Patent
   D717188
Priority
Nov 27 2012
Filed
May 28 2013
Issued
Nov 11 2014
Expiry
Nov 11 2028
Assg.orig
Entity
unknown
0
4
n/a
The ornamental design for a rack for supporting a multi-point electrical probe holder, as shown.

FIG. 1 is a perspective view, taken from the bottom, rear, and left side, of a rack for supporting a multi-point electrical probe holder, in accordance with our new design;

FIG. 2 is a perspective view of the rack for supporting a multi-point electrical probe holder shown in FIG. 1, taken from the top, front, and left side;

FIG. 3 is a bottom plan view of the rack for supporting a multi-point electrical probe holder shown in FIG. 1;

FIG. 4 is a right side elevation view of the rack for supporting a multi-point electrical probe holder shown in FIG. 1;

FIG. 5 is a left side elevation view of the rack for supporting a multi-point electrical probe holder shown in FIG. 1;

FIG. 6 is a top plan view of the rack for supporting a multi-point electrical probe holder shown in FIG. 1;

FIG. 7 is a rear elevation view of the rack for supporting a multi-point electrical probe holder shown in FIG. 1; and,

FIG. 8 is a front elevation view of the rack for supporting a multi-point electrical probe holder shown in FIG. 1.

Khalfaoui, Chaker, Nielsen, Peter Folmer, Jochumsen, Hans Henrik, Jensen, Anders, Sadolin, Jannik, Madsen, Niels Torp, Norregaard, Lars, Baekbo, Henrik, Gammelgaard, Lauge, Jankjaer, Hans Henrik

Patent Priority Assignee Title
Patent Priority Assignee Title
7151368, Oct 01 2004 SAMSUNG ELECTRONICS CO , LTD Insert block with pusher to push semiconductor device under test
7253649, Jan 31 2006 FOUR DIMENSIONS, INC Automatic mercury probe for use with a semiconductor wafer
7898275, Oct 03 1997 Texas Instruments Incorporated Known good die using existing process infrastructure
D400865, Apr 07 1997 Fibox Oy AB Holder for electronics and instrumentation enclosure
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