The present invention relates to photoacid generating compounds, lithographic resists comprising photoacid generating compounds, and to various lithographic processes techniques, and applications. In one embodiment, the present invention provides a photoacid generator of formula (I):
##STR00001##
|
##STR00055##
##STR00057##
##STR00051##
##STR00053##
##STR00056##
##STR00054##
##STR00052##
##STR00050##
##STR00058##
wherein
X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00031##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
17. A lithographic resist comprising an adamantyl component and a photoacid generating component, wherein the photoacid generating component is selected from the group consisting of:
##STR00039##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
30. A method for producing a lithographic resist comprising:
blending a photoacid generating component with a first component, wherein the photoacid generating component is selected from the group consisting of:
##STR00048##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
32. A method for producing a lithographic resist comprising:
copolymerizing a first component and a photoacid generating component, wherein the photoacid generating component is selected from the group consisting of:
##STR00049##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
43. A method of producing a lithographic resist comprising:
blending a photoacid generating component with a first component, wherein the photoacid generating component comprises a photoacid generator having the structure:
##STR00059##
wherein
X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
44. A method of producing a lithographic resist comprising:
copolymerizing a first component and a photoacid generating component, wherein the photoacid generating component comprises a photoacid generator having the structure:
##STR00060##
wherein
X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00028##
wherein R1, R2, R3,R4, R5, and R6 are independently selected from the group consisting of:
##STR00029##
and —O—C(O)—O—R13
wherein R7, R8, R9,R10, R11, and R12 are independently selected from the group consisting of -hydrogen, -alkyl, -alkylene, -fluoroalkyl, -fluoroalkenyl, -aryl, -substituted aryl, —O-alkyl, -halo, -cyano, and -nitro; and
wherein R13 is selected from the group consisting of -hydrogen, -alkyl, -alkenyl, -fluoroalkyl, -fluoroalkenyl, -pyranyl, and -adamantyl,
L− is selected from the group consisting of a sulfonate compound, BF4−, PF6−, and SbF6−; and
X+ is selected form the group consisting of a sulfonium compound and an ionium compound.
##STR00045##
wherein R1, R2, R3, R4, R5, and R6 are independently selected from the group consisting of:
##STR00046##
and —O—C(O)—O—R13
wherein R7, R8, R9,R10, R11, and R12 are independently selected from the group consisting of -hydrogen, -alkyl, -alkylene, -fluoroalkyl, -fluoroalkenyl, -aryl, -substituted aryl, —O-alkyl, -halo, -cyano, and -nitro; and
wherein R13 is selected from the group consisting of -hydrogen, -alkyl, -alkenyl, -fluoroalkyl, -fluoroalkenyl, -pyranyl, and -adamantyl,
L− is selected from the group consisting of a sulfonate compound, BF4−, PF6−, and SbF6−; and
X+ is selected form the group consisting of a sulfonium compound and an ionium compound.
##STR00021##
wherein
Y1, Y2, and Y3 are independently selected from the group consisting of alkylene, alkenylene, fluoroalkylene, and fluoroalkenylene;
Z1, Z2, and Z3 are independently selected from the group consisting of:
##STR00022##
and —O—C(O)—O—R7
wherein R1, R2, R3,R4, R5, and R6 are independently selected from the group consisting of -hydrogen, -alkyl, -alkylene, -fluoroalkyl, -fluoroalkenyl, -aryl, -substituted aryl, —O-alkyl, -halo, -cyano, and -nitro; and
wherein R7 is selected from the group consisting of -hydrogen, -alkyl, -alkenyl, -fluoroalkyl, -fluoroalkenyl, -pyranyl, and -adamantyl,
L− is selected from the group consisting of a sulfonate compound, BF4−, PF6−, and SbF6−; and
X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00040##
wherein
Y1, Y2, and Y3 are independently selected from the group consisting of alkylene, alkenylene, fluoroalkylene, and fluoroalkenylene;
Z1, Z2, and Z3 are independently selected from the group consisting of:
##STR00041##
and —O—C(O)—O—R7
wherein R1, R2, R3, R4, R5, and R6 are independently selected from the group consisting of -hydrogen, -alkyl, -alkylene, -fluoroalkyl, -fluoroalkenyl, -aryl, -substituted aryl, —O-alkyl, -halo, -cyano, and -nitro; and
wherein R7 is selected from the group consisting of -hydrogen, -alkyl, -alkenyl, -fluoroalkyl, -fluoroalkenyl, -pyranyl, and -adamantyl;
L− is selected from the group consisting of a sulfonate compound, BF4−, PF6−, and SbF6−; and
X+ is selected from the group consisting of a sulfonium compound and an ionium compound, wherein the lithographic resist does not comprise a polymeric component.
##STR00023##
##STR00024##
##STR00025##
##STR00026##
##STR00027##
8. The dendrimer of
##STR00030##
and —O—C(O)—O—R13.
##STR00032##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00033##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00034##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00035##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00036##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00037##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
##STR00038##
wherein X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
21. The lithographic resist of
##STR00042##
##STR00043##
##STR00044##
26. The lithographic resist of
##STR00047##
and —O—C(O)—O—R13.
33. The method of
|
|||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
This application is a continuation in part of pending U.S. patent application Ser. No. 11/226,912 filed Sep. 14, 2005, which is a continuation in part of U.S. patent application Ser. No. 09/992,560 filed Nov. 5, 2001, now U.S. Pat. No. 7,008,749, and a continuation in part of U.S. patent application Ser. No. 10/324,642 filed Dec. 19, 2002, now U.S. Pat. No. 7,049,044. This application also claims priority to U.S. Provisional Patent Application Ser. No. 60/763,738 filed Feb. 1, 2006 and U.S. Provisional Patent Application Ser. No. 60/769,990 filed Apr. 7, 2006.
The present invention relates to photoacid generating compounds, lithographic resists comprising photoacid generating compounds, and to various lithographic processes techniques, and applications.
Lithographic techniques for photoresist patterning with resolutions down to the 22 nm node are essential for future device miniaturization. (See: The 2003 Edition of the ITRS: Lithography, 2005 International Technology Roadmap for Semiconductors: http://public.itrs.net/2003). Patterning at the nanometer scale can be achieved in various ways including optical, atomic force microscope, scanning probe, electron beam, nanoimprint, and extreme ultraviolet lithography (EUV lithography). In order to keep pace with the demand for rapid printing of smaller features, it is necessary to gradually reduce the wavelength of light used for imaging and to design imaging systems with larger numerical apertures.
EUV lithography, for example, uses short wavelength (13.4 nm) radiation to administer projection imaging or lithographic patterning. As a result of its short wavelength radiation, EUV lithography has evolved into a possible candidate for the production of future integrated circuits at the 45 or 22 nm mode. Much of the work to date, however, has focused on aspects of lithography tool development as opposed to resist performance.
Two primary types of resist polymers that have been investigated are chain-scission resists and chemically amplified (CA) resists. Upon irradiation of a chain-scission resist film, the molecular weights of the polymers in the exposed regions are decreased via chain scission reactions arising from the irradiation. As a result, solubility differentiation is achieved between the exposed and the unexposed regions. Chemically amplified resists achieve solubility differentiation based on an acid-catalyzed deprotection reaction which changes the polarity of the polymer in the exposed region. A typical CA resist formula consists of a matrix polymer and a photoacid generator (PAG). Upon irradiation with an electron beam or extreme UV radiation, the PAG generates a strong acid that catalyzes the deprotection reaction.
