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The ornamental design for a clamp-on current probe, as shown. |
FIG. 1 is a right side elevational view of the clamp-on current probe according to our new design;
FIG. 2 is a left side elevational view thereof;
FIG. 3 is a bottom plan view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a front elevational view thereof, as seen from the right side of FIG. 1; and,
FIG. 6 is a rear elevational view thereof.
Arnoux, Daniel, Genter, Claude, Arnoux, Axel
Patent | Priority | Assignee | Title |
D416211, | Jun 25 1998 | Societe Chauvin Arnoux | Clamp-on current probe |
Patent | Priority | Assignee | Title |
5610512, | Sep 12 1991 | Lem Heme Limited | Clamp-on electrical measuring device |
D358349, | Apr 05 1994 | Kyoritsu Electrical Instruments Works, Ltd. | Volt-ohm-ammeter |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jul 28 1997 | Societe Chauvin Arnoux | (assignment on the face of the patent) | / | |||
Oct 09 1997 | ARNOUX, DANIEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008763 | /0969 | |
Oct 09 1997 | ARNOUX, AXEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008763 | /0969 | |
Oct 09 1997 | GENTER, CLAUDE | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008763 | /0969 |
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