A target of a nominal thickness includes molybdenum. The target has a lamellar microstructure and an oxygen content of less than 1000 ppm, preferably less than 600 ppm, and even more preferably less than 450 ppm. An electrical resistivity of the target is less than five times, preferably three times and more preferably twice the theoretical electrical resistivity of the compound.
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1. A target, consisting of molybdenum and inevitable impurities,
wherein the target is obtained by a process comprising thermal spraying, and
wherein the target has:
a lamellar microstructure;
an oxygen content of less than 600 ppm;
an electrical resistivity less than five times the theoretical electrical resistivity of molybdenum; and
a nominal thickness of between 1 and 25 mm.
2. The target of
3. The target of
4. A target comprising the target of
5. A target comprising the target of
6. The target of
7. The target of
8. The target of
10. The target of
11. The target of
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Field of the Invention
The present invention relates to a process for producing a target intended to be used in deposition processes carried out in a vacuum or in an inert or reactive atmosphere, especially by magnetron sputtering or by ion beam sputtering.
According to another aspect of the invention, it also relates to a molybdenum-based target possibly obtained by implementing said process and to the use of such a target for the purpose of obtaining films based on the material sputtered from said target, and also to a composition of the compound for producing said target by the process according to the invention.
Description of Related Art
Various techniques for manufacturing targets, including certain powder forming techniques, are known. Thus, the targets in question may result from a casting process or a powder sintering process followed by forming operations, often hot forming, and then assembly on a support, or direct assembly of sintered segments, or less conventionally a technique of thermal spraying and more particularly a plasma spraying technique.
These targets are intended to be used in processes commonly employed on an industrial scale for thin film deposition, especially on a glass substrate, such as for example the magnetron sputtering process. In this process, a plasma is created in a high vacuum close to a target comprising the chemical elements to be deposited. The active species of the plasma, by bombarding the target, tear off said elements, which are deposited on the substrate, forming the desired thin film.
In the specific case of a target intended for depositing molybdenum, a nonreactive deposition process is used in which the plasma is composed only of a sputtering gas, preferably a noble gas of the Ar, Kr, Xe or Ne type. This process is implemented for large substrates and may enable thin films to be deposited on substrates, for example flat glass sheets with sides of more than 6 m in length.
These targets have a planar geometry or a tubular geometry.
Planar targets have the advantage of being able to be integrated in cathodes of relatively simple architecture compared with cathodes dedicated to rotary targets, which are much more complex. However, planar targets have a utilization factor which is generally 50% or less, which is not the case for rotary targets that have a utilization factor substantially greater than 50%.
In the specific case of thin molybdenum films, molybdenum being a particularly expensive metal, it is preferred to use rotary targets of cylindrical geometry, as described in the U.S. Pat. No. 4,356,073 since these targets have a material yield (representing the proportion of sputtered material relative to the amount of material available on the target for producing a thin film) of greater than 70%, preferably greater than 75%. However, various other magnetron target geometries are known: planar (disk, square, rectangular) geometries and the invention is also applicable to geometries other than cylindrical ones.
The following literature data for pure molybdenum are given below:
Furthermore, there are also other vacuum processes for depositing molybdenum other than magnetron sputtering using a target: these include laser sputtering (laser ablation using a pulsed or continuous laser) and ion beam sputtering for example. These processes may also benefit from the use of a target according to the invention.
As regards more particularly molybdenum magnetron targets or those made of other refractory metals, many inventions have been filed relating to the following processes and forming the subject matter of the patent applications listed below:
Pressing then sintering of an ingot or a preform (under a pressure of 200 to 250 MPa and at a temperature of 1780 to 2175° C.) followed by hot forming (at about 900° C.) of this preform by rolling or extrusion or forging. Generally, this process also includes a heat treatment in hydrogen or a reducing atmosphere in order to reduce the oxide content in the target and optionally a stress relaxation annealing treatment.
Although the above documents also cover the production of targets having various compositions using these methods, pure molybdenum targets usually have the following properties:
Targets having these characteristics are sputtered so as to obtain thin films that are used for example as electrodes for photovoltaic applications based on an active material belonging to the chalcopyrite family (CIS or CIGS for example). Molybdenum provides a good compromise between electrical conductivity (less than 30 μohms·cm), temperature resistance (refractory properties: melting point: 2610° C.) and high selenization resistance. This is because molybdenum has a higher resistance to the selenium-rich atmosphere used during the CIS or CIGS deposition step, molybdenum reacting on the surface with selenium to form an MoSe2 passivating layer without losing its electrical conduction properties, or else for TFT (thin film transistor) applications that require extremely low defect (“pinhole”) densities. Maximum pinhole densities of 500/m2 with a size between 1 and 5 μm may especially be mentioned. Such quality levels can be achieved only if the sputtering process is devoid of any electrical instability of the arcing type. This is especially possible when the target has significantly no porosity, i.e. with a density of at least 90%.
