An in situ optical specimen holder is disclosed which may be utilized for imaging and analysis during dynamic experimentation. This holder assembly includes a set of focusing and reflection optics along with an environmental cell. electromagnetic radiation can be used to optically excite the specimen in the presence or absence of fluid. A highly reflective mirror may be used to focus the radiation on to the specimen without the presence of any heating components within the cell. The spot size of the irradiation at the specimen surface can be varied, thus exciting only a specific region on the specimen. The window type cell provides a variable fluid path length ranging from the specimen thickness to 500 μm. The holder has the provision to continuously circulate fluids over the specimen. The pressure within the cell can be regulated by controlling the flow rate of the fluids and the speed of the pumps.
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1. A specimen holder which receives and positions a specimen in an imaging device, said holder comprising:
a receptacle for receiving and supporting said specimen;
a receiver for a beam of electromagnetic radiation;
an elongated barrel mounted between said receiver and said receptacle for positioning said specimen at a preselected location within said imaging device and for containing said beam of electromagnetic radiation; and
an adjustable lens mounted within said elongated barrel for receiving and focusing said beam of electromagnetic radiations on said specimen at a focus point, said beam of electromagnetic radiations causing an increase in the energy level of a portion of said specimen proximate to the focus point of said beam of optical energy.
14. A specimen holder which receives and positions a specimen in an imaging device, said holder comprising:
a closed cell receptacle for receiving and supporting said specimen, said closed cell receptacle having an internal chamber for containing a controlled environment therein, said closed cell receptacle being transparent with respect to said imaging device; a beam of electromagnetic radiation focused on said closed cell receptacle;
at least one port for introduction of fluid components of said controlled environment; and
an elongated barrel for positioning said specimen at a preselected location within said imaging device and having at least one conduit for transmitting said fluid components of said controlled environment from said port to said internal chamber.
34. A specimen holder which receives and positions a specimen in an imaging device, said holder comprising:
a closed cell receptacle for receiving and supporting said specimen, said closed cell receptacle having an internal chamber for containing a controlled environment therein, said closed cell receptacle being transparent with respect to said imaging device;
a receiver for a beam of electromagnetic radiation;
at least one port for introduction of fluid components of said controlled environment;
an elongated barrel mounted between said receiver and said closed cell receptacle for positioning said specimen at a preselected location within said imaging device, said elongated barrel having at least one conduit for transmitting said fluid components of said controlled environment from said port to said internal chamber and said elongated barrel further containing said beam of electromagnetic radiation therein; and
a lens mounted within said elongated barrel for receiving and focusing said beam of electromagnetic radiation on said specimen within said closed cell receptacle at a focus point, said beam of electromagnetic radiation causing an increase in the energy level of said specimen proximate to the focus point of said beam of electromagnetic radiation.
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1. Field of the Invention
The invention relates to specimen holders for imaging and analysis and particularly to in situ holders capable of exciting a specimen for dynamic experimentation.
2. Description of the Prior Art
In situ is a Latin phrase meaning “in the place.” The ability to observe dynamic processes directly, close to their natural state as they undergo changes is vital for the advancement of research in many modern day applications. Various examples of in situ holders for transmission electron microscopy (TEM) include cooling holders, heating holders, nano indentation holders, straining holders, biasing holders and environmental cell holders. Holders are also utilized in a variety of other imaging and analysis devices.
Observations that require the presence of controlled environmental fluids around the specimen at elevated temperatures is one challenging aspect of in situ imaging and analysis. Fluids referred herein may include liquids, gases or plasma. An electron beam, such as that utilized by a TEM to create a specimen image, interacts strongly with matter. This leads to electron beam broadening which is detrimental to image resolution. To avoid extraneous scattering of the electron beam, it is desirable to have a very low-pressure beam path within the TEM column, optimally a high vacuum environment. A specimen immersed in fluids, opposes this basic principle. This limits the in situ environment height adjacent the specimen to less than a few hundred microns, making it extremely difficult to incorporate a heating system within the confined space of the holder necessary to create such an environment. Apart from this, high temperatures also give rise to specimen drift because of asymmetrical thermal expansion of the holder and consequential displacement of the specimen within the TEM. The presence of these fluids, therefore, decreases the resolution of the microscope images, limiting the amount of useful information that can be gathered.
In situ experimentation that requires the presence of fluids is carried out with the help of an environmental cell (E-Cell) that is part of the specimen holder. Typically, such a cell consists of two thin film windows, which completely seal a confined space around the specimen to provide a controlled atmosphere for in situ experimentation. The basic requirement for such a device is to contain the fluid within the cell so that the main microscope vacuum remains undisturbed.
