A socket for testing or burning-in electronic components has a cover including a heat sink and a sensor. The heat sink and sensor are spring loaded so they make direct, temporary contact to an electronic component in the socket during burn-in. A heat transferring device is coupled to each heat sink. The heat transferring device uses input from the sensor to provide heat or cooling to each heat sink to individually control the temperature of each component. The heat transferring device can be an electric heater or a cooling device, such as a fan. Both can also be used. A plurality of these sockets are used in a forced air convective oven for burning-in a plurality of electronic components at one time. The oven provides oven heating and cooling for all components while the socket heater and sensor provide individual temperature control for each component.
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1. An apparatus for burning-in a plurality of electronic components dissipating high power, comprising:
a chamber having a chamber temperature controller; and a plurality of assemblies for burning-in components in said chamber, each assembly comprising: a socket for temporarily holding one of the components during burn-in; a heat sink for pressing in temporary direct physical contact with the component in said socket; a temperature sensor for sensing temperature of the component in said socket; and a heat transferring device positioned to transfer heat to or from said heat sink; wherein said heat sink further comprises a first separate mechanical forcer for forcing said temperature sensor into contact with said component. 36. A method of burning-in a plurality of electronic components dissipating high power, the method comprising the steps of:
a) providing a chamber having a chamber temperature controller; b) providing a plurality of assemblies for burning-in components in said chamber, each assembly comprising: a socket for temporarily holding the component during burn-in; a heat sink for pressing in temporary direct physical contact with the component in said socket; a temperature sensor for sensing temperature of the component in said socket; a heat transferring device positioned to transfer heat to or from said heat sink; wherein said heat sink further comprises a separate mechanical forcer for forcing said temperature sensor into contact with said component; c) enabling said chamber temperature controller to provide a specified chamber temperature; d) enabling said heat transferring devices to transfer heat to or from said components through said heat sink; and e) burning in said components.
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This invention generally relates to testing and burning in semiconductor components. More particularly, it relates to apparatus for controlling the temperature of high power electronic components during test or burn-in. Even more particularly, it relates to apparatus that can burn-in components dissipating substantially different amounts of power while providing each component at the same temperature.
Electronic components are operated at high temperature and voltage conditions during burn-in to weed out defective components and to establish increased reliability for those that pass. To provide the high temperature, components have been mounted in sockets on boards and the boards loaded with components mounted in forced air convection ovens. The ovens themselves are designed to provide a reasonably uniform temperature profile in all portions of the oven. When burning in relatively low power parts the oven temperature is set to approximately equal the desired burn in temperature. Higher power parts are usually burned in by decreasing the oven temperature so that self heating of the components brings them back up to the desired burn in temperature. The amount of self heating that a component experiences during burn in can be calculated by multiplying the part power (watts) by the device to air thermal resistance of the socket (degrees C per watt).
However, when high power dissipating components are operated in a low temperature oven, the variation in dissipation among the components causes substantial variation in the temperature actually experienced by the different components in the oven. Thus, the different components experience different burn-in stress temperatures depending on the heat each component and its neighbors dissipate. Also, parts have been found to vary in temperature as a result of unavoidable variation in airflow velocity and temperature in the oven.
Various systems attempting to burn-in high power components at a more uniform temperature have been disclosed. Tower systems, in which components are individually heated while nearby supporting electronics operates at low temperature, have suffered from high thermal resistance and low throughput. Liquid cooled systems have advantageously low thermal resistance, and can therefore dissipate large amounts of heat. They also have nearby control electronics that operates at low temperature. However, liquid cooled systems suffer greatly from very high cost and low throughput as compared to standard forced air convection oven systems. Thus, a better solution is needed that provides a system in which the temperature of each module can be precisely controlled without adding substantially to cost and without reducing throughput, and this solution is provided by the following invention.
It is therefore an object of the present invention to provide apparatus for burning-in large numbers of high power modules while precisely measuring and controlling the temperature of each module.
