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Patent
D472170
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Priority
Oct 08 2001
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Filed
Apr 05 2002
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Issued
Mar 25 2003
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Expiry
Mar 25 2017
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Assg.orig
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Entity
unknown
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9
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2
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n/a
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The ornamental design for a probe, as shown.
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FIG. 1 is a side view of probe showing my new design.
FIG. 2 is front view thereof.
FIG. 3 is an opposite side view thereof.
FIG. 4 is a rear view thereof; and,
FIG. 5 is a bottom view thereof.
Reymond, Jean-Claude
| Patent |
Priority |
Assignee |
Title |
| D659572, |
Sep 27 2010 |
Mitutoyo Corporation |
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| D659574, |
Apr 22 2011 |
Mitutoyo Corporation |
Measuring head |
| D659575, |
Apr 22 2011 |
Mitutoyo Corporation |
Measuring head |
| D666513, |
Oct 21 2010 |
Mitutoyo Corporation |
Remote probe for a coordinate measuring machine |
| D685275, |
Apr 29 2011 |
Carl Zeiss Industrielle Messtechnik GmbH |
Probe head for coordinate measuring machine |
| D712761, |
Jun 03 2013 |
Mitutoyo Corporation |
Measuring head |
| D714168, |
Nov 27 2013 |
HEXAGON METROLOGY S P A |
Measuring machine |
| D914220, |
May 30 2019 |
ECHONOUS, INC |
Medical examination probe |
| D926997, |
May 30 2019 |
ECHONOUS, INC. |
Medical examination probe |
| Date |
Maintenance Fee Events |
n/a
| Date |
Maintenance Schedule |
n/a