Although the processes for obtaining a target by plasma spraying are known not to give properties similar to those obtained previously, the present invention is applicable to a process for producing a molybdenum-based target by plasma spraying that offers performance in use at least equal to, if not better than, that obtained by conventional manufacturing processes.
For this purpose, the process according to the invention for producing a target by thermal spraying, especially by plasma spraying by means of a plasma torch, said target comprising at least one molybdenum-based compound, is characterized in that at least one fraction of said compound in the form of a powder composition of said compound is sprayed by thermal spraying onto at least one surface portion of the target in an inert gas atmosphere, and in that powerful cryogenic cooling jets directed onto the target during its construction and distributed around the torch are used.
It will be recalled that fluids with a temperature equal to or below −150° C. are considered by definition to be cryogenic fluids.
The use during plasma spraying of cryogenic cooling jets (cryogenic liquid jets or mixed cryogenic gas/liquid jets or cryogenic gas jets) enables the quality of the target to be improved, while providing two functions:
Moreover, the use of a plasma torch and a plasma gas mixture make it possible to obtain a strong reduction in flight of the sprayed powder particles, thus reducing the oxide content present in the target compared with that present in the powder (Toc<Top where Toc is the oxygen content present in the target and Top is the oxygen content present in the powder).
Furthermore, the process according to the invention includes the following, more conventional, aspects:
In other embodiments of the invention, one and/or other of the following arrangements may furthermore be optionally employed:
Another aspect of the invention relates to a target optionally produced by the process according to the invention and intended to be used in a sputtering device, especially a magnetron sputtering device, or in any other vacuum sputtering device using a target, said target comprising predominantly molybdenum.
For this purpose, the target, according to the invention, of nominal thickness (e), comprising at least one molybdenum-based compound, is characterized in that it has:
This resistivity measurement is carried out using the Van der Pauw (ASTM F76) method, the relative resistivity measurement being calculated relative to the theoretical value at 20° C. of the passive compound (or the value obtained from the literature) (as a reminder, molybdenum has a resistivity of 5.34 μohms·cm).
In preferred embodiments of the invention, one and/or other of the following arrangements may furthermore be optionally employed:
In this case, the addition element or elements may be provided by one of the following means:
According to another embodiment of the target, this is composed of molybdenum and silicon in molar proportions that may range from 1 mol of molybdenum per 5 mol of silicon up to 5 mol of molybdenum per 1 mol of silicon, preferably 1 mol of molybdenum per 2 mol of silicon;
According to yet another feature of the invention, this relates to a molybdenum-based or MoSi2-based film obtained by sputtering the above target.
In preferred embodiments of the invention, one and/or other of the following arrangements may furthermore optionally be employed:
According to yet another aspect of the invention, this relates to a flat display screen, which screen may be obtained by one of the following technologies: TFT (Thin Film Transistor), LCD (Liquid Crystal Display), PDP (Plasma Display Panel), OLED (Organic Light-Emitting Diode), ILED (Inorganic Light-Emitting Diode) or FED (Field Emission Display), or else to a semiconductor component that includes at least one Mo-based or MoSi2-based film, or else the invention relates to an MoSi2 film that is used as a mask in the fabrication of a semiconductor component.
According to yet another aspect of the invention, this relates to at least one electrode formed from a molybdenum-based film obtained using a target as described above, this electrode being used in a photovoltaic cell or module.
According to yet another feature of the invention, this relates to a molybdenum film obtained by sputtering the above target.
In preferred embodiments of the invention, one and/or other of the following arrangements may furthermore be optionally employed:
As nonlimiting examples, the invention may be illustrated by the following figures:
Other features and advantages of the invention will become apparent over the course of the following description.
The support on which the target will be constructed may be made of copper, a copper alloy, stainless steel or any other alloy suitably compatible with the production of magnetron targets. In the present invention, no particular requirement associated with the process described in the invention is required that relates to the support such that it only has to meet the usual requirements relating to magnetron targets, in terms of geometry, mechanical strength and chemical inertness with respect to the cooling water.
