An optical spectrum analyzer detects a light output that is dependent on the frequency of light in a wavelength range of light to be measured. The optical spectrum analyzer includes a waveguide acousto-optic tunable filter including a piezoelectric substrate, optical waveguides, and an idt, a light source for providing, to the waveguide acousto-optic tunable filter, reference light having a particular wavelength outside the wavelength range, a driving circuit for providing, to the waveguide acousto-optic tunable filter, a high frequency signal for exciting an idt, and an arithmetic device that, on the basis of the wavelength of selected light when reference light is incident, and an exciting frequency, corrects the wavelength of the selected light, which is obtained from the light to be measured.
|
1. An optical spectrum analyzer for detecting a light output that is dependent on the frequency of light in a wavelength range of light to be measured, comprising:
a waveguide acousto-optic tunable filter including a piezoelectric substrate, an optical waveguide provided on the piezoelectric substrate, and an idt arranged to convert a mode of light being propagated in an approximate middle portion of the optical waveguide;
a light source arranged to provide reference light having a specific wavelength outside of the wavelength range to the waveguide acousto-optic tunable filter;
a driving circuit arranged to excite the idt of the waveguide acousto-optic tunable filter by supplying a high frequency signal to the idt;
a photoreceptor that receives light that is output from the waveguide acousto-optic tunable filter; and
an arithmetic device arranged to make a correction, based on the wavelength of selected light that is output when a mode of the reference light is converted by causing the reference light to be incident on the waveguide acousto-optic tunable filter and by applying high frequency waves having a predetermined frequency to the idt and exciting the idt, to a relationship between the frequency of the high frequency waves applied to the idt and the wavelength of the selected light selected from the light to be measured.
9. An optical spectrum analyzer for detecting a light output that is dependent on the frequency of light in a wavelength range of light to be measured, comprising:
a waveguide non-polarization-dependent acousto-optic tunable filter including a piezoelectric substrate, an optical waveguide provided on the piezoelectric substrate, and an idt arranged to convert a mode of light being propagated in an approximate middle portion of the optical waveguide;
a light source arranged to provide reference light having a specific wavelength outside of the wavelength range to the waveguide non-polarization-dependent acousto-optic tunable filter;
a driving circuit arranged to excite the idt of the waveguide non-polarization-dependent acousto-optic tunable filter by supplying a high frequency signal to the idt;
a photoreceptor arranged to receive light that is output from the waveguide non-polarization-dependent acousto-optic tunable filter; and
an arithmetic device arranged to make a correction, based on the wavelength of selected light that is output when a mode of the reference light is converted by causing the reference light to be incident on the waveguide non-polarization-dependent acousto-optic tunable filter and by applying high frequency waves having a predetermined frequency to the idt and exciting the idt, to a relationship between the frequency of the high frequency waves applied to the idt and the wavelength of the selected light selected from the light to be measured.
2. The optical spectrum analyzer according to
4. The optical spectrum analyzer according to
5. An apparatus comprising:
the optical spectrum analyzer according to
an optical sensor arranged to detect a predetermined physical quantity and including a light source and an optical detecting unit; wherein
the light source of the optical spectrum analyzer is shared with the light source of the optical sensor.
6. The apparatus according to
8. The apparatus according to
10. The optical spectrum analyzer according to
12. The optical spectrum analyzer according to
13. An apparatus comprising:
the optical spectrum analyzer according to
an optical sensor arranged to detect a predetermined physical quantity and including a light source and an optical detecting unit; wherein
the light source of the optical spectrum analyzer is shared with the light source of the optical sensor.
14. The apparatus according to
16. The apparatus according to
|
1. Field of the Invention
The present invention relates to an optical spectrum analyzer using a waveguide acousto-optic tunable filter.
2. Description of the Related Art
In order to measure a light output in a wavelength range of light to be measured, various optical spectrum analyzers have been disclosed. For example, Japanese Unexamined Patent Application Publication No. 2002-214459 discloses an optical spectrum analyzer including a tunable filter using an arrayed waveguide grating. Here, by using the arrayed waveguide grating, light having a target wavelength is extracted. Japanese Unexamined Patent Application Publication No. 2002-214459 also discloses that, by thermo-regulating the arrayed waveguide grating, a target wavelength can be changed.
