
According to the present embodiment, a connection structure and a method for manufacturing connection structure can be provided that can ensure conductivity between the opposing electrodes with a simple process and can reduce a short circuit between adjacent connection electrodes, even if the electrodes arranged on the electronic component have high fineness and high density. Furthermore, since no heat curing connection scheme is used, the electrodes of the upper and lower substrates having different coefficients of thermal expansion can be connected with high accuracy.
The configuration of a connection structure according to a third embodiment is the same as the configuration of the connection structure according to the first embodiment. A method for manufacturing connection structure according to the present embodiment is the same as the method for manufacturing connection structure according to the first embodiment except that the second composite 30′ is arranged in a region other than the second electrode 114 of the second surface. The same description as that of the first embodiment is omitted, and parts different from the methods for manufacturing connection structure according to the first embodiment are described herein.
The method for manufacturing connection structure according to one embodiment of the present invention is described by using
First, the plurality of conductive particles 10 and the first composite 20′ are arranged in a predetermined region on the first electrode 110. The plurality of conductive particles 10 and the first composite 20′ are mixed, and are arranged by using an offset printing scheme. Since the mixture of the conductive particles 10 and the first composite 20′ contains the conductive particles 10, a pad printing scheme of transferring a printed matter by using a pad is particularly preferable. The region and method for arranging the mixture of the plurality of conductive particles 10 and the first composite 20′ are the same as those of the method for manufacturing connection structure according to the first embodiment, and therefore are not described herein.
Next, the second composite 30′ is arranged on the second surface of the second member 112. As shown in
The viscosity of the second composite 30′ is in a range between a value equal to or higher than 2×103 cP and a value equal to or lower than 2×105 cP. This allows a flow of the second composite 30′ to be inhibited.
Next, the second electronic component 111 is mounted on the first surface of the first electronic component 101. As shown in
As shown in
With the first member 102 and the second member 112 pressed, the connection structure 100 is irradiated with light to cure the first composite 20′ and the second composite 30′. A method of curing the first composite 20′ and the second composite 30′ is the same as that of the method for manufacturing connection structure according to the first embodiment, and is therefore not described herein. By curing the first composite 20′ and the second composite 30′, the first resin 20 and the second resin 30 are formed. This configuration allows physical connection between the first surface of the first electronic component 101 and the second surface of the second electronic component 111.
According to the present embodiment, a connection structure and a method for manufacturing connection structure can be provided that can ensure conductivity between the opposing electrodes with a simple process and can reduce a short circuit between adjacent connection electrodes, even if the electrodes arranged on the electronic component have high fineness and high density. Furthermore, since no heat curing connection scheme is used, the electrodes of the upper and lower substrates having different coefficients of thermal expansion can be connected with high accuracy.
The configuration of a connection structure according to a fourth embodiment is the same as the configuration of the connection structure according to the first embodiment. A method for manufacturing connection structure according to the present embodiment is the same as the method for manufacturing connection structure according to the first embodiment except that the second composite 30′ is arranged in a region other than the first electrode 110 of the first member 102 and the plurality of conductive particles 10 and the first composite 20′ are arranged on the second electrode 114 of the second member 112. The same description as that of the first embodiment is omitted, and parts different from the method for manufacturing connection structures according to the first embodiment are described herein.
The method for manufacturing connection structure according to one embodiment of the present invention is described by using
First, the second composite 30′ is arranged on the first surface of the first member 102. As shown in
The viscosity of the second composite 30′ is in a range between a value equal to or higher than 2×103 cP and a value equal to or lower than 2×105 cP. This allows a flow of the second composite 30′ to be inhibited.
Next, the plurality of conductive particles 10 and the first composite 20′ are arranged in a predetermined region on the second electrode 114. The plurality of conductive particles 10 and the first composite 20′ are mixed, and are arranged by using an offset printing scheme. Since the mixture of the conductive particles 10 and the first composite 20′ contains the conductive particles 10, a pad printing scheme of transferring a printed matter by using a pad is particularly preferable. The region and method for arranging the mixture of the plurality of conductive particles 10 and the first composite 20′ are the same as those of the method for manufacturing connection structure according to the first embodiment, and therefore are not described herein.
