Patent
   D315522
Priority
Apr 21 1988
Filed
Oct 06 1988
Issued
Mar 19 1991
Expiry
Mar 19 2005
Assg.orig
Entity
unknown
2
11
n/a
The ornamental design for a current probe, as shown and described.

FIG. 1 is a top, rear, and right side perspective view of a current probe showing our new design;

FIG. 2 is a left side elevational view;

FIG. 3 is a bottom plan view;

FIG. 4 is a top plan view;

FIG. 5 is a front elevational view; and

FIG. 6 is a rear elevational view thereof.

Arnoux, Daniel, Genter, Claude, Arnoux, Axel

Patent Priority Assignee Title
D349067, Mar 19 1993 Internal caliper
D373543, Jul 31 1995 Transparent variable voltage tester
Patent Priority Assignee Title
3840808,
4071824, Oct 04 1976 Yokogawa Electric Corporation Shrouded jaws for hook-on type instruments
4283677, May 18 1979 Clamp type galvanometer
4518913, May 22 1981 H.E.M.E. International Limited Measuring probes
4825154, Feb 15 1986 H E M E INTERNATIONAL LIMITED Current probe
4878852, Jun 03 1988 IDEAL INDUSTRIES, INC Circuit tester construction
D242991, May 27 1975 CLEAN AIR TECHNOLOGIES INC Electrical current probe
D249876, Nov 24 1976 Sun Electric Corporation Inductive clamp
D274892, Feb 26 1982 WESTRONICS INC Electrical sensing and measuring instrument
D288301, Dec 21 1983 Construction d'Appereillage Clamp-on current probe
D300307, Apr 11 1986 Societe Chauvin Arnoux Clamp-on current probe
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 08 1988ARNOUX, DANIELSociete Chauvin ArnouxASSIGNMENT OF ASSIGNORS INTEREST 0055180687 pdf
Sep 08 1988ARNOUX, AXELSociete Chauvin ArnouxASSIGNMENT OF ASSIGNORS INTEREST 0055180687 pdf
Sep 08 1988GENTER, CLAUDESociete Chauvin ArnouxASSIGNMENT OF ASSIGNORS INTEREST 0055180687 pdf
Oct 06 1988Societe Chauvin Arnoux(assignment on the face of the patent)
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