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The ornamental design for an electrical test probe, as shown and described. |
FIG. 1 is a perspective view of the electrical test probe of this invention showing a detachable primary probe point detached to reveal a non-detachable secondary sharp probe point;
FIG. 2 is a top view thereof with the secondary probe point covered;
FIG. 3 is a top view thereof to clearly illustrate the location of views shown in FIGS. 8, 9 and 10;
FIG. 4 is a front view thereof with the secondary probe point covered, the back view being a mirror image of the front view;
FIG. 5 is a bottom view thereof with the secondary probe point covered;
FIG. 6 is a left side view thereof;
FIG. 7 is a right side view thereof;
FIG. 8 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 8--8;
FIG. 9 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 9--9; and,
FIG. 10 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 10--10.
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Mar 31 2000 | BAUMAN, THOMAS F | HICKOK, INC , A CORPORATION OF OHIO | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010680 | /0753 | |
Apr 06 2000 | Hickok, Incorporated | (assignment on the face of the patent) | / |
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