Next, the second electronic component 111 is mounted on the first surface of the first electronic component 101. As shown in
As shown in
With the first member 102 and the second member 112 pressed, the connection structure 100 is irradiated with light to cure the first composite 20′ and the second composite 30′. A method of curing the first composite 20′ and the second composite 30′ is the same as that of the method for manufacturing connection structure according to the first embodiment, and is therefore not described herein. By curing the first composite 20′ and the second composite 30′, the first resin 20 and the second resin 30 are formed. This configuration allows physical connection between the first surface of the first electronic component 101 and the second surface of the second electronic component 111.
According to the present embodiment, a connection structure and a method for manufacturing connection structure can be provided that can ensure conductivity between the opposing electrodes with a simple process and can reduce a short circuit between adjacent connection electrodes, even if the electrodes arranged on the electronic component have high fineness and high density. Furthermore, since no heat curing connection scheme is used, the electrodes of the upper and lower substrates having different coefficients of thermal expansion can be connected with high accuracy.
The configuration of a connection structure according to a fifth embodiment is the same as the configuration of the connection structure according to the first embodiment except that insulating particles 40 are contained in the region where the second resin 30 is arranged. The same description as that of the first embodiment is omitted, and parts different from the connection structure according to the first embodiment are described herein.
As shown in
The second resin 30 and the plurality of insulating particles 40 are arranged between the first surface of the first member 102 and the second surface of the second member 112. The second resin 30 and the plurality of insulating particles 40 are arranged in a region not between the opposing first electrode 110 and second electrode 114. The second resin 30 and the plurality of insulating particles 40 are arranged between a region other than the first electrode of the first surface and a region other than the second electrode of the second surface. That is, the second resin 30 and the plurality of insulating particles 40 are arranged between the plurality of first electrodes 110 adjacent in the surface direction (D2-D3 surface direction) and on the periphery thereof (between the plurality of second electrodes 114 adjacent in the surface direction and on the periphery thereof). Furthermore, the second resin 30 and the insulating particles 40 are also arranged between the first electrode 110 and the second electrode 114 and in a region other than the region where the conductive particles 10 and the first resin 20 are arranged. The second resin 30 and the insulating particles 40 are arranged between the regions adjacent in the surface direction (D2-D3 surface direction) where the plurality of conductive particles 10 and the first resin 20 are arranged and on the periphery thereof. The plurality of insulating particles 40 are dispersed in the second resin 30. When viewed in the opposing direction (D1 direction) of the electrodes, the plurality of respective conductive particles 10 are surrounded by the first resin 20, and the respective insulating particles 40 are surrounded by the second resin 30. Furthermore, the conductive particles 10 and the first resin 20 are surrounded by the second resin 30 and the insulating particles 40 in the surface direction (D2-D3 surface direction).
The plurality of insulating particles 40 are arranged in the surface direction (D2-D3 surface direction) between the opposing first surface and second surface in a region other than the region where the conductive particles 10 and the first resin 20 are arranged. One insulating particle 40 is arranged between the opposing first surface and second surface in the opposing direction (D1 direction) of the first surface and the second surface in a region other than the region where the conductive particles 10 and the first resin 20 are arranged. The respective insulating particles 40 may be in contact with the opposing first surface and second surface. The insulating particles 40 may be pressured and deformed in the opposing direction (D1 direction) of the electrodes between the first surface and the second surface. With a stress provided among the first surface, the insulating particles 40, and the second surface, a stress among the first electrode 110, the conductive particles 10, and the second electrode 114 can be dispersed, and reliability of the connection structure 100a is further improved.
The insulating particle 40 included in the connection structure 100a may have a spherical shape. The diameter (longitudinal diameter) of the insulating particle 40 when viewed in the opposing direction (D1 direction) of the electrodes is in a range between a value equal to or larger than 0.1 μm and a value equal to or smaller than 10 μm. The material of the insulating particle 40 is not limited to particular materials, and any can be selected as appropriate for use from among known insulating particles. The diameter (longitudinal diameter) of the insulating particle 40 can be selected as appropriate from values in the above-described range, depending on the size of the conductive particle 10, the materials and viscosities of the first composite 20′ and the second composite 30′, the method for manufacturing connection structure, and so forth.
