There exists a tradeoff between the fidelity of data storage and the number of bits stored in a memory cell. The number of bits may be increased per cell when fidelity is less important. The number of bits per cell may be decreased when fidelity is more important. A memory, in some embodiments, may change between storage modes on a cell by cell basis.

Patent
   6643169
Priority
Sep 18 2001
Filed
Sep 18 2001
Issued
Nov 04 2003
Expiry
Sep 18 2021
Assg.orig
Entity
Large
82
7
all paid
19. A method comprising:
storing data at a first density in a first cell in a first memory;
storing data at a second density in a second cell in the first memory; and
changing a number orbits stored per cell on the fly.
1. A method comprising:
storing data at a first density in a first cell in a first memory array;
storing data at a second density in a second cell in the first memory array;
changing the number bits stored per cell on the fly.
45. A memory comprising:
a memory array including a first and second cell; and
a controller coupled to said array to store data in said array at a first density in a first cell and to store data at a second density in a second cell, and to store data at levels that are spaced from one another in said cells.
48. A method comprising:
storing data at a first density in a first cell in a first memory array;
storing data at a second density in a second cell in a first memory array; and
storing data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
29. A memory comprising:
a memory array including a first and second cell; and
a controller coupled to said array to store data in said array at a first density in the first cell and to store data at a second density in the second cell, wherein said controller changes a number of bits stored per cell on the fly.
12. A memory comprising:
a memory array including a first and second cell; and
a controller coupled to said array to store data in said array at a first density in the first cell and to store data at a second density in the second cell wherein said controller changes the number of bits stored per cell on the fly.
7. An article comprising a medium storing instructions, that, if executed, enable a processor-based system to:
store data at a first density in a first cell in a first memory array;
store data at a second density in a second cell in said first memory array; and
change the number of bits stored per cell on the fly.
39. A method comprising:
storing data at a first density in a first cell in a first memory array;
storing data at a second density in a second cell in the first memory array, so that fewer bits per cell are stored in one of said first and second cells;
storing data at levels which are spaced from one another in said cells.
42. An article comprising a medium storing instructions that, if executed, enable a processor-based system to:
store data at a first density in a first cell in a first memory array;
store data in a second density in a second cell in said first memory array; and
store data at levels that are spaced from one another in said cell.
24. An article comprising a medium storing instructions that enable a processor-based system to:
store data at a first density in a first cell in a first memory;
store data at a second density in a second cell in said first memory; and
store instructions that enable the processor-based system to change a number of bits stored per cell on the fly.
54. A memory comprising:
a memory array including a first and second cell; and
a controller coupled to said array to store data in said array at a first density in the first cell and to store data at a second density in the second cell and to store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
35. A memory comprising:
a memory array including a first and second cell; and
a controller coupled to said array to store data in said array at a first density in the first cell and to store data at a second density in the second cell and to store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
51. An article comprising a medium storing instructions that, if executed, enable a processor-based system to:
store data at a first density in a first cell in a first memory array;
store data at a second density in a second cell in said first memory array; and
store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
21. A method comprising:
storing data at a first density in a first cell in a first memory;
storing data at a second density in a second cell in the first memory, including storing fewer bits per cell in one of said first or second cells; and
storing data at levels which are spaced from one another in at least one of said first cell and said second cell in order to improve read fidelity.
26. An article comprising a medium storing instructions that enable a processor-based system to:
store data at a first density in a first cell in a first memory;
store data at a, second density in a second cell in said first memory; and
store fewer bits per cell in one of said first or second cells; and
store data at levels which are spaced from one another in said cell in order to improve read fidelity.
2. The method of claim 1 wherein storing data at a second density in a second cell includes storing fewer bits per cell in one of said first or second cells.
3. The method of claim 1 including changing the number of bits stored per cell on the fly.
