Patent
   D738750
Priority
Apr 15 2014
Filed
Apr 15 2014
Issued
Sep 15 2015
Expiry
Sep 15 2029
Assg.orig
Entity
unknown
0
7
n/a
The ornamental design for a moisture and density nuclear gauge calibration device, as shown and described.

FIG. 1 is a front, top perspective view of a moisture and density nuclear gauge calibration device showing our design;

FIG. 2 is a bottom, side perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a side view thereof;

FIG. 6 is a bottom view thereof;

FIG. 7 is a side view thereof, opposite that shown in FIG. 5;

FIG. 8 is a rear view thereof;

FIG. 9 is a side perspective environmental view of the moisture and density nuclear gauge calibration device shown with a nuclear gauge in broken line sitting thereon for calibration;

FIG. 10 is a front, top perspective view of another embodiment of the moisture and density nuclear gauge calibration device showing our design;

FIG. 11 is a bottom, side perspective view thereof;

FIG. 12 is a front view thereof;

FIG. 13 is a top view thereof;

FIG. 14 is a side view thereof;

FIG. 15 is a bottom view thereof;

FIG. 16 is a side view thereof, opposite that shown in FIG. 14;

FIG. 17 is a rear view thereof; and,

FIG. 18 is a side perspective environmental view of the moisture and density nuclear gauge calibration device shown with a nuclear gauge in broken line sitting thereon for calibration.

The broken lines shown herein are for illustrative purposes only and form no part of the claimed design. The different shading on the three blocks shown in FIGS. 1-18 represent respective different visual appearances associated with different materials.

Muse, Peter D., Regimand, Ali, James, Lawrence H., O'Neill, Adam C.

Patent Priority Assignee Title
Patent Priority Assignee Title
4694165, Sep 30 1985 Gamma-Metrics; GAMMA-METRICS, A CORP OF CA Bulk material analyzer calibration block
6050725, Jun 12 1997 InstroTek, Inc. Validation and calibration apparatus and method for nuclear density gauge
6369381, Jan 29 1999 Troxler Electronic Laboratories, Inc. Apparatus and method for calibration of nuclear gauges
6459772, Mar 18 1999 Eisenlohr Technologies, Inc.; EISENLOHR TECHNOLOGIES,INC Radiographic reference marker
8735816, Dec 28 2010 HITACHI HIGH-TECH CORPORATION Standard member for calibration and method of manufacturing the same and scanning electron microscope using the same
D490326, Mar 26 2003 Nuclear radiation monitor
D706146, Nov 30 2012 InstroTek, Inc.; INSTROTEK, INC Nuclear gauge calibration device
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Nov 30 2012REGIMAND, ALIINSTROTEK, INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0327690894 pdf
Nov 30 2012MUSE, PETER D INSTROTEK, INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0327690894 pdf
Nov 30 2012JAMES, LAWRENCE H INSTROTEK, INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0327690894 pdf
Nov 30 2012O NEILL, ADAM C INSTROTEK, INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0327690894 pdf
Apr 15 2014InstroTek, Inc.(assignment on the face of the patent)
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