Surface Preparation of the Support
After having been degreased, the surface of the support is prepared by blasting it with a jet of abrasive grains. These grains may be of various kinds: corundum (fused white alumina) grains, brown corundum grains, alumina-zirconia abrasive grains, abrasive grains produced from fuse-cast slag particles (of the Vasilgrit type), almandine garnet grains or else angular steel or cast iron shot (this list not being exhaustive).
Preferably, the following abrasives are used: corundum (fused white alumina), and alumina-zirconia (for example AZ 24 from Saint-Gobain Coating Solutions) (this material is preferred for its high toughness that limits fracturing of the grains and consequently the inclusion of grain fractions in the surface—such inclusions are deleterious to adhesion of the coating). The average diameter of the abrasive grains is preferably between 180 and 800 μm, depending on the type of abrasive. The purpose of this operation is to give a surface roughness capable of ensuring correct adhesion of the tie sublayer or of the molybdenum-based compound.
An alternative method consists in machining striations that will also allow good adhesion of the sublayer or the molybdenum compound.
Production of a Tie Sublayer by Thermal Spraying
To optimize the mechanical adhesion of the functional layer of the target, a tie sublayer may be produced by thermal spraying. This operation may employ conventional thermal spraying processes taken from the following: plasma (powder) spraying, electric-arc (wire) spraying, oxy-gas flame spraying (wire or powder depending on the equipment), spraying using the HVOF (high-velocity oxy-fuel) process, the detonation gun spraying process and the cold spray process using an optionally preheated gas into which powder is injected. This operation may be carried out in the ambient air without this impairing the invention.
The tie sublayer material may be chosen from the conventional materials used commonly as sublayers:
The above list is not exhaustive, the choice of sublayer material possibly depending on the material of the support tube and on the spraying equipment (and on the availability of filler material in suitable form).
Formation of the Functional Film of the Target According to the Invention, Preferably by Plasma Spraying
The functional film of the target is formed by thermal spraying, preferably by plasma spraying, under the following particular conditions:
The powder used to produce the target has the following typical characteristics:
The process according to the invention makes it possible to obtain a target quality superior to that conventionally obtained by spraying and having a lamellar structure (cf.
The fact of not using a subsequent heat treatment step has the advantage of employing any type of material for the support (tube for a tubular target or flat support for planar targets), including supports having an expansion coefficient markedly different from that of molybdenum, such as austenitic stainless steels, which would be proscribed in the case of a subsequent heat treatment for reducing the oxygen content.
Of course, a heat treatment may also be carried out, as an option, so as to further reduce the oxygen content in the target thus produced.
Planar Target Case:
The present invention makes it possible to produce planar targets according to the following procedure:
The implementation example relates to a tubular target intended to be used in magnetron sputtering with a rotating cathode. The following process was carried out:
Powder
Ar flow
H2 flow
Arc
Spraying
flow
rate
rate
current
distance
rate
Parameter
(slpm)
(slpm)
(A)
(mm)
(g/min)
Value
50
14
600
160
160
As indicated above, thanks to the specific process according to the present invention, the oxygen content in the target obtained was 330 ppm, less than the 600 ppm content initially present in the powder. The essential characteristics of the target obtained are given in the following table (Target Example 4).
Additional results according to this protocol with different powder compositions, in comparison with a result without a cryogenic jet according to the invention, are given in the table below:
Oxygen
Nitrogen
Oxygen
Nitrogen
content
content
content
content
Trial
in the
in the
in the
in the
reference
Process
powder
powder
target
target
A
According
657
18
340
20
to the
invention
B
According
657
18
240
20
to the
invention
C
According
922
26
340
23
to the
invention
D
According
526
29
360
18
to the
invention
E
According
526
29
360
19
to the
invention
F
According
706
31
580
30
to the
invention
G
No
560
29
960
83
cooling
jets
As the above results show, the plasma spraying process with cryogenic cooling jets distributed around the plasma torch makes it possible to reduce the oxygen content in the target compared with the oxygen content in the starting powder. It is thus unnecessary to choose a very pure starting powder, especially since it is not possible in practice to avoid the powder containing a certain amount of oxygen. The process according to the invention is thus particularly advantageous.
Properties and Advantages of the Invention
The targets according to the present invention have the following properties and advantages:
In the case of monolithic tubular or planar targets produced using the present invention, and in contrast with targets comprising assembled segments, the following risks are considerably reduced:
The targets according to the invention are particularly intended to be used in a vacuum film deposition installation (magnetron sputtering in an inert or reactive atmosphere, especially by magnetron cathode sputtering, by corona discharge or by ion beam sputtering), for the purpose of obtaining a film based on the material forming said target, this film being molybdenum-based.
