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The ornamental design for a depth micrometer, substantially as shown and described. |
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FIG. 1 is a right front perspective view of a depth micrometer showing my new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a bottom plan view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a front elevational view thereof;
FIG. 7 is a right side elevational view thereof.
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| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Mar 02 1978 | Mitutoyo Mfg. Co., Ltd. | (assignment on the face of the patent) | / |
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