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The ornamental design for goniometer frame, as shown and described. |
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FIG. 1 shows an isometric view of the preferred embodiment of the design of the present invention, with environment shown in dashed lines.
FIG. 2 is a top plan view of the preferred embodiment of the design of the present invention, with environment shown in dashed lines.
FIG. 3 is a fragmentary view of a second, alternate embodiment of the design of the present invention.
FIG. 4 is a fragmentary view of a third, alternate embodiment of the design of the present invention.
FIG. 5 is a left-side elevation of the preferred embodiment of the design of the present invention, with environment shown in dashed lines.
FIG. 6 is a bottom plan view of the preferred embodiment of the design of the present invention, with environment shown in dashed lines.
FIG. 7 is a front elevation of the preferred embodiment of the design of the present invention, with environment shown in dashed lines.
FIG. 8 is a rear elevation of the preferred embodiment of the design of the present invention, with environment shown in dashed lines; and,
FIG. 9 is a right-side elevation of the preferred embodiment of the design of the present invention, with the environment shown in dashed lines.
| Patent | Priority | Assignee | Title |
| 6702815, | Dec 01 2000 | Method and device to correct instability of hinged joints |
| Patent | Priority | Assignee | Title |
| 3263078, | |||
| 3566112, | |||
| 3600575, | |||
| 3628761, | |||
| 3672607, | |||
| 3723006, | |||
| 4183482, | Dec 09 1975 | Societe Anonyme de Telecommunications | Night guiding device for self-propelled missiles |
| 4323049, | Oct 09 1979 | Quartz wafering machine | |
| 4631832, | Apr 24 1985 | Wegmann & Co. GmbH | Device for measuring axle geometry of motor vehicles with the wheels turning |
| 4651832, | Jun 23 1983 | Flash type sprinkler head | |
| 4658411, | Jun 22 1984 | Centre National de la Recherche Scientifique (CNRS). | Goniometric device particularly for X-ray or neutron diffractometry on monocrystals or any other sample |
| 5263492, | Apr 30 1992 | Recording goniometer | |
| 5268953, | Aug 14 1991 | PANALYTICAL B V | X-ray analysis apparatus including goniometer with angle encoders |
| 5387331, | May 19 1994 | The United States of America as represented by the Secretary of the Air | Wafer cutting device |
| 5481111, | Jan 03 1994 | U S PHILIPS CORPORATION | Electron microscope having a goniometer controlled from the image frame of reference |
| 5561912, | May 28 1992 | Illinois Tool Works, Inc | Three axis goniometer |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Mar 04 1996 | D. Barclay, Slocum | (assignment on the face of the patent) | / |
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