A data programming circuit for storing a writing data into a memory cell is provided. The data programming circuit includes a control circuit and a current generating circuit. The control circuit generates a control signal according to the writing data. The current generating circuit provides a writing current to the memory cell to change a crystalline state of the memory cell. The writing current has a pulse width corresponding to the writing data, and the crystalline state corresponds to the writing data.
|
1. A data programming circuit for storing a writing data into a memory cell, comprising:
a control circuit, generating a first current according to the writing data; and
a current generating circuit, providing a writing current to the memory cell to change a crystalline state of the memory cell according to the first current, wherein the writing current has a pulse amplitude corresponding to the writing data, and the crystalline state corresponds to the writing data.
2. The data programming circuit as claimed in
3. The data programming circuit as claimed in
a signal generating circuit, providing a reference signal with a predetermined waveform;
a voltage generating circuit, generating a plurality of voltage signals according to the reference signal, wherein each of the voltage signals corresponds to the writing data with a specific value; and
a voltage controlled current source, generating the first current according to the writing data and the voltage signal corresponding to the writing data, wherein the first current has the pulse amplitude.
4. The data programming circuit as claimed in
5. The data programming circuit as claimed in
a signal generating circuit, providing a reference signal with a predetermined waveform;
a voltage generating circuit, generating a voltage signal according to the reference signal and the writing data; and
a voltage control current source, generating the first current according to the voltage signal, wherein the first current has the pulse amplitude.
6. The data programming circuit as claimed in
a variable current source, providing a second current corresponding to the writing data; and
a transistor coupled between the variable current source and a ground, having a gate for receiving the reference signal, wherein the transistor provides the voltage signal according to the second current and the reference signal.
7. The data programming circuit as claimed in
8. The data programming circuit as claimed in
9. The data programming circuit as claimed in
|
This application is a divisional of co-pending U.S. application Ser. No. 12/275,223 filed on Nov. 21, 2008, the entirety of which is incorporated by reference herein.
1. Field of the Invention
The invention relates to a data programming circuit, and more particularly to a data programming circuit of a memory.
2. Description of the Related Art
A Phase Change Memory (PCM) is a non-volatile memory with high speed, high capacity and low energy consumption, wherein a plurality of PCM cells of the PCM cell is formed by phase change material, such as chalcogenide etc. The phase change material can be switched between two states, a crystalline state and an amorphous state, with the application of heat, wherein the phase change material has different resistances corresponding to the crystalline and amorphous states respectively, wherein the resistances respectively represent different stored data.
In general, the PCM cell has a relatively high resistance in an amorphous state, which may be used to represent that a data stored in the PCM cell is a binary bit “0”. On the contrary, the PCM cell has a relatively low resistance in a crystalline state, which may be used to represent that a data stored in the PCM cell is a binary bit “1”.
However, for a PCM with a plurality of multi-level memory cells, each memory cell stores at least two-bits data (such as “00”, “01”, “10” and “11”). The multi-level PCM cell needs four different crystalline states in order to represent or identify the two-bits data stored in the PCM cell. Hence, for a PCM cell, the complexity of a programming method is increased when a category of the crystalline state is increased.
Data programming circuits and memory programming methods are provided. An exemplary embodiment of such a data programming circuit for storing a writing data into a memory cell is provided. The data programming circuit includes a control circuit and a current generating circuit. The control circuit generates a control signal according to the writing data. The current generating circuit provides a writing current to the memory cell to change a crystalline state of the memory cell, wherein the writing current has a pulse width corresponding to the writing data, and the crystalline state corresponds to the writing data.
Furthermore, an exemplary embodiment of a data programming circuit for storing a writing data into a memory cell is provided. The data programming circuit includes a control circuit and a current generating circuit. The control circuit generates a first current according to the writing data. The current generating circuit provides a writing current to the memory cell to change a crystalline state of the memory cell according to the first current, wherein the writing current has a pulse amplitude corresponding to the writing data, and the crystalline state corresponds to the writing data.
Moreover, an exemplary embodiment of a memory programming method for programming a memory cell is provided. A writing data is received. A first writing current is provided to the memory cell according to the writing data, wherein a first pulse width, a first pulse amplitude or combinations thereof of the first writing current corresponds to the writing data. A crystalline state of the memory cell is changed according to the first writing current, wherein the crystalline state corresponds to the writing data.
A detailed description is given in the following embodiments with reference to the accompanying drawings.
The invention can be more fully understood by reading the subsequent detailed description and examples with references made to the accompanying drawings, wherein:
The following description is of the best-contemplated mode of carrying out the invention. This description is made for the purpose of illustrating the general principles of the invention and should not be taken in a limiting sense. The scope of the invention is best determined by reference to the appended claims.