Further, Japanese Unexamined Patent Application Publication No. 2001-264167 discloses an optical spectrum analyzer using a tunable fiber grating. By using the tunable fiber grating, light having a target wavelength is extracted. Here, the optical spectrum analyzer is configured so that, by extending or contracting the fiber grating using a piezoelectric element, a target wavelength can be changed.
In an optical analyzer using an arrayed waveguide grating, by using a Peltier element, a heater, or other suitable device to perform thermo-regulation, a wavelength is changed. Accordingly, the spectrum analyzer does not include any mechanical driving parts, but takes a relatively long time for its temperature to change. Thus, this optical spectrum analyzer is unsuitable for high speed measurement.
On the other hand, the optical spectrum analyzer, using the wavelength variable fiber grating, as described in Japanese Unexamined Patent Application Publication No. 2001-264167, is relatively small because it uses a piezoelectric element, and can perform measurements at a relatively high speed. However, it has a problem of a narrow tunable range.
To overcome the problems described above, preferred embodiments of the present invention provide an optical spectrum analyzer that uses a waveguide acousto-optic tunable filter (AOTF), and thus, can have a relatively small size and can perform high speed measurement, and, in addition, can measure an optical spectrum with improved accuracy.
A preferred embodiment of the present invention provides an optical spectrum analyzer for detecting a light output that is dependent on the frequency of light in a wavelength range of light to be measured. The optical spectrum analyzer includes a waveguide acousto-optic tunable filter including a piezoelectric substrate, an optical waveguide provided on the piezoelectric substrate, and an IDT arranged to convert the mode of light being propagated in the middle of the optical waveguide, a light source for providing, to the waveguide acousto-optic tunable filter, reference light having a particular wavelength outside the wavelength range, a driving circuit arranged to excite the IDT of the waveguide acousto-optic tunable filter by supplying a high frequency signal, a photoreceptor that receives light that is output from the waveguide acousto-optic tunable filter, and an arithmetic device in which, based on the wavelength of selected light that is output when the mode of the reference light is converted by causing the reference light to be incident on the waveguide acousto-optic tunable filter and by applying and exciting high frequency waves having a predetermined frequency to the IDT, a relationship between the frequency of the high frequency waves applied to the IDT and the wavelength of the selected light selected from the light to be measured is corrected.
In a preferred embodiment of the optical spectrum analyzer according to the present invention, the light source preferably includes a light generator that generates light having various wavelengths, and a fiber Bragg grating (FBG) that enables, from the light given from the light generator, output of only light having a particular wavelength. With this configuration, an inexpensive generator that generates light having a relatively wide band that reflects light having various wavelengths can be used as the light generator. Accordingly, the cost of the optical spectrum analyzer can be reduced.
In another preferred embodiment of the optical spectrum analyzer according to the present invention, the light source is a laser source. When using the laser source, light having a particular wavelength can be obtained from the laser source. Thus, the FBG or other suitable grating is not required, such that the size of the light source can be reduced and the structure of the light source can be simplified.
In another preferred embodiment of the optical spectrum analyzer according to the present invention, the light source is configured so that first and second types of light having different wavelengths are provided as the reference light, and a relationship between the frequency of the high frequency waves applied to the IDT and the wavelength of the selected light is corrected by the first and second types of light. Therefore, as described later, a relationship between the wavelength of selected light and the frequency of the high frequency signal for exciting the IDT can be obtained at two points. Thus, despite a gradient of a wavelength change dλ of the selected light to a frequency change df of the high frequency signal, that is, despite a change in dλ/df based on the temperature, the optical spectrum can be measured with higher accuracy.
In another preferred embodiment of the optical spectrum analyzer according to the present invention, an optical spectrum analyzer for use in combination with an optical sensor for detecting a predetermined physical quantity is provided, wherein the optical sensor includes a light source and an optical detecting unit, and the light source of the optical spectrum analyzer is shared with the light source of the optical sensor. With this configuration, since the light source is shared with the optical sensor, the overall size of an apparatus including the optical sensor and the optical spectrum analyzer can be reduced.
In the optical spectrum analyzer according to preferred embodiments of the present invention, when detecting a light output that is dependent on the frequency of light in a wavelength range of light to be measured, since the optical spectrum analyzer includes the waveguide acousto-optic tunable filter, the light source, the driving circuit, the photoreceptor, and the arithmetic device, by using the reference light, whose wavelength is known beforehand, the frequency of a signal for exciting the IDT can be accurately converted into the wavelength of the selected light.