Traditionally, heating holders employed resistive heating to elevate the specimen temperature.
Resistive heating is also limited by the maximum specimen temperature that can be achieved, generally limited to the range of 1,000° C. to 1,200° C. Moreover, the use of electrical current for heating can generate an electromagnetic field around the specimen, which may interfere with the electron imaging beam, limiting the image resolution and causing beam drift. Lastly, in light of the inefficient heating mechanism, the time required to attain steady state specimen temperatures is significant. Most dynamic processes occur within a fraction of a second. This makes the use of resistive heating technology difficult for most modern imaging applications.
Some current TEM holders employ microelectromechanical systems (MEMS) for imaging the specimen at elevated temperatures as illustrated in
There are, however, many shortcomings associated with such devices. The MEMS based TEM holders are designed to image small specimens such as particles. These holders cannot be used to observe a standard TEM specimen having a diameter of 3 mm. The specimen viewing area in a MEMS based holder is limited to a few square microns. In the MEMS based system the particle specimen is in contact with the silicon nitride membrane. This limits its use to a specimen temperature of less than 1,200° C. Lastly, the reaction chamber in a MEMS based holder is often limited to one time use.
One approach devised to carry out in situ gas flow experiments is the use of an environmental transmission electron microscope (ETEM). This is a term coined for TEM's modified to include a differentially pumped E-Cell. This ETEM consists of radial holes incorporated in the objective lens pole pieces for the first stage of differential pumping. The regular sample area of the ETEM is the controlled environment volume. Differential pumping systems are connected between apertures using appropriate vacuum pump technology. This permits higher gas pressure in the sample region, while maintaining high vacuum conditions in the remainder of the TEM column. A conventional reactor-type gas manifold system enables inlet of flowing gases into the ETEM, and a sample stage with a furnace allows samples to be heated.
The use of ETEM for in situ experiments has many disadvantages: (i) the high installation and operating cost of ETEM, especially to carry out only a dedicated set of experiments; (ii) ETEM can be used only to circulate gases over the specimen; (iii) since the ETEM does not have a completely sealed E-Cell, the gas pressure around the specimen is typically lower than 1 atmosphere, thus failing to replicate real life conditions, as it is necessary to observe gas-solid reactions at or close to atmospheric pressures; (iv) the gas path length within the ETEM is considerably large; (v) the gas circulation within the ETEM may contaminate the region around the objective lens pole pieces, which, apart from affecting the image resolution, could also affect the results of the next specimen analysis, which may require a different gaseous environment; (vi) it does not include a specimen heating system and heating has to be carried out using a standard heating specimen holder; and (vi) the partial pressure of any residual gas contained in the microscope column may negatively impact the experimental results.
Laser-induced breakdown spectroscopy (LIBS) is a type of atomic emission spectroscopy which utilizes a highly energetic laser pulse as the excitation source. LIBS operates by focusing the laser onto a small area at the surface of the specimen; when the laser is discharged it ablates a very small amount of material, in the range of picograms to nanograms, which instantaneously generates a plasma plume with temperatures of about 10,000-20,000 K. At these temperatures, the ablated material dissociates into excited ionic and atomic species. During this time, the plasma emits a continuum of radiation which does not contain any useful information about the species present, but within a very small timeframe the plasma expands at supersonic velocities and cools. At this point the characteristic atomic emission lines of the elements can be observed. O. Bostanjoglo and E. Endruschat, in “Kinetics of Laser-induced Crystallization of Amorphous Germanium Films”, Phys. Stat. Sol. (a), 91, 17 (1985), and H. Domer and O. Bostanjoglo, in “High-speed transmission electron microscope”, Rev. Sci. Instrum., 74 (10), 4369-4372, (2003) disclose an attached a Q-switched Nd-YAG laser system to a TEM to investigate the crystallization of amorphous Ge films by time resolved microscopy. A. Takaoka, N. Nakamura, K. Ura, H. Nishi, and T. Hata disclose, in “Local Heating of Specimen with Laser Diode in TEM”, J. Electron Microsc., Vol. 38, No. 2, 95-100, 1989, heating specimens locally to a temperature greater than 1000° C. by introducing a laser diode and small lens system into the vacuum space in the TEM. Some prominent laboratories have modified commercial TEM's by setting up an elaborate network of laser optics in order to pulse the electron beam as well as ablate the specimen. V. A. Lobastov, R. Srinivasan, and A. H. Zewail disclose, in “Four-dimensional ultrafast electron microscopy”, PNAS, Vol. 102, No. 20, 2005, a diode-pumped mode-locked Ti:Sapphire laser oscillator to develop a 4D ultra fast electron microscope. Here the laser is used to generate ultra fast electron pulse derived from a train of femtosecond pulses and concurrently heat the specimen and induce melting of metals. Similarly, T. LaGrange et. al., disclose, in “Single-shot dynamic transmission electron microscopy”, Appl. Phys. Lett., 89, 044105, 2006, the modification of a commercial JEOL2000 TEM and designed a dynamic transmission electron microscope (DTEM) with the help of an Nd-YAG laser system. This DTEM is used for vast arrays of applications including the in situ analysis of Nano wire catalysis and growth.
