There exists a tradeoff between the fidelity of data storage and the number of bits stored in a memory cell. The number of bits may be increased per cell when fidelity is less important. The number of bits per cell may be decreased when fidelity is more important. A memory, in some embodiments, may change between storage modes on a cell by cell basis.
|
19. A method comprising:
storing data at a first density in a first cell in a first memory; storing data at a second density in a second cell in the first memory; and changing a number orbits stored per cell on the fly.
1. A method comprising:
storing data at a first density in a first cell in a first memory array; storing data at a second density in a second cell in the first memory array; changing the number bits stored per cell on the fly.
45. A memory comprising:
a memory array including a first and second cell; and a controller coupled to said array to store data in said array at a first density in a first cell and to store data at a second density in a second cell, and to store data at levels that are spaced from one another in said cells.
48. A method comprising:
storing data at a first density in a first cell in a first memory array; storing data at a second density in a second cell in a first memory array; and storing data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
29. A memory comprising:
a memory array including a first and second cell; and a controller coupled to said array to store data in said array at a first density in the first cell and to store data at a second density in the second cell, wherein said controller changes a number of bits stored per cell on the fly.
12. A memory comprising:
a memory array including a first and second cell; and a controller coupled to said array to store data in said array at a first density in the first cell and to store data at a second density in the second cell wherein said controller changes the number of bits stored per cell on the fly.
7. An article comprising a medium storing instructions, that, if executed, enable a processor-based system to:
store data at a first density in a first cell in a first memory array; store data at a second density in a second cell in said first memory array; and change the number of bits stored per cell on the fly.
39. A method comprising:
storing data at a first density in a first cell in a first memory array; storing data at a second density in a second cell in the first memory array, so that fewer bits per cell are stored in one of said first and second cells; storing data at levels which are spaced from one another in said cells.
42. An article comprising a medium storing instructions that, if executed, enable a processor-based system to:
store data at a first density in a first cell in a first memory array; store data in a second density in a second cell in said first memory array; and store data at levels that are spaced from one another in said cell.
24. An article comprising a medium storing instructions that enable a processor-based system to:
store data at a first density in a first cell in a first memory; store data at a second density in a second cell in said first memory; and store instructions that enable the processor-based system to change a number of bits stored per cell on the fly.
54. A memory comprising:
a memory array including a first and second cell; and a controller coupled to said array to store data in said array at a first density in the first cell and to store data at a second density in the second cell and to store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
35. A memory comprising:
a memory array including a first and second cell; and a controller coupled to said array to store data in said array at a first density in the first cell and to store data at a second density in the second cell and to store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
51. An article comprising a medium storing instructions that, if executed, enable a processor-based system to:
store data at a first density in a first cell in a first memory array; store data at a second density in a second cell in said first memory array; and store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
21. A method comprising:
storing data at a first density in a first cell in a first memory; storing data at a second density in a second cell in the first memory, including storing fewer bits per cell in one of said first or second cells; and storing data at levels which are spaced from one another in at least one of said first cell and said second cell in order to improve read fidelity.
26. An article comprising a medium storing instructions that enable a processor-based system to:
store data at a first density in a first cell in a first memory; store data at a, second density in a second cell in said first memory; and store fewer bits per cell in one of said first or second cells; and store data at levels which are spaced from one another in said cell in order to improve read fidelity.
2. The method of
4. The method of
5. The method of
6. The method of
8. The article of
9. The article of
10. The article of
11. The article of
15. The memory of
16. The memory of
17. The memory of
18. The memory of
20. The method of
22. The method of
23. The method of
25. The article of
27. The article of
28. The article of
30. The memory of
31. The memory of
34. The memory of
38. The memory of
40. The method of
41. The method of
43. The article of
44. The article of
46. The memory of
47. The memory of
49. The method of
52. The article of
53. The article of
55. The memory of
56. The memory of
|
This invention relates generally to memory devices and particularly to memory devices with a multi-level cell architecture.
A multi-level cell memory is comprised of multi-level cells, each of which is able to store multiple charge states or levels. Each of the charge states is associated with a memory element bit pattern.
