Various embodiments of the present invention provide systems and methods for data processing. As an example, a data processing circuit is disclosed that includes a noise injection circuit. The noise injection circuit is operable to: determine a difference between a first data output and a second data output to yield an error; and augment an interim data with a noise value corresponding to the error to yield a noise injected output. The interim data may be either the first data output or the second data output.
|
14. A method, the method comprising:
receiving a first data output;
receiving a second data output;
determining a difference between a first data output and a second data output to yield an error; and
augmenting an interim data with a noise value corresponding to the error to yield a noise injected output, wherein the interim data is selected from a group consisting of: the first data output and the second data output.
1. A data processing circuit, the data processing circuit comprising:
a noise injection circuit operable to:
determine a difference between a first data output and a second data output to yield an error; and
augment an interim data with a noise value corresponding to the error to yield a noise injected output, wherein the interim data is selected from a group consisting of: the first data output and the second data output.
20. A storage device, the storage device comprising:
a storage medium;
a head assembly disposed in relation to the storage medium and operable to provide a sensed signal corresponding to information on the storage medium;
a read channel circuit including:
an analog processing circuit operable to provide an analog signal corresponding to the sensed signal;
an analog to digital converter circuit operable to sample the analog signal to yield a series of digital samples;
an equalizer circuit operable to equalize the digital samples to yield an equalized input;
a noise injection circuit operable to:
determine a difference between the equalized output and an expected output to yield an error; and
augment an interim data with a noise value corresponding to the error to yield a noise injected output, wherein the interim data is selected from a group consisting of: the equalized output and the expected output; and
a selector circuit operable to provide a processing output selected from a group consisting of the equalized output and the noise injected output;
a data detector circuit operable to apply a data detection algorithm to the processing output to yield a detected output; and
a data decoder circuit operable to apply a data decode algorithm to the detected output to yield a decoded output.
2. The data processing circuit of
a data detector circuit operable to apply a data detection algorithm to an input derived from the noise injected output to yield a detected output; and
a data decoder circuit operable to apply a data decode algorithm to the detected output to yield a decoded output.
3. The data processing circuit of
a selector circuit operable to provide a processing output selected from a group consisting of the first data output and the noise injected output.
4. The data processing circuit of
a data detector circuit operable to apply a data detection algorithm to the processing output to yield a detected output; and
a data decoder circuit operable to apply a data decode algorithm to the detected output to yield a decoded output.
5. The data processing circuit of
an equalizer circuit operable to receive a data set and to provide an equalized output corresponding to the data set, wherein the first data output is the equalized output.
6. The data processing circuit of
7. The data processing circuit of
a partial response target circuit operable to provide the second data output based at least in part on the expected output.
8. The data processing circuit of
a data detector circuit operable to apply a data detection algorithm to an input derived from the noise injected output to yield a detected output;
a data decoder circuit operable to apply a data decode algorithm to the detected output to yield a decoded output; and
wherein the expected output is derived from the decoded output.
9. The data processing circuit of
10. The data processing circuit of
11. The data processing circuit of
multiplying the error by a scaling factor to yield a scaled error; and
adding the scaled error to one of the first data output or the second data output to yield the noise injected output.
12. The data processing circuit of
13. The data processing circuit of
15. The method of
selecting one of the first data output and the second data output as a processing output;
applying a data detection algorithm to the processing output to yield a detected output; and
applying a data decode algorithm to the detected output to yield a decoded output.
16. The method of
the data detection algorithm is selected from a group consisting of: a maximum a posteriori data detection algorithm, and a Viterbi algorithm detection; and
wherein the data decode algorithm is selected from a group consisting of: a low density parity check algorithm, and a Reed Solomon algorithm.
17. The method of
multiplying the error by a scaling factor to yield a scaled error; and
adding the scaled error to one of the first data output or the second data output to yield the noise injected output.
18. The method of
19. The method of
|
The present invention is related to systems and methods for characterizing circuit operation, and more particularly to systems and methods for injecting noise into a data processing circuit to enhance parameter selection.
It is typical to test a storage device during manufacturing both to reject defective devices and to adjust device parameters to improve operation. This process may include, for example, writing and reading data patterns from a storage medium associated with the device. Each time an error is detected, it is determined whether the parameters governing operation of circuitry associated with the storage device may be modified to reduce the possibility of such an error. This process results in adjustment of various operational parameters.
Most of the tested devices operate at reasonably good signal to noise ratio conditions. Because of this, errors are quite infrequent requiring a long time to collect enough errors to fully characterize circuit operation. Hence, for at least the aforementioned reasons, there exists a need in the art for advanced systems and methods for parameter selection.
The present invention is related to systems and methods for characterizing circuit operation, and more particularly to systems and methods for injecting noise into a data processing circuit to enhance parameter selection.
Various embodiments of the present invention provide data processing circuits that include a noise injection circuit. The noise injection circuit is operable to: determine a difference between a first data output and a second data output to yield an error; and augment an interim data with a noise value corresponding to the error to yield a noise injected output. The interim data may be either the first data output or the second data output. In some instances of the aforementioned embodiments, the data processing circuit is implemented as part of a storage device or a receiving device. In some cases, the data processing circuit is implemented as part of an integrated circuit. In some instances of the aforementioned embodiments, the data processing circuit further includes a data detector circuit and a data decoder circuit. The data detector circuit is operable to apply a data detection algorithm to an input derived from the noise injected output to yield a detected output. The data decoder circuit is operable to apply a data decode algorithm to the detected output to yield a decoded output.
In various instances of the aforementioned embodiments, the data processing circuit further includes a selector circuit that is operable to provide a processing output selected from a group consisting of the first data output and the noise injected output. In some such instances, an included data processing circuit is operable to apply a data detection algorithm to the processing output to yield a detected output, and an included data decoder circuit is operable to apply a data decode algorithm to the detected output to yield a decoded output. In some instances of the aforementioned embodiments, the data processing circuit further includes an equalizer circuit that is operable to receive a data set and to provide an equalized output corresponding to the data set, wherein the first data output is the equalized output. In some such instances, the second data output is derived from an expected output. In particular instances, the data processing circuit further includes a partial response target circuit that is operable to provide the second data output based at least in part on the expected output.
