A phase locked loop design uses a diode operatively connected to a loop filter capacitor to control a leakage current of the loop filter capacitor. By positioning a diode in series with the loop filter capacitor, a voltage potential across the loop filter capacitor is reduced, thereby reducing the leakage current of the loop filter capacitor. Moreover, the leakage current of the loop filter capacitor is controlled in that it cannot exceed the current through the diode. control and reduction of the loop filter capacitor leakage current leads to more reliable and stable phase locked loop behavior.
|
9. A method for performing a phase locked loop operation, comprising:
comparing a phase difference between a first clock signal and a second clock signal;
generating a control voltage signal dependent on the comparing;
storing charge dependent on the control voltage signal using an on-chip capacitor;
controlling a leakage current of the capacitor with a diode positioned in series with the capacitor, wherein one terminal of the series-connected diode and capacitor is directly connected to the control voltage signal, and wherein another terminal of the series-connected diode and capacitor is connected to one of power and ground; and
generating the second clock signal dependent on the control voltage signal.
6. An integrated circuit, comprising:
means for detecting a phase difference between a first clock signal and a second clock signal;
means for generating a signal dependent on the phase difference;
means for storing charge on-chin to maintain a voltage potential on the signal;
a diode positioned in series with the means for storing and arranged to control a leakage current of the means for storing charge, wherein one terminal of the series-connected diode and means for storing is directly connected to the signal, and wherein another terminal of the series-connected diode and means for storing is connected to one of power and ground; and
means for generating the second clock signal dependent on the signal.
1. An integrated circuit, comprising:
a phase frequency detector arranged to detect a phase difference between a first clock signal and a second clock signal;
a charge pump arranged to output a control voltage signal dependent on the phase difference;
an on-chip capacitor operatively connected to the control voltage signal;
a diode operatively connected in series with the capacitor, wherein one terminal of the series-connected diode and capacitor is directly connected to the control voltage signal, and wherein another terminal of the series-connected diode and capacitor is connected to one of power and ground; and
a voltage-controlled oscillator arranged to output the second clock signal dependent on the control voltage signal.
5. The integrated circuit of
a bias generator arranged to output at least one bias signal dependent on the control voltage signal.
|
As shown in
In order to properly accomplish such tasks, the computer system 10 relies on the basis of time to coordinate its various operations. To that end, a crystal oscillator 18 generates a system clock signal (referred to and known in the art as “reference clock” and shown in
One component used within the computer system 10 to ensure a proper reference of time among a system clock and a microprocessor clock, i.e., “chip clock,” is a type of clock generator known as a phase locked loop, or “PLL” 20. The PLL 20 is an electronic circuit that controls an oscillator such that the oscillator maintains a constant phase relative to a reference signal. Referring to
The control voltage signal 45 serves as an input to a bias generator 50, which, in turn, outputs at least one bias signal 51 to a voltage-controlled oscillator 52. The voltage-controlled oscillator (VCO) 52, dependent on the at least one bias signal 51, outputs a clock signal, clk_out 60, that (1) propagates through a clock distribution network 54 (modeled in
According to one aspect of the present invention, an integrated circuit comprises a phase frequency detector arranged to detect a phase difference between a first clock signal and a second clock signal, a charge pump arranged to output a control voltage signal dependent on the phase difference, a capacitor operatively connected to the control voltage signal, a diode operatively connected to the capacitor, and a voltage-controlled oscillator arranged to output the second clock signal dependent on the control voltage signal.
According to another aspect, an integrated circuit comprises means for detecting a phase difference between a first clock signal and a second clock signal, means for generating a signal dependent on the phase difference, means for storing charge to maintain a voltage potential on the signal, a diode arranged to control a leakage current of the means for storing charge, and means for generating the second clock signal dependent on the signal.
According to another aspect, a method for performing a phase locked loop operation comprises comparing a phase difference between a first clock signal and a second clock signal, generating a control voltage signal dependent on the comparing, storing charge dependent on the control voltage signal using a capacitor, controlling a leakage current of the capacitor with a diode positioned in series with the capacitor, and generating the second clock signal dependent on the control voltage signal.
