Patent
   D298923
Priority
Feb 04 1986
Filed
Feb 04 1986
Issued
Dec 13 1988
Expiry
Dec 13 2002
Assg.orig
Entity
unknown
0
4
n/a
The ornamental design for a holder for testing an integrated circuit chip, as shown.

FIG. 1 is a top, front, and right side perspective view of a holder for testing an integrated circuit chip showing my new design;

FIG. 2 is a bottom, rear, and left side perspective view thereof;

FIG. 3 is a left side elevational view thereof, the right side being a mirror image thereof;

FIG. 4 is a rear elevational view thereof; and

FIG. 5 is a front elevatioal view thereof.

Sakihara, Yoshinobu

Patent Priority Assignee Title
Patent Priority Assignee Title
3648167,
4677375, Jun 14 1985 Hanwa Electronic Co., Ltd. Apparatus for testing integrated circuit
4707656, Mar 18 1985 Circuit test fixture
D249937, Dec 28 1976 Electrical battery test instrument
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Feb 03 1986SAKIHARA, YOSHINOBUVANGUARD ELECTRONICS COMPANY, INC , A CORP OF CA ASSIGNMENT OF ASSIGNORS INTEREST 0045140088 pdf
Feb 04 1986Vanguard Electronics Company, Inc.(assignment on the face of the patent)
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