This molybdenum-based film may be deposited directly on a substrate or indirectly on another film which is itself in contact with a substrate, it being possible for the substrate to be of organic nature (PMMA or PC) or of inorganic nature (silica-based glass, metal, etc.).
This thin film may form an electrode for a photovoltaic cell or panel, or else it may form part of the constitution (interconnects, etc.) of display screens using TFT, LCD, OLED, ILED or FED technologies, or any other assembly requiring a thin molybdenum film of good quality.
The films forming the subject matter of the following examples were obtained by magnetron sputtering of various targets obtained according to the prior art (Examples 1 and 3) and according to the invention (Examples 4 and 5):
Deposition
Magnetron target
process
Mo thin film
Thickness
O
Fe
Resistivity
Power
Pressure
Thickness
Resistivity
Example
Process
(mm)
(ppm)
(ppm)
(μohms · cm)
(kW/m)
(μbar)
(nm)
(μohms · cm)
1
Sintering
9
<50
60
5.6
30 (AC)
4
88
19.6
2
Sintering
12.5
<50
50
6
10 (DC)
4
180
18.8
3
Plasma
2.2
>700
?
—
20 (DC)
2
172
24.7
spray
(prior
art)
4
Plasma
9
330
9
8.4
30 (AC)
4
88
19.0
spray
5
Plasma
4
300
15
8.5
20 (DC)
2
120
14.0
spray
The thin molybdenum-based films were deposited on extra-clear glass 3 mm in thickness, of the SGG-Diamant extra-clear glass type. These films were deposited in a horizontal magnetron deposition machine provided with a molybdenum target according to the invention, this target being supplied either in AC mode by a Hüttinger BIG150 power supply or in DC mode by a Pinnacle AE power supply, with an argon plasma of 450 sccm argon in the case of Examples 1 and 4 and 600 sccm argon for Examples 2, 3 and 5.
Comments:
The targets described in Examples 4 and 5 generate a perfectly stable plasma under DC or AC bias without significant arcing throughout the lifetime of the target.
As a variant, if a target possibly obtained by the process according to the invention is sputtered, this target possibly containing at least one metal cation belonging to the (Fe, Ni, Cr, W, etc.) family, a film also having a certain content of these elements is obtained.
The content of cationic impurities in a thin film produced from a rotary target stems practically only from the target. This is because the rotary technology eliminates all components for fastening the target (i.e. clamps) and therefore eliminates any possibility of parasitic sputtering above the glass.
In most applications, the resistivity of the thin Mo film is especially governed by the oxygen content in the film. It is particularly important to minimize this content so as to maintain a minimum level of oxidation of the film and therefore to obtain a resistivity close to that of pure metallic molybdenum.
The oxygen content of the film has two origins: (i) oxygen originating from the residual atmosphere (“basic vacuum”) before introduction of the sputtering gas and (ii) oxygen originating from the target.
Thus, it is possible to calculate the amount of oxygen theoretically included in the molybdenum film, coming from the residual oxygen partial pressure in the sputter coater, using the following:
Assuming that all the oxygen coming into contact with the molybdenum on the substrate reacts, it is possible to calculate the maximum expected oxygen content in the Mo film; for a given deposition rate on sputter coaters of 8×10−7 cm/s, the residual oxygen contents in the Mo layer as a function of the residual oxygen partial pressure are obtained as given in the following table:
Calculated oxygen content
pO2 (mbar) in the
coming from the vacuum in
sputtering atmosphere
the Mo film (ppm)
10−7
1000
5 × 10−8
540
2 × 10−8
250
1 × 10−8
110
5 × 10−9
54
The minimum residual partial pressure measured in the sputter coater is conventionally 5×10−8 mbar, i.e. about 540 ppm theoretical oxygen. It is therefore unnecessary to use high-purity targets with an oxygen content well below 540 ppm since the influence of the target on the purity of the final film is masked by the oxygen coming from the atmosphere in the sputter coater. The invention consists in choosing a less expensive magnetron technology for producing Mo targets, the oxygen content of which is less than 1000 ppm, preferably less than 600 ppm and even more preferably less than 450 ppm.
The residual content of metal cations (Fe, Ni, Cr, W, etc.) of the thin Mo film obtained within the context of the invention is less than that of the films obtained by conventional targets, for two reasons:
The molybdenum film according to the invention typically has:
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