Patent
   D620379
Priority
Mar 27 2009
Filed
Mar 27 2009
Issued
Jul 27 2010
Expiry
Jul 27 2024
Assg.orig
Entity
unknown
0
3
n/a
The ornamental design for an interference test apparatus, as shown and described.

FIG. 1 is a front perspective view showing our new design for an interference test apparatus and wherein the shaded regions denote textured surfaces;

FIG. 2 is a further front perspective view of the interference test apparatus of FIG. 1 and wherein the shaded regions denote textured surfaces;

FIG. 3 is a rear perspective view of the interference test apparatus of FIG. 1 and wherein the shaded regions denote textured surfaces;

FIG. 4 is a right side view of the interference test apparatus of FIG. 1 and wherein the shaded regions denote textured surfaces;

FIG. 5 is a left side view of the interference test apparatus of FIG. 1 and wherein the shaded regions denote textured surfaces;

FIG. 6 is a top plan view of the interference test apparatus of FIG. 1 with the strap removed for clarity and wherein the shaded regions denote textured surfaces;

FIG. 7 is a bottom view showing the interference test apparatus of FIG. 1;

FIG. 8 is a front view showing the interference test apparatus of FIG. 1 and wherein the shaded regions denote textured surfaces;

FIG. 9 is a rear view showing the interference test apparatus of FIG. 1;

FIG. 10 is a front perspective view of a second embodiment of the interference test apparatus;

FIG. 11 is a further front perspective view of the interference test apparatus of FIG. 10;

FIG. 12 is a rear perspective view of the interference test apparatus of FIG. 10;

FIG. 13 is a right side view of the interference test apparatus of FIG. 10;

FIG. 14 is a left side view of the interference test apparatus of FIG. 10;

FIG. 15 is a top plan view of the interference test apparatus of FIG. 10

FIG. 16 is a bottom view showing the interference test apparatus of FIG. 10;

FIG. 17 is a front view showing the interference test apparatus of FIG. 10;

FIG. 18 is a rear view showing the interference test apparatus of FIG. 10

FIG. 19 is a front perspective view of a third embodiment of the interference test apparatus;

FIG. 20 is a further front perspective view of the interference test apparatus of FIG. 19;

FIG. 21 is a rear perspective view of the interference test apparatus of FIG. 19;

FIG. 22 is a right side view of the interference test apparatus of FIG. 19;

FIG. 23 is a left side view of the interference test apparatus of FIG. 19;

FIG. 24 is a top plan view of the interference test apparatus of FIG. 19 with the strap removed for clarity;

FIG. 25 is a bottom view showing the interference test apparatus of FIG. 19;

FIG. 26 is a front view showing the interference test apparatus of FIG. 19; and,

FIG. 27 is a rear view showing the interference test apparatus of FIG. 19.

Wall, Alexander, Schroder, Warren, Strachan, Frank John, Delforce, Greg, Nankivell, John, Racher, Anthony John

Patent Priority Assignee Title
Patent Priority Assignee Title
AU124932008,
D580805, Jan 30 2008 Fluke Corporation Electrical tester
EM9438730001,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Mar 27 2009Triasx Pty Ltd.(assignment on the face of the patent)
Jul 01 2010SCHRODER, WARRENTRIASX PTY LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0247260662 pdf
Jul 01 2010WALL, ALEXANDERTRIASX PTY LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0247260662 pdf
Jul 02 2010STACHAN, FRANK JOHNTRIASX PTY LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0247260662 pdf
Jul 05 2010NANKIVELL, JOHNTRIASX PTY LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0247260662 pdf
Jul 07 2010DELFORCE, GREGTRIASX PTY LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0247260662 pdf
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