It is a further object of the present invention that the apparatus can be adapted to conventional forced air convection ovens so as to extend the usefulness of conventional ovens to high power components.
It is a further object of the present invention that the heat sink assembly can be used to control the temperature of an individual component during module test or during burn-in.
It is a feature of the present invention that apparatus includes a heat sink for temporary contact with the electronic component during burn-in, a sensor in direct contact with the electronic component and isolated from the heat sink, and a heat transferring device having input from the sensor for providing or removing heat to obtain a predetermined temperature for the component.
It is a feature of the present invention that the component to air thermal resistance through the heat sink is exceptionally low, allowing for burn in of high power parts at relatively high air temperature.
It is a feature of one embodiment of the present invention that the heat transferring device is an electrical resistance heater in direct contact with the heat sink.
It is a feature of another embodiment of the present invention that the heat transferring device comprises a cooling device.
It is a feature of this embodiment of the present invention that the cooling device for each heat sink is a fan directing air flow on that heat sink.
It is an advantage of the present invention components operate at the same temperature independent of variation in dissipation, airflow velocity and airflow temperature.
These and other objects, features, and advantages of the invention are accomplished by providing an apparatus for burning-in a plurality of electronic components dissipating high power. The apparatus comprises a chamber having a chamber temperature controller and a plurality of assemblies for burning-in components in the chamber. Each assembly comprises a socket for temporarily holding one of the components during burn-in; a heat sink for pressing in temporary direct contact with the component in the socket; a temperature sensor for sensing temperature of the component in the socket; and a heat transferring device positioned to transfer heat to or from the heat sink.
The temperature controller is a heating device, such as an electric heater or a cooling device, such as a fan. It can also be a thermoelectric device or an air or liquid impingement device. The ambient temperature in the oven is established so that the individual temperature controllers for each component can bring all components to the same specified temperature.
The foregoing and other objects, features, and advantages of the invention will be apparent from the following detailed description of the invention, as illustrated in the accompanying drawings, in which:
A convection burn-in oven has a plurality of burn-in boards, each board having a plurality of sockets for electrically contacting many electronic components at one time. To overcome variation in temperature produced, for example, as a result of differences in dissipation by each of the modules in the oven, each socket is equipped with a socket cover including a heat sink and a sensor. The heat sink and sensor are spring loaded so they make direct, temporary contact to an electronic component in the socket during burn-in. A heat transferring device is coupled to each heat sink. A temperature controller uses input from the sensor to provide heat or cooling from the heat transferring device to each heat sink to individually control the temperature each component.
The heat transferring device is either a heater or a cooling device. The heater is most simply an electric heater, but it can also be a radiant laser heater. The cooling device is most simply a fan. The heater or cooler can also be a thermoelectric device. It can also be a fluid impingement device for directing a cooling flow of gas or liquid at the heat sink. Thus, while the convection oven provides controlled temperature air flow to heat or cool all the components in the chamber, each heat transferring device individually tailors the heat flow to or from each component to provide that all of the components are operating at the same temperature. Thus, wide variation in temperature among the components in the convection oven as a result, for example, of their widely varying dissipation, is overcome, and all components are individually controlled to operate during burn-in at a uniform temperature.
Heat sink 20 having thin film heater 22 and pedestal 24 having recess 26 is shown in cross sectional view in
Electronic component 32 includes semiconductor integrated circuit chip 50 mounted on substrate 52 having contacts pins 54. Limiting the force is important if chip 50 is mounted with C4 connectors. Substrate 52 is commonly formed of a material such as ceramic, semiconductor, organic, or a metal lead frame. Socket cover 28 includes pressure plate 56 that pushes down on substrate 52 when cover 28 is latched to socket base 42. The force provided by plate 56 must be sufficient to push contacts 54 into good electrical contact with contactors 55 in socket base 42 so that good electrical contact is maintained there between during elevated temperature burn-in, and typically a force in the range from about 30 to 100 pounds is needed. Thus, cover 28 of socket 30 includes provision of three independent forces: (a) pressure plate 56 to substrate 52 to provide electrical contact between IC chip 50 and socket 30; (b) heat sink 20 to IC chip 50 to provide a thermal path for heat flow between IC chip 50 and heat sink 20; and (c) sensor 38 to IC chip 50 to provide an accurate measurement of component temperature. Providing pressures on IC chip 50 independently of pressure on substrate 52 reduces the chance of damage to IC chip 50 and to its connectors, providing substantial advantage.
