Patent
   D664869
Priority
Aug 23 2010
Filed
Feb 23 2011
Issued
Aug 07 2012
Expiry
Aug 07 2026
Assg.orig
Entity
unknown
0
3
n/a
The ornamental design for a portion of a cartridge for an ion density measuring instrument, as shown and described.

FIG. 1 is a front elevational view of a portion of a cartridge for an ion density measuring instrument showing my new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side elevational view thereof; and,

FIG. 6 is a left side elevational view thereof; and

FIG. 7 is a top, left and front side perspective view thereof; and,

FIG. 8 is a bottom, right and front side perspective view thereof.

The broken lines shown are for illustrative purposes only and form no part of the claimed design.

Nishimoto, Hideaki

Patent Priority Assignee Title
Patent Priority Assignee Title
6656752, Mar 17 1999 Hitachi, Ltd. Ion current density measuring method and instrument, and semiconductor device manufacturing method
D522145, Jun 18 2003 SECRETARY OF STATE FOR DEFENCE, DTSL, THE Sample processing device
D634659, Jan 29 2010 SANYO FINE IRICA TECHNOLOGY INC Column for chromatograph
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Feb 23 2011Hitachi Chemical Company, Ltd.(assignment on the face of the patent)
Mar 22 2011NISHIMOTO, HIDEAKIHitachi Chemical Company, LTDASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0261860856 pdf
Oct 01 2020Hitachi Chemical Company, LTDSHOWA DENKO MATERIALS CO , LTD CHANGE OF NAME SEE DOCUMENT FOR DETAILS 0629170865 pdf
Jan 01 2023SHOWA DENKO MATERIALS CO , LTD Resonac CorporationCHANGE OF NAME SEE DOCUMENT FOR DETAILS 0629460125 pdf
Oct 01 2023Resonac CorporationResonac CorporationCHANGE OF ADDRESS0665990037 pdf
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