Patent
   D700086
Priority
Sep 07 2012
Filed
Sep 07 2012
Issued
Feb 25 2014
Expiry
Feb 25 2028
Assg.orig
Entity
unknown
0
8
n/a
The ornamental design for a oscilloscope probe, as shown and described.

FIG. 1 is a front perspective view of the oscilloscope probe showing my design thereof;

FIG. 2 is a right side view thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a bottom view thereof; and,

FIG. 6 is a front view thereof.

Broken lines depicting a portion of a cord attached to the oscilloscope probe form no part of the claimed design.

Ketzer, Stefan

Patent Priority Assignee Title
Patent Priority Assignee Title
6404215, Aug 21 2000 Tektronix, Inc.; Tektronix, Inc Variable spacing probe tip adapter for a measurement probe
6828767, Mar 20 2002 Santronics, Inc. Hand-held voltage detection probe
6933713, Jan 26 2004 Agilent Technologies, Inc High bandwidth oscilloscope probe with replaceable cable
6967473, May 27 2004 Tektronix, Inc Attachable/detachable variable spacing probing tip system
7030599, Mar 20 2002 Santronics, Inc. Hand held voltage detection probe
D354923, Jan 31 1994 Tektronix, Inc.; Tektronix, Inc Probing head for an electrical test probe
D397628, Aug 22 1997 The Tsurumi-Seiki Co., Ltd. Probe for measuring an electric conductivity
D444401, Jul 31 2000 TELEDYNE LECROY, INC Electrical test probe wedge tip
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 07 2012Rohde & Schwarz GmbH & Co. KG(assignment on the face of the patent)
Sep 14 2012KETZER, STEFANROHDE & SCHWARZ GMBH & CO KGASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0292690279 pdf
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