In a micro electro-Mechanical System (MEMS) switch, a common switch failure is a short between the upper and the lower electrostatic actuation plates. Such shorts may occur due to torque deformation. Stopper bumps having a slightly lower height profile than that of the contact bumps are provided to prevent such shorts. The stopper bumps may be made using the same mask as that used to create the contact bump with the height of the respective bumps controlled by determining the diameter of the bumps.
|
1. A micro electro-Mechanical System (MEMS) switch, comprising:
a beam cantilevered over a substrate; an upper actuation plate associated with said beam;
a lower actuation plate beneath said upper actuation plate on said substrate;
a contact bump on said substrate to make contact with an end of said beam;
at least one stopper bump on said substrate within the lower actuation plate; and
an isolation groove formed in the lower actuation plate surrounding said at least one stopper bump.
7. A method for preventing torque shorts in a micro electro-Mechanical System (MEMS) switch, comprising:
positioning an upper actuation plate on a cantilevered beam;
actuating a lower actuation plate beneath said upper actuation plate to pull a tip of said beam onto contact with a contact bump;
positioning at least one stopper bump on said lower actuation plate to prevent said upper actuation plate from shorting with said lower actuation plate; and
forming an isolation groove in the lower actuation plate surrounding said stopper bump.
13. A micro electro-Mechanical System (MEMS) switch system, comprising:
a beam cantilevered over a substrate connected to an input signal line;
an upper actuation plate associated with said beam;
a lower actuation plate beneath said upper actuation plate on said substrate;
a contact bump on said substrate connected to an output signal line, to make contact with an end of said beam when said upper actuation plate is energized;
at least one stopper bump on said substrate within the lower actuation plate; and
an isolation groove formed in the lower actuation plate surrounding said at least one stopper bump.
2. The MEMS switch as recited in
a first stopper bump in a first corner of said lower actuation plate; and
a second stopper bump in a second corner of said lower actuation plate.
3. The MEMS switch as recited in
one stopper bump near a rear of said lower actuation plate.
5. The MEMS switch as recited in
6. The MEMS switch as recited in
8. The method as recited in
making said stopper bump with a field oxide (FOX).
9. The method as recited in
positioning two stopper bumps in corners of said lower actuation plate.
10. The method as recited in
positioning said stopper bump near a rear of said lower actuation plate.
11. The method as recited in
12. The method as recited in
14. The system as recited in
a first stopper bump in a first comer of said lower actuation plate; and
a second stopper bump in a second corner of said lower actuation plate.
15. The system as recited in
a stopper bump near a rear of said lower actuation plate.
16. The system as recited in
17. The system as recited in
|
Embodiments of the present invention relate to Micro Electro-Mechanical Systems (MEMS) switches and, more particularly, to MEMS with adjustable height solder bumps.
There are many applications which require fast switching speeds. For example, for multi-mode multi-band cell phone applications such as GSM (Global System for Mobile Communications), GPRS (General Packet Radio Service), and 3G (Third Generation Wireless), the antenna switch unit switches the antenna to different bands as well as between transmission (TX) and receiving (RX) modes. Currently, solid-state switches are used for this purpose. While RF (Radio Frequency) MEMS metal contact series switches generally have much better insertion loss and isolation characteristics, they are much slower than solid-state switches.
Referring to
As shown, the switch is formed on a substrate 100 having an isolation layer 101. A metalized signal line 102 may be formed on one side of the substrate 100 and a second signal line 104 may be formed on the second side of the substrate 100 over the isolation layer 101. A cantilevered beam 106 may be secured to the second signal line 104 with an anchor 103. A bump (electrode) 108 may be formed for example by a field oxide (FOX) technique under the first signal line 102. A lower electrostatic actuation plate 110 may be formed on the substrate 100 beneath an upper electrostatic actuation plate 111 formed in the cantilevered beam 106. When the actuation plate 110 is energized, by applying a voltage, the upper actuation plate 111, and thus the cantilevered beam 106, is pulled downward causing the bump 108 with the first signal line 102 to make contact with the cantilevered beam 106. This closes the switch and provides an electrical signal path between the first signal line 102 and the second signal line 104.
Referring to
Referring now to
In order to prevent shorts due, for example to torque, a stopper bump or bumps 200 are created. The stopper bump 200 may be created by addition of oxidation bumps in the bump mask, in a like manner as the contact bump 108. An isolation groove 202 is formed in the actuation plate 110 so that a short is not created even if the upper actuation plate makes contact with the stopper bump 200. Thus, there is no need for additional mask in the formation process.
As shown in
Referring to
The above description of illustrated embodiments of the invention, including what is described in the Abstract, is not intended to be exhaustive or to limit the invention to the precise forms disclosed. While specific embodiments of, and examples for, the invention are described herein for illustrative purposes, various equivalent modifications are possible within the scope of the invention, as those skilled in the relevant art will recognize.