Several classes of PAGs have been used in CA resists. These PAGs, however, are almost exclusively used in their small molecule forms, and small molecule PAGs typically exhibit limited compatibility with the resist polymer matrix. As a result, problems such as phase separation, non-uniform acid distribution, and non-uniform acid migration occurring during temperature fluctuations (e.g. variation in baking processing) may arise. Such limitations frequently lead to an undesirable, premature and non-uniform deprotection reaction in the CA resist film.
Moreover, resists for EUV lithography and other lithographic techniques must possess reasonable photospeed while maintaining a low level of outgassing components. Lithographic resists must additionally demonstrate high sensitivity, high contrast and resolution, low absorption, high dry-etch resistance, good adhesion to substrates, and low line-edge roughness. Current resists for sub-100 nm patterning applications, including EUV lithography, display poor etch resistance, poor outgassing properties, and undesirable absorption coefficients. As a result, it would be desirable to provide PAGs and resists that exhibit improved properties for lithographic processes such as EUV, X-ray (XRL), 193 nm, electron beam (EBL), and ion beam (IBL) lightographies.
The present invention addresses several of the current limitations in lithographic techniques by providing photoacid generators and lithographic resists comprising photoacid generators which can achieve high sensitivity, high contrast, high resolution, and/or high dry etch resistance for pattern transfer to a substrate. Moreover, the present invention provides photoacid generators and resists that address compatibility problems which can lead to phase separation, non-uniform acid distribution, and non-uniform acid migration occurring during temperature fluctuations.
In one embodiment, the present invention provides a photoacid generator of Formula (I):
##STR00002##
wherein
R1 is selected from the group consisting of -hydrogen, -alkyl, -alkenyl, -alkynyl, -cycloalkyl, -fluoroalkyl, -fluoroalkenyl, -fluoroalkynyl, -aryl, —O-alkyl, —O-alkenyl, —O-aryl, —O-alkylene-aryl, —O-alkylene-arylene-alkyl, —O-alkylene-arylene-alkenyl, —OC(O)-alkyl, —OC(O)-alkenyl, -carboxyl, and -hydroxyl; and
wherein the alkenyl and the aryl groups of R1 are optionally substituted 1 to 5 times with a substituent group, wherein the substituent group(s) are independently selected from the group consisting of -alkyl, -alkylene, -aryl, -carboxyl, and -hydroxyl.
R2, R3, R4, and R5 are independently selected from the group consisting of -hydrogen, -alkyl, -alkenyl, -fluoroalkyl, -fluoroalkenyl, —O-alkyl, -halo, -cyano, and -nitro.
R6 is a direct bond or selected from the group consisting of alkyl or fluorinated alkyl.
X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
In another embodiment, the present invention provides a photoacid generator of Formula (II):
##STR00003##
wherein
R1 is selected from the group consisting of alkylene, alkenylene, fluorinated alkylene, and fluorinated alkenylene; and
X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
In another embodiment, the present invention provides a photoacid generator of Formula (III):
##STR00004##
wherein
Y1, Y2, and Y3 are independently selected from the group consisting of alkylene, alkenylene, fluoroalkylene, and fluoroalkenylene.
Z1, Z2, and Z3 are independently selected from the group consisting of:
##STR00005##
and —O—C(O)—O—R7
In a further embodiment, the present invention provides a dendrimer comprising at least one photoacid generator moiety. In some embodiments, a dendrimer comprises a plurality of photoacid generator moieties. In addition to at least one or a plurality of photoacid generating moieties, a dendrimer, in some embodiments, comprises at least one acid labile protecting group or a plurality of acid labile protecting groups. An acid labile protecting group, according to embodiments of the present invention, is operable to undergo acid catalyzed cleavage resulting in at least a partial polarity change of the molecule with which the acid labile protecting group was associated.
In one embodiment, the present invention provides a dendrimer comprising at least one acid labile protecting group and no photoacid generating moieties. In another embodiment, the present invention provides a dendrimer comprising a plurality of acid labile protecting groups and no photoacid generating moieties.
Dendrimers comprising photoacid generating moieties and/or acid labile protecting groups, according to some embodiments of the present invention, comprise zero generation (G0), first generation (G1), second generation (G2), third generation (G3), fourth generation (G4), fifth generation (G5), and greater than fifth generation (G5) dendrimers.
In some embodiments, the present invention provides a dendrimer of Formula (IV):
##STR00006##
wherein R1, R2, R3, R4, R5, and R6 are independently selected from the group consisting of:
##STR00007##
and —O—C(O)—O—R13
In another aspect, the present invention provides lithographic resists comprising photoacid generators and/or dendrimers as described herein. In one embodiment, the present invention provides a lithographic resist comprising at least one photoacid generator of Formula (I). In another embodiment, the present invention provides lithographic resist comprising at least one photoacid generator of Formula (II). In another embodiment, the present invention provides a lithographic resist comprising at least one photoacid generator of Formula (III). A lithographic resist, in some embodiments, comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III). In a further embodiment, the present invention provides a lithographic resist comprising at least one dendrimer of Formula (IV).
In one embodiment, the present invention provides a lithographic resist comprising an adamantyl component and a photoacid generating component, wherein the photoacid generating component comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the photoacid generating group comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III).
A lithographic resist comprising an adamantyl component and a photoacid generating component, in some embodiments, further comprises a hydroxystyrene component or a γ-butyrolactone component. In some embodiments, the adamantyl component and hydroxystyrene component or γ-butyrolactone component are copolymerized.
In some embodiments, the photoacid generating component is blended with the adamantyl component. In other embodiments, the photoacid generating component is incorporated into the polymeric backbone of the polymeric resist through copolymerization with the adamantyl component.
In another embodiment, a lithographic resist comprises a photoacid generating component comprising a photoacid generator of Formula (III), wherein the lithographic resist does not comprise a polymeric component. In a further embodiment, a lithographic resist comprises a dendrimer comprising photoacid generating moieties and/or acid labile protecting groups, wherein the lithographic resist does not comprise a polymeric component. In one embodiment, a lithographic resist comprises a dendrimer of Formula (IV).
Polymeric resists of the present invention, in some embodiments, further comprise a base component. In one embodiment, the base component is blended in the polymeric resist. In another embodiment, the base component is part of the polymeric backbone of the polymeric resist.
Polymeric resists of the present invention, in some embodiments, further comprise a fullerene derivative. In one embodiment, the fullerene derivative is blended in the polymeric resist. In another embodiment, the fullerene derivative is part of the polymeric backbone of the polymeric resist.
In another aspect the present provides methods for producing lithographic resists. In one embodiment, a method of producing a resist comprises blending a photoacid generating component with a first component, wherein the photoacid generating component comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the photoacid generating component comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the first component comprises an adamantyl component. A method for producing a lithographic resist, in some embodiments, further comprises blending a photoacid generating component with a second component in addition to the first component. A second component, in some embodiments, comprises a hydroxystyrene component or a γ-butyrolactone component. In one embodiment, the first component and second component are copolymerized. Copolymerization of the first and second components, in some embodiments, is completed prior to blending the photoacid generating component.
A method for producing a lithographic resist, in another embodiment, comprises copolymerizing a first component and a photoacid generating component, wherein the photoacid generating component comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the photoacid generating component comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III). The first component, in some embodiments, comprises a first monomer, first oligomer, and/or first polymer. In one embodiment, the first component comprises an adamantyl component.