A flash EEPROM memory cell, as well as other types of memory cells, is configurable to store multiple threshold levels (Vt). In a memory cell capable of storing two bits per cell, for example, four threshold levels (Vt) are used. Consequently, two bits are designated for each threshold level. In one embodiment, the multi-level cell may store four charge states. Level three maintains a higher charge than level two. Level two maintains a higher charge than level one and level one maintains a higher charge than level zero. A reference voltage may separate the various charge states. For example, a first voltage reference may separate level three from level two, a second voltage reference may separate level two from level one and a third reference voltage may separate level one from level zero.
A multi-level cell memory is able to store more than one bit of data based on the number of charge states. For example, multi-level cell memory that can store four charge states can store two bits of data, a multi-level cell memory that can store eight charge states can store three bits of data, and a multi-level cell memory that can store sixteen charge states can store four bits of data. For each of the N-bit multi-level cell memories, various memory element bit patterns can be associated with each of the different charge states.
The number of charge states storable in a multi-level cell, however, is not limited to powers of two. For example, a multi-level cell memory with three charge states stores 1.5 bits of data. When this multi-level cell is combined with additional decoding logic and coupled to a second similar multi-level cell, three bits of data are provided as the output of the two-cell combination. Various other multi-level cell combinations are possible as well.
The higher the number of bits per cell, the greater the possibility of read errors. Thus, a four bit multi-level cell is more likely to experience read errors than a one bit cell. The potential for read errors is inherent in the small differential voltages used to store adjacent states. If the stored data is potentially lossy, sensitive data stored in relatively high-density multi-level cells may be subject to increased error rates.
In many applications, the nonvolatile memories store a large amount of data that is tolerant to a small number of bit errors. Applications may also have a small amount of data that is not tolerant to bit errors. Examples of such applications may include control structures, header information, to mention a few examples. These typical applications, where a relatively small amount of the overall storage requires higher fidelity, may include digital audio players, digital cameras, digital video recorders, to mention a few examples.
Thus, there is a need for a way to store a large amount of data in dense multi-level cells while ensuring that sensitive data is stored in a fashion that sufficiently reduces the possibility of read errors.
Referring to
Although embodiments are described in conjunction with a memory array 150 storing one, two or four bits per cell, any number of bits may be stored in a single cell, for example, by increasing the number of threshold levels, without deviating from the spirit and scope of the present invention. Although embodiments of the present invention are described in conjunction with a memory array 150 of flash cells, other cells such as read only memory (ROM), erasable programmable read only memory (EPROM) conventional electrically erasable programmable read only memory (EEPROM), or dynamic random access memory (DRAM), to mention a few examples, may be substituted without deviating from the spirit and scope of the present invention.
Referring to
Thus, in some embodiments of the present invention, the number of bits per cell may be changed to increase the fidelity of the stored data. Thus, if density is more important than fidelity, the scheme shown in
Thus, in the embodiment shown in
Thus, in some embodiments, data may be stored in varying numbers of bits per cell depending on the type of data involved. Thus, some data may be packed closely as indicated for example in FIG. 4 and other data may be spread farther apart, requiring additional numbers of cells to complete the data storage.
Thus, turning to
The read process simply reverses the flow, ignoring the missing levels, and simply reading the actual data out of each cell. The spread apart data may then be repacked into a continuous data string.
While the present invention has been described with respect to a limited number of embodiments, those skilled in the art will appreciate numerous modifications and variations therefrom. It is intended that the appended claims cover all such modifications and variations as fall within the true spirit and scope of this present invention.
Rudelic, John C., Fackenthal, Richard E.