D. Shindo et. al., in “Development of a multifunctional TEM specimen holder equipped with a piezodriving probe and a laser irradiation port”, J. Electron Microsc., Vol. 58, No. 4, 245-249, 2009, disclose the development of a specimen holder to introduce laser irradiation onto the specimen to study various photo-induced phenomena. Even though this holder has the capability of introducing a laser beam onto the specimen, it does not have a provision for an E-Cell to observe the dynamic reactions between specimen and fluids, nor does it have the ability to focus or adjust the laser beam.
Many of these references highlight the importance of lasers in the field of imaging and analysis. They describe various forms of TEM's that have been modified to focus a laser beam onto the specimen. They do not, however, have any provision for a self contained specimen holder which permits the adjustment of the beam and the selective the flow of fluids over the specimen in a controlled environment. Moreover, the custom installation and operating cost of such modified TEMs are usually very high and the modifications are made to carry out very specific sets of experiments.
There remains a need, therefore, for an optimized in situ holder for the dynamic observation at elevated temperatures in the presence or absence of fluids. Such an in situ holder should have the capability of introducing a beam of electromagnetic radiation through the specimen holder and should be compatible with most major commercially available TEM's. It should be portable and should not involve any modification to the installed microscopes for in situ microscopy.
The holder should be designed such that it can accept a wide range of specimens, including a 3 mm diameter disk, particles dispersed on a grid or FIB lamellae contained on a support grid, and further should incorporate a compact heating design in order to minimize the fluid path length within the environmental cell. It should provide the ability to heat the specimen in the presence of fluids to a temperature in excess of 2,000° C., while providing the capability to heat a localized region of the specimen in order to limit the amount of heat radiated and conducted from the hot specimen to the surrounding region of the environmental cell and microscope components, reducing specimen drift and minimizing the amount of energy required to reach the desired specimen temperature. Finally, it should provide the capability for thermal cycling of the specimen with a short time interval, while incorporating high steady state specimen temperatures in a small time duration.
A specimen holder is disclosed having the benefits of previously known in situ heating and environmental cell holders, while allowing for high temperature localized heating of the specimen in the presence or absence of fluids, using electromagnetic radiation. The holder includes an optical assembly to focus electromagnetic radiation onto the specimen to optically excite the specimen in a well defined and limited area. The optical components of this holder can also be adapted for applications such as cathodoluminescence detection, x-ray fluorescence and photoluminescence.
For heating applications, an external source of electromagnetic radiation, such as a laser having a fixed wavelength, is attached to the holder using a standard connector. The laser beam enters the holder through a collimator that helps maintain a parallel laser beam path as it travels along the length of the holder barrel. A converging lens module is assembled near the specimen end of the holder barrel. The spot diameter of the laser beam at the focus point on the specimen can be varied by translating this converging lens module to locally heat the specimen in a limited manner. The converged laser beam is further reflected onto the specimen with the help of a minor or a polished surface on the holder tip. The angular position of the mirror is such that the laser beam nominally strikes the center of the specimen. The dimension and position of the minor can also be varied based on the application to obtain the desired irradiation effect on the specimen. Few examples of such minors include convex, concave and spherical mirrors.
When laser irradiation is used, as in the preferred embodiment, a radial, symmetric heating zone is generated on the specimen. This allows for uniform expansion of the specimen at high temperatures, minimizing specimen drift from uneven thermal expansion or contraction across the specimen. The maximum temperature that can be attained by the specimen is limited largely by the material properties of the specimen and the laser power, thus creating a potential for applications in an extraordinary range of fields including catalysis, chemical vapor deposition, and molecular beam epitaxy.