4. The method of claim 2 including storing data at levels which are spaced from one another in said cell in order to improve the read fidelity.
5. The method of claim 4 including storing data in a cell including a plurality of levels and filling less than all of said levels.
6. The method of claim 5 including storing data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
8. The article of claim 7 further storing instructions that enable the processor-based system to store fever bits per cell in one of said first or second cells.
9. The article of claim 8 further storing instructions that enable the processor-based system to store data at levels which are spaced from one another in said cell in order to improve the read fidelity.
10. The article of claim 9 further storing instructions that enable the processor-based system to store data in a cell including a plurality of levels and fill less than all of said levels.
11. The article of claim 10 further storing instructions that enable the processor-based system to store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
13. The memory of claim 12 wherein said memory is a flash memory.
14. The memory of claim 13 wherein said memory is a multi-level cell memory.
15. The memory of claim 12 wherein said controller stores fewer bits per cell in one of said first or second cells.
16. The memory of claim 12 wherein said controller stores data at levels that are spaced from one another in said cell in order to improve the read fidelity.
17. The memory of claim 16 wherein said controller stores data in a cell including a plurality of levels and fills less than all of the levels.
18. The memory of claim 12 wherein said controller stores data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
20. The method of claim 19 wherein storing data at a second density in a second cell includes storing fewer bits per cell in one of said first or second cells.
22. The method of claim 21 including storing data in a cell including a plurality of levels and tilling less than all of said levels.
23. The method of claim 22 including storing data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
25. The article of claim 24 further storing instructions that enable the processor-based system to store fewer bits per cell in one of said first or second cells.
27. The article of claim 26 further storing instructions that enable the processor-based system to store data in a cell including a plurality of levels and fill less than all of said levels.
28. The article of claim 27 further storing instructions that enable the processor-based system to store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
30. The memory of claim 29 wherein said controller stores data at levels that are spaced from one another in said cell in order to improve read fidelity.
31. The memory of claim 30 wherein said controller stores data in a cell including a plurality of levels and fills less than all of the levels.
32. The memory of claim 29 wherein said memory is a flash memory.
33. The memory of claim 32 wherein said memory is a multi-level cell memory.
34. The memory of claim 29 wherein said controller stores fewer bits per cell in one or said first or second cells.
36. The memory of claim 35 wherein said memory is a flash memory.
37. The memory of claim 36 wherein said memory is a multi-level cell memory.
38. The memory of claim 35 wherein said controller stores fewer bits per cell in one or said first or second cells.
40. The method of claim 39 including storing data in a cell including a plurality of levels filling less than all of the levels.
41. The method of claim 40 including storing data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
43. The article of claim 42 further storing instructions that, if executed, enable the processor-based system to store data in a cell including a plurality of levels that fills less of all of said levels.
44. The article of claim 43 further storing instructions that, if executed, enable the processor-based system to store data in regularly spaced levels within a cell while leaving intervening levels within the cell unoccupied by stored data.
46. The memory of claim 45 wherein said controller stores data in a cell including a plurality of levels that fills less than all of the levels.
47. The memory of claim 45 wherein said controller stores data in regularly spaced levels within a cell while leaving intervening levels within the cells unoccupied by stored data.
49. The method of claim 48 including storing data in a cell including a plurality of levels filling less than all said levels.
50. The method of claim 49 including changing the number of bits stored per cell on the fly.
52. The article of claim 51 further storing instructions that, if executed, enable a processor-based system to store data at levels which are spaced from one another in said cell in order to improve the read fidelity.
53. The article of claim 52 further storing instructions that, if executed, enable a processor-based system to change the number of bits stored per cell on the fly.
55. The memory of claim 54 wherein said controller stores data in a cell including a plurality of levels that fills less than all of the levels.
56. The memory of claim 55 wherein said controller changes the number of bits stored per cell on the fly.

