Patent
   D252501
Priority
Feb 22 1978
Filed
Feb 22 1978
Issued
Jul 31 1979
Expiry
Jul 31 1993
Assg.orig
Entity
unknown
2
6
n/a
The ornamental design for an inner diameter micrometer, substantially as shown and described.

FIG. 1 is a front perspective view of an inner diameter micrometer showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a left side elevational view thereof.

Yamauchi, Mineo, Nakahara, Masao

Patent Priority Assignee Title
6338202, Jan 14 2000 Measurement tool used with an indicator
D327026, Jun 05 1989 Depth finder
Patent Priority Assignee Title
2356037,
2478427,
2604703,
2881529,
2923064,
57932,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Feb 22 1978Mitutoyo Mfg., Co., Ltd.(assignment on the face of the patent)
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