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The ornamental design for an integrated circuit tester, as shown and described. |
FIG. 1 is a top plan view of an integrated circuit tester showing our new design;
FIG. 2 is a front elevational view;
FIG. 3 is a rear elevational view;
FIG. 4 is a right side elevational view, the hinged keyboard shown extended;
FIG. 5 is a left side elevational view, the hinged keyboard shown extended;
FIG. 6 is a bottom plan view;
FIG. 7 is another right side elevational view, the hinged keyboard shown in the closed position;
FIG. 8 is another left side elevational view, the hinged keyboard shown in the closed position; and,
FIG. 9 is a top, front and right side perspective view thereof.
Hughes, Cheryl A., Eng, Edmond C.
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Feb 24 1987 | HUGHES, CHERYL A | JOHN FLUKE MFG CO , INC , FLUKE ELECTRONIC PARK, 6920 SEAWAY BLVD , EVERETT, WASHINGTON 98203 A WASHINGTON CORP | ASSIGNMENT OF ASSIGNORS INTEREST | 004675 | /0331 | |
Feb 24 1987 | ENG, EDMOND CHO | JOHN FLUKE MFG CO , INC , FLUKE ELECTRONIC PARK, 6920 SEAWAY BLVD , EVERETT, WASHINGTON 98203 A WASHINGTON CORP | ASSIGNMENT OF ASSIGNORS INTEREST | 004675 | /0331 | |
Feb 26 1987 | John Fluke Mfg. Co., Inc. | (assignment on the face of the patent) | / |
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