Patent
   D595601
Priority
Apr 10 2008
Filed
Apr 10 2008
Issued
Jul 07 2009
Expiry
Jul 07 2023
Assg.orig
Entity
unknown
2
2
n/a
The ornamental design for a measuring apparatus, as shown and described.

FIG. 1 is a perspective view of a measuring apparatus showing my new design.

FIG. 2 is a top view of the measuring apparatus.

FIG. 3 is a left side view of the measuring apparatus.

FIG. 4 is a right side view of the measuring apparatus.

FIG. 5 is a front end view of the measuring apparatus.

FIG. 6 is rear end view of the measuring apparatus; and,

FIG. 7 is a bottom view of the measuring apparatus.

Gallon, Andrew Munro

Patent Priority Assignee Title
D896672, Feb 13 2019 Yokogawa Electric Corporation Flowmeter
D904910, Sep 21 2018 Electricity meter
Patent Priority Assignee Title
180192,
D292979, Apr 26 1985 TENCOR INSTRUMENTS A CA CORP Automatic semiconductor wafer tester
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Apr 10 2008Insensys Limited(assignment on the face of the patent)
Jun 12 2008GALLON, ANDREW MUNROInsensys LimitedASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0211330515 pdf
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