Patent
   D415700
Priority
Nov 23 1998
Filed
Nov 23 1998
Issued
Oct 26 1999
Expiry
Oct 26 2013
Assg.orig
Entity
unknown
0
13
n/a
The ornamental design for a stack thickness measuring gauge, as shown and described.

FIG. 1 is a perspective view of a stack thickness measuring gauge, as seen from the front and one side, showing my new design;

FIG. 2 is an elevational view thereof, as taken from the other side, the two sides being mirror images of each other;

FIG. 3 is is a top plan view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof; and,

FIG. 6 is a bottom plan view thereof.

Being shown in an arbitrary orientation for illustrative purposes, the stack thickness measuring gauge is useful also in different orientations. In FIG. 1, broken-line showings of a user's hand and of a stack of sheets are for illustrative purposes only and form no part of the claimed design.

Bagnal, Joel B.

Patent Priority Assignee Title
Patent Priority Assignee Title
1196188,
1299256,
205225,
2794257,
2799939,
3751814,
3999667, Nov 13 1975 Atlas Spokane, Inc. Drag bucket chain conveyor
4455753, Mar 01 1982 Thickness gauge
4519142, Jan 28 1983 Blade height calibration device
477183,
5235756, Aug 21 1992 Grumman Aerospace Corporation Portable coating thickness measuring device
5249366, Apr 26 1991 Mitutoyo Corporation Dimension measuring instrument
5390427, May 10 1993 Fastener measuring device
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Nov 23 1998Charles W., Goff(assignment on the face of the patent)
Nov 23 1998BAGNAL, JOEL B GOFF, CHARLES W ASSIGNMENT OF UNDIVIDED HALF-INTEREST0097630467 pdf
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