At any given time, imaging and analysis is carried out on a small specimen region. Thus, it is not required to heat the entire specimen. Spot heating of the specimen also reduces the energy and the time required to achieve a given steady state specimen temperature. Heat radiated from the specimen increases exponentially with the increase in the heated surface area. Hence, spot heating of the specimen reduces the heat radiation exponentially. This keeps the surrounding region of the holder close to ambient temperatures and reduces drift, which in turn enhances resolution. Localized heating of the specimen also reduces the heat conduction to other parts of the holder therefore minimizing thermal drift of the device as a whole.
The electromagnetic radiation may be modulated using a computer program. This provides dynamic thermal cycling of the specimen between ambient and elevated temperatures. Further, a pulsed laser can be attached to the holder to provide pulses of energy as small as a few nanoseconds for specific applications.
Unlike a MEMS heating holder, this holder can be used with standard TEM specimen types, as well as non-traditional specimens such as cones, pillars and lamellae.
The environmental cell on the specimen holder provides a controlled atmosphere for in situ observations and analysis. This cell preferentially consists of a pair of thin windows separated by spacers. The specimen is placed between the thermally insulating spacers. A particular O-ring sealing mechanism provides the user with the flexibility to choose the desired fluid path length. Since there is no heating element present within the E-Cell, the holder can be used with a fluid path length as small as the specimen thickness. An optimum fluid path length can be selected based on the required specimen temperature and the acceptable image resolution. The inlet and outlet conduits allow the entrance and the exit of fluids from the environmental cell.
The holder, together with its particular features and advantages, will become more apparent from the following detailed description and with reference to the appended drawings.
The present invention will be described in detail with respect to its preferred embodiment which is a specimen holder for a transmission electron microscope.
Referring now to
E-cell assembly 42 is placed within the cavity while in the open position as more fully described with reference to
Main body 12 is provided with a series of recesses and conduits to accommodate fluid conduits 22 which will not be described further as being within the ambit of one skilled in the art. Fluid inlet and outlet conduits 22a and 22b, respectively, are a means for the environmental fluid to enter and exit E-cell 4. Although
Mirror retainer assembly 14 is utilized to receive and support minor 15, which adapted to reflect the laser beam onto the specimen, as more fully discussed below. Minor 15 is bonded to minor retainer 14 at a precise, preselected angle or may be dynamically adjustable by external control. Minor retainer 14 is removably affixed to main body 12 by mounting screw 18.
Referring now to
E-Cell assembly 4 is restrained within E-Cell cavity 101 by the action of lid 6. Lid 6 is provided with an O-ring receiving recess 102a, corresponding to recess 102 in main body 12, for receiving and restraining O-ring 44b. O-ring 44b provides a sealing engagement between lid 6 and window frame 32a. This sealing engagement, when lid 6 is in the operative position, causes E-Cell 4 to be restrained as a unit within E-Cell cavity 101 for imaging and analysis. Additional sealing of the E-Cell cavity is provided by O-ring 44c, disposed between main body 12 and lid 6. Additionally, clamp 6a is slidingly engaged with lid 6 to more securely depress lid 6 into engagement with E-Cell 4. Clamp 6a is provided with a wedge shaped armature 6b which is interposed between lid 6 and main body 12. Once lid 6 is engaged with tangs 10 in the operative position, clamp 6a is slidingly displaced along track 11 (as shown in
In certain embodiments, the thickness of the components of the E-cell 4 may be adjusted to achieve a particular fluid path length above and below the specimen. However, the total height of the E-cell assembly 4 should not exceed 650 μm+/−25 μm. Tables 1 and 2 illustrate two different configurations of the E-cell 4 components to achieve a path length of 250 μm and 10 μm respectively. This assembly is illustrated in
TABLE 1
Example of Variable E-cell Assembly Height
Window Frame Thickness
320 μm × 2 = 640 μm
Specimen Disk Thickness
10 μm × 1 = 10 μm
TOTAL THICKNESS
650 μm
FLUID PATH LENGTH
10 μm
CONFIGURATION
TABLE 2
Example of Variable E-cell Assembly Height
Window Frame Thickness
200 μm × 2 = 400 μm
Specimen Disk Thickness
200 μm × 1 = 200 μm
Top Spacer Thickness
25 μm × 1 = 25 μm
Bottom Spacer Thickness
25 μm × 1 = 25 μm
TOTAL THICKNESS
650 μm
FLUID PATH LENGTH
250 μm
CONFIGURATION
Table 1 shows an E-cell 4 configuration for use with thin specimens. In this embodiment, the spacers are not utilized in the assembly. The fluid path length totally comprises the specimen thickness of 10 μm. Table 2 shows an E-cell 4 configuration for use with thicker specimens. As illustrated, the fluid path length is 250 μm, corresponding to the combined height of the specimen 38 and the top and bottom spacers 36a and 36b. The major contributor to the relatively large fluid path length is the specimen 38 thickness. As illustrated in