This invention relates generally to memory devices and particularly to memory devices with a multi-level cell architecture.

A multi-level cell memory is comprised of multi-level cells, each of which is able to store multiple charge states or levels. Each of the charge states is associated with a memory element bit pattern.

A flash EEPROM memory cell, as well as other types of memory cells, is configurable to store multiple threshold levels (Vt). In a memory cell capable of storing two bits per cell, for example, four threshold levels (Vt) are used. Consequently, two bits are designated for each threshold level. In one embodiment, the multi-level cell may store four charge states. Level three maintains a higher charge than level two. Level two maintains a higher charge than level one and level one maintains a higher charge than level zero. A reference voltage may separate the various charge states. For example, a first voltage reference may separate level three from level two, a second voltage reference may separate level two from level one and a third reference voltage may separate level one from level zero.

A multi-level cell memory is able to store more than one bit of data based on the number of charge states. For example, multi-level cell memory that can store four charge states can store two bits of data, a multi-level cell memory that can store eight charge states can store three bits of data, and a multi-level cell memory that can store sixteen charge states can store four bits of data. For each of the N-bit multi-level cell memories, various memory element bit patterns can be associated with each of the different charge states.

The number of charge states storable in a multi-level cell, however, is not limited to powers of two. For example, a multi-level cell memory with three charge states stores 1.5 bits of data. When this multi-level cell is combined with additional decoding logic and coupled to a second similar multi-level cell, three bits of data are provided as the output of the two-cell combination. Various other multi-level cell combinations are possible as well.

The higher the number of bits per cell, the greater the possibility of read errors. Thus, a four bit multi-level cell is more likely to experience read errors than a one bit cell. The potential for read errors is inherent in the small differential voltages used to store adjacent states. If the stored data is potentially lossy, sensitive data stored in relatively high-density multi-level cells may be subject to increased error rates.

In many applications, the nonvolatile memories store a large amount of data that is tolerant to a small number of bit errors. Applications may also have a small amount of data that is not tolerant to bit errors. Examples of such applications may include control structures, header information, to mention a few examples. These typical applications, where a relatively small amount of the overall storage requires higher fidelity, may include digital audio players, digital cameras, digital video recorders, to mention a few examples.

Thus, there is a need for a way to store a large amount of data in dense multi-level cells while ensuring that sensitive data is stored in a fashion that sufficiently reduces the possibility of read errors.

FIG. 1 is a block depiction of one embodiment of the present invention;

FIG. 2 is a depiction of a cell in accordance with one embodiment of the present invention;

FIG. 3 is a depiction of another cell in accordance with another embodiment of the present invention;

FIG. 4 is a depiction of still another cell in accordance with one embodiment of the present invention; and

FIG. 5 is a flow chart for software in accordance with one embodiment of the present invention.

Referring to FIG. 1, a processor 100 may be coupled through a bus 102 to a multi-level cell memory 104. The memory 104 contains an interface controller 105, a write state machine 106 and a multi-level cell memory array 150. The processor 100 is coupled by the bus 102 to both the interface controller 105 and the memory array 150 in one embodiment of the present invention. The interface controller 105 provides control over the multi-level cell memory array 150. The write state machine 106 communicates with the interface controller 105 and the memory array 150. The interface controller 105 passes data to be written into the array 150 to the state machine 106. The state machine 106 executes a sequence of events to write data into the array 150. In one embodiment, the interface controller 105, the write state machine 106 and the multi-level cell memory array 150 are located on a single integrated circuit die.

Although embodiments are described in conjunction with a memory array 150 storing one, two or four bits per cell, any number of bits may be stored in a single cell, for example, by increasing the number of threshold levels, without deviating from the spirit and scope of the present invention. Although embodiments of the present invention are described in conjunction with a memory array 150 of flash cells, other cells such as read only memory (ROM), erasable programmable read only memory (EPROM) conventional electrically erasable programmable read only memory (EEPROM), or dynamic random access memory (DRAM), to mention a few examples, may be substituted without deviating from the spirit and scope of the present invention.

Referring to FIG. 2, a cell may include only one bit of data at the first and last states of the cell. In the embodiments shown in FIGS. 2, 3 and 4, the actual storage of data is indicated by an X and empty states are indicated by dashes. A similarly sized cell, shown in FIG. 3, may store two bits per cell at every fifth level within the cell. Likewise, as shown in FIG. 4, the same sized cell may store four bits per cell using every single state or level of the sixteen available states in this example.

Thus, in some embodiments of the present invention, the number of bits per cell may be changed to increase the fidelity of the stored data. Thus, if density is more important than fidelity, the scheme shown in FIG. 4 or other higher density schemes may be utilized. Conversely, when fidelity is more important, the data may be spread in the cell, decreasing the density per cell and increasing the number of cells required to store all of the data. With wider spacing between the states that are utilized, the integrity of the data storage will be improved. This is because it is easier to discern the differential voltage between significantly nonadjacent levels. In fact, the greater the distance between the levels, the easier it is to discern a differential voltage.

Thus, in the embodiment shown in FIG. 2, only two levels are used, and in the embodiment shown in FIG. 3, four levels are used. In the embodiment shown in FIG. 4, all sixteen levels are utilized in accordance with some embodiments of the present invention.