These modifications can be made to the invention in light of the above detailed description. The terms used in the following claims should not be construed to limit the invention to the specific embodiments disclosed in the specification and the claims. Rather, the scope of the invention is to be determined entirely by the following claims, which are to be construed in accordance with established doctrines of claim interpretation.
Patent | Priority | Assignee | Title |
10147577, | Jun 20 2011 | International Business Machines Corporation | Micro-electro-mechanical system (MEMS) and related actuator bumps, methods of manufacture and design structures |
10160634, | Dec 15 2015 | International Business Machines Corporation | Small wafer are MEMS switch |
10170262, | Jun 20 2011 | International Business Machines Corporation | Micro-electro-mechanical system (MEMS) and related actuator bumps, methods of manufacture and design structures |
10173888, | Dec 15 2015 | International Business Machines Corporatiion | Small wafer area MEMs switch |
10748725, | Jun 20 2011 | International Business Machines Corporation | Micro-electro-mechanical system (MEMS) and related actuator bumps, methods of manufacture and design structures |
10811206, | Jun 20 2011 | International Business Machines Corporation | Micro-electro-mechanical system (MEMS) and related actuator bumps, methods of manufacture and design structures |
7554421, | May 16 2006 | Intel Corporation | Micro-electromechanical system (MEMS) trampoline switch/varactor |
7605675, | Jun 20 2006 | Intel Corporation | Electromechanical switch with partially rigidified electrode |
7609136, | Dec 20 2007 | General Electric Company | MEMS microswitch having a conductive mechanical stop |
7898371, | Jun 20 2006 | Intel Corporation | Electromechanical switch with partially rigidified electrode |
8432239, | Nov 20 2006 | Massachusetts Institute of Technology | Micro-electro mechanical tunneling switch |
8436508, | Mar 12 2004 | SRI International | Mechanical meta-materials |
8973250, | Jun 20 2011 | International Business Machines Corporation | Methods of manufacturing a micro-electro-mechanical system (MEMS) structure |
9120667, | Jun 20 2011 | International Business Machines Corporation | Micro-electro-mechanical system (MEMS) and related actuator bumps, methods of manufacture and design structures |
9233832, | May 10 2013 | GLOBALFOUNDRIES U S INC | Micro-electro-mechanical system (MEMS) structures and design structures |
9593007, | Jun 20 2011 | International Business Machines Corporation | Method of forming a micro-electro-mechanical system (MEMS) structure |
9604839, | Jun 20 2011 | International Business Machines Corporation | Micro-electro-mechanical system (MEMS) and related actuator bumps, methods of manufacture and design structures |
9758366, | Dec 15 2015 | International Business Machines Corporation | Small wafer area MEMS switch |
Patent | Priority | Assignee | Title |
6054659, | Mar 09 1998 | General Motors Corporation | Integrated electrostatically-actuated micromachined all-metal micro-relays |
6307169, | Feb 01 2000 | SHENZHEN XINGUODU TECHNOLOGY CO , LTD | Micro-electromechanical switch |
6331257, | May 15 1998 | Hughes Electronics Corporation | Fabrication of broadband surface-micromachined micro-electro-mechanical switches for microwave and millimeter-wave applications |
20030058069, | |||
20030116417, |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Dec 18 2003 | Intel Corporation | (assignment on the face of the patent) | / | |||
Jan 28 2004 | HECK, JOHN | Intel Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015197 | /0476 | |
Feb 10 2004 | BAR, HANAN | Intel Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015197 | /0476 |
Date | Maintenance Fee Events |
Apr 14 2011 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
May 29 2015 | REM: Maintenance Fee Reminder Mailed. |
Oct 16 2015 | EXP: Patent Expired for Failure to Pay Maintenance Fees. |
Date | Maintenance Schedule |
Oct 16 2010 | 4 years fee payment window open |
Apr 16 2011 | 6 months grace period start (w surcharge) |
Oct 16 2011 | patent expiry (for year 4) |
Oct 16 2013 | 2 years to revive unintentionally abandoned end. (for year 4) |
Oct 16 2014 | 8 years fee payment window open |
Apr 16 2015 | 6 months grace period start (w surcharge) |
Oct 16 2015 | patent expiry (for year 8) |
Oct 16 2017 | 2 years to revive unintentionally abandoned end. (for year 8) |
Oct 16 2018 | 12 years fee payment window open |
Apr 16 2019 | 6 months grace period start (w surcharge) |
Oct 16 2019 | patent expiry (for year 12) |
Oct 16 2021 | 2 years to revive unintentionally abandoned end. (for year 12) |