Patent | Priority | Assignee | Title |
11556416, | May 05 2021 | Apple Inc. | Controlling memory readout reliability and throughput by adjusting distance between read thresholds |
11847342, | Jul 28 2021 | Apple Inc. | Efficient transfer of hard data and confidence levels in reading a nonvolatile memory |
7593263, | Dec 17 2006 | Apple Inc | Memory device with reduced reading latency |
7697326, | May 12 2006 | Apple Inc | Reducing programming error in memory devices |
7743230, | Jan 31 2003 | MORGAN STANLEY SENIOR FUNDING | Memory array programming circuit and a method for using the circuit |
7751240, | Jan 24 2007 | Apple Inc | Memory device with negative thresholds |
7773413, | Oct 08 2007 | Apple Inc | Reliable data storage in analog memory cells in the presence of temperature variations |
7821826, | Oct 30 2006 | Apple Inc | Memory cell readout using successive approximation |
7864573, | Feb 24 2008 | Apple Inc | Programming analog memory cells for reduced variance after retention |
7881107, | Jan 24 2007 | Apple Inc | Memory device with negative thresholds |
7900102, | Dec 17 2006 | Apple Inc | High-speed programming of memory devices |
7924587, | Feb 21 2008 | Apple Inc | Programming of analog memory cells using a single programming pulse per state transition |
7924613, | Aug 05 2008 | Apple Inc | Data storage in analog memory cells with protection against programming interruption |
7924648, | Nov 28 2006 | Apple Inc | Memory power and performance management |
7925936, | Jul 13 2007 | Apple Inc | Memory device with non-uniform programming levels |
7975192, | Oct 30 2006 | Apple Inc | Reading memory cells using multiple thresholds |
7995388, | Aug 05 2008 | Apple Inc | Data storage using modified voltages |
8000135, | Sep 14 2008 | Apple Inc | Estimation of memory cell read thresholds by sampling inside programming level distribution intervals |
8000141, | Oct 19 2007 | Apple Inc | Compensation for voltage drifts in analog memory cells |
8001320, | Apr 22 2007 | Apple Inc | Command interface for memory devices |
8050086, | May 12 2006 | Apple Inc | Distortion estimation and cancellation in memory devices |
8059457, | Mar 18 2008 | Apple Inc | Memory device with multiple-accuracy read commands |
8060806, | Aug 27 2006 | Apple Inc | Estimation of non-linear distortion in memory devices |
8068360, | Oct 19 2007 | Apple Inc | Reading analog memory cells using built-in multi-threshold commands |
8085586, | Dec 27 2007 | Apple Inc | Wear level estimation in analog memory cells |
8116133, | May 15 2006 | Apple Inc. | Maintenance operations for multi-level data storage cells |
8145984, | Oct 30 2006 | Apple Inc | Reading memory cells using multiple thresholds |
8151163, | Dec 03 2006 | Apple Inc | Automatic defect management in memory devices |
8151166, | Jan 24 2007 | Apple Inc | Reduction of back pattern dependency effects in memory devices |
8156398, | Feb 05 2008 | Apple Inc | Parameter estimation based on error correction code parity check equations |
8156403, | May 12 2006 | Apple Inc | Combined distortion estimation and error correction coding for memory devices |
8169825, | Sep 02 2008 | Apple Inc | Reliable data storage in analog memory cells subjected to long retention periods |
8174857, | Dec 31 2008 | Apple Inc | Efficient readout schemes for analog memory cell devices using multiple read threshold sets |
8174905, | Sep 19 2007 | Apple Inc | Programming orders for reducing distortion in arrays of multi-level analog memory cells |
8208304, | Nov 16 2008 | Apple Inc | Storage at M bits/cell density in N bits/cell analog memory cell devices, M>N |
8209588, | Dec 12 2007 | Apple Inc | Efficient interference cancellation in analog memory cell arrays |
8225181, | Nov 30 2007 | Apple Inc | Efficient re-read operations from memory devices |
8228701, | Mar 01 2009 | Apple Inc | Selective activation of programming schemes in analog memory cell arrays |
8230300, | Mar 07 2008 | Apple Inc | Efficient readout from analog memory cells using data compression |
8234545, | May 12 2007 | Apple Inc | Data storage with incremental redundancy |
