Patent
   D699607
Priority
Mar 01 2012
Filed
Aug 31 2012
Issued
Feb 18 2014
Expiry
Feb 18 2028
Assg.orig
Entity
unknown
3
13
n/a
The ornamental design(s) for a contact probe, as shown and described.

FIG. 1 is a perspective view of the front, top and left side of a contact probe of a first embodiment showing our new design;

FIG. 2 is a perspective view of the rear, top and right side thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof;

FIG. 8 is a bottom view thereof;

FIG. 9 is an enlarged view of tip side from 9-9 section in FIG. 1 thereof;

FIG. 10 is an enlarged view of tip side from 10-10 section in FIG. 2 thereof;

FIG. 11 is an enlarged view of tip side from 11-11 section in FIG. 3 thereof; and

FIG. 12 is an enlarged view of tip side from 12-12 section in FIG. 6 thereof,

FIG. 13 is a perspective view of the front, top and left side of a contact probe of a second embodiment showing our new design;

FIG. 14 is a perspective view of the rear, top and right side thereof;

FIG. 15 is a front view thereof;

FIG. 16 is a rear view thereof;

FIG. 17 is a left side view thereof;

FIG. 18 is a right side view thereof;

FIG. 19 is a top view thereof;

FIG. 20 is a bottom view thereof;

FIG. 21 is an enlarged view of tip side from 21-21 section in FIG. 13 thereof;

FIG. 22 is an enlarged view of tip side from 22-22 section in FIG. 14 thereof;

FIG. 23 is an enlarged view of tip side from 23-23 section in FIG. 15 thereof; and

FIG. 24 is an enlarged view of tip side from 24-24 section in FIG. 18 thereof,

FIG. 25 is a perspective view of the front, top and left side of a contact probe of a third embodiment showing our new design;

FIG. 26 is a perspective view of the rear, top and right side thereof;

FIG. 27 is a front view thereof;

FIG. 28 is a rear view thereof;

FIG. 29 is a left side view thereof;

FIG. 30 is a right side view thereof;

FIG. 31 is a top view thereof;

FIG. 32 is a bottom view thereof;

FIG. 33 is an enlarged view of tip side from 33-33 section in FIG. 25 thereof;

FIG. 34 is an enlarged view of tip side from 34-34 section in FIG. 26 thereof;

FIG. 35 is an enlarged view of tip side from 35-35 section in FIG. 27 thereof; and

FIG. 36 is an enlarged view of tip side from 36-36 section in FIG. 30 thereof,

FIG. 37 is a perspective view of the front, top and left side of a contact probe of a fourth embodiment showing our new design;

FIG. 38 is a perspective view of the rear, top and right side thereof;

FIG. 39 is a front view thereof;

FIG. 40 is a rear view thereof;

FIG. 41 is a left side view thereof;

FIG. 42 is a right side view thereof;

FIG. 43 is a top view thereof;

FIG. 44 is a bottom view thereof;

FIG. 45 is an enlarged view of tip side from 45-45 section in FIG. 37 thereof;

FIG. 46 is an enlarged view of tip side from 46-46 section in FIG. 38 thereof;

FIG. 47 is an enlarged view of tip side from 47-47 section in FIG. 39 thereof; and,

FIG. 48 is an enlarged view of tip side from 48-48 section in FIG. 42 thereof.

The portions of the article in broken lines are shown for illustrative purposes only and form no part of the claimed design.

Nakamura, Yuji, Suzuki, Katsumi

Patent Priority Assignee Title
9702905, Aug 02 2011 NHK SPRING CO , LTD Probe unit
D769753, Dec 19 2014 Omron Corporation Probe pin
D983056, Dec 13 2019 GENED CO., LTD. Probe pin
Patent Priority Assignee Title
4050762, Nov 10 1976 Everett/Charles, Inc. Telescoping spring probe having separate wiper contact member
4417206, Mar 09 1981 Virginia Panel Corporation Electrical contact probe and method of manufacturing
4438397, Dec 26 1979 Teradyne, Inc. Test pin
4885533, Sep 09 1988 Q A Technology Company, Inc. Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region
5032787, Nov 03 1989 EVERETT CHARLES TECHNOLOGIES, INC Electrical test probe having rotational control of the probe shaft
6053777, Jan 05 1998 RIKA DENSHI AMERICA, INC Coaxial contact assembly apparatus
6159056, Nov 25 1998 RIKA DENSHI AMERICA, INC Electrical contact assembly for interconnecting test apparatus and the like
7253647, May 17 2004 Probe for high electric current
20120122355,
D400811, Nov 21 1997 Delaware Capital Formation, Inc Test probe plunger tip
JP2002357622,
JP2010038612,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Aug 31 2012Yamaichi Electronics Co., Ltd.(assignment on the face of the patent)
Nov 08 2012NAKAMURA, YUJIYAMAICHI ELECTRONICS CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0292820393 pdf
Nov 08 2012SUZUKI, KATSUMIYAMAICHI ELECTRONICS CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0292820393 pdf
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