In some embodiments, a method for producing a lithographic resist further comprises copolymerizing a second component with the first component and photoacid generating component. The second component, in some embodiments, comprises a second monomer, second oligomer, and/or second polymer. In one embodiment, the second component comprises a hydroxystyrene component or a γ-butyrolactone component.
In another aspect, the present invention provides lithographic processes. In one embodiment, a lithographic process of the present invention comprises exposing a lithographic recording medium to radiation to form a pattern, wherein the lithographic recording medium comprises a resist as described herein. In some embodiments, a lithographic process further comprises developing the pattern. In some embodiments of lithographic processes of the present invention, radiation used in the patterning of resists comprises extreme ultraviolet radiation (EUV), x-ray radiation, 193 nm radiation, electron beam radiation, ion beam radiation, or combinations thereof.
In a further aspect, the present invention provides integrated circuits prepared by lithographic processes utilizing the presently described resists.
These and other features, embodiments, objects, and advantages of the present invention will become apparent after a review of the following detailed description of the disclosed embodiments.
The present invention provides photoacid generators and lithographic resists comprising photoacid generators which can achieve high sensitivity, high contrast, high resolution, and/or high dry etch resistance for pattern transfer to a substrate. Moreover, the present invention provides photoacid generators and resists that address compatibility problems associated with photoacid generators which can lead to phase separation, non-uniform acid distribution, and non-uniform acid migration occurring during temperature fluctuations.
Definitions
In order to more clearly define the terms used herein, the following definitions are provided.
The terms alkyl, alkylene, alkenyl, alkenylene, alkynyl, and alkylene are intended to encompass straight chain and branched structures. The chemical nomenclature used herein is meant to be interpreted by one of skill in the art, and, therefore, any deviations and combinations of this type of nomenclature is also within the abilities of those of skilled in the art to interpret. Accordingly, this type of nomenclature is not to be applied to combinations that would result in an unrealistic molecule or substituent.
A resist, as used herein, refers to an imaging or recording medium, usually a polymeric material, that is used in a lithographic process, typically for the production of integrated circuits. In a general sense, a resist is a material that is used to prevent a particular chemical or physical reaction such as chemical attack, electrodeposition, vapor phase deposition, or other reactions. A resist of the present invention may comprise a positive resist or a negative resist.
Lithography, or a lithographic process, as used herein, refers to a process by which the pattern, typically a pattern of an integrated circuit, is imprinted onto a substrate or a resist. Lithography may be accomplished by exposing a recording medium with radiation of some form, followed by developing the pattern to be used, which results in the removal of either the exposed or the unexposed material. A variety of radiation sources may be used, including but not limited to, extreme ultraviolet (EUV) or deep ultraviolet (DUV) radiation, 193 nm radiation, X-rays, electron beams, and ion beams.
Photoacid Generators
In one embodiment, the present invention provides a photoacid generator of Formula (I):
##STR00008##
wherein
R1 is selected from the group consisting of -hydrogen, -alkyl, -alkenyl, -alkynyl, -cycloalkyl, -fluoroalkyl, -fluoroalkenyl, -fluoroalkynyl, -aryl, —O-alkyl, —O-alkenyl, —O-aryl, —O-alkylene-aryl, —O-alkylene-arylene-alkyl, —O-alkylene-arylene-alkenyl, —OC(O)-alkyl, —OC(O)-alkenyl, -carboxyl, and -hydroxyl, and
wherein the alkenyl and the aryl groups of R1 are optionally substituted 1 to 5 times with a substituent group, wherein the substituent group(s) are independently selected from the group consisting of -alkyl, -alkylene, -aryl, -carboxyl, and -hydroxyl.
R2, R3, R4, and R5 are independently selected from the group consisting of -hydrogen, -alkyl, -alkenyl, -fluoroalkyl, -fluoroalkenyl, —O-alkyl, -halo, -cyano, and -nitro.
R6 is a direct bond or selected from the group consisting of alkyl or fluorinated alkyl.
X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
Sulfonium compounds, according to some embodiments of the present invention, have the formula:
##STR00009##
wherein R14, R15, and R16 are independently selected from the group consisting of -alkyl and -aryl, wherein the aryl is optionally substituted 1 to 5 times with a substituent group, wherein the substituent group(s) are independently selected from the group consisting of -alkyl and -aryl.
Ionium compounds, according to some embodiments of the present invention, have the formula:
##STR00010##
wherein R17 and R18 are independently selected from the group consisting of -alkyl and -aryl, wherein the aryl is optionally substituted 1 to 5 times with a substituent group, wherein the substituent group(s) are independently selected from the group consisting of -alkyl and -aryl.
Non-limiting examples of photoacid generators of Formula (I) are provided below:
##STR00011## ##STR00012##
Photoacid generators of Formula (I), according to some embodiments of the present invention, are synthesized according to the reaction schemes illustrated in
In another embodiment, the present invention provides a photoacid generator of Formula (II):
##STR00013##
wherein
R1 is selected from the group consisting of alkylene, alkenylene, fluorinated alkylene, and fluorinated alkenylene; and
X+ is selected from the group consisting of a sulfonium compound and an ionium compound.
Sulfonium and ionium compounds, in some embodiments of photoacid generators of Formula (II), are consistent with the sulfonium and ionium compounds provided in Formula (I).
A non-limiting example of a photoacid generator of Formula (II) is provided below:
##STR00014##
Photoacid generators of Formula (II), in some embodiments, are synthesized according to the reaction scheme provided in
In another embodiment, the present invention provides a photoacid generator of Formula (III):
##STR00015##
wherein
Y1, Y2, and Y3 are independently selected from the group consisting of alkylene, alkenylene, fluoroalkylene, and fluoroalkenylene.
Z1, Z2, and Z3 are independently selected from the group consisting of:
##STR00016##
and —O—C(O)—O—R7
Sulfonium and ionium compounds, in some embodiments of photoacid generators of Formula (III), are consistent with the sulfonium and ionium compounds provided in Formula (I). Moreover, sulfonate compounds, in some embodiments of photoacid generators of Formula (III), comprise −OSO2C4F9 and/or −OSO2CF3.
Non-limiting examples of photoacid generators of Formula (III) are provided below:
##STR00017## ##STR00018##
Photoacid generators of Formula (III), in some embodiments, are synthesized according to the reaction schemes provided in
In a further embodiment, the present invention provides a dendrimer comprising at least one photoacid generating moiety. In some embodiments, a dendrimer comprises a plurality of photoacid generating moieties. In addition to at least one or a plurality of photoacid generating moieties, a dendrimer, in some embodiments, comprises at least one acid labile protecting group.
In one embodiment, the present invention provides a dendrimer comprising at least one acid labile protecting group and no photoacid generating moieties. In another embodiment, the present invention provides a dendrimer comprising a plurality of acid labile protecting groups and no photoacid generating moieties.
Dendrimers comprising photoacid generating moieties and/or acid labile protecting groups, according to some embodiments of the present invention, comprise zero generation (G0), first generation (G1), second generation (G2), third generation (G3), fourth generation (G4), fifth generation (G5), and greater than fifth generation (G5) dendrimers.
