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Patent
D554008
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Priority
Nov 03 2005
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Filed
Oct 06 2006
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Issued
Oct 30 2007
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Expiry
Oct 30 2021
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Assg.orig
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Entity
unknown
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5
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29
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n/a
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The ornamental design for a probe handle for thermometer, as shown and described.
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FIG. 1 is a front perspective view of a probe handle for thermometer with parts of a thermometer probe other than the probe handle shown in phantom;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof.
FIG. 4 is a left side elevational view thereof.
FIG. 5 is a right side elevational view thereof.
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is a rear perspective view of the probe handle in combination with the probe.
Portions of the views shown in phantom form no part of the design.
Breitweiser, Kenneth M., Sisk, Ricky A., Davis, Mark A.
Patent |
Priority |
Assignee |
Title |
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Feb 25 1997 |
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Measuring instrument |
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Jul 27 2000 |
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Infrared thermometer |
D480977, |
Oct 03 2002 |
Welch Allyn, Inc |
Thermometry probe |
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|
Temperature probe handle |
JP6241914, |
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Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a