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The ornamental design of a current probe, as shown and described. |
FIG. 1 is a perspective view of a current probe showing the first embodiment of my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top elevational view thereof;
FIG. 5 is a bottom elevational view thereof;
FIG. 6 is a left elevational view thereof;
FIG. 7 is a right elevational view thereof;
FIG. 8 is a perspective view of a current probe showing the second embodiment of my new design;
FIG. 9 is a front elevational view thereof;
FIG. 10 is a rear elevational view thereof;
FIG. 11 is a top elevational view thereof;
FIG. 12 is a bottom elevational view thereof;
FIG. 13 is a left elevational view thereof; and,
FIG. 14 is a right elevational view thereof.
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D358349, | Apr 05 1994 | Kyoritsu Electrical Instruments Works, Ltd. | Volt-ohm-ammeter |
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Dec 07 1998 | SHAFIE, MATT H | BELL TECHNOLOGIES INC | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 009659 | /0811 | |
Dec 09 1998 | Bell Technologies Inc. | (assignment on the face of the patent) | / | |||
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