In other words, in the waveguide acousto-optic tunable filter, the light to be measured is propagated in a single polarization mode on the optical waveguide. Where a high frequency signal having a predetermined frequency is applied from the IDT, the polarization mode of the light being propagated is converted, and, from the acousto-optic tunable filter, light having a particular wavelength can be separated and output. In this case, the wavelength of the selected light that is output corresponds to the frequency of the high frequency signal applied to the IDT at approximately 1:1. Therefore, by changing the frequency of the signal for exciting the IDT in accordance with the wavelength range, the light output that is dependent on the frequency of light in a wavelength range can be detected.
However, although the frequency of the high frequency signal for exciting the IDT corresponds to the wavelength of the selected light at approximately 1:1, a ratio at which the wavelength of the selected light changes, when the frequency of the high frequency signal is changed, varies depending on the temperature. In other words, when df is a change in frequency of the high frequency signal, and dλ is a change in wavelength of the selected light to the frequency of the high frequency signal, dλ/df is dependent upon temperature. Therefore, there is a possibility that the wavelength of the selected light may shift from a wavelength corresponding to the frequency of the high frequency signal applied when the IDT is excited, depending on the operating temperature.
In contrast, according to preferred embodiments of the present invention, reference light having a specific known wavelength is input from the light source. When a high frequency signal having a predetermined frequency is applied, on the basis of the frequency of the high frequency signal and the wavelength of selected light, the wavelength of the selected light, which is selected from the light to be measured, is corrected. Therefore, the optical spectrum can be detected with higher accuracy, even when the temperature changes.
Thus, according to preferred embodiments of the present invention, by using a waveguide acousto-optic tunable filter that does not require mechanical driving parts and whose size is reduced, the optical spectrum can be measured with high speed and outstanding accuracy.
Other features, elements, steps, characteristics and advantages of the present invention will become more apparent from the following detailed description of preferred embodiments of the present invention with reference to the attached drawings.
The present invention will be clarified by describing specific preferred embodiments of the present invention with reference to the drawings.
The optical spectrum analyzer 1 includes a waveguide acousto-optic tunable filter 2 to which light to be measured is input and from which selected light is output. The waveguide acousto-optic tunable filter 2 includes a piezoelectric substrate 3. In this preferred embodiment of the present invention, the piezoelectric substrate 3 is preferably made of a LiNbO3 piezoelectric monocrystal substrate. However, the piezoelectric substrate 3 may be made of a different piezoelectric monocrystal or may be made of a piezoelectric ceramic.
On the piezoelectric substrate 3, optical waveguides 4a and 4b are provided. An IDT 5 is provided in a portion of the optical waveguides 4a and 4b. The IDT 5 is electrically connected to a driving circuit 6. The IDT 5 includes a pair of interlocking comb electrodes having a plurality of electrode fingers. When a high frequency signal is applied to the IDT 5, the IDT 5 is excited and a surface acoustic wave is excited. This excitation of the surface acoustic wave converts a polarization mode of light that converts the optical waveguides 4a and 4b into a single polarization mode.
In addition, a cross waveguide polarizing splitter 7 is disposed closer to an input side of the optical waveguides 4a and 4b than the IDT 5, and a cross waveguide polarizing splitter 8 is similarly provided on an output side of the optical waveguides 4a and 4b.
The waveguide acousto-optic tunable filter 2 that includes the optical waveguides 4a and 4b, the IDT 5, and the polarizing splitters 7 and 8 has been known as a non-dependent AOTF.
In the waveguide acousto-optic tunable filter 2, which is a non-polarization-dependent AOTF, light to be measured, and reference light, which is described below, are incident on one incident end 7a of the polarizing splitter 7 provided on an incident side. As described below, selected light is emitted from one emitting end 8a of the second cross waveguide polarizing splitter 8.
The IDT 5 can be made of Al, Cu, or any suitable metal or alloy.
Further, the optical waveguides 4a and 4b, and the cross waveguide polarizing splitters 7 and 8 can be made in accordance with a known technique in which Ti is diffused in a portion of a piezoelectric substrate.
In this preferred embodiment, an incident optical fiber 9 is connected to the one incident end 7a of the waveguide acousto-optic tunable filter 2. The light to be measured or the reference light is incident on the incident optical fiber 9. Here, the reference light is incident from a light source 10 on the incident optical fiber 9. The light source 10 includes a wideband light source 11 having a relatively wide band, that is, the wideband light source 11, which generates light having various wavelengths, an optical circulator 12, and an FBG 13. The FBG 13 is a fiber Bragg grating, and has a function of reflecting and emitting light having a predetermined wavelength. The wavelength of the reference light is outside a wavelength range in which the spectrum of the light to be measured is measured and is within a wavelength range that can be monitored by the AOTF.