In some embodiments, the present invention provides a dendrimer of Formula (IV):
##STR00019##
wherein R1, R2, R3, R4, R5, and R6 are independently selected from the group consisting of:
##STR00020##
and —O—C(O)—O—R13
Sulfonium and ionium compounds, in some embodiments of dendrimers of Formula (IV), are consistent with the sulfonium and ionium compounds provided in Formula (I). Moreover, sulfonate compounds, in some embodiments of photoacid generators of Formula (IV), comprise −OSO2C4F9 and/or −OSO2CF3.
In some embodiments, dendrimers of Formula (IV) are synthesized according to the reaction scheme illustrated in
Lithographic Resists Comprising Photoacid Generators
In another aspect, the present invention provides lithographic resists comprising photoacid generators and/or dendrimers as described herein. In one embodiment, the present invention provides a resist comprising at least one photoacid generator of Formula (I). In another embodiment, the present invention provides a resist comprising at least one photoacid generator of Formula (II). In another embodiment, the present invention provides a resist comprising at least one photoacid generator of Formula (III). A polymeric resist, in some embodiments, comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III). In a further embodiment, the present invention provides a lithographic resist comprising at least one dendrimer of Formula (IV).
In one embodiment, the present invention provides a polymeric resist comprising an adamantyl component and a photoacid generating component, wherein the photoacid generating component comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the photoacid generating component comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III). Moreover, in some embodiments, a polymeric resist comprising an adamantyl component and a photoacid generating component further comprises a hydroxystyrene component or a γ-butyrolactone component.
In some embodiments, the adamantyl component of a polymeric resist comprises methyl-adamantyl methacrylates, ethyl-adamantyl methacrylates, such as 2-ethyl-2-adamantyl methacrylate, propyl-adamantyl methacrylates, butyl-adamantyl methacrylates, methoxybutyl-adamantyl methacrylates, such as 2-(4-methoxybutyl)-2-adamantyl methacrylate, hydroxy-adamantyl methacrylates, such as 3-hydroxy-adamantyl methacrylate, or combinations thereof. Moreover, a hydroxystyrene component of a polymeric resist, in some embodiments, comprises para-hydroxystyrene (PHS), poly-(para-hydroxystyrene) (poly-PHS), or combinations thereof. In some embodiments, a γ-butyrolactone component comprises a γ-butryolactone methacrylate.
In some embodiments, the adamantyl component and hydroxystyrene component of the resist are copolymerized.
In some embodiments, a copolymer of a hydroxystyrene component and an adamantyl component comprises about 45 mol % hydroxystyrene component and about 55 mol % adamantyl component. In other embodiments, a copolymer of a hydroxystyrene component and an adamantyl component comprises about 40 mol % hydroxystyrene component and about 60 mol % adamantyl component. In a further embodiment, a copolymer of a hydroxystyrene component and an adamantyl component comprises about 20 mol % hydroxystyrene component and about 80 mol % adamantyl component.
In some embodiments, a copolymer of a hydroxystyrene component and an adamantyl component comprises from about 10 mol % to about 50 mol % hydroxystyrene component. In other embodiments, a copolymer of a hydroxystyrene component and an adamantyl component comprises from about 20 mol % to about 40 mol % hydroxystyrene component.
In some embodiments, the weight average molecular weight (Mw) of a copolymer of a hydroxystyrene component and an adamantyl component ranges from about 2200 to about 8000. In some embodiments, the glass transition (Tg) temperature of a copolymer of a hydroxystyrene component and an adamantyl component ranges from about 100° C. to about 170° C. In other embodiments, the glass transition temperature ranges from about 100° C. to about 120° C.
A photoacid generating component, in some embodiments, is blended with a copolymer comprising a hydroxystyrene component and an adamantyl component in producing a polymeric resist of the present invention. In some embodiments, the blended photoacid generating component comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In other embodiments, the blended photoacid generating component comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III).
In some embodiments, the blended photoacid generating component comprises from about 1 weight percent to about 20 weight percent of the polymeric resist. In other embodiments, the blended photoacid generating component comprises from about 5 weight percent to about 15 weight percent of the polymeric resist. In a further embodiment, the blended photoacid generating component comprises about 10 weight percent of the polymeric resist.
In some embodiments, a polymeric resist comprising a hydroxystyrene component, an adamantyl component, and a blended photoacid generating component can further comprise a base component. The base component, in some embodiments, is blended into the polymer matrix. Base components operable to be blended into the polymer matrix, in some embodiments, comprise triethyl amine, trioctyl amine, tetramethyl ammonium hydroxide, and tetrabutyl ammonium hydroxide.
In some embodiments, a polymeric resist comprising a hydroxystyrene component, an adamantyl component, and a blended photoacid generating component can further comprise a fullerene component. The fullerene component, in some embodiments, can be blended into the polymer matrix. Fullerene components operable to be blended into the polymer matrix, in some embodiments, comprise fullerene derivatives as illustrated in
In another embodiment, the present invention provides a polymeric resist comprising an adamantyl component copolymerized with a γ-butyrolactone component.
In some embodiments, a copolymer of a γ-butyrolactone component and an adamantyl component comprises about 60 mol % γ-butyrolactone component and about 40 mol % adamantyl component. In other embodiments, a copolymer of a γ-butyrolactone component and an adamantyl component comprises about 65 mol % γ-butyrolactone component and about 35 mol % adamantyl component. In a further embodiment, a copolymer of a γ-butyrolactone component and an adamantyl component comprises about 50 mol % γ-butyrolactone component and about 50 mol % adamantyl component.
In some embodiments, a copolymer of a γ-butyrolactone component and an adamantyl component comprises from about 30 mol % to about 70 mol % γ-butyrolactone component. In other embodiments, a copolymer of a γ-butyrolactone component and an adamantyl component comprises from about 40 mol % to about 60 mol % γ-butyrolactone component.
In some embodiments, the weight average molecular weight (Mw) of a copolymer of a γ-butyrolactone component and an adamantyl component ranges from about 2200 to about 8000. In some embodiments, the glass transition (Tg) temperature of a copolymer of a γ-butyrolactone component and an adamantyl component ranges from about 100° C. to about 150° C. In other embodiments, the glass transition temperature ranges from about 100° C. to about 120° C.
A photoacid generating component, in some embodiments, is blended with a copolymer comprising a γ-butyrolactone component and an adamantyl component in producing a polymeric resist of the present invention. In some embodiments, the blended photoacid generating component comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In other embodiments, the blended photoacid generating component comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III).
In some embodiments, the blended photoacid generating component comprises from about 1 weight percent to about 20 weight percent of the polymeric resist. In other embodiments, the blended photoacid generating component comprises from about 5 weight percent to about 15 weight percent of the polymeric resist. In a further embodiment, the blended photoacid generating component comprises about 10 weight percent of the polymeric resist.
In some embodiments, a polymeric resist comprising a γ-butyrolactone component, an adamantyl component, and a blended photoacid generating component can further comprise a base component. The base component, in some embodiments, is blended into the polymer matrix. Base components operable to be blended into the polymer matrix, in some embodiments, comprises triethyl amine, trioctyl amine, tetramethyl ammonium hydroxide, and tetrabutyl ammonium hydroxide.