In one or more instances of the aforementioned embodiments, determining the difference between the first data output and the second data output to yield the error includes subtracting the second data output from the first data output. In other instances of the aforementioned embodiments, determining the difference between the first data output and the second data output to yield the error includes subtracting the first data output from the second data output. In some cases, augmenting the interim data with the noise value corresponding to the error to yield the noise injected output includes: multiplying the error by a scaling factor to yield a scaled error; and adding the scaled error to one of the first data output or the second data output to yield the noise injected output.
Other embodiments of the present invention provide methods that include: receiving a first data output; receiving a second data output; determining a difference between a first data output and a second data output to yield an error; and augmenting an interim data with a noise value corresponding to the error to yield a noise injected output. In such embodiments, the interim data is either the first data output or the second data output. In some instances of the aforementioned embodiments, the method further includes: selecting one of the first data output and the second data output as a processing output; applying a data detection algorithm to the processing output to yield a detected output; and applying a data decode algorithm to the detected output to yield a decoded output. In some cases, the data detection algorithm is a Viterbi algorithm detection, and in other cases, the data detection algorithm is a maximum a posteriori data detection algorithm. In one or more cases, the data decode algorithm is a low density parity check algorithm. In other cases, the data decode algorithm is a Reed Solomon algorithm. In some cases, augmenting the interim data with the noise value corresponding to the error to yield the noise injected output includes multiplying the error by a scaling factor to yield a scaled error; and adding the scaled error to one of the first data output or the second data output to yield the noise injected output. In various cases, determining the difference between the first data output and the second data output to yield the error includes subtracting the first data output from the second data output. In other cases, determining the difference between the first data output and the second data output to yield the error includes subtracting the second data output from the first data output.
This summary provides only a general outline of some embodiments of the invention. Many other objects, features, advantages and other embodiments of the invention will become more fully apparent from the following detailed description, the appended claims and the accompanying drawings.
A further understanding of the various embodiments of the present invention may be realized by reference to the figures which are described in remaining portions of the specification. In the figures, like reference numerals are used throughout several figures to refer to similar components. In some instances, a sub-label consisting of a lower case letter is associated with a reference numeral to denote one of multiple similar components. When reference is made to a reference numeral without specification to an existing sub-label, it is intended to refer to all such multiple similar components.
The present invention is related to systems and methods for characterizing circuit operation, and more particularly to systems and methods for injecting noise into a data processing circuit to enhance parameter selection.
Various embodiments of the present invention provide for noise injection based parameter modification. The injected noise corresponds to actual errors in a received data set. This noise is referred to herein as “actual noise” which is defined in its broadest sense to be any signal related to an error in a received data set. In some cases, the actual noise is a difference between a received input and an expected input multiplied by a scaling factor. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of sources and/or approaches for generating actual noise that may be used in relation to different embodiments of the present invention. Such an approach of generating actual noise results in the occurrence of increased errors during data processing that allow for characterization of one or more parameters in a data processing circuit operating on the received data set. Further, the injection of actual noise rather than random noise provides an advantage in that the injected noise causes only a limited impact on the characteristics of the data processing circuit. In contrast, random noise has Gaussian noise characteristics that cause a change in the original characteristics of the data processing circuit that adversely impacts the ability to properly characterize parameters.
Turning to
Equalized output 125 is provided to both a data detector circuit 108 and a Y-sample circuit 104. Y-sample circuit 104 stores equalized output 125 as buffered data 106 for use in subsequent iterations through data detector circuit 108. Data detector circuit 108 provides a detected output 112 to a data decoder circuit 114. Data decoder circuit 114 provides a decoded output 116. One or more iterations through data detector circuit 108 and data decoder circuit 114 may be made in an effort to converge on the originally written data set. Decoded output 116 is provided to circuit parameter adjustment circuit 199. Circuit parameter adjustment circuit 199 modifies one or more parameters used by circuit 100 in an effort to reduce any errors remaining at the output of data detector circuit 108 and/or data decoder circuit 114.
Turning to
Equalized output 225 is provided to both a selector circuit 240 and noise injection circuit 250. A noise injected output 295 from noise injection circuit 250 is also provided to selector circuit 240. Selector circuit 240 provides one of equalized output 225 or noise injected output 295 as a processing output 245 depending upon an assertion level of a noise injection select input 230. In operation, noise injection select input 230 is de-asserted to cause selection of equalized output 225 to be provided as processing output 245 when normal operation of data processing circuit 200 is desired. In contrast, noise injection select input 230 is asserted to cause selection of noise injected output 295 to be provided as processing output 245 when circuit characterization of data processing circuit 200 is desired. Such circuit characterization involves modifying one or more parameters used by data processing circuit 200 to reduce any errors resulting from processing a given input data set. Such parameters may include, but are not limited to, gain parameters applied by analog to digital converter circuit 210 or by an analog front end circuit (not shown) from which analog input 205 is derived, filter taps used by digital finite impulse response filter 220, data detection parameters used by a data detector circuit 208, and/or data decode parameters used by a data decoder circuit 214. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of parameters that may be adjusted based upon processing of noise injected output 295. Selection by assertion of noise injection select input 230 may be done at the time of manufacture of a device including data processing circuit 200, and/or after deployment of a device including data processing circuit 200.
Noise injection circuit 250 includes a partial response target circuit 260 that is operable to receive an expected data input 235 and to yield a filtered output 265 (Yideal[k]). Expected data input 235 is a known data set corresponding to the data set received as analog input 205. Thus, where data processing circuit 200 is operating perfectly, the result of processing analog input 205 will be expected data input 235. In some cases expected data input 235 is known and is maintained in a memory for use during parameter characterization. In other cases, as described more fully below in relation to the circuit of
Both filtered output 265 and equalized output 225 are provided to a summation circuit 270 where filtered output 265 is subtracted from equalized output 225 to yield an error 275 (e[k]) in accordance with the following equation:
e[k]=Y[k]−Yideal[k],
where k designates particular instances of the associated values. Error 275 is provided to a multiplier circuit 280 where it is multiplied by a scalar value 202 (a) to yield a scaled error 285 (escaled[k]) in accordance with the following equation:
escaled[k]=α×e[k].