Referring back to
Accordingly, since only light having a particular wavelength can be extracted using the FBG 13, for example, a wideband light source, such as an ASE light source, can be used as the light source 11.
In addition, an optical fiber 14 is connected to the emitting end 8a of the waveguide acousto-optic tunable filter 2. A photoreceptor 15 is connected to an output side of the optical fiber 14. The photoreceptor 15 is defined by, for example, a suitable photoelectric conversion element such as a photodiode, and outputs an electric signal in accordance with the intensity of input light.
In this preferred embodiment, an arithmetic device 16 is electrically connected to the photoreceptor 15. Also, the arithmetic device 16 is electrically connected to the driving circuit 6.
The arithmetic device 16 calculates a light output that is output in accordance with an electric signal provided from the photoreceptor 15. Also, as described below, on the basis of a relationship between the frequency of a high frequency signal that is applied in order to excite the IDT 5 and a known wavelength of the reference light, the arithmetic device 16 corrects a relationship between the frequency of the high frequency signal and the wavelength of selected light selected from the light to be measured, and provides a highly accurate optical spectrum.
An operation of the optical spectrum analyzer 1 according to this preferred embodiment will now be described. In the optical spectrum analyzer 1, the light to be measured is incident from the input optical fiber 9 on the incident end 7a. In this case, the light to be measured includes light having various wavelength components. Accordingly, with the optical spectrum analyzer 1, an output change dependent on the wavelength of light in a wavelength range, that is, a light output dependent on the frequency of light in a wavelength range, is measured.
More specifically, incident light is split by the polarizing splitter 7 into TE mode light and TM mode light. The TE mode light or TM mode light is guided to one optical waveguide 4a, and the TM mode light or TE mode light is guided to the other optical waveguide 4b. In addition, by applying the high frequency signal from the driving circuit 6 to the IDT 5, the IDT 5 is excited and a surface acoustic wave is propagated. This propagation of the surface acoustic wave deforms a crystal structure of the piezoelectric substrate 3, so that, among polarization modes in which propagation through the optical waveguides 4a and 4b is performed in a single polarization mode, a polarization mode of polarization of a particular wavelength according to the frequency of an IDT driving high frequency signal is converted.
In other words, where a high frequency signal having a frequency fa is applied from the driving circuit 6 to the IDT 5, for example, when TE mode polarization is propagated through the optical waveguide 4a, in TE mode polarization, only a polarization mode of a wavelength having a particular wavelength λa is converted into the TM mode. The light having the mode changed in the above manner is separated from light having other wavelengths by the polarizing splitter 8. The separated light is output as selected light from the emitting end 8a and is transmitted to the photoreceptor 15.
In this case, the frequency of the high frequency signal applied to the IDT 5 and the wavelength of the selected light have a one-to-one relationship.
Thus, a high frequency signal in a frequency range according to a wavelength range is applied from the driving circuit 6 to the IDT 5, while performing sweeping, and measurement is performed, whereby a light output change dependent on a wavelength in a wavelength range can be obtained.
However, although the frequency of the high frequency signal applied to the IDT 5 and the wavelength of the selected light have a one-to-one relationship, a wavelength gradient dλ/df of the wavelength of the selected light to the frequency changes as the temperature changes. Here, dλ represents a change in wavelength of the selected light, and df represents a change of the high frequency signal. In other words, the relationship of the wavelength of the selected light with the frequency of the high frequency signal applied to the IDT 5 has temperature dependency.
Accordingly, when the ambient temperature changes, there is a possibility that the wavelength of the selected light in the obtained optical spectrum may be shifted away from an accurate wavelength.
Conversely, in this preferred embodiment, the reference light is incident from the light source 10, and, based on the result of the reference light, the wavelength of the selected light obtained from the light to be measured is corrected.
