Patent
   D338415
Priority
Oct 24 1989
Filed
Apr 24 1990
Issued
Aug 17 1993
Expiry
Aug 17 2007
Assg.orig
Entity
unknown
0
4
n/a
The ornamental design for an instrument for measuring size, as shown and described.

FIG. 1 is a front elevational view of an instrument for measuring size;

FIG. 2 is a left side elevational view thereof the right side being substantially a mirror image thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a bottom view thereof; and,

FIG. 6 is a perspective view thereof.

Wuest, Robert

Patent Priority Assignee Title
Patent Priority Assignee Title
2923064,
3781998,
4547970, Aug 03 1984 Thread anvils for inside micrometer
4885845, May 20 1987 Mitutoyo Corporation Inner diameter measuring machine
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Feb 22 1990WUEST, ROBERTSCHNYDER & CIE S A ASSIGNMENT OF ASSIGNORS INTEREST 0052900185 pdf
Apr 24 1990Schnyder & Cie S.A.(assignment on the face of the patent)
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