In some embodiments of the present invention, scalar value 202 may be dynamically calculated by calculating the standard deviation of error 275 for two different data sets in accordance with the following equations:
where the subscript “1” indicates a first data set, the subscript “2” indicates a second data set, and Δ is the signal to noise ratio of the first data set less the signal to noise ratio of the second data set as defined by the following equation:
In other embodiments of the present invention, scalar value 202 is a fixed value that is programmed into a memory (not shown) that is accessible to data processing circuit 200. Scaled error 285 is then added to filtered output 265 by a summation circuit 290 to yield noise injected output 295 (Ynoise[k]) in accordance with the following equation:
Ynoise[k]=Yideal[k]+escaled[k].
As such, noise injected output 295 is similar to equalized output 225 with the noise accentuated.
Processing output 245 is provided to both data detector circuit 208 and a Y-sample circuit 204. Y-sample circuit 204 stores processing output 245 as buffered data 206 for use in subsequent iterations through data detector circuit 208. Data detector circuit 208 may be any data detector circuit known in the art that is capable of producing a detected output 212. As some examples, data detector circuit 204 may be, but is not limited to, a Viterbi algorithm detector circuit or a maximum a posteriori detector circuit as are known in the art. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of data detector circuits that may be used in relation to different embodiments of the present invention. Detected output 212 may include both hard decisions and soft decisions. The terms “hard decisions” and “soft decisions” are used in their broadest sense. In particular, “hard decisions” are outputs indicating an expected original input value (e.g., a binary ‘1’ or ‘0’, or a non-binary digital value), and the “soft decisions” indicate a likelihood that corresponding hard decisions are correct. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of hard decisions and soft decisions that may be used in relation to different embodiments of the present invention.
Detected output 212 is provided to data decoder circuit 214. Data decoder circuit 214 applies a data decoding algorithm to detected output 212 in an attempt to recover originally written data. The result of the data decoding algorithm is provided as a decoded output 216. Similar to detected output 212, decoded output 216 may include both hard decisions and soft decisions. Data decoder circuit 214 may be any data decoder circuit known in the art that is capable of applying a decoding algorithm to a received input. For example, data decoder circuit 214 may be, but is not limited to, a low density parity check decoder circuit or a Reed Solomon decoder circuit as are known in the art. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of data decoder circuits that may be used in relation to different embodiments of the present invention. One or more iterations through data detector circuit 208 and data decoder circuit 214 may be made in an effort to converge on the originally written data set.
Decoded output 216 is provided to circuit parameter adjustment circuit 299. Circuit parameter adjustment circuit 299 modifies one or more parameters used by data processing circuit 200 in an effort to reduce any errors remaining at the output of data detector circuit 208 and/or data decoder circuit 214. Circuit parameter adjustment circuit 299 may be any circuit known in the art that is capable of adjusting one or more parameters governing the operation of a circuit. As just some examples, circuit parameter adjustment circuit 299 may adjust gain parameters applied by analog to digital converter circuit 210 or by an analog front end circuit (not shown) from which analog input 205 is derived, filter taps used by digital finite impulse response filter 220, data detection parameters used by a data detector circuit 208, and/or data decode parameters used by a data decoder circuit 214. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of parameters that may be adjusted by circuit parameter adjustment circuit.
Turning to
Equalized output 325 is provided to both a selector circuit 340 and noise injection circuit 350. A noise injected output 395 from noise injection circuit 350 is also provided to selector circuit 340. Selector circuit 340 provides one of equalized output 325 or noise injected output 395 as a processing output 345 depending upon an assertion level of a noise injection select input 330. In operation, noise injection select input 330 is asserted to cause selection of equalized output 325 to be provided as processing output 345 when normal operation of data processing circuit 300 is desired. In contrast, noise injection select input 330 is asserted to cause selection of noise injected output 395 to be provided as processing output 345 when circuit characterization of data processing circuit 300 is desired. Such circuit characterization involves modifying one or more parameters used by data processing circuit 300 to reduce any errors resulting from processing a given input data set. Such parameters may include, but are not limited to, gain parameters applied by analog to digital converter circuit 310 or by an analog front end circuit (not shown) from which analog input 305 is derived, filter taps used by digital finite impulse response filter 320, data detection parameters used by a data detector circuit 308, and/or data decode parameters used by a data decoder circuit 314. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of parameters that may be adjusted based upon processing of noise injected output 395. Selection of through assertion of noise injection select input 330 may be done at the time of manufacture of a device including data processing circuit 300, and/or after deployment of a device including data processing circuit 300.
Noise injection circuit 350 includes a recovered data storage circuit 335 that stores a prior result of processing a data set corresponding to analog input 305. This prior processing result is an expected data input 355 that may be used to determine errors based upon a comparison with equalized output 325. In particular, expected data input 355 is provided to a partial response target circuit 360 that yields a filtered output 365 (Yideal[k]). Partial response target circuit 360 may be any circuit known in the art that is capable of rendering a received expected input 335 compatible with equalized output 325.
Both filtered output 365 and equalized output 325 are provided to a summation circuit 370 where filtered output 365 is subtracted from equalized output 325 to yield an error 375 (e[k]) in accordance with the following equation:
e[k]=Y[k]−Yideal[k].
where k designates particular instances of the associated values. Error 375 is provided to a multiplier circuit 380 where it is multiplied by a scalar value 302 (α) to yield a scaled error 385 (escaled[k]) in accordance with the following equation:
escaled[k]=α×e[k].
In some embodiments of the present invention, scalar value 302 may be dynamically calculated by calculating the standard deviation of error 375 for two different data sets in accordance with the following equations:
where the subscript “1” indicates a first data set, the subscript “2” indicates a second data set, and Δ is the signal to noise ratio of the first data set less the signal to noise ratio of the second data set as defined by the following equation:
In other embodiments of the present invention, scalar value 302 is a fixed value that is programmed into a memory (not shown) that is accessible to data processing circuit 300. Scaled error 385 is then added to filtered output 365 by a summation circuit 390 to yield noise injected output 395 (Ynoise[k]) in accordance with the following equation:
Ynoise[k]=Yideal[k]+escaled[k].
As such, noise injected output 395 is similar to equalized output 325 with the noise accentuated.
