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The ornamental design for a probe thermometer, as shown. |
FIG. 1 is a perspective view of the probe thermometer showing our new design;
FIG. 2 is a right side elevation view of the probe thermometer shown in FIG. 1, the left side elevation view being a mirror image thereof;
FIG. 3 is a front elevation view of the probe thermometer of FIG. 1;
FIG. 4 is a top plan view of the probe thermometer shown in FIG. 1;
FIG. 5 is a bottom plan view of the probe thermometer shown in FIG. 1;
FIG. 6 is a back plan view of the probe thermometer shown in FIG. 1;
FIG. 7 is a perspective view of an alternate embodiment of the invention in which a portion of the probe of FIG. 1 is uncovered;
FIG. 8 is a perspective view of an alternate embodiment of the invention in which a portion of the probe of FIG. 1 is uncovered;
FIG. 9 is a right side elevation view of the probe thermometer of FIG. 7, with the left side elevation view being a mirror image thereof;
FIG. 10 is a front elevation view of the probe thermometer of FIG. 7;
FIG. 11 is a top plan view of the probe thermometer of FIG. 7; and,
FIG. 12 is a back elevation of the probe thermometer of FIG. 7.
Mayer, Paul, Wai Ming, Ho, Kovarsky, Ronald J.
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
May 08 2000 | MING, HO WAI | Chaney Instrument Company | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010825 | /0215 | |
May 08 2000 | KOVARSKY, RONALD J | Chaney Instrument Company | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010825 | /0215 | |
May 08 2000 | MEYER, PAUL | Chaney Instrument Company | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 010825 | /0215 | |
May 26 2000 | Chaney Instrument Company | (assignment on the face of the patent) | / |
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