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Patent
   D706652
Priority
Jan 10 2013
Filed
Jan 10 2013
Issued
Jun 10 2014
Expiry
Jun 10 2028
Inventors
Cipriano, …
Assg.orig
Assg.curr
Entity
unknown
Referenced by
0
References
9
Maint.:
n/a
The ornamental design for an apparatus for measuring cuts, as shown and described.

FIG. 1 is a perspective view of the apparatus for measuring cuts in accordance with the invention;

FIG. 1A is a perspective view thereof;

FIG. 2 is a top view thereof;

FIG. 3 is a perspective view of another embodiment of the apparatus for measuring cuts in accordance with the invention;

FIG. 4 is a perspective view of another embodiment of the apparatus for measuring cuts in accordance with the invention; and,

FIG. 5 is a perspective view of another embodiment of the apparatus for measuring cuts in accordance with the invention.

The sheet portion of the claim in both embodiments are identical.
INVENTORS:

Cipriano, Chris

THIS PATENT IS REFERENCED BY THESE PATENTS:
Patent Priority Assignee Title
THIS PATENT REFERENCES THESE PATENTS:
Patent Priority Assignee Title
4498238, Sep 30 1982 DRAWING DIRECTIONS, INC Transparent perspective tracing board
5491902, Aug 23 1994 Apparatus for matching wall coverings
5557996, May 06 1993 Method and apparatus for cutting pieces of cloth for use in quilts or the like
5673490, Apr 08 1994 Alignment mechanism
5922157, Jul 31 1997 Tileze, Inc.; TILEZE, INC , AN ARIZONA CORPORATION Method for cutting rigid tile
6049987, Oct 06 1997 Gridded measurement system for construction materials
6834438, Feb 04 2002 Tile template
7178249, Dec 13 2001 Rulersmith IP, Inc Measuring tool and method of making
7472492, Aug 17 2007 Stencil assembly for marking pavement grade levels
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