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The ornamental design for a current probe, as shown and described. |
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FIG. 1 is a top, rear, and right side perspective view of a current probe showing our new design;
FIG. 2 is a left side elevational view;
FIG. 3 is a bottom plan view;
FIG. 4 is a top plan view;
FIG. 5 is a front elevational view; and
FIG. 6 is a rear elevational view thereof.
Arnoux, Daniel, Genter, Claude, Arnoux, Axel
| Patent | Priority | Assignee | Title |
| D349067, | Mar 19 1993 | Internal caliper | |
| D373543, | Jul 31 1995 | Transparent variable voltage tester |
| Patent | Priority | Assignee | Title |
| 3840808, | |||
| 4071824, | Oct 04 1976 | Yokogawa Electric Corporation | Shrouded jaws for hook-on type instruments |
| 4283677, | May 18 1979 | Clamp type galvanometer | |
| 4518913, | May 22 1981 | H.E.M.E. International Limited | Measuring probes |
| 4825154, | Feb 15 1986 | H E M E INTERNATIONAL LIMITED | Current probe |
| 4878852, | Jun 03 1988 | IDEAL INDUSTRIES, INC | Circuit tester construction |
| D242991, | May 27 1975 | CLEAN AIR TECHNOLOGIES INC | Electrical current probe |
| D249876, | Nov 24 1976 | Sun Electric Corporation | Inductive clamp |
| D274892, | Feb 26 1982 | WESTRONICS INC | Electrical sensing and measuring instrument |
| D288301, | Dec 21 1983 | Construction d'Appereillage | Clamp-on current probe |
| D300307, | Apr 11 1986 | Societe Chauvin Arnoux | Clamp-on current probe |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Sep 08 1988 | ARNOUX, DANIEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST | 005518 | /0687 | |
| Sep 08 1988 | ARNOUX, AXEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST | 005518 | /0687 | |
| Sep 08 1988 | GENTER, CLAUDE | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST | 005518 | /0687 | |
| Oct 06 1988 | Societe Chauvin Arnoux | (assignment on the face of the patent) | / |
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