A laser induced breakdown spectroscopy system includes a laser module having a laser source, a sample chamber, a spectrometer arranged to capture spectral data from the sample chamber, a voltage source attached to the sample chamber arranged to apply a voltage to the sample during capture, and a controller in communication with the spectrometer, the voltage source and the laser module to trigger the voltage source and the spectrometer during laser excitation of the sample. A method of operating a laser induced breakdown spectroscopy system includes applying a voltage to a set of electrodes arranged around a sample, striking the sample with a laser during a time interval in which the voltage is being applied to the electrodes, sampling spectral data from the sample after the sample is struck with the laser, and removing the voltage after the spectral data has been sampled.
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17. A method of operating a laser induced breakdown spectroscopy system, comprising:
applying a high-voltage, high-frequency voltage in the range of 6 to 16 kilovolts operating at a frequency in the range of 100 kilohertz to 4 Megahertz to a set of electrodes arranged around a sample;
striking the sample with a laser during a time interval in which the voltage is being applied to the electrodes;
sampling spectral data from the sample after the sample is struck with the laser; and
removing the voltage after the spectral data has been sampled.
1. A laser induced breakdown spectroscopy system, comprising:
a laser module having a laser source;
a sample chamber;
a spectrometer arranged to capture spectral data from the sample chamber;
a high-voltage, high-frequency source attached to the sample chamber arranged to apply a voltage to the sample during capture, wherein the high-voltage, high-frequency source has voltage in the range of 6 to 15 kilovolts, and operates at a frequency in the range of 100 Kilohertz to 4 Megahertz; and
a controller in communication with the spectrometer, the voltage source and the laser module to trigger the voltage source and the spectrometer during laser excitation of the sample.
12. A laser induced breakdown spectroscopy system, comprising:
a laser module having a laser source, the laser source having an yttrium garnet aluminum:
erbium gain element and a passive q-switch, the gain element having at least partially mirrored coatings at each of two ends of the gain element;
a sample chamber;
a spectrometer arranged to capture spectral data from the sample chamber;
a high-voltage, high-frequency voltage source attached to a set of electrodes in the sample chamber, the voltage source arranged to apply a voltage in the range of 6 to 15 Kilovolts having a frequency in the range of 100 Kilohertz to 4 Megahertz to the sample during capture; and
a controller in communication with the spectrometer, the voltage source and the laser module to trigger the voltage source and the spectrometer during laser excitation of the sample.
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This application is a continuation of and claims priority to U.S. Provisional Patent Application No. 61/476,152, filed Apr. 15, 2011.
Laser-Induced Breakdown Spectroscopy (LIBS) uses a highly energetic laser pulse as an excitation source. The laser forms a plasma that atomizes and excites samples. A spectrometer then analyzes light emitted from the excited sample and determines what elements are present.
Theoretically, a LIBS system can detect all elements, limited only by the power of the laser, the sensitivity and the wavelength range of the detector. In reality, detection limits result from the plasma excitation temperature, the amount of time the spectrometer needs to collect the light, and the strength of the light emitted by the elements during transition. These limits affect the system's ability to detect the elements present, reducing it sensitivity. Increasing the sensitivity of the system allows for more accurate measurements.
LIBS systems have some advantages in size and potential for portability over other spectroscopy systems. However, portability may have trade offs with regard to the amount of power available to the system, which in turn may affect the sensitivity. The ability to increase the sensitivity of the measurements without sacrificing portability has significant advantages in producing a portable, accurate detector for use in the field.
When the laser 12 focuses on the sample 16, it creates a plasma by ablating a very small amount of material from the sample, typically in the range of picograms to nanograms. The laser ablation generates a plasma plume having very high initial temperatures that then settle into thermodynamic equilibrium. As it settles into thermodynamic equilibrium, generally within microseconds, the plasma expands and cools, generating detectable emission lines. The detector 22 of the spectrometer 20 detects the characteristic atomic emission lines of the various elements present in the sample and the spectrometer analyzes them to produce a result.
In one embodiment, the laser uses an yttrium aluminum garnet (ND:Y3Al5O12) laser element as its gain medium. For power savings purposes, the system may employ a passive Q-switch rather than an electro-optical or acoustic-optical Q-switch. Q-switching causes a laser to produce a pulsed output beam, allowing the laser to produce high peak power when compared to continuous output. Q-switching generally results from some sort of attenuation of the laser's optical resonator. The laser medium is pumped and the Q-switch is set to prevent feedback into the gain medium. Once the laser medium reaches some maximum level, the Q-switch is changed from low-Q to high-Q and the laser outputs a high peak intensity pulse of light.
Active Q-switching typically uses an externally controlled attenuator, such as a shutter, chopper, spinning mirror or an acousto- or electro-optic device. While these allow for faster transitions from low to high Q, they consume power and reduce the portability of the LIBS system. An alternative method uses a passive Q-switch.
A passive Q-switch generally involves some sort of absorber that can become saturated, a material in which transmission increases with the intensity of light exceeds some threshold. The material may include an ion-doped crystal, such as YAG:CR+4 used with a YAG:Nd lasing element. By varying the laser's pump power and the amount of absorber in the cavity, one can control the pulse repetition rate.
In addition to using a passive Q-switch to generate a pulse-train output, one may also consider using a different type of lasing element. Typically, the YAG:Nd laser using a YAG:Cr+4 passive Q-switch has become one of the most popular systems for LIBS systems. This system emits light at a wavelength of about 1064 nanometers (nm).
