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Patent
D700086
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Priority
Sep 07 2012
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Filed
Sep 07 2012
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Issued
Feb 25 2014
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Expiry
Feb 25 2028
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Assg.orig
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Entity
unknown
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0
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8
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n/a
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The ornamental design for a oscilloscope probe, as shown and described.
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FIG. 1 is a front perspective view of the oscilloscope probe showing my design thereof;
FIG. 2 is a right side view thereof;
FIG. 3 is a left side view thereof;
FIG. 4 is a top view thereof;
FIG. 5 is a bottom view thereof; and,
FIG. 6 is a front view thereof.
Broken lines depicting a portion of a cord attached to the oscilloscope probe form no part of the claimed design.
Ketzer, Stefan
Patent |
Priority |
Assignee |
Title |
Patent |
Priority |
Assignee |
Title |
6404215, |
Aug 21 2000 |
Tektronix, Inc.; Tektronix, Inc |
Variable spacing probe tip adapter for a measurement probe |
6828767, |
Mar 20 2002 |
Santronics, Inc. |
Hand-held voltage detection probe |
6933713, |
Jan 26 2004 |
Agilent Technologies, Inc |
High bandwidth oscilloscope probe with replaceable cable |
6967473, |
May 27 2004 |
Tektronix, Inc |
Attachable/detachable variable spacing probing tip system |
7030599, |
Mar 20 2002 |
Santronics, Inc. |
Hand held voltage detection probe |
D354923, |
Jan 31 1994 |
Tektronix, Inc.; Tektronix, Inc |
Probing head for an electrical test probe |
D397628, |
Aug 22 1997 |
The Tsurumi-Seiki Co., Ltd. |
Probe for measuring an electric conductivity |
D444401, |
Jul 31 2000 |
TELEDYNE LECROY, INC |
Electrical test probe wedge tip |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a