Patent
   D573047
Priority
Sep 27 2006
Filed
Dec 28 2006
Issued
Jul 15 2008
Expiry
Jul 15 2022
Assg.orig
Entity
unknown
4
7
n/a
The ornamental design for a testing device for electronic component, as shown and described.

FIG. 1 is a top, front, and right side perspective view of a testing device for electronic component showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left-side, elevational view thereof;

FIG. 5 is a right-side, elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a top, front, and right-side perspective view, showing the article with a display thereof in a released position and a drawer in a drawn-out position.

(Broken line portions are only included to show the intended use environment and do not constitute a part of the claimed design.)

Fan, Chiou-Lin, Huang, Ying-Chih, Chen, Chin-Feng, Lin, Tay-Yang

Patent Priority Assignee Title
D788612, Feb 11 2016 EXFO INC Modular test instrument
D870575, Aug 02 2018 BANKSUPPLIES, INC Multi-counterfeit detection station
D965456, Dec 16 2019 ABB Schweiz AG Electricity meter
D978686, Apr 05 2021 DOBLE ENGINEERING COMPANY Configurable test instrument for power equipment
Patent Priority Assignee Title
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Dec 13 2006CHEN, CHIN-FENG HON HAI PRECISION INDUSTRY CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0186840047 pdf
Dec 13 2006FAN, CHIOU-LINHON HAI PRECISION INDUSTRY CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0186840047 pdf
Dec 13 2006HUANG, YING-CHIHHON HAI PRECISION INDUSTRY CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0186840047 pdf
Dec 13 2006LIN, TAY-YANGHON HAI PRECISION INDUSTRY CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0186840047 pdf
Dec 28 2006Hon Hai Precision Industry Co, Ltd.(assignment on the face of the patent)
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