8238157, | Apr 12 2009 | Apple Inc | Selective re-programming of analog memory cells |
8239734, | Oct 15 2008 | Apple Inc | Efficient data storage in storage device arrays |
8239735, | May 12 2006 | Apple Inc | Memory Device with adaptive capacity |
8248831, | Dec 31 2008 | Apple Inc | Rejuvenation of analog memory cells |
8259497, | Aug 06 2007 | Apple Inc | Programming schemes for multi-level analog memory cells |
8259506, | Mar 25 2009 | Apple Inc | Database of memory read thresholds |
8261159, | Oct 30 2008 | Apple Inc | Data scrambling schemes for memory devices |
8270246, | Nov 13 2007 | Apple Inc | Optimized selection of memory chips in multi-chips memory devices |
8369141, | Mar 12 2007 | Apple Inc | Adaptive estimation of memory cell read thresholds |
8397131, | Dec 31 2008 | Apple Inc | Efficient readout schemes for analog memory cell devices |
8400858, | Mar 18 2008 | Apple Inc | Memory device with reduced sense time readout |
8429493, | May 12 2007 | Apple Inc | Memory device with internal signap processing unit |
8456905, | Dec 16 2007 | Apple Inc | Efficient data storage in multi-plane memory devices |
8479080, | Jul 12 2009 | Apple Inc | Adaptive over-provisioning in memory systems |
8482978, | Sep 14 2008 | Apple Inc | Estimation of memory cell read thresholds by sampling inside programming level distribution intervals |
8495465, | Oct 15 2009 | Apple Inc | Error correction coding over multiple memory pages |
8498151, | Aug 05 2008 | Apple Inc | Data storage in analog memory cells using modified pass voltages |
8527819, | Oct 19 2007 | Apple Inc | Data storage in analog memory cell arrays having erase failures |
8570804, | May 12 2006 | Apple Inc | Distortion estimation and cancellation in memory devices |
8572311, | Jan 11 2010 | Apple Inc | Redundant data storage in multi-die memory systems |
8572423, | Jun 22 2010 | Apple Inc | Reducing peak current in memory systems |
8595591, | Jul 11 2010 | Apple Inc | Interference-aware assignment of programming levels in analog memory cells |
8599611, | May 12 2006 | Apple Inc | Distortion estimation and cancellation in memory devices |
8645794, | Jul 31 2010 | Apple Inc | Data storage in analog memory cells using a non-integer number of bits per cell |
8677054, | Dec 16 2009 | Apple Inc | Memory management schemes for non-volatile memory devices |
8677203, | Jan 11 2010 | Apple Inc | Redundant data storage schemes for multi-die memory systems |
8694814, | Jan 10 2010 | Apple Inc | Reuse of host hibernation storage space by memory controller |
8694853, | May 04 2010 | Apple Inc | Read commands for reading interfering memory cells |
8694854, | Aug 17 2010 | Apple Inc | Read threshold setting based on soft readout statistics |
8767459, | Jul 31 2010 | Apple Inc | Data storage in analog memory cells across word lines using a non-integer number of bits per cell |
8832354, | Mar 25 2009 | Apple Inc | Use of host system resources by memory controller |
8856475, | Aug 01 2010 | Apple Inc | Efficient selection of memory blocks for compaction |
8924661, | Jan 18 2009 | Apple Inc | Memory system including a controller and processors associated with memory devices |
8949684, | Sep 02 2008 | Apple Inc | Segmented data storage |
9021181, | Sep 27 2010 | Apple Inc | Memory management for unifying memory cell conditions by using maximum time intervals |
9047211, | Mar 15 2013 | SanDisk Technologies, Inc | Managing data reliability |
9104580, | Jul 27 2010 | Apple Inc | Cache memory for hybrid disk drives |
9189386, | Feb 25 2010 | Apple Inc. | Dynamically allocating number of bits per cell for memory locations of a non-volatile memory |
9245616, | May 15 2006 | Apple Inc. | Dynamic cell state resolution |
9690656, | Feb 27 2015 | Microsoft Technology Licensing, LLC | Data encoding on single-level and variable multi-level cell storage |
9786386, | Feb 27 2015 | Microsoft Technology Licensing, LLC | Dynamic approximate storage for custom applications |
RE46346, | Oct 30 2006 | Apple Inc. | Reading memory cells using multiple thresholds |
