Patent
   D419467
Priority
Apr 12 1999
Filed
Apr 12 1999
Issued
Jan 25 2000
Expiry
Jan 25 2014
Assg.orig
Entity
unknown
3
4
n/a
The ornamental design for a clamp tester, as shown and described.

FIG. 1 is a perspective view of a clamp tester showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a front elevational view indicating a clamp-open status.

Kaise, Hideo, Shirai, Etsuo

Patent Priority Assignee Title
D440892, Mar 27 2000 Kyoritsu Electrical Instruments Works, Ltd. Volt-ohm-ammeter
D457824, Apr 30 2001 Brymen Technology Corporation Clamp meter
D637927, Mar 08 2010 Megger Limited Electrical test device
Patent Priority Assignee Title
D345704, Jan 14 1992 Kaise Kabushiki Kaisha Multimeter
D396657, Dec 27 1996 HIOKI DENKI KABUSHIKI KAISHA Clamp meter
JP6130771,
RE36227,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Mar 25 1999KAISE, HIDEOKaise Kabushiki KaishaASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0099080717 pdf
Mar 25 1999SHIRAI, ETSUOKaise Kabushiki KaishaASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0099080717 pdf
Apr 12 1999Kaise Kabushiki Kaisha(assignment on the face of the patent)
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