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The ornamental design for an instrument for measuring size, as shown and described. |
FIG. 1 is a front elevational view of an instrument for measuring size;
FIG. 2 is a left side elevational view thereof the right side being substantially a mirror image thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top view thereof;
FIG. 5 is a bottom view thereof; and,
FIG. 6 is a perspective view thereof.
Patent | Priority | Assignee | Title |
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4547970, | Aug 03 1984 | Thread anvils for inside micrometer | |
4885845, | May 20 1987 | Mitutoyo Corporation | Inner diameter measuring machine |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Feb 22 1990 | WUEST, ROBERT | SCHNYDER & CIE S A | ASSIGNMENT OF ASSIGNORS INTEREST | 005290 | /0185 | |
Apr 24 1990 | Schnyder & Cie S.A. | (assignment on the face of the patent) | / |
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