Processing output 345 is provided to both data detector circuit 308 and a Y-sample circuit 304. Y-sample circuit 304 stores processing output 345 as buffered data 306 for use in subsequent iterations through data detector circuit 308. Data detector circuit 308 may be any data detector circuit known in the art that is capable of producing a detected output 312. As some examples, data detector circuit 304 may be, but is not limited to, a Viterbi algorithm detector circuit or a maximum a posteriori detector circuit as are known in the art. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of data detector circuits that may be used in relation to different embodiments of the present invention. Detected output 312 may include both hard decisions and soft decisions. The terms “hard decisions” and “soft decisions” are used in their broadest sense. In particular, “hard decisions” are outputs indicating an expected original input value (e.g., a binary ‘1’ or ‘0’, or a non-binary digital value), and the “soft decisions” indicate a likelihood that corresponding hard decisions are correct. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of hard decisions and soft decisions that may be used in relation to different embodiments of the present invention.
Detected output 312 is provided to data decoder circuit 314. Data decoder circuit 314 applies a data decoding algorithm to detected output 312 in an attempt to recover originally written data. The result of the data decoding algorithm is provided as a decoded output 316. Similar to detected output 312, decoded output 316 may include both hard decisions and soft decisions. For example, data decoder circuit 314 may be any data decoder circuit known in the art that is capable of applying a decoding algorithm to a received input. Data decoder circuit 314 may be, but is not limited to, a low density parity check decoder circuit or a Reed Solomon decoder circuit as are known in the art. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of data decoder circuits that may be used in relation to different embodiments of the present invention. One or more iterations through data detector circuit 308 and data decoder circuit 314 may be made in an effort to converge on the originally written data set.
Decoded output 316 is provided to circuit parameter adjustment circuit 399. Circuit parameter adjustment circuit 399 modifies one or more parameters used by data processing circuit 300 in an effort to reduce any errors remaining at the output of data detector circuit 308 and/or data decoder circuit 314. Circuit parameter adjustment circuit 399 may be any circuit known in the art that is capable of adjusting one or more parameters governing the operation of a circuit. As just some examples, circuit parameter adjustment circuit 399 may adjust gain parameters applied by analog to digital converter circuit 310 or by an analog front end circuit (not shown) from which analog input 305 is derived, filter taps used by digital finite impulse response filter 320, data detection parameters used by a data detector circuit 308, and/or data decode parameters used by a data decoder circuit 314. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of parameters that may be adjusted by circuit parameter adjustment circuit.
Turning to
In addition, an expected output is received (block 490). The expected output is a known data set corresponding to the data set received as the aforementioned analog input. Thus, where the data processing circuit processing the analog input is operating perfectly, the result of processing the analog input will be the expected output. In some cases the expected output is known and is maintained in a memory for use during parameter characterization. In other cases, the expected output is derived from the processing of an earlier processing of a signal similar to the analog input by the data processing circuit. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of sources of the expected output and formats thereof that may be used in relation to different embodiments of the present invention.
A partial response filtering is applied to the expected output to yield a filtered output (Yidea[k]) (block 495). The partial response filtering may be any process known in the art that receives the expected output and yields a filtered output that is comparable to the aforementioned equalized output. The filtered output (block 495) is subtracted from the equalized output (block 415) to yield an error in accordance with the following equation (block 420):
e[k]=Y[k]−Yideal[k],
where k designates particular instances of the associated values. The error is multiplied by a scaling factor (a) to yield a scaled error (block 425) in accordance with the following equation:
escaled[k]=α×e[k].
In some embodiments of the present invention, the scaling factor may be dynamically calculated by calculating the standard deviation of the error for two different data sets in accordance with the following equations:
where the subscript “1” indicates a first data set, the subscript “2” indicates a second data set, and Δ is the signal to noise ratio of the first data set less the signal to noise ratio of the second data set as defined by the following equation:
In other embodiments of the present invention, the scaling factor is a fixed value that is programmed into a memory that is accessible to the data processing circuit. The scaled error is added to the filtered output to yield a noise injected output (Ynoise[k]) in accordance with the following equation (block 430):
Ynoise[k]=Yideal[k]+escaled[k].
As such, the noise injected output is similar to the aforementioned equalized output (block 415) with the noise accentuated.
It is determined whether noise injection is selected (block 435). Noise injection may be selected where data processing circuit characterization is desired. Such circuit characterization involves modifying one or more parameters used by the data processing circuit to reduce any errors resulting from processing a given input data set. Such parameters may include, but are not limited to, gain parameters applied by an analog to digital converter circuit or by an analog front end circuit from which the analog input is derived, filter taps used by a digital finite impulse response filter, data detection parameters used by a data detector circuit, and/or data decode parameters used by a data decoder circuit. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of parameters that may be adjusted based upon processing of a noise injected output. Noise injection is not selected where standard operation is desired. Where noise injection is not selected (block 435), the equalized output (block 415) is stored as a processing output to a memory (block 445). In contrast, where noise injection is selected (block 435), the noise injected output (block 430) is stored as the processing output to the memory (block 440).
Data processing is applied to the processing output in an attempt to recover originally written data that yields a decoded output (block 450). The data processing may include, but is not limited to, one or more iterations through a data detection algorithm and a data decoding algorithm. The results of the data processing including anomalies therein due to the injected noise are used to adjust parameters in the data processing circuit in an effort to reduce errors (block 455). In some cases, this parameter modification may be turned off where noise injection is not selected (block 435).
Turning to
Equalized output 525 is provided to both a selector circuit 540 and noise injection circuit 550. A noise injected output 595 from noise injection circuit 550 is also provided to selector circuit 540. Selector circuit 540 provides one of equalized output 525 or noise injected output 595 as a processing output 545 depending upon an assertion level of a noise injection select input 530. In operation, noise injection select input 530 is asserted to cause selection of equalized output 525 to be provided as processing output 545 when normal operation of data processing circuit 500 is desired. In contrast, noise injection select input 530 is asserted to cause selection of noise injected output 595 to be provided as processing output 545 when circuit characterization of data processing circuit 500 is desired. Such circuit characterization involves modifying one or more parameters used by data processing circuit 500 to reduce any errors resulting from processing a given input data set. Such parameters may include, but are not limited to, gain parameters applied by analog to digital converter circuit 510 or by an analog front end circuit (not shown) from which analog input 505 is derived, filter taps used by digital finite impulse response filter 520, data detection parameters used by a data detector circuit 508, and/or data decode parameters used by a data decoder circuit 514. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of parameters that may be adjusted based upon processing of noise injected output 595. Selection of through assertion of noise injection select input 530 may be done at the time of manufacture of a device including data processing circuit 500, and/or after deployment of a device including data processing circuit 500.
