Patent
   D476020
Priority
Jul 15 2002
Filed
Jul 15 2002
Issued
Jun 17 2003
Expiry
Jun 17 2017
Assg.orig
Entity
unknown
14
2
n/a
The ornamental design for an innovative micrometric measuring instrument, as shown and described.

FIG. 1 is a front elevational view of an innovative micrometric measuring instrument showing my new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a top plan elevational view thereof;

FIG. 6 is a bottom plan elevational view thereof; and,

FIG. 7 is a top, front and right perspective elevational view thereof.

Chih, Chiang Chin

Patent Priority Assignee Title
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ER7216,
ER8005,
Patent Priority Assignee Title
5694242, May 31 1996 Lunax Company Limited Multi-function microscope
D359059, May 24 1993 Lunax Company Limited Projection microscope
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Executed onAssignorAssigneeConveyanceFrameReelDoc
May 29 2002CHIANG, CHIN CHIHHung Fu Group of CompaniesASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0130580235 pdf
Jul 15 2002Hung Fu Group of Companies(assignment on the face of the patent)
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