Patent
   D618570
Priority
Aug 05 2009
Filed
Aug 05 2009
Issued
Jun 29 2010
Expiry
Jun 29 2024
Assg.orig
Entity
unknown
7
3
n/a
The ornamental design for an optical emission analyzer, as shown and described.

FIG. 1 is a front view of an optical emission analyzer showing my new design;

FIG. 2 is a rear view thereof.

FIG. 3 is a left side view thereof.

FIG. 4 is a right side view thereof.

FIG. 5 is a top view thereof.

FIG. 6 is a bottom view thereof;

FIG. 7 is a perspective view thereof.

FIG. 8 is a perspective view thereof with the sampling room cover opened; and,

FIG. 9 is a perspective view thereof with the dial cover opened.

In the drawings, the whole surface of each part of the claimed design is shown in dark and light colors to illustrate the three-dimensional shape of the part. The dark and light colors in the drawings are for illustrative purposes only and form no part of the claimed design.

Ihara, Kaoru

Patent Priority Assignee Title
D879994, Jul 23 2015 Meso Scale Technologies, LLC Automated assay system
D920144, Feb 15 2017 Becton, Dickinson and Company Diagnostic testing module
D920145, Feb 15 2017 Becton, Dickinson and Company Sample preparation module
D979614, Feb 15 2017 Becton, Dickinson and Company Sample preparation module
ER1665,
ER2646,
ER8122,
Patent Priority Assignee Title
6830939, Aug 28 2002 Verity Instruments, Inc. System and method for determining endpoint in etch processes using partial least squares discriminant analysis in the time domain of optical emission spectra
20040045934,
D364576, Jan 13 1995 Agilent Technologies Inc Chromatograph
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May 25 2009IHARA, KAORUShimadzu CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0230590687 pdf
Aug 05 2009Shimadzu Corporation(assignment on the face of the patent)
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