Noise injection circuit 550 includes a partial response target circuit 560 that is operable to receive an expected data input 535 and to yield a filtered output 565 (Yideal[k]). Expected data input 535 is a known data set corresponding to the data set received as analog input 505. Thus, where data processing circuit 500 is operating perfectly, the result of processing analog input 505 will be expected data input 535. Partial response target circuit 560 may be any circuit known in the art that is capable of rendering a received expected input 535 compatible with equalized output 525.
Both filtered output 565 and equalized output 525 are provided to a summation circuit 570 where filtered output 565 is subtracted from equalized output 525 to yield an error 575 (e[k]) in accordance with the following equation:
e[k]=Y[k]−Yideal[k],
where k designates particular instances of the associated values. Error 575 is provided to a multiplier circuit 580 where it is multiplied by a scalar value 502 (α) to yield a scaled error 585 (escaled[k]) in accordance with the following equation:
escaled[k]=α×e[k].
In some embodiments of the present invention, scalar value 502 may be dynamically calculated by calculating the standard deviation of error 575 for two different data sets in accordance with the following equations:
where the subscript “1” indicates a first data set, the subscript “2” indicates a second data set, and Δ is the signal to noise ratio of the first data set less the signal to noise ratio of the second data set as defined by the following equation:
In other embodiments of the present invention, scalar value 502 is a fixed value that is programmed into a memory (not shown) that is accessible to data processing circuit 500. Scaled error 585 is then added to equalized output 225 by a summation circuit 590 to yield noise injected output 595 (Ynoise[k]) in accordance with the following equation:
Ynoise[k]=Y[k]+escaled[k].
As such, noise injected output 595 is similar to equalized output 525 with the noise accentuated.
Processing output 545 is provided to both data detector circuit 508 and a Y-sample circuit 504. Y-sample circuit 504 stores processing output 545 as buffered data 506 for use in subsequent iterations through data detector circuit 508. Data detector circuit 508 may be any data detector circuit known in the art that is capable of producing a detected output 512. As some examples, data detector circuit 504 may be, but is not limited to, a Viterbi algorithm detector circuit or a maximum a posteriori detector circuit as are known in the art. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of data detector circuits that may be used in relation to different embodiments of the present invention. Detected output 512 may include both hard decisions and soft decisions. The terms “hard decisions” and “soft decisions” are used in their broadest sense. In particular, “hard decisions” are outputs indicating an expected original input value (e.g., a binary ‘1’ or ‘0’, or a non-binary digital value), and the “soft decisions” indicate a likelihood that corresponding hard decisions are correct. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of hard decisions and soft decisions that may be used in relation to different embodiments of the present invention.
Detected output 512 is provided to data decoder circuit 514. Data decoder circuit 514 applies a data decoding algorithm to detected output 512 in an attempt to recover originally written data. The result of the data decoding algorithm is provided as a decoded output 516. Similar to detected output 512, decoded output 516 may include both hard decisions and soft decisions. For example, data decoder circuit 514 may be any data decoder circuit known in the art that is capable of applying a decoding algorithm to a received input. Data decoder circuit 514 may be, but is not limited to, a low density parity check decoder circuit or a Reed Solomon decoder circuit as are known in the art. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of data decoder circuits that may be used in relation to different embodiments of the present invention. One or more iterations through data detector circuit 508 and data decoder circuit 514 may be made in an effort to converge on the originally written data set.
Decoded output 516 is provided to circuit parameter adjustment circuit 599. Circuit parameter adjustment circuit 599 modifies one or more parameters used by data processing circuit 500 in an effort to reduce any errors remaining at the output of data detector circuit 508 and/or data decoder circuit 514. Circuit parameter adjustment circuit 599 may be any circuit known in the art that is capable of adjusting one or more parameters governing the operation of a circuit. As just some examples, circuit parameter adjustment circuit 599 may adjust gain parameters applied by analog to digital converter circuit 510 or by an analog front end circuit (not shown) from which analog input 505 is derived, filter taps used by digital finite impulse response filter 520, data detection parameters used by a data detector circuit 508, and/or data decode parameters used by a data decoder circuit 514. Based upon the disclosure provided herein, one of ordinary skill in the art will recognize a variety of parameters that may be adjusted by circuit parameter adjustment circuit.
Turning to
In a typical read operation, read/write head assembly 776 is accurately positioned by motor controller 768 over a desired data track on disk platter 778. Motor controller 768 both positions read/write head assembly 776 in relation to disk platter 778 and drives spindle motor 772 by moving read/write head assembly to the proper data track on disk platter 778 under the direction of hard disk controller 766. Spindle motor 772 spins disk platter 778 at a determined spin rate (RPMs). Once read/write head assembly 778 is positioned adjacent the proper data track, magnetic signals representing data on disk platter 778 are sensed by read/write head assembly 776 as disk platter 778 is rotated by spindle motor 772. The sensed magnetic signals are provided as a continuous, minute analog signal representative of the magnetic data on disk platter 778. This minute analog signal is transferred from read/write head assembly 776 to read channel circuit 710 via preamplifier 770. Preamplifier 770 is operable to amplify the minute analog signals accessed from disk platter 778. In turn, read channel circuit 710 decodes and digitizes the received analog signal to recreate the information originally written to disk platter 778. This data is provided as read data 703 to a receiving circuit. A write operation is substantially the opposite of the preceding read operation with write data 701 being provided to read channel circuit 710. This data is then encoded and written to disk platter 778.