In some embodiments, a polymeric resist comprising a γ-butyrolactone component, an adamantyl component, and a blended photoacid generating component can further comprise a fullerene component. The fullerene component, in some embodiments, is blended into the polymer matrix. Fullerene components operable to be blended into the polymer matrix, in some embodiments, comprise fullerene derivatives such as those illustrated in
Lithographic Resist with Photoacid Generating Groups Incorporated in the Resist Chains
In another aspect, the present invention provides polymeric resists comprising photoacid generators incorporated into the polymeric resist chains as part of the polymeric unit. In one embodiment, the present invention provides a polymeric resist comprising at least one photoacid generator of Formula (I) incorporated into the polymeric chain of the resist. In another embodiment, the present invention provides a polymeric resist comprising at least one photoacid generator of Formula (II) incorporated into the polymeric chain of the resist. In another embodiment, the present invention provides a polymeric resist comprising at least one photoacid generator of Formula (III) incorporated into the polymeric chain of the resist. In a further embodiment, a polymeric resist comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III) incorporated into the polymeric chain of the resist.
In one embodiment, a polymeric resist comprising at least one photoacid generator incorporated in the polymeric resist chain comprises an adamantyl component and a photoacid generating component. In some embodiments, the adamantyl component comprises an adamantyl methacrylate. Adamantyl methacrlyates, in some embodiments, comprise ethyl-adamantyl methacrylates, such as 2-ethyl-2-adamantyl methacrylate, propyl-adamantyl methacrylates, butyl-adamantyl methacrylates, methoxybutyl-adamantyl methacrylates, such as 2-(4-methoxybutyl)-2-adamantyl methacrylate, hydroxy-adamantyl methacrylates, such as 3-hydroxy-adamantyl methacrylate, or combinations thereof.
The photoacid generating component incorporated into the polymeric resist chain, in some embodiments, comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the photoacid generating component incorporated into the polymeric resist chain comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III).
Polymeric resists comprising an adamantyl component and a photoacid generating component incorporated into the polymeric resist chain, in some embodiments, further comprise a hydroxystyrene component. A hydroxystyrene component, in some embodiments, comprises para-hydroxystyrene (PHS), poly-(para-hydroxystyrene) (poly-PHS), or combinations thereof.
Photoacid generators of Formula (I), Formula (II), and/or Formula (III) incorporated in the polymeric resist chain, according to embodiments of the present invention, comprise a polymerizable functionality permitting copolymerization with the adamantyl and hydroxystyrene components.
In some embodiments, a polymeric resist comprising a hydroxystyrene component, an adamantyl component, and a photoacid generating component incorporated into the polymeric resist chain comprises about 35 mol % hydroxystyrene component, about 50 mol % adamantyl component, and about 15% photoacid generating component. In some embodiments, the hydroxystyrene component content of the polymeric resist ranges from about 20 mol % to about 50 mol % or from about 30 mol % to about 40 mol %. The adamantyl component content of the polymeric resist, in some embodiments, ranges from about 25 mol % to about 60 mol % or from about 30 mol % to about 50 mol %. The photoacid generating component content of the polymeric resist, in some embodiments, ranges from about 1 mol % to about 30 mol %, from about 5 mol % to about 20 mol %, or from about 10 mol % to about 15 mol %.
A base component, in some embodiments, can be incorporated in the polymeric chain of a polymeric resist comprising a hydroxystyrene component, an adamantyl component, and a photoacid generating component. Incorporation of a base component into the polymeric resist chain, in some embodiments, is effectuated according to the reaction scheme provided in
In some embodiments, a fullerene component can be incorporated in the polymeric chain of a polymeric resist comprising a hydroxystyrene component, an adamantyl component, and a photoacid generating component. Fullerene components operable to be incorporated in the polymeric chain, in some embodiments, comprise fullerene derivatives as illustrated in
In some embodiments, the weight average molecular weight (Mw) of a polymeric resist comprising a hydroxystyrene component, an adamantyl component, and a photoacid generating component incorporated in the polymeric resist chain ranges from about 1900 to about 6000. In some embodiments, the weight average molecular weight (Mw) ranges from about 2500 to about 5000 or from about 3000 to about 4000.
Polymeric resists comprising an adamantyl component and a photoacid generating component incorporated into the polymeric resist chain as provided herein, in some embodiments, further comprises a γ-butyrolactone component. The γ-butyrolactone component, in some embodiments, is copolymerized with the adamantyl component and photoacid generating component. In some embodiments, the γ-butyrolactone component comprises γ-butyrolactone methacrylate. Polymeric resists comprising a γ-butyrolactone component, adamantyl component, and photoacid generating component can be synthesized, in some embodiments, according to the reaction scheme illustrated in
In some embodiments, a polymeric resist comprising a γ-butyrolactone component, an adamantyl component, and a photoacid generating component incorporated into the polymeric resist chain comprises about 45 mol % γ-butyrolactone component, about 40 mol % adamantyl component, and about 15% photoacid generating component. In some embodiments, the γ-butyrolactone component content of the polymeric resist ranges from about 25 mol % to about 60 mol % or from about 30 mol % to about 50 mol %. The adamantyl component content of the polymeric resist, in some embodiments, ranges from about 25 mol % to about 50 mol % or from about 30 mol % to about 40 mol %. The photoacid generating component content of the polymeric resist, in some embodiments, ranges from about 1 mol % to about 30 mol %, from about 5 mol % to about 20 mol %, or from about 10 mol % to about 15 mol %.
A base component, in some embodiments, can be incorporated in the polymeric chain of a polymeric resist comprising a γ-butyrolactone component, an adamantyl component, and a photoacid generating component. Base components operable to be incorporated into the polymeric backbone of the polymeric resist, in some embodiments, can comprise N-vinylpyrrolidone and other bases with polymerizable functionalities. Base components, according to embodiments of the present invention, can be operable to control acid diffusion and concomitantly enhance resolution.
In some embodiments, the weight average molecular weight (Mw) of a polymeric resist comprising a γ-butyrolactone component, an adamantyl component, and a photoacid generating component incorporated in the polymeric resist chain ranges from about 1900 to about 6000. In some embodiments, the weight average molecular weight (Mw) ranges from about 2500 to about 5000 or from about 3000 to about 4000.
In another aspect the present invention provides methods for producing lithographic resists. In one embodiment, a method for producing a resist comprises blending a photoacid generating component with a first component, wherein the photoacid generating component comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the photoacid generating component comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the first component comprises an adamantyl component as provided herein. A method for producing a lithographic resist, in some embodiments, further comprises blending a photoacid generating group with a second component in addition to the first component. A second component, in some embodiments, comprises a hydroxystyrene component or a γ-butyrolactone component. In one embodiment, the first component and second component are copolymerized. Copolymerization of the first and second components, in some embodiments, is completed prior to blending with the photoacid generating component.
A method for producing a lithographic resist, in another embodiment, comprises copolymerizing a first component and a photoacid generating component, wherein the photoacid generating component comprises at least one photoacid generator of Formula (I), Formula (II), and/or Formula (III). In some embodiments, the photoacid generating component comprises a plurality of photoacid generators of Formula (I), Formula (II), and/or Formula (III). The first component, in some embodiments, comprises a first monomer, first oligomer, and/or first polymer. In one embodiment, the first component comprises an adamantyl component.
In some embodiments, a method for producing a lithographic resist further comprises copolymerizing a second component with the first component and photoacid generating component. The second component, in some embodiments, comprises a second monomer, second oligomer, and/or second polymer. In one embodiment, the second component comprises a hydroxystyrene component or a γ-butyrolactone component.
