Patent
   D344030
Priority
Nov 25 1992
Filed
Nov 25 1992
Issued
Feb 08 1994
Expiry
Feb 08 2008
Assg.orig
Entity
unknown
3
3
n/a
The ornamental design for a capacitive test probe board, as shown and described.

FIG. 1 is a top, front perspective view of a capacitive test probe board showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a front elevation view thereof;

FIG. 5 is a left side elevation view thereof;

FIG. 6 is a right side elevation view thereof; and,

FIG. 7 is a bottom plan view thereof.

Kerschner, Ronald K., Kent, Lisa M.

Patent Priority Assignee Title
D964191, Aug 21 2018 Mitsubishi Electric Corporation Capacitive sensor
ER2189,
ER2259,
Patent Priority Assignee Title
5075621, Dec 19 1988 International Business Machines Corporation Capacitor power probe
5202640, Jun 03 1991 International Business Machines Corporation Capacitance and leakage test method and apparatus
5212992, Jun 14 1991 Medical Laboratory Automation, Inc. Capacitive probe sensor with reduced effective stray capacitance
////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Nov 25 1992Hewlett-Packard Company(assignment on the face of the patent)
Jan 22 1993KERSCHNER, RONALD K Hewlett-Packard CompanyASSIGNMENT OF ASSIGNORS INTEREST 0064270279 pdf
Jan 22 1993KENT, LISA M Hewlett-Packard CompanyASSIGNMENT OF ASSIGNORS INTEREST 0064270279 pdf
May 20 2000HEWLETT-PACKARD COMPANY, A DELAWARE CORPORATIONAgilent Technologies IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0109010336 pdf
n/a
Date Maintenance Fee Events


n/a
Date Maintenance Schedule