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The ornamental design for an inside micrometer, as shown. |
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FIG. 1 is a front elevational view of an inside micrometer showing my new design;
FIG. 2 is a right side elevational view thereof;
FIG. 3 is a left side elevational view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a top plan view thereof; and
FIG. 6 is a bottom view thereof.
| Patent | Priority | Assignee | Title |
| D670585, | Apr 15 2011 | Mitutoyo Corporation | Inside diameter measurement tool |
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| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Oct 18 1976 | Mitutoyo Manufacturing Company, Ltd. | (assignment on the face of the patent) | / |
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