Patent | Priority | Assignee | Title |
5424978, | Mar 15 1993 | Intellectual Ventures I LLC | Non-volatile semiconductor memory cell capable of storing more than two different data and method of using the same |
5515317, | Jun 02 1994 | Micron Technology, Inc | Addressing modes for a dynamic single bit per cell to multiple bit per cell memory |
5812447, | Aug 02 1995 | Sanyo Electric Co., Ltd. | Method and apparatus to write and/or read two types of data from memory |
6097637, | Jun 02 1994 | Intel Corporation | Dynamic single bit per cell to multiple bit per cell memory |
6097639, | Dec 31 1997 | LG Semicon Co., Ltd. | System and method for programming nonvolatile memory |
6363008, | Feb 17 2000 | SAMSUNG ELECTRONICS CO , LTD | Multi-bit-cell non-volatile memory with maximized data capacity |
EP788113, |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Sep 17 2001 | FACKENTHAL, RICHARD E | Intel Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 012180 | /0148 | |
Sep 17 2001 | RUDELIC, JOHN C | Intel Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 012180 | /0148 | |
Sep 18 2001 | Intel Corporation | (assignment on the face of the patent) | / | |||
Mar 25 2008 | Intel Corporation | NUMONYX B V | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 028055 | /0478 | |
Sep 30 2011 | NUMONYX B V | Micron Technology, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 027075 | /0682 | |
Apr 26 2016 | Micron Technology, Inc | U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT | SECURITY INTEREST SEE DOCUMENT FOR DETAILS | 038669 | /0001 | |
Apr 26 2016 | Micron Technology, Inc | MORGAN STANLEY SENIOR FUNDING, INC , AS COLLATERAL AGENT | PATENT SECURITY AGREEMENT | 038954 | /0001 | |
Apr 26 2016 | Micron Technology, Inc | U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT | CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001 ASSIGNOR S HEREBY CONFIRMS THE SECURITY INTEREST | 043079 | /0001 | |
Jun 29 2018 | U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT | Micron Technology, Inc | RELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS | 047243 | /0001 | |
Jul 03 2018 | MICRON SEMICONDUCTOR PRODUCTS, INC | JPMORGAN CHASE BANK, N A , AS COLLATERAL AGENT | SECURITY INTEREST SEE DOCUMENT FOR DETAILS | 047540 | /0001 | |
Jul 03 2018 | Micron Technology, Inc | JPMORGAN CHASE BANK, N A , AS COLLATERAL AGENT | SECURITY INTEREST SEE DOCUMENT FOR DETAILS | 047540 | /0001 | |
Jul 31 2019 | JPMORGAN CHASE BANK, N A , AS COLLATERAL AGENT | MICRON SEMICONDUCTOR PRODUCTS, INC | RELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS | 051028 | /0001 | |
Jul 31 2019 | MORGAN STANLEY SENIOR FUNDING, INC , AS COLLATERAL AGENT | Micron Technology, Inc | RELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS | 050937 | /0001 | |
Jul 31 2019 | JPMORGAN CHASE BANK, N A , AS COLLATERAL AGENT | Micron Technology, Inc | RELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS | 051028 | /0001 |
Date | Maintenance Fee Events |
Sep 15 2005 | ASPN: Payor Number Assigned. |
Apr 27 2007 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
Mar 23 2011 | M1552: Payment of Maintenance Fee, 8th Year, Large Entity. |
Dec 17 2013 | ASPN: Payor Number Assigned. |
Dec 17 2013 | RMPN: Payer Number De-assigned. |
Apr 22 2015 | M1553: Payment of Maintenance Fee, 12th Year, Large Entity. |
Date | Maintenance Schedule |
Nov 04 2006 | 4 years fee payment window open |
May 04 2007 | 6 months grace period start (w surcharge) |
Nov 04 2007 | patent expiry (for year 4) |
Nov 04 2009 | 2 years to revive unintentionally abandoned end. (for year 4) |
Nov 04 2010 | 8 years fee payment window open |
May 04 2011 | 6 months grace period start (w surcharge) |
Nov 04 2011 | patent expiry (for year 8) |
Nov 04 2013 | 2 years to revive unintentionally abandoned end. (for year 8) |
Nov 04 2014 | 12 years fee payment window open |
May 04 2015 | 6 months grace period start (w surcharge) |
Nov 04 2015 | patent expiry (for year 12) |
Nov 04 2017 | 2 years to revive unintentionally abandoned end. (for year 12) |