|
The ornamental design for an integrated circuit test clip, as shown and described. |
|||||||||||||||||
FIG. 1 is a perspective view of an integrated circuit test clip, showing our new design;
FIG. 2 is a side elevation view thereof, the opposite side being substantially identical to that shown;
FIG. 3 is a side elevation view thereof, orthogonal to the view shown in FIG. 2, the opposite side being substantially identical to that shown;
FIG. 4 is a top plan view thereof; and
FIG. 5 is a bottom plan view thereof.
The cables have been broken away in FIGS. 1-4 to indicate indeterminate length.
Jones, Wayne R., Voss, Daniel J.
| Patent | Priority | Assignee | Title |
| Patent | Priority | Assignee | Title |
| 3506949, | |||
| 3963986, | Feb 10 1975 | International Business Machines Corporation | Programmable interface contactor structure |
| 4055806, | Jan 23 1976 | PATEL, HARSHAD M | Integrated circuit substitution device |
| 4541676, | Mar 19 1984 | ITT Corporation | Chip carrier test adapter |
| 4671592, | Mar 06 1985 | Minnesota Mining and Manufacturing Company | Test clip for PLCC |
| D284185, | Apr 18 1983 | CRT adapter |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Jul 17 1987 | JONES, WAYNE R | JOHN FLUKE MFG CO , INC , A WASHINGTON CORP | ASSIGNMENT OF ASSIGNORS INTEREST | 004746 | /0934 | |
| Jul 17 1987 | VOSS, DANIEL J | JOHN FLUKE MFG CO , INC , A WASHINGTON CORP | ASSIGNMENT OF ASSIGNORS INTEREST | 004746 | /0934 | |
| Jul 24 1987 | John Fluke Mfg. Co., Inc. | (assignment on the face of the patent) | / |
| Date | Maintenance Fee Events |
| Date | Maintenance Schedule |