Thus, in some embodiments, data may be stored in varying numbers of bits per cell depending on the type of data involved. Thus, some data may be packed closely as indicated for example in FIG. 4 and other data may be spread farther apart, requiring additional numbers of cells to complete the data storage.

Thus, turning to FIG. 5, the write algorithm 122, which may be implemented in software or hardware, initially identifies the number of bits per cell. The number of bits per cell may be derived from information included with the data indicating the desired fidelity. Based on the number of bits per cell, the packing of bits into each given cell may be adjusted. Thus, in some cases, denser packing may be utilized, for example as shown in FIG. 4, and in other cases, looser or more spread apart packing may be utilized as shown in FIG. 2. Once the number of bits per cell has been determined as indicated in block 124, the packing of bits into each cell is adjusted as indicated in block 126. Finally the bits are written to the cells as indicated in block 128. The number of bits per cell may be changed on the fly from cell to cell.

The read process simply reverses the flow, ignoring the missing levels, and simply reading the actual data out of each cell. The spread apart data may then be repacked into a continuous data string.

While the present invention has been described with respect to a limited number of embodiments, those skilled in the art will appreciate numerous modifications and variations therefrom. It is intended that the appended claims cover all such modifications and variations as fall within the true spirit and scope of this present invention.

Rudelic, John C., Fackenthal, Richard E.

