Defect inspection device for semiconductors

Abstract

Description

FIG. 1 is a front, top and left side perspective view of a defect inspection device for semiconductors showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a rear elevational view thereof; and

FIG. 7 is a bottom plan view thereof.

Claims

The ornamental design for a defect inspection device for semiconductors, as shown.