Lithographic Processes
The present invention also provides lithographic processes comprising exposing a lithographic recording medium to radiation to form a pattern and developing the pattern, wherein the lithographic recording medium comprises any resist of the present invention described herein. In some embodiments, the radiation of lithographic processes of the present invention comprises extreme ultraviolet radiation, 193 nm, X-ray radiation, electron beam radiation, ion beam radiation, or combinations thereof. Additionally, lithographic processes of the present invention can be used to produce integrated circuits.
Embodiments of the present invention are further illustrated in the following Examples.
Synthesis of Photoacid Generators
P-chloromethylstyrene (20 mmol) in 10 ml acetone was added dropwise to the aqueous solution of sodium sulfite (25 mmol) under nitrogen at reflux, and the mixture was refluxed for 12 hours. After cooling to room temperature, the solid was filtered and washed with water, acetone, and dried under high vacuum overnight to give pure product sodium salt, 4-vinyl benzylsulfonate (F4-VBzS-Na) as white solid in 81% yield. characterized by 1H NMR (25° C., ppm) δ7.34 (d, J=9.1 Hz, 2H); 7.26 (d, J=9.1 Hz, 2H); 6.72 (dd, J=10.7 and 18.6 Hz, 1H); 5.79 (d, J=18.6 Hz, 1H); 5.20 (d, J=10.7 Hz, 3H); 3.68 (s, 3H). Then the (VBzS-Na) was reacted with triphenylsulfonium chloride 50% aqueous solution in water, at room temperature overnight. The product was refined with dichloromethane and hexane, Triphenylsulfonium salt 4-vinylbenzylsulfonate (VBzS-TPS) was obtained in 90% yield as a colorless crystal. 1H NMR (25° C., ppm) δ7.42-7.92 (m, 15H); 7.32 (d, J=8.7 Hz, 2H); 7.24 (d, J=8.7 Hz, 2H); 6.68 (dd, J=11.2 and 18.0 Hz, 1H); 5.75 (d, J=18.0 Hz, 1H); 5.17 (d, s J=11.2 Hz, 3H); 3.66 (s, 3H).
P-chloromethylstyrene (20 mmol) in 10 ml acetone was added dropwise to the aqueous solution of sodium 4-hydroxy-2.3.5.6-tetrafluoro benzenesulfonate (25 mmol) under nitrogen at reflux, and the mixture was refluxed for 12 hours. After cooling to room temperature, the solid was filtered and washed with acetone, and dried under high vacuum overnight to give pure product sodium salt, 4-(vinyl benzyloxy) benzenesulfonate (VBzBS-Na) as white solid in 76% yield. characterized by 1H NMR (25° C., ppm) δ7.46-7.54 (m, 4H); 7.41 (d, J=9.0 Hz, 2H); 6.93 (d, J=9.3 Hz, 2H); 6.72 (dd, J=11.0 and 18.4 Hz, 1H); 5.83 (d, J=18.4 Hz, 1H); 5.27 (d, J=11.0 Hz, 1H); 5.1 (s, 2H). Then the (VBzBS-Na) was reacted with triphenylsulfonium chloride 50% aqueous solution in water, at room temperature overnight. The product was refined with dichloromethane and hexane, triphenylsulfonium salt 4-(vinyl benzyloxy) benzenesulfonate (VBzBS-TPS) was obtained in 90% yield as a colorless crystal. 1H NMR (25° C., ppm) δ7.39-7.90 (m, 21H); 6.92 (d, J=9.1 Hz, 2H); 6.73 (dd, J=11.0 and 18.2 Hz, 1H); 5.82 (d, J=18.2 Hz, 1H); 5.25 (d, s J=11.0 Hz, 1H); 5.1 (s, 2H).
P-chloromethylstyrene (20 mmol) in 10 ml acetone was added dropwise to the aqueous solution of sodium 4-hydroxy-2.3.5.6-tetrafluoro benzenesulfonate (25 mmol) under nitrogen at reflux, and the mixture was refluxed for 12 hours. After cooling to room temperature, the solid was filtered and washed with water and acetone, and dried under high vacuum overnight to give pure product sodium salt, 4-(vinyl benzyloxy) 2.3.5.6-tetrafluoro benzenesulfonate (F4-VBzBS-Na) as white solid in 79% yield. characterized by 1H NMR (25° C., ppm) δ7.49 (d, J=8.1 Hz, 2H); 7.41 (d, J=8.1 Hz, 2H); 6.72 (dd, J=11.2 and 17.8 Hz, 1H); 5.85 (d, J=17.8 Hz, 1H); 5.26 (d, s J=11.2 Hz, 3H), 19F NMR (25° C., ppm, ext.CF3COOH): δ −152.15 (m, 2F); −137.45 (m, 2F). Then the (F4-VBzBS-Na) was reacted with triphenylsulfonium chloride 50% aqueous solution in water, at room temperature overnight. The product was refined with dichloromethane and hexane, triphenylsulfonium salt 4-(vinyl benzyloxy) 2.3.5.6-tetrafluoro benzenesulfonate (F4-VBzBS-TPS) was obtained in 90% yield as a colorless crystal. 1H NMR (25° C., ppm) δ7.42-7.92 (m, 19H); 6.73 (dd, J=11.2 and 17.8 Hz, 1H); 5.86 (d, J=17.8 Hz, 1H); 5.27 (d, s J=11.2.0 Hz, 3H).
Triphenylsulfonium salt 4-vinylbenzylsulfonate (VBzS-TPS) was prepared as set forth in Example 1. To a solution of hexamethyldisilazane (1 mL) in THF(10 mL) was added Bu-Li(1.5 mL) at −78° C. After 1 hour at −78° C., The solution was dropwise added to a solution of VBzS-TPS (0.6 g) and N-fluorophenylsulfonimide(0.95 g)in DMF and THF cosolvents(10 mL) at −78° C. After 3 hours at −78° C., the resulting solution was warmed to ambient temperature and allowed to react an additional 3 hours. The reaction was quenched with saturated brine, extracted with dichloromethane and washed with water, to dried and removed the solvents to give a pale brown oil, in 33% yield. 1H NMR (25° C., ppm) δ7.02-8.13 (m, 19H). 13C NMR (25° C., ppm) δ 162.8, 152.0, 141.2, 140.8, 138.2, 136.3, 134.5, 133.1, 132.5, 131.3, 130.4, 129.5, 128.4, 127.0, 126.3, 125.4, 124.2 and 30.9. 19F NMR (25° C., ppm, ext. CF3COOH): δ −97.55 (m, 2F); −38.07 (m, 1F); 38.55 (m, 1F); 50.20 (m, 1F).
First, 4-hydroxy-2.3.5.6-tetrafluoro benzenesulfonate was prepared as per literature method[10]. This was then reacted with methacrylic acid in trifluoroacetic acid (TFA) and trifluoroacetic anhydride (TFAA) as media[11], under a nitrogen atmosphere overnight, to get sodium 4-(methacryloxy) 2.3.5.6-tetrafluorobenzenesulfonate [F4-MBS-Na] in 97% yield, characterized by 1H NMR (25° C., ppm) δ6.45 (s, 1H); 6.13 (s, 1H); 2.06 (s, 3H), 19F NMR (25° C., ppm, ext.CF3COOH): δ −152.35 (m, 2F); −137.68 (m, 2F). Then the F4-MBS-Na was reacted with triphenylsulfonium chloride 50% aqueous solution in water, at room temperature overnight. The product was refined with dichloromethane and hexane, F4-MBS-TPS was obtained in 90% yield as a colorless crystal, MP: 57-59° C. 1H NMR (25° C., ppm) δ7.42-7.92 (m, 15H); 6.45 (s, 1H); 6.12 (s, 1H); 2.03 (s, 3H). 13C NMR (25° C., ppm) δ162.8, 141.0, 136.3, 134.5, 133.1, 132.5, 131.3, 130.4, 128.7, 125.4, 124.2 and 17.9. 19F NMR (25° C., ppm, ext. CF3COOH): δ −152.55 (m, 2F); −137.62 (m, 2F). Anal. Calcd for C28H20F4O5S2: C, 58.33; H, 3.50; F, 13.18; O, 13.87; S, 11.12. Found: C, 58.39; H, 3.34; F, 12.85; O, 13.83; S, 11.06.