While the insulating particle 40 included in the connection structure 100a has a spherical shape in
As for the concentration of the insulating particles 40 arranged between the opposing first surface and second surface in the region other than the region where the conductive particles 10 and the first resin 20 are arranged when viewed in the opposing direction (D1 direction) of the electrodes is preferably in a range between a value equal to or larger than 10 volume % and a value equal to or smaller than 50 volume % with respect to a total volume of the insulating particles 40 and the second composite 30′. This arrangement can prevent a short circuit between the plurality of first electrodes 110 adjacent in the surface direction (D2-D3 surface direction), between the plurality of second electrodes 114 adjacent in the surface direction (D2-D3 surface direction), and between the first electrode 110 and the second electrode 114 not opposed to each other. Also, a flow of the conductive particles 10 mixed into the first composite 20′ is inhibited, and the conductive particles 10 can be efficiently arranged between the first electrode 110 and the second electrode 114. Therefore, insulation reliability and connection reliability of the connection structure 100a can be ensured.
A method for manufacturing connection structure according to one embodiment of the present invention is the same as the method for manufacturing connection structure according to the first embodiment except that a mixture of the plurality of insulating particles 40 and the second composite 30′ is arranged in place of the second composite 30′. The same description as that of the first embodiment is omitted, and parts different from the methods for manufacturing connection structure according to the first embodiment are described herein. Also, the present embodiment is not limited to this, and can be applied to the second to fourth embodiments.
The plurality of insulating particles 40 and the second composite 30′ are mixed, and are arranged by using an offset printing scheme. Since the mixture of the insulating particles 40 and the second composite 30′ contains the insulating particles 40, a pad printing scheme of transferring a printed matter by using a pad is particularly preferable.
As for the concentration of the insulating particles 40 mixed into the second composite 30′, the insulating particles 40 is preferably in a range between a value equal to or larger than 10 volume % and a value equal to or smaller than 50 volume % with respect to a total volume of the insulating particles 40 and the second composite 30′. If the mixing amount of the insulating particles 40 is smaller than 10 volume %, it is difficult to arrange a sufficient number of insulating particles 40. If the mixing amount of the insulating particles 40 is larger than 50 volume %, operability is degraded, and it is difficult to arrange the mixture of the insulating particles 40 and the second composite 30′. A method of arranging the mixture of the plurality of insulating particles 40 and the second composite 30′ is the same as the method of arranging the mixture of the plurality of conductive particles 10 and the first composite 20′, and is thus omitted herein.
According to the present embodiment, a connection structure and its method for manufacturing can be provided capable of ensuring conductivity between the opposing electrodes with a simple process and reducing a short circuit between adjacent connection electrodes, even if the electrodes arranged on the electronic component have high fineness and high density.
The configuration of a connection structure according to a sixth embodiment is the same as the configuration of the connection structure according to the first embodiment except that the conductive nanoparticles 50 are further contained in the region where the first resin 20 is arranged. The same description as that of the first embodiment is omitted, and parts different from the connection structure according to the first embodiment are described herein.
As shown in
The plurality of conductive particles 10, the plurality of conductive nanoparticles 50 and the first resin 20 are arranged between the opposing first electrode 110 and second electrode 114. The plurality of conductive particles 10 and the plurality of conductive nanoparticles 50 are arranged between the opposing first electrode 110 and second electrode 114 in the surface direction (D2-D3 surface direction). One conductive particle 10 and the plurality of conductive nanoparticles 50 are arranged between the opposing first electrode 110 and second electrode 114 in the opposing direction (D1 direction) of the electrodes. The respective conductive particles 10 may be in contact with the plurality of conductive nanoparticles 50 and the opposing first electrode 110 and second electrode 114. As shown in
The plurality of conductive particles 10 and the plurality of conductive nanoparticles 50 are dispersed in the first resin 20 between the first electrode 110 and the second electrode 114. The respective conductive nanoparticles 50 and conductive particles 10 are surrounded by the first resin 20 between the first electrode 110 and the second electrode 114. The first resin 20 is an insulating resin. Thus, the connection structure 100b has insulation properties in the surface direction (D2-D3 surface direction). However, the plurality of conductive particles 10 and the plurality of conductive nanoparticles 50 arranged between the opposing first electrode 110 and second electrode 114 and adjacent in the surface direction (D2-D3 surface direction) may be in contact with each other. When the conductive particles 10 and the plurality of conductive nanoparticles 50 adjacent in the surface direction (D2-D3 surface direction) are in contact with each other, electrical connection of adjacent conductive particles 10 can be improved. This arrangement allows the conductive particles 10 and the conductive nanoparticles 50 to further reliably connect the opposing first electrode 110 and second electrode 114 electrically.