The use of a laser in the present system allows for high precision, localized heating of the TEM specimen. The laser optical components for this holder are illustrated in FIGS. 3 and 8-10. A standard laser connector 80, for example a SMA 905 laser connector, is provided at the handle 54 of the holder body (
The laser optics of the present invention, i.e., collimator 78, converging lens 72 and minor 15, act together to precisely focus laser beam 70 onto the E-cell 4 to attain high specimen temperatures. The maximum temperature that can be attained on the specimen is limited largely by the material properties of the specimen and the laser 500 power, thus creating a potential for applications in an extraordinary range of fields. The inventors have found that less than 1 Watt of laser energy was required to raise the specimen temperature to 2,000° C. An additional advantage of the presently described specimen laser spot heating is the speed in which the steady state specimen temperature is achieved. Most specimen reactions occur instantly once a critical temperature is obtained. Standard TEM heating holders utilizing resistive heaters have a slow heating response time and it takes a considerable amount of time to reach a steady state specimen temperature. The laser optics utilized in the present holder achieves sub millisecond heating response times due to the small heating zone. As a result, steady state specimen temperature is achieved instantly. The laser beam 70 can easily be modulated to provide dynamic thermal cycling of the specimen between ambient and elevated temperatures. Pulsed lasers can be attached to the holder to provide pulses of energy within a time frame as small as few nano seconds.
In addition, the laser heating system of the present invention is adjustable so that it may be used with a wide variety of specimens. The spot size of laser beam 70 may be adjusted by longitudinal displacement of lens body 72A. This allows the flexibility of changing the laser power density. For example, it is possible to first melt a 10 μm hole in the specimen at high laser power density, thus locating the laser beam position within the microscope. The laser beam size may be increased to obtain the desired specimen temperature in the vicinity of the hole.
Referring now to
Similarly, an external liquid circulation unit can be attached to the holder in a similar fashion to incorporate biological applications that require the flow of liquids through the cell.
The terms and expressions which have been employed herein are used as terms of description and not as limitation, and there is no intention in the use of such terms and expressions of excluding equivalents of the features shown and described or portions thereof, it being recognized that various modifications are possible within the scope of the invention claimed. Although particular embodiments of the present invention have been illustrated in the foregoing detailed description, it is to be further understood that the present invention is not to be limited to just the embodiments disclosed, but that they are capable of numerous rearrangements, modifications and substitutions.
Gronsky, Jeffrey J., Deshmukh, Pushkarraj V., Fischione, Paul E.
Patent | Priority | Assignee | Title |
10309878, | Jul 07 2016 | LIQUIDVIEW TECHNOLOGY CO , LTD | Packaging unit for liquid sample loading devices applied in electron microscope and packaging method |
11075054, | Apr 12 2018 | Nanofluidic cell system | |
8698098, | Jul 30 2010 | E.A. Fischione Instruments, Inc. | In situ holder assembly |
9812285, | Jan 27 2016 | Fei Company | Holder assembly for cooperating with a nanoreactor and an electron microscope |
9837244, | Dec 26 2014 | Industrial Technology Research Institute | Sample holding device for studying light-driven reactions and sample analysis method using the same |
Patent | Priority | Assignee | Title |
4229640, | Jan 18 1978 | R.T.M.-Istituto per le Ricerche di Tecnologia Meccanica | Working pieces by laser beam |
4591722, | Apr 20 1982 | The University Court of the University of Glasgow | Low temperature stage for microanalysis |
5326971, | May 17 1993 | Motorola, Inc. | Transmission electron microscope environmental specimen holder |
5972667, | May 19 1998 | Cell Robotics, Inc.; CELL ROBOTICS, INC | Method and apparatus for activating a thermo-enzyme reaction with electromagnetic energy |
6080956, | May 19 1997 | MATSUSHITA ELECTRIC INDUSTRIAL CO , LTD | Fiber optic light beam heating apparatus with adjustable lens position |
7006741, | Mar 22 2005 | Contact-field optical microscope | |
7219565, | Apr 08 2002 | E A FISCHIONE INSTRUMENTS, INC | Specimen holding apparatus |
8059271, | Feb 04 2009 | United States Government | Reusable sample holding device permitting ready loading of very small wet samples |
20050186776, | |||
20050279938, | |||
20060044554, | |||
20080015557, | |||
20080283748, | |||
JP8031361, |
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