Triphenylsulfonium salt 4-(methacryloxy) benzenesulfonate (MBS-TPS) was prepared by a similar procedure to that of F4-MBS-TPS above by reacting sodium 4-phenosulfonate and methacrylic acid in TFA and TFAA media, yield 88% as a colorless crystal, MP: 68-70° C. 1H NMR (25° C., ppm) δ7.61-7.82 (m, 17H); 7.09 (d, J=8.0 Hz, 2H); 6.28 (s, 1H); 5.89 (s, 1H) and 2.00 (s, 3H). 13C NMR (25° C., ppm) δ 165.3, 150.4, 146.2, 141.0, 135.2, 134.5, 132.5, 131.4, 127.9, 126.9, 125.2, 121.1 and 18.0. Anal. Calcd for C28H24O5S2: C, 66.64; H, 4.79; O, 15.85; S, 12.71. Found: C, 66.77; H, 4.44; O, 15.65; S, 12.35.
Triphenylsulfonium salt 4-(vinyl) benzenesulfonate (VBS-TPS) was prepared by reacting sodium 4-styrenesulfonate and triphenylsulfonium chloride 50% aqueous solution in water, at room temperature overnight, yield 83% as a colorless crystal[12], MP: 56-58° C. 1H NMR (25° C., ppm) δ7.65-7.92 (m, 15H); 7.54 (d, J=8.1 Hz, 2H); 7.40 (d, J=8.1 Hz, 2H); 6.72 (dd, J=17.6 and 10.8 Hz, 1H); 5.84 (d, J=17.6 Hz, 1H) and 5.26 (d, J=10.8 Hz, 1H). 13C NMR ( 25° C., ppm) δ148.0, 141.0, 137.1, 136.3, 134.5, 132.5, 131.4, 125.4, 124.2 and 114.7. Anal. Calcd for C26H22O3S2: C, 69.93; H, 4.97; O, 10.75; S, 14.36. Found: C, 69.77; H, 4.89; O, 11.19; O, 11.19; S, 14.74.
Triphenylsulfonium salt 4-(isobutyloxy) benezenesulfonate (IBBS-TPS) was prepared by a similar procedure for (MBS-TPS) above using isobutyric acid instead of methacrylic acid in 90.5% yield as a colorless crystal, MP: 76-78° C. 1H NMR (25° C., ppm) δ7.46-7.86 (m, 15H); 7.60 (d, J=7.6 Hz, 2H); 7.04 (d, J=7.6 Hz, 2H); 2.81 (heptet, J=7.4 Hz, 1H) and 1.23 (s, 6H). 13C NMR (25° C., ppm) δ175.0, 150.4, 146.0, 134.4, 132.4, 131.3, 126.8, 125.1, 124.1, 120.9, 33.3 and 18.6. Anal. Calcd for C28H26O5S2: C, 66.38; H, 5.17; O, 15.79; S, 12.66 . Found: C, 66.26; H, 4.70; O, 15.68; S, 13.03.
Triphenylsulfonium salt 4-(isobutyloxy) 2,3,5,6-tetrafluorobenzenesulfonate (F4-IBBS-TPS) was prepared by a method similar to F4-MBS-TPS above using isobutyric acid instead of methacrylic acid in 78.0% yield as a colorless crystal, MP: 62-64° C. 1H NMR (25° C., ppm) δ7.42-7.95 (m, 15H); 3.02 (heptet, J=7.2 Hz, 1H) and 1.26 (s, 6H). 13C NMR ( 25° C., ppm) δ172.9, 140.9, 136.2, 134.3, 132.4, 131.3, 131.0, 128.6, 125.1, 124.1, 33.1 and 18.4. 19F NMR (25° C., ppm, ext.CF3COOH): δ −153.82 (m, 2F); −138.73 (m, 2F). Anal. Calcd for C28H22F4O5S2: C, 58.12; H, 3.83; F, 13.13; O, 13.83; S, 11.08. Found: C, 58.34; H, 3.56; F, 12.79; O, 13.54; S, 10.83.
Synthesis of Polymeric Resists Comprising Photoacid Generators
4-(vinyl) benzene sulfonate (VBS-TPS) was prepared in accordance with Example 7. A terpolymer of hydroxystyrene, 2-ethyl-2-adamantyl methacrlyation, and 4-(vinyl) benzenesulfonate (VBS-TPS) was prepared by free radical polymerization in a sealed pressure vessel. Hydroxystyrene, 2-ethyl-2-adamantyl-methacrylate, VBS-TPS, and 2,2′-azobisisobutyronitrile (AIBN) as a free radical initiator (5 mol % to the monomers) were dissolved in freshly distilled anhydrous tetrahydrofuran (THF) and acetonitrile. Polymerization was performed at 65° C. for 24 hours. The polymer solution was precipitated into a large amount of diethyl ether or petroleum ether and dried under vacuum.
Triphenylsulfonium salt 4-(methacryloxy) benzenesulfonate (MBS-TPS) was prepared in accordance with Example 6. A terpolymer of hydroxystyrene, 2-ethyl-2-adamantyl methacrlyation, and triphenylsulfonium salt 4-(methacryloxy) benzenesulfonate (MBS-TPS) was prepared by free radical polymerization in a sealed pressure vessel. Hydroxystyrene, 2-ethyl-2-adamantyl-methacrylate, MBS-TPS, and 2,2′-azobisisobutyronitrile (AIBN) as a free radical initiator (5 mol % to the monomers) were dissolved in freshly distilled anhydrous tetrahydrofuran (THF) and acetonitrile. Polymerization was performed at 65° C. for 24 hours. The polymer solution was precipitated into a large amount of diethyl ether or petroleum ether and dried under vacuum.
Triphenylsulfonium salt 4-(methacryloxy) 2,3,5,6-tetrafluoro benzenesulfonate (F4-MBS-TPS) was prepared in accordance with Example 5. A terpolymer of hydroxystyrene, 2-ethyl-2-adamantyl methacrlyation, and Triphenylsulfonium salt 4-(methacryloxy) 2,3,5,6-tetrafluoro benzenesulfonate (F4-MBS-TPS) was prepared by free radical polymerization in a sealed pressure vessel. Hydroxystyrene, 2-ethyl-2-adamantyl-methacrylate, F4-MBS-TPS, and 2,2′-azobisisobutyronitrile (AIBN) as a free radical initiator (5 mol % to the monomers) were dissolved in freshly distilled anhydrous tetrahydrofuran (THF) and acetonitrile. Polymerization was performed at 65° C. for 24 hours. The polymer solution was precipitated into a large amount of diethyl ether or petroleum ether and dried under vacuum.
