Patent
   D254656
Priority
Oct 17 1977
Filed
Mar 02 1978
Issued
Apr 08 1980
Expiry
Apr 08 1994
Assg.orig
Entity
unknown
4
6
n/a
The ornamental design for a depth micrometer, substantially as shown and described.

FIG. 1 is a right front perspective view of a depth micrometer showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a front elevational view thereof;

FIG. 7 is a right side elevational view thereof.

Suwa, Hiroaki

Patent Priority Assignee Title
5235988, Jul 15 1991 United States Surgical Corporation Device for evaluating surface contour
D301987, Jul 15 1986 Equipment Development Company, Inc. Cutting blade wear guage
D327026, Jun 05 1989 Depth finder
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Patent Priority Assignee Title
2520022,
2717451,
2855686,
2893130,
3018557,
3753295,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Mar 02 1978Mitutoyo Mfg. Co., Ltd.(assignment on the face of the patent)
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