In other words, the reference light has a particular known wavelength determined by the FBG 13. As indicated by the arrows in
As is commonly known, the wavelength of selected light in an acousto-optic tunable filter is proportional to the reciprocal of a high frequency signal exciting an IDT. Accordingly, in the case of measuring reference light and light to be measured, as shown above, when the wavelength of the reference light is lower, the peak of the reference light appears on a side having a lower frequency of the high frequency signal. Therefore,
In addition, although the frequency of the high frequency signal and the wavelength of selected light have a one-to-one relationship, as described above, a change in temperature changes dλ/df. In this preferred embodiment, despite the change in dλ/df caused by the change in temperature, the optical spectrum can be measured with high accuracy. This will be described with reference to
For example, it is assumed that light to be measured in the vicinity of about 1550 nm be measured by using reference light having a wavelength of about 1545 nm at a temperature of about 35° C. In this case, if correction using the above dλ/df is not performed, the result indicated by the dotted line E in
Therefore, even if the ambient temperature changes, the optical spectrum can be measured with higher accuracy.
As described above, the reference light is used to correct the relationship between the exciting frequency and the wavelength of the selected light. Thus, it is necessary for the wavelength of the reference light to exist outside a wavelength range of the light to be measured.
The optical spectrum analyzer 31 is similar to the optical spectrum analyzer according to the first preferred embodiment, except that it includes an FBG 13, a temperature sensor 32 that detects the temperature of a portion provided with the FBG 13, and a temperature correcting device 33 electrically connected to the temperature sensor 32.
As described above, the FBG 13 reflects and outputs a particular wavelength of light. However, the particular wavelength in the FBG 13 is temperature dependent. In other words, the FBG 13 reflects and emits only light having a particular wavelength. The particular wavelength changes with changes in temperature. In the optical spectrum analyzer 31 according to the second preferred embodiment, the temperature of the FBG 13 is detected by the temperature sensor 32 defining a temperature detecting device. The wavelength of the light reflected by the FBG 13 changes with changes in the temperature. Thus, a change in the wavelength of the reference light, is corrected by the temperature correcting device 33, and the corrected light is transmitted to the arithmetic device 16. Accordingly, in this preferred embodiment, the change in the wavelength of the reference light caused by a change in the temperature is compensated for. Thus, the optical spectrum can be measured with higher accuracy.
Although, in the second preferred embodiment, the temperature sensor 32 defining a temperature detecting device and the temperature correcting device 33 are preferably used, for example, in order to thermoregulate the temperature of the FBG 13, a thermoregulator may be provided. In other words, a thermoregulator may be used so that the temperature of the FBG 13 is maintained at a constant temperature. In this case, reference light having a constant wavelength can be transmitted to the acousto-optic tunable filter 2 without being corrected.
Such a thermoregulator is not particularly limited. A suitable thermoregulator that includes a heater, a temperature sensor, and a controller that switches the heater on and off based on a temperature measured by the temperature sensor can be used.
In this preferred embodiment, the light source 50, which has a relatively wide bandwidth, is provided as a light generator that generates light having various wavelengths. The light source 50 is used as a light source for providing reference light in the optical spectrum analyzer 41, and is also used as a light source for the optical sensor 51. In other words, the light source 50 is shared by the optical spectrum analyzer 41 and the optical sensor 51.
The optical sensor 51 is a sensor that detects various physical quantities on the basis of light wavelengths and changes in strength, such as a sensor that detects a displacement based on deformation in the ground. The optical sensor 51 detects a change in light based on a change in target physical quantity. In the optical sensor 51, a plurality of FBGs 52 to 54 are provided. The FBGs 52 to 54 are arranged to respectively reflect light having a wavelength of λ1, light having a wavelength of λ2, and light having a wavelength of λ3, and are connected to one another in series.
Thus, from the light incident from the wideband light source 50 on the FBGs 52 to 54, the light having a wavelength of λ1, the light having a wavelength of λ2, and the light having a wavelength of λ3 can be used in the optical sensor 51.
In addition, in this preferred embodiment, two types of light having two wavelengths are used as reference light that is transmitted to the acousto-optic tunable filter 2. Accordingly, the FBGs 42 and 43 are connected to each other in series. The FBGs 42 and 43 are arranged to reflect only light having a wavelength of λa and light having a wavelength λb from the light provided from the light source 50. Thus, from the light incident from the light source 50, two types of light having wavelengths λa and λb are provided as a first reference light and a second reference light to the acousto-optic tunable filter 2.