During one or more set up periods, noise injection circuitry injects noise into a read data stream to intentionally stress the system resulting in increased errors. During this process, one or more system parameters are modified to reduce the level of errors. Such modification of the parameters may be done during manufacture, and/or may be done once storage device 700 is deployed. The noise injection circuitry that may be implemented similar to that discussed above in relation to
It should be noted that storage system 500 may be integrated into a larger storage system such as, for example, a RAID (redundant array of inexpensive disks or redundant array of independent disks) based storage system. It should also be noted that various functions or blocks of storage system 500 may be implemented in either software or firmware, while other functions or blocks are implemented in hardware.
It should be noted that the various blocks discussed in the above application may be implemented in integrated circuits along with other functionality. Such integrated circuits may include all of the functions of a given block, system or circuit, or only a subset of the block, system or circuit. Further, elements of the blocks, systems or circuits may be implemented across multiple integrated circuits. Such integrated circuits may be any type of integrated circuit known in the art including, but are not limited to, a monolithic integrated circuit, a flip chip integrated circuit, a multichip module integrated circuit, and/or a mixed signal integrated circuit. It should also be noted that various functions of the blocks, systems or circuits discussed herein may be implemented in either software or firmware. In some such cases, the entire system, block or circuit may be implemented using its software or firmware equivalent. In other cases, the one part of a given system, block or circuit may be implemented in software or firmware, while other parts are implemented in hardware.
In conclusion, the invention provides novel systems, devices, methods and arrangements for data processing. While detailed descriptions of one or more embodiments of the invention have been given above, various alternatives, modifications, and equivalents will be apparent to those skilled in the art without varying from the spirit of the invention. Therefore, the above description should not be taken as limiting the scope of the invention, which is defined by the appended claims.
Zhang, Fan, Jin, Ming, Chang, Wu
Patent | Priority | Assignee | Title |
10068608, | Jun 20 2017 | Seagate Technology LLC | Multi-stage MISO circuit for fast adaptation |
10157637, | Jun 20 2017 | Seagate Technology LLC | Sampling for multi-reader magnetic recording |
10177771, | Jun 20 2017 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Multi-signal realignment for changing sampling clock |
10276197, | Jun 20 2017 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Parallelized writing of servo RRO/ZAP fields |
10297281, | Nov 06 2017 | Seagate Technology LLC | Servo sector detection |
10410672, | Oct 03 2017 | Seagate Technology LLC | Multi-stage MISO circuit for fast adaptation |
10460762, | Sep 04 2018 | Seagate Technology LLC | Cancelling adjacent track interference signal with different data rate |
10468060, | Sep 27 2018 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Cancelling adjacent track interference |
10469290, | Jun 20 2017 | Seagate Technology LLC | Regularized parameter adaptation |
10496559, | Jun 20 2017 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Data path dynamic range optimization |
10522177, | Jul 31 2018 | Seagate Technology LLC | Disc locked clock-based servo timing |
10665256, | Jun 20 2017 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Hybrid timing recovery |
10714134, | Jun 20 2017 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Approximated parameter adaptation |
10803902, | Aug 19 2018 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Hardware-based read sample averaging |
10936003, | Jun 20 2017 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Phase locking multiple clocks of different frequencies |
11016681, | Jul 31 2018 | Seagate Technology LLC | Multi-threshold parameter adaptation |
11018842, | Jul 31 2018 | Seagate Technology LLC | Dynamic timing recovery bandwidth modulation for phase offset mitigation |
Patent | Priority | Assignee | Title |
5001712, | Oct 17 1988 | Lockheed Martin Corp | Diagnostic error injection for a synchronous bus system |
5278703, | Jun 21 1991 | Maxtor Corporation | Embedded servo banded format for magnetic disks for use with a data processing system |
5278846, | Jun 11 1990 | Matsushita Electric Industrial Co., Ltd. | Digital signal decoder |
5317472, | Mar 17 1992 | SCHWEITZER, EDMUND O ,III; SCHWEITZER, MARY S | Apparatus for insuring the security of output signals from protective relays used in electric power systems |
5325402, | Apr 30 1991 | NEC Corporation | Method and arrangement for estimating data sequences transmsitted using Viterbi algorithm |
5392299, | Jan 15 1992 | EMASS, INC | Triple orthogonally interleaed error correction system |
5471500, | Mar 08 1994 | CHASE MANHATTAN BANK, AS ADMINISTRATIVE AGENT, THE | Soft symbol decoding |
5513192, | Aug 28 1992 | Sun Microsystems, Inc. | Fault tolerant disk drive system with error detection and correction |
5523903, | Dec 23 1993 | HGST NETHERLANDS B V | Sector architecture for fixed block disk drive |
5550870, | Mar 02 1994 | THE CHASE MANHATTAN BANK, AS COLLATERAL AGENT | Viterbi processor |
5612964, | Apr 08 1991 | High performance, fault tolerant orthogonal shuffle memory and method | |
5701314, | Dec 21 1995 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | On-the-fly error correction using thermal asperity erasure pointers from a sampled amplitude read channel in a magnetic disk drive |
5710784, | Sep 24 1993 | Qualcomm Incorporated | Multirate serial viterbi decoder for code division multiple access system applications |
5712861, | Jul 12 1994 | Mitsubishi Denki Kabushiki Kaisha | Error correcting method and decoder with improved reliability |
5717706, | Mar 04 1994 | Sony Corporation | Apparatus and method for detecting signal points using signal point-mapping |
