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The ornamental design for a handle for test fixture, as shown. |
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FIG. 1 is a perspective view of a handle for test fixture showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top view thereof;
FIG. 5 is a bottom view thereof;
FIG. 6 is a left side elevational view thereof; and,
FIG. 7 is a right side elevational view thereof.
Green, III, Gerald A., Hutton, Gordon R.
| Patent | Priority | Assignee | Title |
| D469027, | Sep 13 1999 | University of Medicine and Dentistry of New Jersey | Combination rack for chemical analyzers |
| D561787, | Jul 27 2006 | Samsung Electronics Co., Ltd. | Handle |
| ER5448, | |||
| ER7094, |
| Patent | Priority | Assignee | Title |
| 226365, | |||
| D388685, | Feb 06 1996 | Knurr-Mechanik fur die Elektronik Aktiengesellschaft | Handle |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Jan 15 1999 | HUTTON, GORDON R | H+W TEST PRODUCTS, INC | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 009819 | /0563 | |
| Jan 15 1999 | GREENE, GERALD A III | H+W TEST PRODUCTS, INC | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 009819 | /0563 | |
| Feb 16 1999 | H+W Test Products, Inc. | (assignment on the face of the patent) | / |
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