Other aspects and advantages of the invention will be apparent from the following description and the appended claims.
As device features, such as transistor features, used to implement integrated circuit components, e.g., PLLs, continue to get smaller, they may have higher leakage currents (i.e., higher gate tunneling currents). This is due to the fact that as transistor features are designed smaller, the thickness of the transistor's oxide layer (located between the transistor's gate and the semiconductor substrate) is reduced. As the oxide layer is reduced to a few angstroms, the transistor's gate terminal begins to leak charge to the other terminals of the transistor. In the case of a PLL's loop filter capacitor, which is typically desired to be large from a capacitance perspective and that can be implemented with a transistor, such reduction in transistor size features and consequential increase in leakage current can adversely affect the behavior of the PLL. In some cases, particular amounts of leakage current through the PLL's loop filter capacitor can even cause the PLL to malfunction. Accordingly, there is a need for a PLL design that guards against or compensates for a PLL loop filter capacitor's leakage current.
For stability, the PLL 70 uses a loop filter, formed by a loop filter capacitor 86 and a loop filter resistor 87, that is operatively connected to the control voltage signal 84. The loop filter capacitor 86 stores/dissipates charge dependent on the control voltage signal 84. Those skilled in the art will understand that the loop filter capacitor 86 may be implemented using the gate capacitance of a metal-oxide semiconductor field-effect transistor (MOSFET). The UP 78 and DOWN 80 signals are pulsed only once per clock cycle, and therefore, the control voltage signal 84 may not be maintained due to the leakage current of the loop filter capacitor 86. To guard against increased leakage currents associated with smaller transistor features, a first terminal of a diode 88 is connected to the loop filter capacitor 86. In other words, the diode 88 is positioned in series with the loop filter capacitor 86. A second terminal of the diode 88 is connected to a voltage potential Vdd 90. Those skilled in the art will note, that in one or more other embodiments, the second terminal of the diode 88 may be connected to a voltage potential Vss (not shown) instead of the voltage potential Vdd 90.
By connecting the diode 88 in series with the loop filter capacitor 86, the voltage potential across the loop filter capacitor 86 is reduced relative to the case in which there is no diode and the loop filter is connected across the control voltage signal 84 and the voltage potential Vdd 90. Accordingly, by reducing the voltage potential across the loop filter capacitor 86, the leakage current of the loop filter capacitor 86 is reduced, which, in turn, promotes stable and reliable PLL 70 operation. Moreover, those skilled in the art will understand that the diode 88 should have a maximum leakage current less than that of the loop filter capacitor 86. The implementation of the diode 88 is further described below with reference to
Referring to
Due to this configuration, the leakage current of the loop filter capacitor 86 is controlled because it cannot get larger than the source to drain current of the diode-connected p-channel transistor 110. Moreover, due to the voltage drop across the diode-connected p-channel transistor 110, the voltage potential across the loop filter capacitor 86 is reduced, which, in turn, reduces the leakage current of the loop filter capacitor 86.
Those skilled in the art will note that, in one or more other embodiments, a diode-connected transistor positioned in series with a PLL loop filter capacitor maybe connected to a voltage potential Vss (i.e., a ground potential), in which case, the diode-connected transistor could be implemented with an n-channel transistor.
Due to this configuration, the leakage current of the loop filter capacitor 86 is controlled because it cannot get larger than the, current through the p-n junction diode 118. Moreover, due to the voltage drop across the p-n junction diode 118, the voltage potential across the loop filter capacitor 86 is reduced, which, in turn, reduces the leakage current of the loop filter capacitor 86.
Those skilled in the art will note that, in one or more other embodiments, a p-n junction diode positioned in series with a PLL loop filter capacitor may be connected to a voltage potential Vss (i.e., a ground potential), in which case, the p-n junction diode would have its anode terminal connected to the PLL loop filter capacitor and its cathode terminal connected to the voltage potential Vss.
Those skilled in the art will further note that p-n junction devices that may be positioned in series with the loop filter capacitor 86 include, among other types, rectifier diodes, Schottky diodes, and Zener diodes.
