Patent
   D257239
Priority
May 10 1978
Filed
May 10 1978
Issued
Oct 07 1980
Expiry
Oct 07 1994
Assg.orig
Entity
unknown
6
7
n/a
The ornamental design for an electrical test probe, as shown and described.

FIG. 1 is a side elevational view of an electrical test probe showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is an end elevational view thereof on an enlarged scale as seen from plane 3--3 of FIG. 1;

FIG. 4 is an end elevational view thereof on an enlarged scale as seen from plane 4--4 of FIG. 1.

Johnson, Philmore E.

Patent Priority Assignee Title
D300909, Sep 19 1986 ALARIS MEDICAL SYSTEMS, INC Probe for electronic thermometer
D309271, Jul 31 1987 Terumo Kabushiki Kaisha Probe for electronic clinical thermometer
D310038, Jul 31 1987 Terumo Kabushiki Kaisha Probe for electronic clinical thermometer
D412447, Dec 22 1997 SDS Digger Tools Pty Ltd Sample tube for a percussive hammer
D711706, Aug 03 2012 SPELLBOUND DEVELOPMENT GROUP, INC Telescoping reset/testing tool with interchangeable heads
D835170, Dec 22 2015 KARL STORZ SE & CO KG Borescopes
Patent Priority Assignee Title
2654076,
2677117,
2894205,
3513388,
3822598,
3893027,
4151462, Apr 13 1977 Electrical test probe having a spring biased clip with an extendable and retractable tip movable within the clip
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Executed onAssignorAssigneeConveyanceFrameReelDoc
May 10 1978The Superior Electric Company(assignment on the face of the patent)
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