The invention can be adapted to others kinds of sockets or contactor assemblies. For example, cover arm 36 and spring 34 can be replaced with a flat bar of appropriate dimensions to provide the spring force. The invention can be adapted to a wide range of available sockets including sockets that do not have pivoting covers. The invention can be attached using other mechanical fasteners, such as latches or clamps. Also, heat sink 20 does not have to be connected to pressure plate 56; heat sink 20 can be separately attached to burn-in board 48 or socket base 42.
A preferred embodiment of sensor 38 and its mounting is illustrated in
Each wire 80' from RTD38' is soldered to two traces 83 on thin film heater 22 at solder joint 85, as shown in
Providing wires 80' extending through hole 81 through the side of pedestal 24 (
Pedestal 24 can have length and width dimensions equal or larger than chip 50 to provide the largest area of thermal contact with chip 50 and to provide a surface applicable to chips of any size, as shown in
Burn-in board 48 is a printed circuit board on which are mounted many sockets 30, as shown in
Burn-in system 74 also includes driver boards 76 that provide power and stimulation patterns to electronic components 32 and individual device temperature controller signals to heater 22. Oven electronics and driver boards 76 are located outside chamber 60 (see
Heater 22 can be replaced with heat sink fan 90 as shown in
Of course, heater 22 and fan 90 can both be coupled to heat sink 20, as shown in
In preparation for performing burn-in, components 32 are first loaded on burn-in boards 48 and plugged into burn-in chamber 60. The next series of steps for performing the burn-in operation on a large number of components in chamber 60 are shown in the flow charts of
Preferably chamber-heater 70 provides chamber 60 at a temperature so that all components need at least a small amount of heat from their individual chip heaters 22. An over temperature alarm or an automatic control is provided if components 32 are running too hot. In this case, chamber heater 70 is adjusted to provide a sufficiently low temperature in the chamber so no component is running too hot. Similarly, in the case where individual chip coolers 90 are used, chamber temperature is set so that no component is running too cool and so all components need at least some cooling with their individual fans 90.
The exact chamber ambient temperature required will depend on factors such as the type of temperature controller, component power dissipation, type of socket and the variations in component power, airflow velocity, and air temperature in the chamber. The chamber set point temperature can be determined experimentally for a certain class of products or can be adjusted in real time during the burn-in run based on feedback from the chip temperature sensors. In this way, each component is individually controlled and differences in temperature as a result of differences in dissipation are avoided while active chamber heating and cooling improve throughput, reduce demand on individual heaters or fans, and lower cost.
The present inventors have designed and built a socket having a heat sink that has the same vertical dimension as a standard socket without a heat sink. The socket also has a thermocouple temperature sensor and a forcing plate, each providing a separate force, as described herein above. With these sockets mounted on burn-in boards, substantial additional temperature control over individual components is achieved without lowering the number of components that can fit in the chamber for burn-in. For high dissipation components a larger heat sink can be used, and to the extent a taller heat sink is needed, oven loading is reduced.
While several embodiments of the invention, together with modifications thereof, have been described in detail herein and illustrated in the accompanying drawings, it will be evident that various further modifications are possible without departing from the scope of the invention. For example, alternate methods of cooling can be used, such as blowing cold air or liquid individually on each part. Nothing in the above specification is intended to limit the invention more narrowly than the appended claims. The examples given are intended only to be illustrative rather than exclusive.
Gardell, David L., LaForce, Mark R., Fredeman, John A., Knox, Marc D.
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Mar 25 1999 | KNOX, MARC D | International Business Machines Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 009856 | /0385 | |
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