Patent Priority Assignee Title
11556416, May 05 2021 Apple Inc. Controlling memory readout reliability and throughput by adjusting distance between read thresholds
11847342, Jul 28 2021 Apple Inc. Efficient transfer of hard data and confidence levels in reading a nonvolatile memory
7593263, Dec 17 2006 Apple Inc Memory device with reduced reading latency
7697326, May 12 2006 Apple Inc Reducing programming error in memory devices
7743230, Jan 31 2003 MORGAN STANLEY SENIOR FUNDING Memory array programming circuit and a method for using the circuit
7751240, Jan 24 2007 Apple Inc Memory device with negative thresholds
7773413, Oct 08 2007 Apple Inc Reliable data storage in analog memory cells in the presence of temperature variations
7821826, Oct 30 2006 Apple Inc Memory cell readout using successive approximation
7864573, Feb 24 2008 Apple Inc Programming analog memory cells for reduced variance after retention
7881107, Jan 24 2007 Apple Inc Memory device with negative thresholds
7900102, Dec 17 2006 Apple Inc High-speed programming of memory devices
7924587, Feb 21 2008 Apple Inc Programming of analog memory cells using a single programming pulse per state transition
7924613, Aug 05 2008 Apple Inc Data storage in analog memory cells with protection against programming interruption
7924648, Nov 28 2006 Apple Inc Memory power and performance management
7925936, Jul 13 2007 Apple Inc Memory device with non-uniform programming levels
7975192, Oct 30 2006 Apple Inc Reading memory cells using multiple thresholds
7995388, Aug 05 2008 Apple Inc Data storage using modified voltages
8000135, Sep 14 2008 Apple Inc Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
8000141, Oct 19 2007 Apple Inc Compensation for voltage drifts in analog memory cells
8001320, Apr 22 2007 Apple Inc Command interface for memory devices
8050086, May 12 2006 Apple Inc Distortion estimation and cancellation in memory devices
8059457, Mar 18 2008 Apple Inc Memory device with multiple-accuracy read commands
8060806, Aug 27 2006 Apple Inc Estimation of non-linear distortion in memory devices
8068360, Oct 19 2007 Apple Inc Reading analog memory cells using built-in multi-threshold commands
8085586, Dec 27 2007 Apple Inc Wear level estimation in analog memory cells
8116133, May 15 2006 Apple Inc. Maintenance operations for multi-level data storage cells
8145984, Oct 30 2006 Apple Inc Reading memory cells using multiple thresholds
8151163, Dec 03 2006 Apple Inc Automatic defect management in memory devices
8151166, Jan 24 2007 Apple Inc Reduction of back pattern dependency effects in memory devices
8156398, Feb 05 2008 Apple Inc Parameter estimation based on error correction code parity check equations
8156403, May 12 2006 Apple Inc Combined distortion estimation and error correction coding for memory devices
8169825, Sep 02 2008 Apple Inc Reliable data storage in analog memory cells subjected to long retention periods
8174857, Dec 31 2008 Apple Inc Efficient readout schemes for analog memory cell devices using multiple read threshold sets
8174905, Sep 19 2007 Apple Inc Programming orders for reducing distortion in arrays of multi-level analog memory cells
8208304, Nov 16 2008 Apple Inc Storage at M bits/cell density in N bits/cell analog memory cell devices, M>N
8209588, Dec 12 2007 Apple Inc Efficient interference cancellation in analog memory cell arrays
8225181, Nov 30 2007 Apple Inc Efficient re-read operations from memory devices
8228701, Mar 01 2009 Apple Inc Selective activation of programming schemes in analog memory cell arrays
8230300, Mar 07 2008 Apple Inc Efficient readout from analog memory cells using data compression
8234545, May 12 2007 Apple Inc Data storage with incremental redundancy
8238157, Apr 12 2009 Apple Inc Selective re-programming of analog memory cells
8239734, Oct 15 2008 Apple Inc Efficient data storage in storage device arrays
8239735, May 12 2006 Apple Inc Memory Device with adaptive capacity
8248831, Dec 31 2008 Apple Inc Rejuvenation of analog memory cells
8259497, Aug 06 2007 Apple Inc Programming schemes for multi-level analog memory cells
8259506, Mar 25 2009 Apple Inc Database of memory read thresholds
8261159, Oct 30 2008 Apple Inc Data scrambling schemes for memory devices
8270246, Nov 13 2007 Apple Inc Optimized selection of memory chips in multi-chips memory devices
8369141, Mar 12 2007 Apple Inc Adaptive estimation of memory cell read thresholds
8397131, Dec 31 2008 Apple Inc Efficient readout schemes for analog memory cell devices
8400858, Mar 18 2008 Apple Inc Memory device with reduced sense time readout
8429493, May 12 2007 Apple Inc Memory device with internal signap processing unit
8456905, Dec 16 2007 Apple Inc Efficient data storage in multi-plane memory devices
8479080, Jul 12 2009 Apple Inc Adaptive over-provisioning in memory systems
8482978, Sep 14 2008 Apple Inc Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
8495465, Oct 15 2009 Apple Inc Error correction coding over multiple memory pages
8498151, Aug 05 2008 Apple Inc Data storage in analog memory cells using modified pass voltages
8527819, Oct 19 2007 Apple Inc Data storage in analog memory cell arrays having erase failures
8570804, May 12 2006 Apple Inc Distortion estimation and cancellation in memory devices
8572311, Jan 11 2010 Apple Inc Redundant data storage in multi-die memory systems
8572423, Jun 22 2010 Apple Inc Reducing peak current in memory systems
8595591, Jul 11 2010 Apple Inc Interference-aware assignment of programming levels in analog memory cells
