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The ornamental design for an electrical test instrument, as shown and described.
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FIG. 1 is a perspective view of a first embodiment of an electrical test instrument showing our new design;
FIG. 2 is a front elevation view thereof;
FIG. 3 is a right side elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
Ikeda, John K., Kearsley, Duncan N.
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
May 14 2001 | Fluke Corporation | (assignment on the face of the patent) | / | |||
May 14 2001 | IKEDA, JOHN K | Fluke Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 011822 | /0758 | |
May 14 2001 | KEARSLEY, DUNCAN N | Fluke Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 011822 | /0758 |
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