Advantages of the present invention may include one or more of the following. In one or more embodiments,.because a leakage current of a PLL loop filter capacitor may be controlled, a more stable and reliable operation of the PLL may be facilitated. Accordingly, the phase, shift of the PLL may not drift or may not drift as much as a PLL design without a diode.
In one or more embodiments, because a diode positioned in series with a PLL loop filter capacitor helps control a leakage current of the PLL loop filter capacitor, the chip area consumed by the PLL loop filter capacitor may be reduced because the PLL loop filter capacitor does not have to be as large to maintain the voltage potential on a control voltage signal.
While the invention has been described with respect to a limited number of embodiments, those skilled in the art, having benefit of this disclosure, will appreciate that other embodiments can be devised which do not depart from the scope of the invention as disclosed herein. Accordingly, the scope of the invention should be limited only by the attached claims.
Trivedi, Pradeep, Bobba, Sudhakar, Gauthier, Claude
Patent | Priority | Assignee | Title |
6956417, | Nov 21 2003 | International Business Machines Corporation | Leakage compensation circuit |
Patent | Priority | Assignee | Title |
2912651, | |||
5334952, | Mar 29 1993 | SpectraLink Corporation | Fast settling phase locked loop |
5523724, | Aug 19 1994 | Cirrus Logic, Inc. | Fast recovering charge pump for controlling a VCO in a low power clocking circuit |
5548829, | Dec 01 1993 | Rohm Co., Ltd. | PLL circuit having a low-pass passive filter coupled to a varactor diode |
5559474, | May 26 1994 | Matsushita Electric Industrial Co., Ltd. | Frequency synthesizer with controllable loop filter |
5659588, | Aug 15 1996 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | Phase-locked loop having filter leakage cancellation circuit |
5717353, | Sep 29 1994 | Kabushiki Kaisha Toshiba | Clock signal generating circuit |
6437615, | Sep 13 2001 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Loop filter and method for generating a control signal in phase-locked loop circuits |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jul 16 2002 | TRIVEDI, PRADEEP | Sun Microsystems, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 013134 | /0707 | |
Jul 16 2002 | BOBBA, SUDHAKAR | Sun Microsystems, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 013134 | /0707 | |
Jul 16 2002 | GAUTHIER, CLAUDE | Sun Microsystems, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 013134 | /0707 | |
Jul 19 2002 | Sun Microsystems, Inc. | (assignment on the face of the patent) | / | |||
Feb 12 2010 | ORACLE USA, INC | Oracle America, Inc | MERGER AND CHANGE OF NAME SEE DOCUMENT FOR DETAILS | 037278 | /0877 | |
Feb 12 2010 | Sun Microsystems, Inc | Oracle America, Inc | MERGER AND CHANGE OF NAME SEE DOCUMENT FOR DETAILS | 037278 | /0877 | |
Feb 12 2010 | Oracle America, Inc | Oracle America, Inc | MERGER AND CHANGE OF NAME SEE DOCUMENT FOR DETAILS | 037278 | /0877 |
Date | Maintenance Fee Events |
Aug 27 2008 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
Aug 01 2012 | M1552: Payment of Maintenance Fee, 8th Year, Large Entity. |
Aug 18 2016 | M1553: Payment of Maintenance Fee, 12th Year, Large Entity. |
Date | Maintenance Schedule |
Mar 01 2008 | 4 years fee payment window open |
Sep 01 2008 | 6 months grace period start (w surcharge) |
Mar 01 2009 | patent expiry (for year 4) |
Mar 01 2011 | 2 years to revive unintentionally abandoned end. (for year 4) |
Mar 01 2012 | 8 years fee payment window open |
Sep 01 2012 | 6 months grace period start (w surcharge) |
Mar 01 2013 | patent expiry (for year 8) |
Mar 01 2015 | 2 years to revive unintentionally abandoned end. (for year 8) |
Mar 01 2016 | 12 years fee payment window open |
Sep 01 2016 | 6 months grace period start (w surcharge) |
Mar 01 2017 | patent expiry (for year 12) |
Mar 01 2019 | 2 years to revive unintentionally abandoned end. (for year 12) |