5768044, | Dec 23 1993 | Western Digital Technologies, INC | Zoned recording embedded servo disk drive having no data identification fields and reduced rotational latency |
5802118, | Jul 29 1996 | Cirrus Logic, INC | Sub-sampled discrete time read channel for computer storage systems |
5844945, | Apr 12 1994 | LG ELECTRONICS, INC | Viterbi decoder for a high definition television |
5898710, | Jun 06 1995 | Ikanos Communications, Inc | Implied interleaving, a family of systematic interleavers and deinterleavers |
5923713, | Feb 28 1996 | Sony Corporation | Viterbi decoder |
5978414, | Jul 03 1996 | Matsushita Electric Industrial Co., Ltd. | Transmission rate judging unit |
5983383, | Jan 17 1997 | Qualcom Incorporated | Method and apparatus for transmitting and receiving concatenated code data |
6005897, | Dec 16 1997 | Intersil Americas, Inc | Data communication system and method therefor |
6023783, | May 15 1997 | Intellectual Ventures I LLC | Hybrid concatenated codes and iterative decoding |
6029264, | Apr 28 1997 | The Trustees of Princeton University | System and method for error correcting a received data stream in a concatenated system |
6041432, | Mar 04 1994 | Sony Corporation | Apparatus and method for detecting signal points using signal point-mapping |
6065149, | Nov 21 1996 | MATSUSHITA ELECTRIC INDUSTRIAL CO , LTD | Error correction device for a communication system |
6097764, | Dec 16 1997 | Intersil Americas, Inc | Pragmatic trellis-coded modulation system and method therefor |
6145110, | Jun 22 1998 | Ericsson Inc. | Digital data decoder that derives codeword estimates from soft data |
6216249, | Mar 03 1999 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Simplified branch metric for reducing the cost of a trellis sequence detector in a sampled amplitude read channel |
6216251, | Apr 30 1999 | PROGRESSIVE SEMICONDUCTOR SOLUTIONS LLC | On-chip error detection and correction system for an embedded non-volatile memory array and method of operation |
6229467, | May 28 1999 | Infineon Technologies AG | Correction static errors in a/d-converter |
6266795, | May 28 1999 | WSOU Investments, LLC | Turbo code termination |
6317472, | Aug 07 1997 | SAMSUNG ELECTRONICS CO , LTD | Viterbi decoder |
6351832, | May 28 1999 | WSOU Investments, LLC | Turbo code symbol interleaver |
6377610, | Mar 06 1998 | Deutsche Telekom AG | Decoding method and decoding device for a CDMA transmission system for demodulating a received signal available in serial code concatenation |
6381726, | Jan 04 1999 | Maxtor Corporation | Architecture for soft decision decoding of linear block error correcting codes |
6438717, | May 26 1999 | HEWLETT-PACKARD DEVELOPMENT COMPANY, L P | High speed parallel bit error rate tester |
6466631, | Jan 28 1998 | LANTIQ BETEILIGUNGS-GMBH & CO KG | Device and method of changing the noise characteristic in a receiver of a data transmission system |
6473878, | May 28 1999 | WSOU Investments, LLC | Serial-concatenated turbo codes |
6476989, | Jul 09 1996 | HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B V ; MARIANA HDD B V | Radial self-propagation pattern generation for disk file servowriting |
6625775, | Dec 10 1998 | Nokia Technologies Oy | Encoder/decoder with serial concatenated structure in communication system |
6657803, | Nov 22 1999 | Seagate Technology LLC | Method and apparatus for data error recovery using defect threshold detector and viterbi gain |
6671404, | Feb 14 1997 | HEWLETT-PACKARD DEVELOPMENT COMPANY L P | Method and apparatus for recognizing patterns |
6748034, | Dec 19 1997 | Sony Corporation | Viterbi decoding apparatus and viterbi decoding method |
6757862, | Aug 21 2000 | Qualcomm Incorporated | Method and apparatus for digital data error correction coding |
6785863, | Sep 18 2002 | MOTOROLA SOLUTIONS, INC | Method and apparatus for generating parity-check bits from a symbol set |
6788654, | Jan 29 1998 | Nippon Hoso Kyokai | Digital data receiver |
6810502, | Jan 28 2000 | ENTROPIC COMMUNICATIONS, INC ; Entropic Communications, LLC | Iteractive decoder employing multiple external code error checks to lower the error floor |
6980382, | Nov 09 2001 | Kabushiki Kaisha Toshiba | Magnetic disk drive system |
6986098, | Nov 20 2001 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | Method of reducing miscorrections in a post-processor using column parity checks |
7010051, | Mar 24 2000 | Sony Corporation | Coding apparatus, coding method and recording medium having coded program recorded therein, and decoding apparatus, decoding method and recording medium having decoded program recorded therein |
7047474, | Dec 23 2002 | SAMSUNG ELECTRONICS CO , LTD | Decoding concatenated codes via parity bit recycling |
7058873, | Nov 07 2002 | Carnegie Mellon University | Encoding method using a low density parity check code with a column weight of two |
7073118, | Sep 17 2001 | ARRIS ENTERPRISES LLC | Apparatus and method for saturating decoder values |
7093179, | Mar 22 2001 | University of Florida; FLORIDA, UNIVERSITY OF | Method and coding means for error-correction utilizing concatenated parity and turbo codes |
7113356, | Sep 10 2002 | CAVIUM INTERNATIONAL; MARVELL ASIA PTE, LTD | Method for checking the quality of servo gray codes |
7136244, | Feb 22 2002 | Western Digital Technologies, Inc. | Disk drive employing data averaging techniques during retry operations to facilitate data recovery |
7173783, | Sep 21 2001 | Maxtor Corporation | Media noise optimized detector for magnetic recording |
7184486, | Apr 27 2000 | CAVIUM INTERNATIONAL; MARVELL ASIA PTE, LTD | LDPC encoder and decoder and method thereof |
7191378, | Jul 03 2002 | DTVG LICENSING, INC | Method and system for providing low density parity check (LDPC) encoding |
7203015, | Jul 31 2003 | Kabushiki Kaisha Toshiba | Method and apparatus for decoding sync marks in a disk |
7203887, | Jul 03 2002 | DTVG LICENSING, INC | Method and system for routing in low density parity check (LDPC) decoders |
7236757, | Jul 11 2001 | Entropic Communications, LLC | High-speed multi-channel communications transceiver with inter-channel interference filter |
7257764, | Nov 03 2003 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | FEC (Forward Error Correction) decoder with dynamic parameters |