In this preferred embodiment, as described above, two types of reference light having particular wavelengths, a first wavelength of λa and a second wavelength λb, are transmitted to the acousto-optic tunable filter 2. By performing correction using a plurality of types of reference light in this manner, the optical spectrum can be measured with higher accuracy. This will be described with reference to
A case in which light in the vicinity of about 1550 nm is incident as light to be measured on the optical spectrum analyzer 41 according to this preferred embodiment in order to measure the optical spectrum is described. In this case, the optical spectrum is measured in a similar manner to that in the first preferred embodiment with first reference light wavelength λa=1545 nm and second reference light wavelength λb=1555 nm. As shown in
As described above, dλ/df has temperature dependency. As in the first preferred embodiment, when the dλ/df is corrected by using single reference light, the correspondence between the reference light wavelength and the exciting frequency can be determined at only one point. However, since dλ/df itself is unknown, it is unclear to which light wavelength range a sweeping range of the high frequency signal frequency corresponds. Accordingly, in the first preferred embodiment, it is preferable that, after a temperature characteristic of an acousto-optic tunable filter is determined in advance, a change in corresponding dλ/df be determined, while monitoring the temperature.
Compared with this, since this preferred embodiment uses the first reference light having a wavelength λa and the second reference light having a wavelength λb, a relationship between the wavelength of the selected light and the exciting frequency can be determined at two points. Therefore, simultaneously during measurement, dλ/df itself can be determined based on a gradient between the two points. In other words, as
In addition, in particular, when using two types of reference light, it is preferable that the wavelength λa of the reference light and wavelength λb be dispersed on low-frequency and high-frequency sides of the wavelength range of the light to be measured. This makes it possible to perform more accurate temperature correction in the wavelength range of the light to be measured.
Also, in this preferred embodiment, the optical spectrum analyzer 41 shares the light source with the optical sensor 51. Thus, in the optical spectrum analyzer used with the optical sensor device, a reduced number of components, a reduced cost, and a reduced size are obtained. The light source of the optical spectrum analyzer in the optical sensor 51 can be shared with the optical sensor 51, and can also be used with an apparatus light source.
While preferred embodiments of the present invention have been described above, it is to be understood that variations and modifications will be apparent to those skilled in the art without departing the scope and spirit of the present invention. The scope of the present invention, therefore, is to be determined solely by the following claims.
Tanaka, Shinji, Kobayashi, Hideaki, Yamada, Kiyokazu
Patent | Priority | Assignee | Title |
Patent | Priority | Assignee | Title |
6552785, | Apr 27 2000 | Advantest Corporation | Reference wavelength light generating apparatus |
JP2001264167, | |||
JP2002214459, | |||
JP2004077416, | |||
JP2007178258, | |||
JP2194337, |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jun 16 2008 | KOBAYASHI, HIDEAKI | MURATA MANUFACTURING CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 021177 | /0404 | |
Jun 17 2008 | YAMADA, KIYOKAZU | MURATA MANUFACTURING CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 021177 | /0404 | |
Jun 19 2008 | TANAKA, SHINJI | MURATA MANUFACTURING CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 021177 | /0404 | |
Jul 01 2008 | Murata Manufacturing Co. Ltd. | (assignment on the face of the patent) | / |
Date | Maintenance Fee Events |
Jun 24 2010 | ASPN: Payor Number Assigned. |
Mar 07 2013 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
Nov 05 2015 | ASPN: Payor Number Assigned. |
Nov 05 2015 | RMPN: Payer Number De-assigned. |
Apr 18 2017 | M1552: Payment of Maintenance Fee, 8th Year, Large Entity. |
Apr 21 2021 | M1553: Payment of Maintenance Fee, 12th Year, Large Entity. |
Date | Maintenance Schedule |
Oct 27 2012 | 4 years fee payment window open |
Apr 27 2013 | 6 months grace period start (w surcharge) |
Oct 27 2013 | patent expiry (for year 4) |
Oct 27 2015 | 2 years to revive unintentionally abandoned end. (for year 4) |
Oct 27 2016 | 8 years fee payment window open |
Apr 27 2017 | 6 months grace period start (w surcharge) |
Oct 27 2017 | patent expiry (for year 8) |
Oct 27 2019 | 2 years to revive unintentionally abandoned end. (for year 8) |
Oct 27 2020 | 12 years fee payment window open |
Apr 27 2021 | 6 months grace period start (w surcharge) |
Oct 27 2021 | patent expiry (for year 12) |
Oct 27 2023 | 2 years to revive unintentionally abandoned end. (for year 12) |