Patent
   D720999
Priority
Jun 27 2013
Filed
Jul 29 2013
Issued
Jan 13 2015
Expiry
Jan 13 2029
Assg.orig
Entity
unknown
1
5
n/a
The ornamental design for a microscope measurement apparatus, as shown and described.

FIG. 1 is a perspective view of a microscope measurement apparatus showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Chang, Chih-Kuang, Jiang, Li, Li, Dong-Hai

Patent Priority Assignee Title
D737152, Dec 09 2013 Hon Hai Precision Industry Co., Ltd. Image measuring device
Patent Priority Assignee Title
7599073, Jun 03 2005 Mitutoyo Corporation Image measuring system and methods of generating and executing non-stop image measuring program
8303125, Dec 18 2009 Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.; Hon Hai Precision Industry Co., Ltd. Focus apparatus of image measuring system
8559119, Dec 10 2010 Leica Microsystems CMS GmbH Microscope stage with pivotable objective holder
8650767, Sep 27 2010 Mitutoyo Corporation Coordinates measuring head unit and coordinates measuring machine
8749882, Mar 26 2009 University of Vermont and State Agricultural College Low numerical aperture exclusion imaging
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Jul 05 2013CHANG, CHIH-KUANG HON HAI PRECISION INDUSTRY CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0308920845 pdf
Jul 05 2013JIANG, LIHON HAI PRECISION INDUSTRY CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0308920845 pdf
Jul 05 2013LI, DONG-HAI HON HAI PRECISION INDUSTRY CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0308920845 pdf
Jul 29 2013Hon Hai Precision Industry Co., Ltd.(assignment on the face of the patent)
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