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The ornamental design for a parcel and letter x-ray inspection unit, substantially as shown and described. |
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FIG. 1 is a front, top and right side perspective view of a parcel and letter X-ray inspection unit showing our new design;
FIG. 2 is a right side elevational view thereof, the left side being substantially a mirror image thereto;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a front elevational view thereof; and
FIG. 5 is a top plan view thereof.
De Lucia, Victor E., Ivy, William R.
| Patent | Priority | Assignee | Title |
| D270181, | Oct 27 1980 | North American Philips Corporation | X-Ray inspection cabinet |
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| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Jun 30 1975 | Torr Laboratories, Inc. | (assignment on the face of the patent) | / |
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