7310768, | Jan 28 2000 | ENTROPIC COMMUNICATIONS, INC ; Entropic Communications, LLC | Iterative decoder employing multiple external code error checks to lower the error floor |
7313750, | Aug 06 2003 | MEDIATEK INC | Efficient soft decision demapper to minimize viterbi decoder complexity |
7370258, | Apr 28 2005 | Qualcomm Incorporated | Iterative concatenated convolutional Reed-Solomon decoding method |
7403752, | Jul 11 2001 | Entropic Communications, LLC | Multi-channel communications transceiver |
7430256, | Sep 26 2003 | Samsung Electronics Co., Ltd. | Method and apparatus for providing channel state information |
7502189, | Oct 23 2000 | Western Digital Technologies, INC | Apparatus, signal-processing circuit and device for magnetic recording system |
7505537, | Mar 25 2003 | CAVIUM INTERNATIONAL; MARVELL ASIA PTE, LTD | System and method for controlling gain and timing phase in a presence of a first least mean square filter using a second adaptive filter |
7509927, | Jan 25 2006 | Comfort-Sinusverteiler GmbH | Hydraulic header for a heating system |
7523375, | Sep 21 2005 | ACLARA TECHNOLOGIES LLC | Set of irregular LDPC codes with random structure and low encoding complexity |
7587657, | Apr 29 2005 | BROADCOM INTERNATIONAL PTE LTD | Method and apparatus for iterative error-erasure decoding |
7590168, | Jul 11 2001 | Entropic Communications, LLC | Low complexity high-speed communications transceiver |
7702989, | Sep 27 2006 | BROADCOM INTERNATIONAL PTE LTD | Systems and methods for generating erasure flags |
7712008, | Jan 26 2006 | BROADCOM INTERNATIONAL PTE LTD | Systems and methods for error reduction associated with information transfer |
7738201, | Aug 18 2006 | Seagate Technology LLC | Read error recovery using soft information |
7752523, | Feb 13 2006 | CAVIUM INTERNATIONAL; MARVELL ASIA PTE, LTD | Reduced-complexity decoding of parity check codes |
7801200, | Jul 31 2006 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Systems and methods for code dependency reduction |
7802163, | Jul 31 2006 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Systems and methods for code based error reduction |
20030063405, | |||
20030081693, | |||
20030087634, | |||
20030112896, | |||
20030134607, | |||
20040071206, | |||
20040098659, | |||
20050010855, | |||
20050078399, | |||
20050111540, | |||
20050157780, | |||
20050195749, | |||
20050216819, | |||
20050273688, | |||
20060020872, | |||
20060031737, | |||
20060123285, | |||
20060140311, | |||
20060168493, | |||
20060195772, | |||
20060210002, | |||
20060248435, | |||
20060256670, | |||
20070011569, | |||
20070047121, | |||
20070047635, | |||
20070110200, | |||
20070230407, | |||
20070286270, | |||
20080049825, | |||
20080055122, | |||
20080065970, | |||
20080069373, | |||
20080168330, | |||
20080276156, | |||
20080301521, | |||
20090185643, | |||
20090199071, | |||
20090235116, | |||
20090235146, | |||
20090259915, | |||
20090273492, | |||
20090274247, | |||
20100002795, | |||
20100042877, | |||
20100042890, | |||
20100050043, | |||
20100061492, | |||
20100070837, | |||
20100164764, | |||
20100185914, | |||
20110075569, | |||
20110080211, | |||
20110167246, | |||
EP522578, | |||
EP631277, | |||
EP1814108, | |||
WO2010101578, | |||
WO2006016751, | |||
WO2006134527, | |||
WO2007091797, | |||
WO2010101578, | |||
WO2010126482, |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Aug 09 2011 | JIN, MING | LSI Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026779 | /0662 | |
Aug 09 2011 | CHANG, WU | LSI Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026779 | /0662 | |
Aug 09 2011 | ZHANG, FAN | LSI Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 026779 | /0662 | |
Aug 19 2011 | LSI Corporation | (assignment on the face of the patent) | / | |||
May 06 2014 | Agere Systems LLC | DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT | PATENT SECURITY AGREEMENT | 032856 | /0031 | |
May 06 2014 | LSI Corporation | DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT | PATENT SECURITY AGREEMENT | 032856 | /0031 | |
Aug 14 2014 | LSI Corporation | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 035390 | /0388 | |
Feb 01 2016 | DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT | Agere Systems LLC | TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS RELEASES RF 032856-0031 | 037684 | /0039 | |
Feb 01 2016 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | BANK OF AMERICA, N A , AS COLLATERAL AGENT | PATENT SECURITY AGREEMENT | 037808 | /0001 | |
Feb 01 2016 | DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT | LSI Corporation | TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS RELEASES RF 032856-0031 | 037684 | /0039 | |
Jan 19 2017 | BANK OF AMERICA, N A , AS COLLATERAL AGENT | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS | 041710 | /0001 | |
May 09 2018 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | MERGER SEE DOCUMENT FOR DETAILS | 047230 | /0910 | |
Sep 05 2018 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF THE MERGER PREVIOUSLY RECORDED AT REEL: 047230 FRAME: 0910 ASSIGNOR S HEREBY CONFIRMS THE MERGER | 047351 | /0384 | |
Sep 05 2018 | AVAGO TECHNOLOGIES GENERAL IP SINGAPORE PTE LTD | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | CORRECTIVE ASSIGNMENT TO CORRECT THE ERROR IN RECORDING THE MERGER IN THE INCORRECT US PATENT NO 8,876,094 PREVIOUSLY RECORDED ON REEL 047351 FRAME 0384 ASSIGNOR S HEREBY CONFIRMS THE MERGER | 049248 | /0558 |
Date | Maintenance Fee Events |
Feb 23 2017 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
May 10 2021 | REM: Maintenance Fee Reminder Mailed. |
Oct 25 2021 | EXP: Patent Expired for Failure to Pay Maintenance Fees. |
Date | Maintenance Schedule |
Sep 17 2016 | 4 years fee payment window open |
Mar 17 2017 | 6 months grace period start (w surcharge) |
Sep 17 2017 | patent expiry (for year 4) |
Sep 17 2019 | 2 years to revive unintentionally abandoned end. (for year 4) |
Sep 17 2020 | 8 years fee payment window open |
Mar 17 2021 | 6 months grace period start (w surcharge) |
Sep 17 2021 | patent expiry (for year 8) |
Sep 17 2023 | 2 years to revive unintentionally abandoned end. (for year 8) |
Sep 17 2024 | 12 years fee payment window open |
Mar 17 2025 | 6 months grace period start (w surcharge) |
Sep 17 2025 | patent expiry (for year 12) |
Sep 17 2027 | 2 years to revive unintentionally abandoned end. (for year 12) |