The conductive nanoparticle 50 included in the connection structure 100b may have a spherical shape. The diameter of the conductive nanoparticle 50 may be in a range between a value equal to or larger than 10−3 μm and a value equal to or smaller than 10−1 μm. As a material of the conductive nanoparticles 50, any can be selected as appropriate from among known conductive particles for use. As the material of the conductive nanoparticles 50, Ni-based nanoparticles less prone to oxidation and with less migration are preferable, but the material may be Cu-based nanoparticles. The material may be nanoparticles in a core and shell configuration formed of a Cu-based metal as a core and a Ni-based metal as a shell. The diameter and material of the conductive nanoparticle 50 can be selected as appropriate from values in the above-described range, depending on the size and material of the conductive particle 10, the materials and viscosities of the first composite 20′ and the second composite 30′, the method for manufacturing connection structure, and so forth.
A method for manufacturing connection structure according to one embodiment of the present invention is the same as the method for manufacturing connection structure according to the first embodiment except that a mixture of the plurality of conductive particles 10, the plurality of conductive nanoparticles 50, and the first composite 20′ is arranged in place of the plurality of conductive particles 10 and the first composite 20′. The same description as that of the first embodiment is omitted, and parts different from the methods for manufacturing connection structure according to the first embodiment are described herein. Also, the present embodiment is not limited to this, and can be applied to the second to fourth embodiments.
The plurality of conductive particles 10, the plurality of conductive nanoparticles 50, and the first composite 20′ are mixed, and are arranged by using an offset printing scheme. Since the mixture of the plurality of conductive particles 10, the plurality of conductive nanoparticles 50, and the first composite 20′ contains the conductive particles 10, a pad printing scheme of transferring a printed matter by using a pad is particularly preferable.
As for the concentration of the conductive nanoparticles 50 mixed into the first composite 20′, the conductive nanoparticles 50 is preferably in a range between a value equal to or larger than 0.1 weight % and a value equal to or smaller than 10 weight % with respect to a total volume of the plurality of conductive particles 10, the plurality of conductive nanoparticles 50, and the first composite 20′. If the mixing amount of the conductive nanoparticles 50 is smaller than 0.1 weight %, it is difficult to arrange a sufficient number of conductive nanoparticles 50. If the mixing amount of the conductive nanoparticles 50 is larger than 10 weight %, operability is degraded, and it is difficult to arrange the mixture of the plurality of conductive particles 10, the plurality of conductive nanoparticles 50, and the first composite 20′. A method of arranging the mixture of the plurality of conductive particles 10, the plurality of conductive nanoparticles 50, and the first composite 20′ is the same as the method of arranging the mixture of the plurality of conductive particles 10 and the first composite 20′, and is thus omitted herein.
According to the present embodiment, a connection structure and a method for manufacturing connection structure can be provided that can ensure conductivity between the opposing electrodes with a simple process and can reduce a short circuit between adjacent connection electrodes, even if the electrodes arranged on the electronic component have high fineness and high density.
The present invention is not limited to the above-described embodiments, and can be modified as appropriate in a range not deviating from the gist of the invention. Also, the embodiments can be combined as appropriate.
As shown in the first to sixth examples, according to one embodiment of the present invention, even if the electrodes arranged on the electronic components have high fineness and high density, conductivity between opposing electrodes is ensured with simple process, and a short circuit between adjacent electrodes can be reduced.
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