Table I provides molar feed ratios and other chemical and physical properties of the polymeric resists synthesized in Examples 10-12.
TABLE I
Chemical and Physical Properties of Polymeric Resists
Polymer
Mole Feed Ratio
Polymer Composition
Mw*
Stability/
Tg/
(Resist)
HOST
EAMA
PAG
HOST
EAMA
PAG
Yield/%
(PDI)
° C.
° C.
EXAMPLE 10
30
65
5.0
41.7
48.6
9.7
44.3
3700 (1.7)
156
***
HE-VBS-TPS
EXAMPLE 11
25
73.5
1.5
37.7
55.8
6.5
35.4
3800 (1.8)
153
***
HE-MBS-TPS
EXAMPLE 12
25
72.5
2.5
35.0
57.9
7.1
37.3
3600 (1.6)
145
***
HE-F4-MBS-
TPS
4-(vinyl) benzene sulfonate (VBS-TPS) was prepared in accordance with Example 7. γ-Butyrolactone, 2-ethyl-2-adamantyl-methacrylate, VBS-TPS, and 2,2′-azobisisobutyronitrile (AIBN) as a free radical initiator (5 mol % to the monomers) were dissolved in freshly distilled anhydrous tetrahydrofuran (THF) and acetonitrile. Polymerization was performed at 65° C. for 24 hours. The polymer solution was precipitated into a large amount of diethyl ether or petroleum ether and dried under vacuum.
Triphenylsulfonium salt 4-(methacryloxy) 2,3,5,6-tetrafluoro benzenesulfonate (F4-MBS-TPS) was prepared in accordance with Example 5. γ-Butyrolactone, 2-ethyl-2-adamantyl-methacrylate, F4-MBS-TPS, and 2,2′-azobisisobutyronitrile (AIBN) as a free radical initiator (5 mol % to the monomers) were dissolved in freshly distilled anhydrous tetrahydrofuran (THF) and acetonitrile. Polymerization was performed at 65° C. for 24 hours. The polymer solution was precipitated into a large amount of diethyl ether or petroleum ether and dried under vacuum.
Table II provides molar feed ratios and other chemical and physical properties of the polymeric resists synthesized in Examples 13-14.
TABLE II
Chemical and Physical Properties of Polymeric Resists
Polymer
Mole Feed Ratio
Polymer Composition
Mw*
Stability/
Tg/
(Resist)
GBLMA
EAMA
PAG
GBLMA
EAMA
PAG
Yield/%
(PDI)
° C.
° C.
EXAMPLE
30.7
66.5
2.8
52.5
41.1
6.4
17.4
3700 (2.3)
163
100
13
GE-VBS-TPS
EXAMPLE
25
72.5
2.5
55.3
39.2
5.5
31.5
2100 (3.3)
151
142
14
GE-F4-MBS-
TPS
Resist Processing
Polymeric resists of Examples 13 and 14 were processed according to the following procedure. 0.2 g of polymer prepared in accordance with Examples 13 or 14 was dissolved in 3.4 g of cyclohexanone. The resist solution was filtered through 0.2 μm filter and spin coated (2500 rpm, 60s) onto silicon wafers primed with a 20% 1,1,3,3,3-hexamethyldisilazane (HMDS)-80% propylene glycol-1-monomethylether-2-acetate (PGMEA) solution. The post apply bake was carried out at 100° C. for 90 seconds. The thickness of the resist was determined to be in the range of 110 nm to 150 nm. The exposed wafers were baked at 100 C for 90 s. The development was conducted in conventional 2.38-wt % tetramethylammonium hydroxide (TMAH) for approximately 10-20 s and rinsed with de-ionized water.
Lithographic Evaluation
Exposed wafers were evaluated on an Raith 150 SEM. Top down SEM images of exposed polymeric resists of Examples 13 and 14 are provided in
Various embodiments of the invention have been described in fulfillment of the various objects of the invention. It should be recognized that these embodiments are merely illustrative of the principles of the present invention. Numerous modifications and adaptations will be readily apparent to those skilled in the art without departing from the spirit and scope of the present invention.
Gonsalves, Kenneth E., Wang, Mingxing
| Patent | Priority | Assignee | Title |
| 10310375, | Jun 10 2008 | Photoacid generators and lithographic resists comprising the same | |
| 10662274, | Dec 02 2016 | Georgia Tech Research Corporation | Self-immolative polymers, articles thereof, and methods of making and using same |
| 8685616, | Jun 10 2008 | University of North Carolina at Charlotte | Photoacid generators and lithographic resists comprising the same |
| 8716518, | Dec 31 2010 | Dow Global Technologies LLC | Photoacid generating monomer and precursor thereof |
| 8895222, | Mar 25 2009 | FUJIFILM Corporation | Actinic ray-sensitive or radiation-sensitive resin composition and resist film and pattern forming method using the composition |
| 8900792, | Dec 31 2010 | Rohm and Haas Electronic Materials LLC | Polymerizable photoacid generators |
| 8907122, | Dec 31 2010 | Dow Global Technologies LLC | Method of preparing photoacid generating monomer |
| 9128372, | Dec 31 2012 | DUPONT ELECTRONIC MATERIALS INTERNATIONAL, LLC | Dendritic compounds, photoresist compositions and methods of making electronic devices |
| 9604921, | Sep 25 2014 | Shin-Etsu Chemical Co., Ltd. | Sulfonium salt, resist composition and resist pattern forming process |
| Patent | Priority | Assignee | Title |
| 5945250, | Jun 04 1996 | FUJIFILM Corporation | Positive photosensitive composition |
| 6869748, | Jul 04 2002 | Shin-Etsu Chemical Co., Ltd. | Resist composition and patterning process |
| 20020051928, | |||
| 20040029037, | |||
| 20040229161, | |||
| 20050208419, | |||
| 20060121390, | |||
| JP10221852, | |||
| JP11167199, | |||
| JP2003322972, | |||
| JP2006178317, |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Oct 06 2006 | The University of North Carolina at Charlotte | (assignment on the face of the patent) | / | |||
| Jan 19 2018 | University of Connecticut | NATIONAL SCIENCE FOUNDATION | CONFIRMATORY LICENSE SEE DOCUMENT FOR DETAILS | 045095 | /0496 |
| Date | Maintenance Fee Events |
| May 13 2014 | M2551: Payment of Maintenance Fee, 4th Yr, Small Entity. |
| Jul 02 2018 | REM: Maintenance Fee Reminder Mailed. |
| Dec 24 2018 | EXP: Patent Expired for Failure to Pay Maintenance Fees. |
| Date | Maintenance Schedule |
| Nov 16 2013 | 4 years fee payment window open |
| May 16 2014 | 6 months grace period start (w surcharge) |
| Nov 16 2014 | patent expiry (for year 4) |
| Nov 16 2016 | 2 years to revive unintentionally abandoned end. (for year 4) |
| Nov 16 2017 | 8 years fee payment window open |
| May 16 2018 | 6 months grace period start (w surcharge) |
| Nov 16 2018 | patent expiry (for year 8) |
| Nov 16 2020 | 2 years to revive unintentionally abandoned end. (for year 8) |
| Nov 16 2021 | 12 years fee payment window open |
| May 16 2022 | 6 months grace period start (w surcharge) |
| Nov 16 2022 | patent expiry (for year 12) |
| Nov 16 2024 | 2 years to revive unintentionally abandoned end. (for year 12) |