The output circuit 250 includes a selecting circuit 260 and a comparator 270, wherein the selecting circuit 260 includes a decoder 261 and four switches 262, 263, 264 and 265. In the selecting circuit 260, the decoder 261 may decode the writing data Data to generate four signals SW00SW01SW10 and SW11 according to a enable signal EN, wherein the signals SW00SW01SW10 and SW11 are coupled to the switches 262, 263, 264 and 265, respectively. The selecting circuit 260 may select one of the voltage signals V00, V01, V10 and V11 as an output voltage Vout according to the writing data Data. For example, if the writing data Data has the value “10”, the switch 264 may be turned on by the signal SW10 such that the voltage signal V10 is transmitted to an output terminal of the selecting circuit 260 as the output voltage Vout. Next, the comparator 270 may compare the output voltage Vout with a voltage Vref to generate a control signal Vc. Thus, the output circuit 250 may generate the control signal Vc according to the writing data Data and the voltage signals V00, V01, V10 and V11.
The current generating circuit 220 includes a current mirror circuit 280 and a switch 290. The current mirror circuit 280 receives a current I4 to generate a current I5, wherein a ratio of the current I4 to the current I5 is determined by the sizes of the transistors in the current mirror circuit 280. The switch 290 is coupled between the current mirror circuit 280 and a PCM cell (not shown), and a turned-on/turned-off state of the switch 290 is controlled by the control signal Vc to provide the writing current Iwrite to the PCM cell to change a crystalline state of the PCM cell, wherein the writing current Iwrite has a pulse width corresponding to the writing data Data. The invention may apply to other types of memories in addition to a phase change memory.
In one embodiment, the control circuit may only use a logic circuit to simplify its design, wherein the logic circuit may generate the control signal Vc with a specific pulse width corresponding to the writing data Data.
While the invention has been described by way of example and in terms of preferred embodiment, it is to be understood that the invention is not limited thereto. Those who are skilled in this technology can still make various alterations and modifications without departing from the scope and spirit of this invention. Therefore, the scope of the present invention shall be defined and protected by the following claims and their equivalents.
Lin, Wen-Pin, Sheu, Shyh-Shyuan, Chiang, Pei-Chia, Lin, Lieh-Chiu
Patent | Priority | Assignee | Title |
Patent | Priority | Assignee | Title |
4225946, | Jan 24 1979 | Harris Corporation | Multilevel erase pulse for amorphous memory devices |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Dec 15 2008 | LIN, WEN-PIN | Nanya Technology Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | SHEU, SHYH-SHYUAN | ProMos Technologies, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, LIEH-CHIU | ProMos Technologies, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | CHIANG, PEI-CHIA | ProMos Technologies, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, WEN-PIN | ProMos Technologies, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | SHEU, SHYH-SHYUAN | Winbond Electronics Corp | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, LIEH-CHIU | Winbond Electronics Corp | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | CHIANG, PEI-CHIA | Winbond Electronics Corp | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, WEN-PIN | Winbond Electronics Corp | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | CHIANG, PEI-CHIA | Nanya Technology Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, LIEH-CHIU | Nanya Technology Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | SHEU, SHYH-SHYUAN | Nanya Technology Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | SHEU, SHYH-SHYUAN | Industrial Technology Research Institute | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, LIEH-CHIU | Industrial Technology Research Institute | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | CHIANG, PEI-CHIA | Industrial Technology Research Institute | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, WEN-PIN | Industrial Technology Research Institute | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | SHEU, SHYH-SHYUAN | POWERCHIP SEMICONDUCTOR CORP | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, LIEH-CHIU | POWERCHIP SEMICONDUCTOR CORP | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | CHIANG, PEI-CHIA | POWERCHIP SEMICONDUCTOR CORP | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 15 2008 | LIN, WEN-PIN | POWERCHIP SEMICONDUCTOR CORP | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026791 | /0363 | |
Dec 03 2009 | Industrial Technology Research Institute | Nanya Technology Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026801 | /0319 | |
Dec 09 2009 | Promos Technologies Inc | Nanya Technology Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026801 | /0319 | |
Dec 29 2009 | Winbond Electronics Corp | Nanya Technology Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026801 | /0319 | |
Jan 05 2010 | POWERCHIP SEMICONDUCTOR CORP | Nanya Technology Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026801 | /0319 | |
Aug 23 2011 | Nanya Technology Corporation | (assignment on the face of the patent) | / |
Date | Maintenance Fee Events |
Jan 11 2016 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
Nov 12 2019 | M1552: Payment of Maintenance Fee, 8th Year, Large Entity. |
Jan 10 2024 | M1553: Payment of Maintenance Fee, 12th Year, Large Entity. |
Date | Maintenance Schedule |
Jul 10 2015 | 4 years fee payment window open |
Jan 10 2016 | 6 months grace period start (w surcharge) |
Jul 10 2016 | patent expiry (for year 4) |
Jul 10 2018 | 2 years to revive unintentionally abandoned end. (for year 4) |
Jul 10 2019 | 8 years fee payment window open |
Jan 10 2020 | 6 months grace period start (w surcharge) |
Jul 10 2020 | patent expiry (for year 8) |
Jul 10 2022 | 2 years to revive unintentionally abandoned end. (for year 8) |
Jul 10 2023 | 12 years fee payment window open |
Jan 10 2024 | 6 months grace period start (w surcharge) |
Jul 10 2024 | patent expiry (for year 12) |
Jul 10 2026 | 2 years to revive unintentionally abandoned end. (for year 12) |