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The ornamental design for an innovative micrometric measuring instrument, as shown and described.
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FIG. 1 is a front elevational view of an innovative micrometric measuring instrument showing my new design;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a left side elevational view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a top plan elevational view thereof;
FIG. 6 is a bottom plan elevational view thereof; and,
FIG. 7 is a top, front and right perspective elevational view thereof.
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
May 29 2002 | CHIANG, CHIN CHIH | Hung Fu Group of Companies | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 013058 | /0235 | |
Jul 15 2002 | Hung Fu Group of Companies | (assignment on the face of the patent) | / |
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