8599611, May 12 2006 Apple Inc Distortion estimation and cancellation in memory devices
8645794, Jul 31 2010 Apple Inc Data storage in analog memory cells using a non-integer number of bits per cell
8677054, Dec 16 2009 Apple Inc Memory management schemes for non-volatile memory devices
8677203, Jan 11 2010 Apple Inc Redundant data storage schemes for multi-die memory systems
8694814, Jan 10 2010 Apple Inc Reuse of host hibernation storage space by memory controller
8694853, May 04 2010 Apple Inc Read commands for reading interfering memory cells
8694854, Aug 17 2010 Apple Inc Read threshold setting based on soft readout statistics
8767459, Jul 31 2010 Apple Inc Data storage in analog memory cells across word lines using a non-integer number of bits per cell
8832354, Mar 25 2009 Apple Inc Use of host system resources by memory controller
8856475, Aug 01 2010 Apple Inc Efficient selection of memory blocks for compaction
8924661, Jan 18 2009 Apple Inc Memory system including a controller and processors associated with memory devices
8949684, Sep 02 2008 Apple Inc Segmented data storage
9021181, Sep 27 2010 Apple Inc Memory management for unifying memory cell conditions by using maximum time intervals
9047211, Mar 15 2013 SanDisk Technologies LLC Managing data reliability
9104580, Jul 27 2010 Apple Inc Cache memory for hybrid disk drives
9189386, Feb 25 2010 Apple Inc. Dynamically allocating number of bits per cell for memory locations of a non-volatile memory
9245616, May 15 2006 Apple Inc. Dynamic cell state resolution
9690656, Feb 27 2015 Microsoft Technology Licensing, LLC Data encoding on single-level and variable multi-level cell storage
9786386, Feb 27 2015 Microsoft Technology Licensing, LLC Dynamic approximate storage for custom applications
RE46346, Oct 30 2006 Apple Inc. Reading memory cells using multiple thresholds
Patent Priority Assignee Title
5424978, Mar 15 1993 Intellectual Ventures I LLC Non-volatile semiconductor memory cell capable of storing more than two different data and method of using the same
5515317, Jun 02 1994 Micron Technology, Inc Addressing modes for a dynamic single bit per cell to multiple bit per cell memory
5812447, Aug 02 1995 Sanyo Electric Co., Ltd. Method and apparatus to write and/or read two types of data from memory
6097637, Jun 02 1994 Intel Corporation Dynamic single bit per cell to multiple bit per cell memory
6097639, Dec 31 1997 LG Semicon Co., Ltd. System and method for programming nonvolatile memory
6363008, Feb 17 2000 SAMSUNG ELECTRONICS CO , LTD Multi-bit-cell non-volatile memory with maximized data capacity
EP788113,
//////////////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 17 2001FACKENTHAL, RICHARD E Intel CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0121800148 pdf
Sep 17 2001RUDELIC, JOHN C Intel CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0121800148 pdf
Sep 18 2001Intel Corporation(assignment on the face of the patent)
Mar 25 2008Intel CorporationNUMONYX B V ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0280550478 pdf
Sep 30 2011NUMONYX B V Micron Technology, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0270750682 pdf
Apr 26 2016Micron Technology, IncU S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENTSECURITY INTEREST SEE DOCUMENT FOR DETAILS 0386690001 pdf
Apr 26 2016Micron Technology, IncMORGAN STANLEY SENIOR FUNDING, INC , AS COLLATERAL AGENTPATENT SECURITY AGREEMENT0389540001 pdf
Apr 26 2016Micron Technology, IncU S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENTCORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001 ASSIGNOR S HEREBY CONFIRMS THE SECURITY INTEREST 0430790001 pdf
Jun 29 2018U S BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENTMicron Technology, IncRELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS 0472430001 pdf
Jul 03 2018MICRON SEMICONDUCTOR PRODUCTS, INC JPMORGAN CHASE BANK, N A , AS COLLATERAL AGENTSECURITY INTEREST SEE DOCUMENT FOR DETAILS 0475400001 pdf
Jul 03 2018Micron Technology, IncJPMORGAN CHASE BANK, N A , AS COLLATERAL AGENTSECURITY INTEREST SEE DOCUMENT FOR DETAILS 0475400001 pdf
Jul 31 2019JPMORGAN CHASE BANK, N A , AS COLLATERAL AGENTMICRON SEMICONDUCTOR PRODUCTS, INC RELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS 0510280001 pdf
Jul 31 2019MORGAN STANLEY SENIOR FUNDING, INC , AS COLLATERAL AGENTMicron Technology, IncRELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS 0509370001 pdf
Jul 31 2019JPMORGAN CHASE BANK, N A , AS COLLATERAL AGENTMicron Technology, IncRELEASE BY SECURED PARTY SEE DOCUMENT FOR DETAILS 0510280001 pdf
Date Maintenance Fee Events
Sep 15 2005ASPN: Payor Number Assigned.
Apr 27 2007M1551: Payment of Maintenance Fee, 4th Year, Large Entity.
Mar 23 2011M1552: Payment of Maintenance Fee, 8th Year, Large Entity.
Dec 17 2013ASPN: Payor Number Assigned.
Dec 17 2013RMPN: Payer Number De-assigned.
Apr 22 2015M1553: Payment of Maintenance Fee, 12th Year, Large Entity.


Date Maintenance Schedule
Nov 04 20064 years fee payment window open
May 04 20076 months grace period start (w surcharge)
Nov 04 2007patent expiry (for year 4)
Nov 04 20092 years to revive unintentionally abandoned end. (for year 4)
Nov 04 20108 years fee payment window open
May 04 20116 months grace period start (w surcharge)
Nov 04 2011patent expiry (for year 8)
Nov 04 20132 years to revive unintentionally abandoned end. (for year 8)
Nov 04 201412 years fee payment window open
May 04 20156 months grace period start (w surcharge)
Nov 04 2015patent expiry (for year 12)
Nov 04 20172 years to revive unintentionally abandoned end. (for year 12)