However, one could employ a YAG:Er (erbium-doped YAG) emitting light at a wavelength of 2940 nm. This lasing element has better safety for eyes. In laboratory environments, protocols and safety procedures make laser injuries fairly uncommon. However, in a portable system used in the field that moves around may have heightened risk factors for injury. This lasing system at the broader wavelength has maximum absorption in water. This renders the system safer than other types of lasers, as if the laser were to strike a user's eye, the water in the user's eye would absorb the energy of the laser, avoiding damage to the eye.
In addition, the broader wavelength increases the sensitivity of the measurement. The broader wavelength increases the chances of detecting an element, because the chemical signatures of the elements spread out over the spectrum. The passive Q-switch for this system may use ZnSe:Fe+2 (zinc selenium doped with iron ions), or YAG:Fe+2 to achieve the pulse train discussed above.
Further, to increase the system stability and to keep the dimensions of the system minimal for portability, one can coat the ends of the lasing element with mirrored coatings. In the embodiment of
One issue that arises in laser systems in generally is the mirror alignment. Poorly aligned mirrors may result in the light becoming misdirected, reducing the operability of the system. This problem only increases when the system becomes portable and moves around. By using mirrored coatings on the elements, one avoids possible misalignment or maladjustment of mirrors, increasing the stability of the system.
Another improvement that can result in increased sensitivity of measurement involves increasing the duration and intensity of the plasma emission. This allows the detector to have more time to gather more information about elements that may exist in the sample in minute amounts. Without the extra time, the detector may not detect the smaller emissions of the smaller amounts of certain elements. This increase results from the application of a high-frequency, high-voltage source to the sample during laser ablation. LIBS plus high frequency (LHF™ or L+HF™) may result from placing electrodes on either side of the sample and activating them with a high-frequency, high-voltage (HVHF) pulse when the laser is applied.
The controller also makes possible an automatic mode, in which the controller first turns on the high-frequency, high-voltage source and then the laser pulse, allowing for coordination between the two. In one embodiment, the electrodes receive a voltage signal in the range of 6-15 kV at a frequency of 100 KHz-4 MHz with a power of 5-100 W. The electrodes may be spaced apart by 5-8 millimeters, allowing a steady plasma in air or inert gas.
The period of time in which to make the detection remains one of the issues in measurement sensitivity. The detector must be very ‘fast’ in that it must detect the characteristic emission lines during the microseconds in which they are present. One advantage of using the electrodes is that they extend this period of time, giving the detector more time to respond.
Thus, although there has been described to this point a particular embodiment for a method and apparatus for renewable security transactions in a SNAP environment, it is not intended that such specific references be considered as limitations upon the scope of this invention except in-so-far as set forth in the following claims.
Gennadievich, Polushkin Valery
Patent | Priority | Assignee | Title |
10070661, | Sep 24 2015 | FRITO-LAY NORTH AMERICA, INC | Feedback control of food texture system and method |
10107785, | Sep 24 2015 | FRITO-LAY NORTH AMERICA, INC | Quantitative liquid texture measurement apparatus and method |
10598648, | Sep 24 2015 | Frito-Lay North America, Inc.; FRITO-LAY NORTH AMERICA, INC | Quantitative texture measurement apparatus and method |
10761029, | Sep 05 2019 | SCHENCK PROCESS LLC | Laser-induced spectroscopy system and process |
10791753, | Sep 24 2015 | Frito-Lay North America, Inc. | Feedback control of food texture system and method |
10845239, | Sep 05 2019 | SCHENCK PROCESS LLC | Laser-induced spectroscopy system and process |
10969316, | Sep 24 2015 | FRITO-LAY NORTH AMERICA, INC | Quantitative in-situ texture measurement apparatus and method |
11243190, | Sep 24 2015 | Frito-Lay North America, Inc. | Quantitative liquid texture measurement method |
9506869, | Oct 16 2013 | TSI, Incorporated | Handheld laser induced breakdown spectroscopy device |
9541537, | Sep 24 2015 | FRITO-LAY NORTH AMERICA, INC | Quantitative texture measurement apparatus and method |
9678015, | Sep 26 2014 | Applied Spectra, Inc | Method for elemental analysis of a snack food product in a dynamic production line |
Patent | Priority | Assignee | Title |
4410338, | Jun 25 1979 | Kabushiki Kaisha Toyota Chuo Kenkyusho | Gas separating members and a method of making the same |
5560890, | Jul 28 1993 | Gas Research Institute | Apparatus for gas glow discharge |
6771368, | Sep 04 1998 | XRF Scientific Limited | Laser-induced ionisation spectroscopy, particularly for coal |
6869544, | Dec 14 2001 | National Cheng Kung University | Process for producing nanoscale yttrium aluminum garnet (YAG) fluorescent powders |
7394537, | Dec 22 2006 | Hitachi High-Tech Analytical Science Finland Oy | Practical laser induced breakdown spectroscopy unit |
7821634, | Apr 20 2007 | Thermo Niton Analyzers LLC | Laser-triggered plasma apparatus for atomic emission spectroscopy |
8248602, | Oct 18 2006 | Laser assisted microwave plasma spectroscopy | |
20070046934, | |||
20070140931, | |||
20080101423, | |||
20090298193, |
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